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Annie Malchère
CNRS Engineer at MATEIS, INSA Lyon, France
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Documents
Identifiants chercheurs
- annie-malchere
- 0000-0002-8921-5387
- Google Scholar : https://scholar.google.fr/citations?user=70Oi8c8AAAAJ
Présentation
**Skills and Expertise:**
- Advanced Electron Microscopy
- In situ high temperature Environmental scanning electron microscope (ESEM)
- In situ tensile tests Environmental scanning electron microscope (ESEM)
- X-rays Microanalysis
- Advanced materials
- Image treatments
- Image analysis
Publications
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Better understand the crystallization dynamics of ZrCu TFMGs: Benefits of combining global and local in situ approachesJournal of Alloys and Compounds, 2024, 987, pp.174233. ⟨10.1016/j.jallcom.2024.174233⟩
Article dans une revue
hal-04526222v1
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