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Bruno Rouzeyre

8
Documents
Identifiants chercheurs

Présentation

Publications

vincent-beroulle
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The case of using CMOS FD-SOI rather than CMOS bulk to harden ICs against laser attacks

Jean-Max Dutertre , Vincent Beroulle , Philippe Candelier , Louis-Barthelemy Faber , Marie-Lise Flottes
IOLTS: International On-Line Testing Symposium, Jul 2018, Platja d’Aro, Spain. pp.214-219, ⟨10.1109/IOLTS.2018.8474230⟩
Communication dans un congrès emse-01856000v1
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Laser fault injection at the CMOS 28 nm technology node: an analysis of the fault model

Jean-Max Dutertre , Vincent Beroulle , Philippe Candelier , Stephan de Castro , Louis-Barthelemy Faber
FDTC: Fault Diagnosis and Tolerance in Cryptography, Sep 2018, Amsterdam, Netherlands. pp.1-6, ⟨10.1109/FDTC.2018.00009⟩
Communication dans un congrès emse-01856008v1
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Laser-Induced Fault Effects in Security-Dedicated Circuits

Vincent Beroulle , Philippe Candelier , Stephan de Castro , Giorgio Di Natale , Jean-Max Dutertre
VLSI-SoC: Very Large Scale Integration and System-on-Chip, Oct 2014, Playa del Carmen, Mexico. pp.220-240, ⟨10.1007/978-3-319-25279-7_12⟩
Communication dans un congrès hal-01383737v1
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Mutation Sampling Technique for the Generation of Structural Test Data

Mathieu Scholivé , Vincent Beroulle , Chantal Robach , Marie-Lise Flottes , Bruno Rouzeyre
DATE 2005 - 8th Design, Automation and Test in Europe Conference and Exhibition, Mar 2005, Munich, Germany. pp.1022-1023, ⟨10.1109/DATE.2005.220⟩
Communication dans un congrès lirmm-00105978v1

Mutation sampling technique for the generation of structural test data

Mathieu Scholivé , Vincent Beroulle , Chantal Robach , Marie-Lise Flottes , Bruno Rouzeyre
6th IEEE Latin American Test Workshop, Mar 2005, Salvador, Bahia, Brazil
Communication dans un congrès hal-00378490v1
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Mutation Sampling Technique for the Generation of Structural Test Data

Mathieu Scholivé , Vincent Beroulle , Chantal Robach , Marie-Lise Flottes , Bruno Rouzeyre
DATE 2005 - 8th Design, Automation and Test in Europe Conference and Exhibition, Mar 2005, Munich, Germany. pp.1022-1023, ⟨10.1109/DATE.2005.220⟩
Communication dans un congrès hal-00181680v1
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Software-Based Testing of Sequential VHDL Descriptions

Mathieu Scholivé , Vincent Beroulle , Chantal Robach , Marie-Lise Flottes , Bruno Rouzeyre
8th IEEE European Test Workshop (ETW), May 2003, Maastricht, Netherlands. pp.199-200
Communication dans un congrès lirmm-00269437v1