BR
Bruno Rouzeyre
120
Documents
Identifiants chercheurs
- bruno-rouzeyre
- IdRef : 07124705X
Présentation
Publications
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Providing Confidentiality and Integrity in Ultra Low Power IoT DevicesDTIS 2019 - 14th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Apr 2019, Mykonos, Greece. ⟨10.1109/DTIS.2019.8735090⟩
Communication dans un congrès
hal-02166920v1
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A Comprehensive Approach to a Trusted Test InfrastructureIVSW 2019 - 4th IEEE International Verification and Security Workshop, Jul 2019, Rhodes, Greece. pp.43-48, ⟨10.1109/IVSW.2019.8854428⟩
Communication dans un congrès
lirmm-02306980v1
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Encryption-Based Secure JTAGDDECS 2019 - 22nd International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Apr 2019, Cluj-Napoca, Romania. pp.1-6, ⟨10.1109/DDECS.2019.8724654⟩
Communication dans un congrès
hal-02149061v1
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Stream Cipher Based Encryption in IEEE Test StandardsTRUDEVICE 2019 - 8th Workshop on Trustworthy Manufacturing and Utilization of Secure Devices, May 2019, Baden Baden, Germany
Communication dans un congrès
hal-02506743v1
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Encryption of test data: which cipher is better?PRIME: PhD Research in Microelectronics and Electronics, Jul 2018, Prague, Czech Republic. pp.85-88, ⟨10.1109/PRIME.2018.8430366⟩
Communication dans un congrès
lirmm-01867249v1
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Assessing Body Built-In Current Sensors for Detection of Multiple Transient FaultsESREF 2018 - European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Oct 2018, Aalborg, Denmark
Communication dans un congrès
hal-04457522v1
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The case of using CMOS FD-SOI rather than CMOS bulk to harden ICs against laser attacksIOLTS: International On-Line Testing Symposium, Jul 2018, Platja d’Aro, Spain. pp.214-219, ⟨10.1109/IOLTS.2018.8474230⟩
Communication dans un congrès
emse-01856000v1
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A new secure stream cipher for scan chain encryption3rd IEEE International Verification and Security Workshop (IVSW 2018), Jul 2018, Platja d’Aro, Spain. pp.68-73, ⟨10.1109/IVSW.2018.8494852⟩
Communication dans un congrès
lirmm-01867256v1
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Laser fault injection at the CMOS 28 nm technology node: an analysis of the fault modelFDTC: Fault Diagnosis and Tolerance in Cryptography, Sep 2018, Amsterdam, Netherlands. pp.1-6, ⟨10.1109/FDTC.2018.00009⟩
Communication dans un congrès
emse-01856008v1
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Does stream cipher-based scan chains encryption really prevent scan attacks?TRUDEVICE Workshop, Mar 2018, Dresden, Germany
Communication dans un congrès
lirmm-01867286v1
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SI ECCS: SECure context saving for IoT devicesDTIS 2018 - 13th International Conference on Design and Technology of Integrated Systems in Nanoscale Era, Apr 2018, Taormina, Italy. ⟨10.1109/DTIS.2018.8368561⟩
Communication dans un congrès
hal-01740173v1
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Hacking the Control Flow error detection mechanismIVSW: International Verification and Security Workshop, Jul 2017, Thessaloniki, Greece. pp.51-56, ⟨10.1109/IVSW.2017.8031544⟩
Communication dans un congrès
lirmm-01700739v1
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Scan Chain EncryptionDOCTIS: Journée des Doctorants de l’école doctorale I2S, 2017, Montpellier, France
Communication dans un congrès
lirmm-01867277v1
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Experimentations on scan chain encryption with PRESENTIVSW: International Verification and Security Workshop, Jul 2017, Thessaloniki, Greece. pp.45-50, ⟨10.1109/IVSW.2017.8031543⟩
Communication dans un congrès
lirmm-01699258v1
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Scan chain encryption for the test, diagnosis and debug of secure circuitsETS: European Test Symposium, May 2017, Limassol, Cyprus. ⟨10.1109/ETS.2017.7968248⟩
Communication dans un congrès
lirmm-01699254v1
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Duplication-based Concurrent Detection of Hardware Trojans in Integrated CircuitsTRUDEVICE, Nov 2016, Barcelona, Spain
Communication dans un congrès
lirmm-01385551v1
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Using Outliers to Detect Stealthy Hardware Trojan Triggering?IVSW: International Verification and Security Workshop, Jul 2016, Sant Feliu de Guixols, France
Communication dans un congrès
lirmm-01347119v1
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Hardware Trust through Layout Filling: a Hardware Trojan Prevention TechniqueISVLSI: International Symposium on Very Large Scale Integration, Jul 2016, Pittsburgh, United States. pp.254-259, ⟨10.1109/ISVLSI.2016.22⟩
Communication dans un congrès
lirmm-01346529v1
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Multi-segment Enhanced Scan-chains for Secure ICsTRUDEVICE Workshop, Sep 2015, Saint-Malo, France
Communication dans un congrès
lirmm-01276304v1
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Validation Of Single BBICS Architecture In Detecting Multiple FaultsATS: Asian Test Symposium, Nov 2015, Mumbai, India
Communication dans un congrès
lirmm-01234067v1
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Sensitivity to fault laser injection: a comparison between 28nm bulk and FD-SOI technologyTRUDEVICE Workshop, Sep 2015, Saint-Malo, France
Communication dans un congrès
lirmm-01234094v1
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Figure of merits of 28nm Si technologies for implementing laser attack resistant security dedicated circuitsISVLSI: International Symposium on Very Large Scale Integration, Jul 2015, Montpellier, France. pp.362-367, ⟨10.1109/ISVLSI.2015.76⟩
Communication dans un congrès
emse-01227138v1
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3D DFT Challenges and SolutionsISVLSI: International Symposium on Very Large Scale Integration, Jul 2015, Montpellier, France. pp.603-608, ⟨10.1109/ISVLSI.2015.11⟩
Communication dans un congrès
lirmm-01234076v1
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Session-less based thermal-aware 3D-SIC test schedulingETS: European Test Symposium, May 2015, Cluj-Napoca, Romania. ⟨10.1109/ETS.2015.7138732⟩
Communication dans un congrès
lirmm-01922990v1
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Hardware Trojan Prevention using Layout-Level Design ApproachECCTD: European Conference on Circuit Theory and Design, Aug 2015, Trondheim, Norway. ⟨10.1109/ECCTD.2015.7300093⟩
Communication dans un congrès
lirmm-01234072v1
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New Testing Procedure for Finding Insertion Sites of Stealthy Hardware TrojansDATE 2015 - 18th Design, Automation and Test in Europe Conference and Exhibition, Mar 2015, Grenoble, France. pp.776-781, ⟨10.7873/DATE.2015.1102⟩
Communication dans un congrès
lirmm-01141619v1
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Hierarchical Secure DfTTRUDEVICE Workshop, Sep 2015, St Malo, France
Communication dans un congrès
lirmm-01234095v1
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Simulating Laser Effects on ICs, from Physical Level to Gate Level: a comprehensive approachTRUDEVICE Workshop, May 2014, Paderborn, Germany
Communication dans un congrès
lirmm-01119614v1
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Laser attacks on integrated circuits: from CMOS to FD-SOIDTIS: Design and Technology of Integrated Systems in Nanoscale Era, May 2014, Santorin, Greece. ⟨10.1109/DTIS.2014.6850664⟩
Communication dans un congrès
emse-01099042v1
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Layout-Aware Laser Fault Injection Simulation and Modeling: from physical level to gate levelDTIS: Design and Technology of Integrated Systems in Nanoscale Era, May 2014, Santorin, Greece. ⟨10.1109/DTIS.2014.6850665⟩
Communication dans un congrès
lirmm-01119592v1
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Built-In Self-Test for Manufacturing TSV Defects before bondingVTS: VLSI Test Symposium, Apr 2014, Napa, CA, United States. ⟨10.1109/VTS.2014.6818771⟩
Communication dans un congrès
lirmm-00989682v1
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Customized Cell Detector for Laser-Induced-Fault DetectionIOLTS: International On-Line Testing Symposium, Jul 2014, Platja d'Aro, Spain. pp.37-42, ⟨10.1109/IOLTS.2014.6873669⟩
Communication dans un congrès
lirmm-01119576v1
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Design of Bulk Built-In Current Sensors to Detect Single Event Effects and Laser-Induced Fault Injection AttemptsJoint MEDIAN–TRUDEVICE Open Forum, Sep 2014, Amsterdam, Netherlands
Communication dans un congrès
emse-01099040v1
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Laser-Induced Fault Effects in Security-Dedicated CircuitsVLSI-SoC: Very Large Scale Integration and System-on-Chip, Oct 2014, Playa del Carmen, Mexico. pp.220-240, ⟨10.1007/978-3-319-25279-7_12⟩
Communication dans un congrès
hal-01383737v1
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A Novel Hardware Logic Encryption Technique for thwarting Illegal Overproduction and Hardware TrojansIOLTS: International On-Line Testing Symposium, Jul 2014, Platja d'Aro, Girona, Spain. pp.49-54, ⟨10.1109/IOLTS.2014.6873671⟩
Communication dans un congrès
lirmm-01025275v1
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2D to 3D Test Pattern Retargeting Using IEEE P1687 Based 3D DFT ArchitecturesISVLSI: International Symposium on Very Large Scale Integration, Jul 2014, Tampa, FL, United States. pp.386-391, ⟨10.1109/ISVLSI.2014.83⟩
Communication dans un congrès
lirmm-01119605v1
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Improving the ability of Bulk Built-In Current Sensors to detect Single Event Effects by using triple-well CMOS25th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2014), Sep 2014, Berlin, Germany
Communication dans un congrès
hal-03094235v1
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TSVs Pre-Bond Testing: a test scheme for capturing BIST responses3D-Test: Testing Three-Dimensional Stacked Integrated Circuits, Sep 2013, Anaheim, CA, United States
Communication dans un congrès
lirmm-00989707v1
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Identification of Hardware Trojans triggering signalsFirst Workshop on Trustworthy Manufacturing and Utilization of Secure Devices, May 2013, Avignon, France
Communication dans un congrès
lirmm-00991360v1
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A 3D IC BIST for pre-bond test of TSVs using Ring OscillatorsNEWCAS: New Circuits and Systems, Jun 2013, Paris, France. pp.001-004
Communication dans un congrès
lirmm-00838524v1
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A BIST Method for TSVs Pre-Bond TestIDT'13: 8th IEEE International Design & Test Symposium, Dec 2013, Marrakesh, Morocco. pp.1-6, ⟨10.1109/IDT.2013.6727081⟩
Communication dans un congrès
lirmm-00989727v1
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Laser-Induced Fault SimulationEUROMICRO DSD/SEAA, Sep 2013, Santander, Spain. pp.609-614, ⟨10.1109/DSD.2013.72⟩
Communication dans un congrès
lirmm-01430807v1
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Sensitivity tuning of a bulk built-in current sensor for optimal transient-fault detectionESREF: European Symposium on Reliability of Electron devices, Failure physics and analysis, Sep 2013, Arcachon, France. pp.B3c-2 #68
Communication dans un congrès
hal-00872705v1
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A Bulk Built-in Sensor for Detection of Fault AttacksHOST: Hardware-Oriented Security and Trust, Jun 2013, Austin, TX, United States. pp.51-54, ⟨10.1109/HST.2013.6581565⟩
Communication dans un congrès
lirmm-01430800v1
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3D Design For Test Architectures Based on IEEE P16874th IEEE International Workshop on Testing Three-Dimensional Stacked Integrated Circuits (3D-TEST), Sep 2013, Anaheim, CA, United States
Communication dans un congrès
lirmm-00989717v1
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A smart test controller for scan chains in secure circuitsIOLTS: International On-Line Testing Symposium, Jul 2013, Chania, Greece. pp.228-229, ⟨10.1109/IOLTS.2013.6604085⟩
Communication dans un congrès
lirmm-01430814v1
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A single built-in sensor to check pull-up and pull-down CMOS networks against transient faultsPATMOS: Power and Timing Modeling, Optimization and Simulation, Sep 2013, Karlsruhe, Germany. pp.157-163, ⟨10.1109/PATMOS.2013.6662169⟩
Communication dans un congrès
lirmm-00968621v1
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Novel transient-fault detection circuit featuring enhanced bulk built-in current sensor with low-power sleep-modeESREF: European Symposium on Reliability of Electron devices, Failure physics and analysis, Oct 2012, Cagliari, Italy
Communication dans un congrès
hal-00867864v1
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A New Scan Attack on RSA in Presence of Industrial CountermeasuresCOSADE: Constructive Side-Channel Analysis and Secure Design, May 2012, Darmstadt, Germany. pp.89-104, ⟨10.1007/978-3-642-29912-4_8⟩
Communication dans un congrès
lirmm-00719986v1
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On-Chip Comparison for Testing Secure ICsDCIS 2012 - 27th Conference on Design of Circuits and Integrated Systems, Nov 2012, Avignon, France. pp.112-117
Communication dans un congrès
lirmm-00795205v1
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Is Side-Channel Analysis really reliable for detecting Hardware Trojans?DCIS 2012 - 27th Conference on Design of Circuits and Integrated Systems, Nov 2012, Avignon, France. pp.238-242
Communication dans un congrès
lirmm-00823477v1
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A Scan-based Attack on Elliptic Curve Cryptosystems in presence of Industrial Design-for-Testability StructuresIEEE International Symposium on Defect and Fault Tolerance in VLSI & Nanotechnology Systems, United States. http://www.dfts.org/
Communication dans un congrès
lirmm-00744472v1
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Are Advanced DfT Structures Sufficient for Preventing Scan-Attacks?VTS'12: 30th IEEE VLSI Test Symposium, Apr 2012, Maui, Hawai, United States. pp.246-251
Communication dans un congrès
lirmm-00694536v1
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Calibrating Bulk Built-in Current Sensors for Detecting Transient FaultsColloque GDR SoC-SiP, 2012, Lyon, France
Communication dans un congrès
lirmm-00715126v1
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New Security Threats Against Chips Containing Scan Chain StructuresHOST'11: IEEE International Symposium on Hardware-Oriented Security and Trust, San Diego, CA, United States. pp.105-110
Communication dans un congrès
lirmm-00599690v1
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Power Consumption Traces Realignment to Improve Differential Power AnalysisDDECS'11: 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits ans Systems, Germany. pp.201-206
Communication dans un congrès
lirmm-00592005v1
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Scan Attacks and Countermeasures in Presence of Scan Response CompactorsETS: European Test Symposium, May 2011, Trondheim, Norway. pp.19-24, ⟨10.1109/ETS.2011.30⟩
Communication dans un congrès
lirmm-00647062v1
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New side-channel attack against scan chains9th CryptArchi Workshop (2011), Jun 2011, Bochum, Germany. pp.2
Communication dans un congrès
lirmm-00648575v1
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Timing Issues of Transient Faults in Concurrent Error Detection SchemesGdR SoC-SiP'2011: Colloque national du Groupement de Recherche System-On-Chip et System-In-Package, Jun 2011, Lyon, France. http://www2.lirmm.fr/~w3mic/SOCSIP/
Communication dans un congrès
lirmm-00701798v1
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How to Sample Results of Concurrent Error Detection Schemes in Transient Fault Scenarios?RADECS: Radiation and Its Effects on Components and Systems, Sep 2011, Sevilla, Spain. pp.635-642, ⟨10.1109/RADECS.2011.6131361⟩
Communication dans un congrès
lirmm-00701776v1
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Timing Issues for an Efficient Use of Concurrent Error Detection CodesLATW: Latin American Test Workshop, Mar 2011, Porto de Galinhas, Brazil. pp.1-6, ⟨10.1109/LATW.2011.5985933⟩
Communication dans un congrès
lirmm-00627427v1
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A New Bulk Built-in Current Sensor-Based Strategy for Dealing with Long-Duration Transient Faults in Deep-Submicron TechnologiesDFT'2011: International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2011, Vancouver, Canada. pp.302-308, ⟨10.1109/DFT.2011.15⟩
Communication dans un congrès
lirmm-00701789v1
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Evaluation of Resistance to Differential Power Analysis: Execution Time Optimizations for DesignersDELTA'10: Fifth IEEE International Symposium on Electronic Design, Test and Application, Jan 2010, Ho Chi Minh City, Vietnam. pp.256-261
Communication dans un congrès
lirmm-00539993v1
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Waveforms re-Alignment to Improve DPA AttacksCryptArchi: Cryptographic Architectures, Jun 2010, Gif-sur-Yvette, France
Communication dans un congrès
lirmm-00539994v1
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Ensuring High Testability without Degrading SecurityDDECS'10: IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, Vienna, Austria. pp.6
Communication dans un congrès
lirmm-00480710v1
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Evaluation of Concurrent Error Detection Techniques on the Advanced Encryption StandardIOLTS: International On-Line Testing Symposium, Jul 2010, Corfu, Greece. pp.223-228, ⟨10.1109/IOLTS.2010.5560196⟩
Communication dans un congrès
lirmm-00539232v1
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Evaluation of Concurrent Error Detection Techniques on the Advanced Encryption StandardETS: European Test Symposium, May 2010, Prague, Czech Republic
Communication dans un congrès
lirmm-00493247v1
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Ensuring High Testability without Degrading SecurityETS: European Test Symposium, May 2009, Seville, Spain
Communication dans un congrès
lirmm-00407163v1
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Tutorial on Design For Testability & Digital SecurityIEEE 10th Latin American Test Workshop, 2009, Buzios, Brazil
Communication dans un congrès
lirmm-00407161v1
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Execution Time Reduction of Differential Power Analysis ExperimentsLATW'09: 10th Latin-American Test Workshop, Mar 2009, Armaçao dos Buzios, Brazil, pp.1-5, ⟨10.1109/LATW.2009.4813819⟩
Communication dans un congrès
lirmm-00367712v1
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An Integrated Validation Environment for Differential Power AnalysisDELTA: Electronic Design, Test and Applications, Jan 2008, Hong Kong, China. pp.527-532, ⟨10.1109/DELTA.2008.61⟩
Communication dans un congrès
lirmm-00407165v1
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A Reliable Architecture for Substitution Boxes in Integrated CryptographicDCIS'08: Conference on Design of Circuits and Integrated Systems, Nov 2008, pp.27-32
Communication dans un congrès
lirmm-00363783v1
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Stuck-at-Faults Test using Differential Power AnalysisLPonTR'08: Workshop on Low Power Design Impact on Test and Reliability, May 2008, Italy
Communication dans un congrès
lirmm-00332529v1
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Observability of Stuck-at-Faults with Differential Power AnalysisLATW'08: IEEE Latin American Test Workshop, Feb 2008, Mexico. pp.N/A
Communication dans un congrès
lirmm-00295498v1
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Low Cost Self-Test of Crypto-DevicesWDSN'08: 2nd Workshop on Dependable and Secure Nanocomputing, Jun 2008, Anchorage, Canada, United States. pp.41-46
Communication dans un congrès
lirmm-00295108v1
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An Integrated Validation Environment for Differential Power AnalysisSAME'08: Sophia-Antipolis Forum on MicroElectronics 2008, Sep 2008, Sophia-Antipolis, France
Communication dans un congrès
lirmm-00363796v1
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A Reliable Architecture for the Advanced Encryption Standard13th IEEE European Test Symposium, May 2008, Verbania, Italy. pp.13-18, ⟨10.1109/ETS.2008.26⟩
Communication dans un congrès
lirmm-00285868v1
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Test and SecurityCryptArchi: Cryptographic Architectures, Jun 2007, Montpellier, France
Communication dans un congrès
lirmm-00163017v1
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An On-Line Fault Detection Scheme for SBoxes in Secure CircuitsIOLTS 2007 - 13th IEEE International On-Line Testing and Robust System Design Symposium, Jul 2007, Heraklion, Crete, Greece. pp.57-62, ⟨10.1109/IOLTS.2007.16⟩
Communication dans un congrès
lirmm-00163244v1
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A Novel Parity Bit Scheme for SBOX in AES CircuitsIEEE Design and Diagnostics of Electronic Circuits and Systems (DDECS), Apr 2007, Cracovie, Poland. pp.267-271, ⟨10.1109/DDECS.2007.4295295⟩
Communication dans un congrès
lirmm-00141799v1
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On-Line Self-Test of AES Hardware ImplementationsDSN'07: Workshop on Dependable and Secure Nanocomputing, Jun 2007, Edinburgh, United Kingdom
Communication dans un congrès
lirmm-00163405v1
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Encryption Techniques for Test InfrastructuresPoster de conférence lirmm-02306922v1 |
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Scan chain encryption in Test StandardsSURREALIST: SecURity, REliAbiLity, test, prIvacy, Safety and Trust of Future Devices, May 2018, Bremen, Germany. , Workshop on SecURity, REliAbiLity, test, prIvacy, Safety and Trust of Future Devices, 2018
Poster de conférence
lirmm-01882578v2
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Stream cipher-based scan encryption in test standards12e Colloque National du GDR SoC/SiP, Jun 2018, Paris, France. 2018
Poster de conférence
lirmm-01867283v1
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Scan chain encryption, a countermeasure against scan attacksPHISIC: Practical Hardware Innovations in Security Implementation and Characterization, May 2018, Gardanne, France. , Workshop on Practical Hardware Innovations in Security Implementation and Characterization, 2018
Poster de conférence
lirmm-01882565v2
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Sécurité des moyens de test des SoCJournée thématique des GDR SoC² et Sécurité Informatique : Sécurité des SoC complexes hétérogènes – de la TEE au matériel, Sep 2018, Paris, France. 2018
Poster de conférence
lirmm-01882552v1
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SECCS: SECure Context Saving for IoT Devices12e Colloque National du GDR SoC/SiP, Jun 2018, Paris, France. 2018
Poster de conférence
hal-02042659v1
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Sécurisation des structures de test : étude comparative11e Colloque National du GDR SoC/SiP, Jun 2017, Bordeaux, France. 2017
Poster de conférence
lirmm-01867279v1
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Scan Chain Encryption for the Test, Diagnosis and Debug of Secure CircuitsPoster de conférence lirmm-01892667v1 |
Detection and Prevention of Hardware Trojan through Logic TestingTRUDEVICE, Nov 2016, Barcelona, Spain. , 4th Workshop on Trustworthy Manufacturing and Utilization of Secure Devices, Manufacturing test of secure devices / Reverse engineering countermeasures / Other topics, pp.#33, 2016, Posters IV
Poster de conférence
lirmm-01430007v1
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tLIFTING : A Multi-level Delay-annotated Fault Simulator for Digital CircuitsDCIS 2012 - 27th Conference on Design of Circuits and Integrated Systems, Nov 2012, Avignon, France. , 2012
Poster de conférence
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A Dependable Parallel Architecture for SBoxesReCoSoc'07: International Workshop on Reconfigurable Communication Centric System-On-Chips, Jun 2007, Montpellier, France. pp.CD-ROM, 2007
Poster de conférence
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Chapitre 6 : On Countermeasures Against Fault Attacks on the Advanced Encryption StandardMarc Joye and Michael Tunstall. Fault Analysis in Cryptography, Springer, pp.89-109, 2012, Information Security and Cryptography, 978-3-642-29656-0 (-7 for eBook)
Chapitre d'ouvrage
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Chapter 9: Fault Detection in Crypto-devicesWei Zhang. Fault Detection, InTech, pp.177-194, 2010, 978-953-307-037-7. ⟨10.5772/213⟩
Chapitre d'ouvrage
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Rapport Technique intermédiaire, Contrat TOETS CT 302, Programme CEE CATRENE2011
Autre publication scientifique
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Rapport Technique de fin d'année, Contrat TOETS CT 302, Programme CEE CATRENE2011
Autre publication scientifique
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Contrat TOETS CT 302 - Programme CEE CATRENE (Rapport Intermédiaire)2010
Autre publication scientifique
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TOETS CT302 - Programme CEE CATRENE - Summary Technical Report 2S-2009 - Rapport Technique de Fin d'année2010
Autre publication scientifique
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Test and Harware Security2008
Autre publication scientifique
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Differential Power Analysis against the Miller AlgorithmRR-08021, 2008
Rapport
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