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AV
Angela Vella
Professuer Université de Rouen Normandie
8
Documents
Identifiants chercheurs
- angela-vella
- 0000-0003-1501-159X
- IdRef : 156843463
Présentation
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Numerical study of femtosecond laser assisted atom probe tomographyApplied physics. A, Materials science & processing, 2013, 110 (3), pp.703-707. ⟨10.1007/s00339-012-7189-7⟩
Article dans une revue
ujm-00866898v1
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Probing the thermal response of a silicon field emitted by ultrafast Laser Assistet Atom Probe TomographyAnnalen der Physik, 2012, 525 (1-2), pp.L1-L5. ⟨10.1002/andp.201200182⟩
Article dans une revue
ujm-00866966v1
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Ultrafast laser-triggered field ion emission from semiconductor tipNew Journal of Physics, 2012, 14, pp.113026. ⟨10.1088/1367-2630/14/11/113026⟩
Article dans une revue
ujm-00866869v1
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Photo-excitation and carrier relaxation in semiconductor tip under high dc electric field during laser-assisted atom probe tomography analysisSpring2012 E-MRS 2012 SPRING MEETING Technical sessions: May 14-18, 2012, May 2012, Strasbourg, France
Communication dans un congrès
ujm-00710870v1
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Thermal response of semiconductor tip during femtosecond laser-assisted field evaporationInternational Conference on Photo-Excited Processes and Applications, ICPEPA 8, Aug 2012, Rochester, United States
Communication dans un congrès
ujm-00749065v1
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Role of surface band bending and hole accumulation in laser-assisted field evaporation of semiconductorsInternational Field Emission Society (IFES) 2012, May 2012, Alabama, United States
Communication dans un congrès
ujm-00711690v1
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Numerical study of femtosecond laser-assisted atom probe tomography11th International Conference on Laser Ablation, Nov 2011, Playa del Carmen, Mexico. pp.133
Communication dans un congrès
ujm-00710834v1
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Optical properties of silicon under high electric fieldEuromat 2011, Sep 2011, France. pp.PP
Communication dans un congrès
ujm-00711694v1
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