
bernard deconihout
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Publications
Effect of laser pulse duration on laser assisted atom probe analysis on metals and oxidesCLEO/Europe-EQEC, 2015, Munich, Germany
Communication dans un congrès
hal-02419701
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Atom probe tomography: An imaging tool at the atomic scale using ltrafast laser pulsesCLEO: Applications and Technology, CLEO_AT 2013, 2013, Unknown, Unknown Region
Communication dans un congrès
hal-01928864
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Thermal response of semiconductor tip during femtosecond laser-assisted field evaporationInternational Conference on Photo-Excited Processes and Applications, ICPEPA 8, Aug 2012, Rochester, United States
Communication dans un congrès
ujm-00749065
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Role of surface band bending and hole accumulation in laser-assisted field evaporation of semiconductorsInternational Field Emission Society (IFES) 2012, May 2012, Alabama, United States
Communication dans un congrès
ujm-00711690
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Optical properties of silicon under high electric fieldEuromat 2011, Sep 2011, France. pp.PP
Communication dans un congrès
ujm-00711694
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Numerical study of femtosecond laser-assisted atom probe tomography11th International Conference on Laser Ablation, Nov 2011, Playa del Carmen, Mexico. pp.133
Communication dans un congrès
ujm-00710834
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Modeling artifacts in the analysis of test semiconductor structures in atom probe tomographyAIP Conference Proceedings, 2009, Unknown, Unknown Region. pp.175--180, ⟨10.1063/1.3251216⟩
Communication dans un congrès
hal-01929146
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Toward a laser assisted wide-angle tomographic atom-probeSurface and Interface Analysis, 2007, Unknown, Unknown Region. pp.278--282, ⟨10.1002/sia.2491⟩
Communication dans un congrès
istex
hal-01928893
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Laser atom probe tomography: Some applicationsIVNC and IFES 2006 - Technical Digest - l9th International Vacuum Nanoelectronics Conference and 50th International Field Emission Symposium, 2006, Unknown, Unknown Region. pp.61--62, ⟨10.1109/IVNC.2006.335352⟩
Communication dans un congrès
hal-01928901
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Atom Probe Tomography in Materials ScienceEUROMAT conference, 2005, Prag, Czech Republic
Communication dans un congrès
hal-01838937
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The tomographic atom probe: Salient results and recent breakthroughsMicroscopy and Microanalysis, 2005, Unknown, Unknown Region. pp.96--97, ⟨10.1017/S1431927605501545⟩
Communication dans un congrès
hal-01928903
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Atom-probe investigations of fine-scale features in intermetallicsMicron, 2001, Unknown, Unknown Region. pp.721--729, ⟨10.1016/S0968-4328(00)00079-2⟩
Communication dans un congrès
istex
hal-01928922
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Why do We Need a High Performance Position Sensitive Detector in Atom Probe Tomography?50th International Field Emission Symposium (IFES), 2006, Guilin, China. 2006
Poster de conférence
hal-01838932
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Composition measurements in 3DAP: a Bayesian approach49th International Field Emission Symposium (IFES), 2004, Graz, Austria. 2004
Poster de conférence
hal-01838939
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