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Bruno Rouzeyre

17
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jean-max-dutertre

Sensitivity to Laser Fault Injection: CMOS FD-SOI vs. CMOS bulk

J.-M. Dutertre , Vincent Beroulle , Philippe Candelier , Stephan de Castro , Louis-Barthelemy Faber
IEEE Transactions on Device and Materials Reliability, 2019, 19 (1), pp.6-15. ⟨10.1109/TDMR.2018.2886463⟩
Article dans une revue hal-01971932v1

Assessing Body Built-In Current Sensors for Detection of Multiple Transient Faults

Raphael Viera , Jean-Max Dutertre , Marie-Lise Flottes , Olivier Potin , Giorgio Di Natale
Microelectronics Reliability, 2018, 88-90, pp.128-134. ⟨10.1016/j.microrel.2018.07.111⟩
Article dans une revue hal-01893676v1

Frontside Versus Backside Laser Injection: A Comparative Study

Stephan de Castro , Jean-Max Dutertre , Bruno Rouzeyre , Giorgio Di Natale , Marie-Lise Flottes
ACM Journal on Emerging Technologies in Computing Systems, 2016, Special Issue on Secure and Trustworthy Computing, 13 (1), pp.7. ⟨10.1145/2845999⟩
Article dans une revue lirmm-01444121v1
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Improving the ability of Bulk Built-In Current Sensors to detect Single Event Effects by using triple-well CMOS

Jean-Max Dutertre , Rodrigo Possamai Bastos , Olivier Potin , Marie-Lise Flottes , Bruno Rouzeyre
Microelectronics Reliability, 2014, 54 (9-10), pp.2289-2294. ⟨10.1016/j.microrel.2014.07.151⟩
Article dans une revue emse-01094805v1
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Sensitivity tuning of a bulk built-in current sensor for optimal transient-fault detection

Jean-Max Dutertre , Rodrigo Possamai Bastos , Olivier Potin , Marie-Lise Flottes , Bruno Rouzeyre
Microelectronics Reliability, 2013, European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 53 (9), pp.1320-1324. ⟨10.1016/j.microrel.2013.07.069⟩
Article dans une revue emse-01100723v1
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The case of using CMOS FD-SOI rather than CMOS bulk to harden ICs against laser attacks

Jean-Max Dutertre , Vincent Beroulle , Philippe Candelier , Louis-Barthelemy Faber , Marie-Lise Flottes
IOLTS: International On-Line Testing Symposium, Jul 2018, Platja d’Aro, Spain. pp.214-219, ⟨10.1109/IOLTS.2018.8474230⟩
Communication dans un congrès emse-01856000v1

Assessing Body Built-In Current Sensors for Detection of Multiple Transient Faults

Raphael Viera , Jean-Max Dutertre , Marie-Lise Flottes , Olivier Potin , Giorgio Di Natale
ESREF 2018 - European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Oct 2018, Aalborg, Denmark
Communication dans un congrès hal-04457522v1
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Laser fault injection at the CMOS 28 nm technology node: an analysis of the fault model

Jean-Max Dutertre , Vincent Beroulle , Philippe Candelier , Stephan de Castro , Louis-Barthelemy Faber
FDTC: Fault Diagnosis and Tolerance in Cryptography, Sep 2018, Amsterdam, Netherlands. pp.1-6, ⟨10.1109/FDTC.2018.00009⟩
Communication dans un congrès emse-01856008v1
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Figure of merits of 28nm Si technologies for implementing laser attack resistant security dedicated circuits

Stephan de Castro , Jean-Max Dutertre , Giorgio Di Natale , Marie-Lise Flottes , Bruno Rouzeyre
ISVLSI: International Symposium on Very Large Scale Integration, Jul 2015, Montpellier, France. pp.362-367, ⟨10.1109/ISVLSI.2015.76⟩
Communication dans un congrès emse-01227138v1

Validation Of Single BBICS Architecture In Detecting Multiple Faults

Raphael Andreoni Camponogara-Viera , Rodrigo Possamai Bastos , Jean-Max Dutertre , Olivier Potin , Marie-Lise Flottes
ATS: Asian Test Symposium, Nov 2015, Mumbai, India
Communication dans un congrès lirmm-01234067v1
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Laser attacks on integrated circuits: from CMOS to FD-SOI

Jean-Max Dutertre , Stephan de Castro , Alexandre Sarafianos , Noémie Boher , Bruno Rouzeyre
DTIS: Design and Technology of Integrated Systems in Nanoscale Era, May 2014, Santorin, Greece. ⟨10.1109/DTIS.2014.6850664⟩
Communication dans un congrès emse-01099042v1
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Design of Bulk Built-In Current Sensors to Detect Single Event Effects and Laser-Induced Fault Injection Attempts

Jean-Max Dutertre , Rodrigo Possamai Bastos , Olivier Potin , Marie-Lise Flottes , Giorgio Di Natale
Joint MEDIAN–TRUDEVICE Open Forum, Sep 2014, Amsterdam, Netherlands
Communication dans un congrès emse-01099040v1

Improving the ability of Bulk Built-In Current Sensors to detect Single Event Effects by using triple-well CMOS

Jean-Max Dutertre , Rodrigo Possamai Bastos , Olivier Potin , Marie-Lise Flottes , Bruno Rouzeyre
25th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2014), Sep 2014, Berlin, Germany
Communication dans un congrès hal-03094235v1
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Laser-Induced Fault Effects in Security-Dedicated Circuits

Vincent Beroulle , Philippe Candelier , Stephan de Castro , Giorgio Di Natale , Jean-Max Dutertre
VLSI-SoC: Very Large Scale Integration and System-on-Chip, Oct 2014, Playa del Carmen, Mexico. pp.220-240, ⟨10.1007/978-3-319-25279-7_12⟩
Communication dans un congrès hal-01383737v1
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A Bulk Built-in Sensor for Detection of Fault Attacks

Rodrigo Possamai Bastos , Frank Sill Torres , Jean Max Dutertre , Marie-Lise Flottes , Giorgio Di Natale
HOST: Hardware-Oriented Security and Trust, Jun 2013, Austin, TX, United States. pp.51-54, ⟨10.1109/HST.2013.6581565⟩
Communication dans un congrès lirmm-01430800v1
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A single built-in sensor to check pull-up and pull-down CMOS networks against transient faults

Rodrigo Possamai Bastos , Frank Sill Torres , Jean-Max Dutertre , Marie-Lise Flottes , Giorgio Di Natale
PATMOS: Power and Timing Modeling, Optimization and Simulation, Sep 2013, Karlsruhe, Germany. pp.157-163, ⟨10.1109/PATMOS.2013.6662169⟩
Communication dans un congrès lirmm-00968621v1

Sensitivity tuning of a bulk built-in current sensor for optimal transient-fault detection

Jean-Max Dutertre , Rodrigo Possamai Bastos , Olivier Potin , Marie-Lise Flottes , Bruno Rouzeyre
ESREF: European Symposium on Reliability of Electron devices, Failure physics and analysis, Sep 2013, Arcachon, France. pp.B3c-2 #68
Communication dans un congrès hal-00872705v1