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Jerome Wolfman
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Identifiants chercheurs
- jerome-wolfman
- IdRef : 184724678
- 0000-0002-4786-2869
Présentation
**2003-2018** CNRS Senior Scientist, GREMAN Laboratory, UMR-CNRS 7347, University of Tours
**2001-2002** Staff Process Development Engineer, Cypress Semiconductor, California, USA
**2000-2001** Visiting Scientist, IBM Almaden Research Center, California, USA
**1998-2000** Research Associate, Device Material Group, University of Cambridge, UK
**1995-1998** Ph. D Student, CRISMAT Laboratory, UMR-CNRS 6508, University of Caen
**2003-now** CNRS Senior Scientist, GREMAN Laboratory, UMR-CNRS 7347, University of Tours
**2001-2002** Staff Process Development Engineer, Cypress Semiconductor, California, USA
**2000-2001** Visiting Scientist, IBM Almaden Research Center, California, USA
**1998-2000** Research Associate, Device Material Group, University of Cambridge, UK
**1995-1998** Ph. D Student, CRISMAT Laboratory, UMR-CNRS 6508, University of Caen
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Tunability investigation in the BaTiO3-CaTiO3-BaZrO3 phase diagram using a refined combinatorial thin film approachCoatings, 2021, 11 (9), pp.1082. ⟨10.3390/coatings11091082⟩
Article dans une revue
hal-03391541v2
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Extreme dielectric non-linearities at the convergence point in Ba1-xCaxTi1-xZrxO3 thin filmsJournal of Alloys and Compounds, 2018, 747, pp.366-373. ⟨10.1016/j.jallcom.2018.03.010⟩
Article dans une revue
hal-01753849v1
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Tunability, dielectric, and piezoelectric properties of Ba(1−x)CaxTi(1−y)ZryO3 ferroelectric thin filmsJournal of Applied Physics, 2016, 119 (9), 094107 (8 p.). ⟨10.1063/1.4942924⟩
Article dans une revue
hal-01309603v1
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