BR
Bruno Rouzeyre
2
Documents
Identifiants chercheurs
- bruno-rouzeyre
- IdRef : 07124705X
Présentation
Publications
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 2
- 2
- 2
- 2
- 2
- 2
- 2
- 2
- 2
- 2
- 1
- 1
- 1
- 1
- 1
- 1
- 2
- 1
- 1
- 1
- 2
- 1
Sensitivity to Laser Fault Injection: CMOS FD-SOI vs. CMOS bulkIEEE Transactions on Device and Materials Reliability, 2019, 19 (1), pp.6-15. ⟨10.1109/TDMR.2018.2886463⟩
Article dans une revue
hal-01971932v1
|
|
Laser-Induced Fault Effects in Security-Dedicated CircuitsVLSI-SoC: Very Large Scale Integration and System-on-Chip, Oct 2014, Playa del Carmen, Mexico. pp.220-240, ⟨10.1007/978-3-319-25279-7_12⟩
Communication dans un congrès
hal-01383737v1
|