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Annie Malchère
CNRS Engineer at MATEIS, INSA Lyon, France
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Documents
Identifiants chercheurs
- annie-malchere
- 0000-0002-8921-5387
- Google Scholar : https://scholar.google.fr/citations?user=70Oi8c8AAAAJ
Présentation
**Skills and Expertise:**
- Advanced Electron Microscopy
- In situ high temperature Environmental scanning electron microscope (ESEM)
- In situ tensile tests Environmental scanning electron microscope (ESEM)
- X-rays Microanalysis
- Advanced materials
- Image treatments
- Image analysis
Publications
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Effect of Thermal Stresses Formed during Air Annealing of Amorphous Lanthanum Cuprate Thin Films Deposited on Silicon SubstrateCoatings, 2020, 10 (7), pp.613. ⟨10.3390/coatings10070613⟩
Article dans une revue
hal-02945236v1
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