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Annie Malchère
CNRS Engineer at MATEIS, INSA Lyon, France
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Documents
Identifiants chercheurs
- annie-malchere
- 0000-0002-8921-5387
- Google Scholar : https://scholar.google.fr/citations?user=70Oi8c8AAAAJ
Présentation
**Skills and Expertise:**
- Advanced Electron Microscopy
- In situ high temperature Environmental scanning electron microscope (ESEM)
- In situ tensile tests Environmental scanning electron microscope (ESEM)
- X-rays Microanalysis
- Advanced materials
- Image treatments
- Image analysis
Publications
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Metallic nanoparticle-based strain sensors elaborated by atomic layer depositionApplied Physics Letters, 2017, 110, pp.123103. ⟨10.1063/1.4978778⟩
Article dans une revue
hal-01701521v1
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Investigation of the in-plane and out-of-plane electrical properties of metallic nanoparticles in dielectric matrix thin films elaborated by atomic layer depositionNanotechnology, 2017, 28 (45), 455602 (8 p.). ⟨10.1088/1361-6528/aa8b5e⟩
Article dans une revue
hal-01644827v1
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ALD growth of Platinum Nanoislands on Alumina for Single Electron Transistors ApplicationsALD growth of Platinum Nanoislands on Alumina for Single Electron Transistors Applications, 2016, Paris, France. 2016
Poster de conférence
hal-01489072v1
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Shadow Edge Evaporation for Single Electron TransistorsShadow Edge Evaporation for Single Electron Transistors, 2015, Lyon, France. 2015
Poster de conférence
hal-01489632v1
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