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Luigi Dilillo
10
Documents
Identifiants chercheurs
- luigi-dilillo
- IdRef : 18891885X
- 0000-0002-1295-2688
Présentation
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Investigation on Radiation-Induced Latch-Ups in COTS SRAM Memories On-Board PROBA-VIEEE Transactions on Nuclear Science, inPress, ⟨10.1109/tns.2024.3378668⟩
Article dans une revue
hal-04526731v1
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Enhancing Fault Awareness and Reliability of a Fault-Tolerant RISC-V System-on-ChipElectronics, 2023, 12 (12), pp.2557. ⟨10.3390/electronics12122557⟩
Article dans une revue
hal-04120525v1
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Hybrid Radiation Hardening Approach: a RISC-V System-on-Chip case studyG-RADNEXT Workshop, Nov 2023, Geneva, Switzerland
Communication dans un congrès
hal-04296178v1
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Radiation-induced SEL in a COTS SRAM memory - test and flight dataTEC-QEC Final Presentation Days, Jun 2023, Noordwijk, Netherlands
Communication dans un congrès
hal-04295893v1
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Using HARV-SoC for Reliable Sensing Applications in Radiation Harsh EnvironmentsIWASI 2023 - 9th IEEE International Workshop on Advances in Sensors and Interfaces, Jun 2023, Bari, Italy. pp.227-232, ⟨10.1109/IWASI58316.2023.10164578⟩
Communication dans un congrès
hal-04266899v1
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Investigation on Radiation-Induced Single-Event Latch-up in SRAM Memories on-Board PROBA-VRADECS 2023 - European Conference on Radiation and Its Effects on Components and Systems, Sep 2023, Toulouse, France
Communication dans un congrès
hal-04266897v1
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Hybrid Hardening Approach for a Fault-Tolerant RISC-V System-on-ChipRADECS 2023 - European Conference on Radiation and Its Effects on Components and Systems, Sep 2023, Toulouse, France
Communication dans un congrès
hal-04266891v1
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Neutron Irradiation Testing and Analysis of a Fault-Tolerant RISC-V System-on-ChipDFT 2022 - 35th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2022, Austin, United States. pp.1-6, ⟨10.1109/DFT56152.2022.9962335⟩
Communication dans un congrès
lirmm-03833983v1
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Effects of High-Energy Protons on a Self-Refresh DRAMSELSE 2022 - 18th IEEE Workshop on Silicon Errors in Logic – System Effects, May 2022, Virtual Event, Italy
Communication dans un congrès
lirmm-03832662v1
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