Frédéric Houzé
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Documents
Publications
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Calibrating Resistance Measurements in Conductive Probe Atomic Force Microscopy: development of the first universal standard sampleNanoscale 2023 : 13th Seminar on Quantitative Microscopy (QM) and 9th Seminar on Nanoscale Calibration, Standards and Methods, Oct 2023, Helsinki (Finland), Finland. pp.77-78
Communication dans un congrès
hal-04230175v1
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Calibrating resistance and current measurements in C-AFM : Development of universal standard samples25ème Forum des microscopies à sondes locales, Apr 2024, Lyon, France. Actes du 25ème Forum des microscopies à sondes locales (format pdf), 2024
Poster de conférence
hal-04569986v1
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