Antoine GUITTON
3
Documents
Identifiants chercheurs
- antoine-guitton
- 0000-0002-1508-787X
- Google Scholar : https://scholar.google.fr/citations?user=V-N5CQYAAAAJ&hl=fr
- IdRef : 177791039
Présentation
Publications
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On-axis TKD for orientation mapping of nanocrystalline materials in SEMMaterials Characterization, 2017, 130, pp.92-96. ⟨10.1016/j.matchar.2017.05.036⟩
Article dans une revue
hal-02392258v1
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Characterization of crystalline defects studied by STEM-in-SEMPoster de conférence hal-03165869v1 |
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Grain size determination in nanocrystalline materials using the TKD techniquePoster de conférence hal-03165887v1 |