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Bruno Rouzeyre

12
Documents
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Publications

david-hely
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Laser fault injection at the CMOS 28 nm technology node: an analysis of the fault model

Jean-Max Dutertre , Vincent Beroulle , Philippe Candelier , Stephan de Castro , Louis-Barthelemy Faber
FDTC: Fault Diagnosis and Tolerance in Cryptography, Sep 2018, Amsterdam, Netherlands. pp.1-6, ⟨10.1109/FDTC.2018.00009⟩
Communication dans un congrès emse-01856008v1
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The case of using CMOS FD-SOI rather than CMOS bulk to harden ICs against laser attacks

Jean-Max Dutertre , Vincent Beroulle , Philippe Candelier , Louis-Barthelemy Faber , Marie-Lise Flottes
IOLTS: International On-Line Testing Symposium, Jul 2018, Platja d’Aro, Spain. pp.214-219, ⟨10.1109/IOLTS.2018.8474230⟩
Communication dans un congrès emse-01856000v1
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Laser-Induced Fault Effects in Security-Dedicated Circuits

Vincent Beroulle , Philippe Candelier , Stephan de Castro , Giorgio Di Natale , Jean-Max Dutertre
VLSI-SoC: Very Large Scale Integration and System-on-Chip, Oct 2014, Playa del Carmen, Mexico. pp.220-240, ⟨10.1007/978-3-319-25279-7_12⟩
Communication dans un congrès hal-01383737v1

Scan Pattern Watermarking

David Hely , Frédéric Bancel , Marie-Lise Flottes , Bruno Rouzeyre
LATW'06: 7th IEEE Latin American Test Workshop, Mar 2006, Buenos Aires, pp.63-67
Communication dans un congrès lirmm-00102753v1
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A secure Scan Design Methodology

David Hély , Frédéric Bancel , Marie-Lise Flottes , Bruno Rouzeyre
DATE: Design, Automation and Test in Europe, Mar 2006, Munich, Germany. pp.1177-1178, ⟨10.1109/DATE.2006.244019⟩
Communication dans un congrès lirmm-00132516v1

A Secure Scan Design Methodology

David Hély , Frédéric Bancel , Marie-Lise Flottes , Bruno Rouzeyre
LATW'06: 7th IEEE Latin American Test Workshop, Mar 2006, Buenos Aires, Argentina. pp.81-86
Communication dans un congrès lirmm-00102752v1

Secure Scan Techniques: a Comparison

David Hély , Frédéric Bancel , Marie-Lise Flottes , Bruno Rouzeyre
IOLTS: International On-Line Testing Symposium, Jul 2006, Como, Italy. pp.119-124, ⟨10.1109/IOLTS.2006.55⟩
Communication dans un congrès lirmm-00102857v1

Test Control for Secure Scan Designs

David Hely , Frédéric Bancel , Marie-Lise Flottes , Bruno Rouzeyre
ETS: European Test Symposium, May 2005, Tallinn, Estonia. pp.190-195
Communication dans un congrès lirmm-00106011v1
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Scan Design and Secure Chips : Can They Work Together

David Hely , Frédéric Bancel , Marie-Lise Flottes , Bruno Rouzeyre
SAME'05: Sophia-Antipolis Forum on MicroElectronics, Oct 2005, Sophia-Antipolis, France
Communication dans un congrès lirmm-00106546v1
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Scan design and secure chip [secure IC testing]

David Hely , Marie-Lise Flottes , Frédéric Bancel , Bruno Rouzeyre , Nicolas Berard
IOLTS: International On-Line Testing Symposium, Jul 2004, Madeira Island, Portugal. pp.219-224, ⟨10.1109/OLT.2004.1319691⟩
Communication dans un congrès lirmm-00108909v1