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Annie Malchère
CNRS Engineer at MATEIS, INSA Lyon, France
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Documents
Identifiants chercheurs
- annie-malchere
- 0000-0002-8921-5387
- Google Scholar : https://scholar.google.fr/citations?user=70Oi8c8AAAAJ
Présentation
**Skills and Expertise:**
- Advanced Electron Microscopy
- In situ high temperature Environmental scanning electron microscope (ESEM)
- In situ tensile tests Environmental scanning electron microscope (ESEM)
- X-rays Microanalysis
- Advanced materials
- Image treatments
- Image analysis
Publications
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Metallic nanoparticle-based strain sensors elaborated by atomic layer depositionApplied Physics Letters, 2017, 110, pp.123103. ⟨10.1063/1.4978778⟩
Article dans une revue
hal-01701521v1
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PEALD of Pt nanoparticles: towards the development of single electron transistors and flexible strain sensorsRAFALD (Réseau des Acteurs Français de l’ALD), Nov 2018, Lyon, France
Communication dans un congrès
hal-02075020v1
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Flexible Platinum Nanoparticle-based Piezoresistive Transducers Elaborated by Atomic Layer DepositionAVS 17th International Conference on Atomic Layer Deposition, Jan 2017, Denver, United States
Communication dans un congrès
hal-01701470v1
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