Christophe Hecquet
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Characterization of EUV periodic multilayersX-Ray Spectrometry, 2011, 40, pp.338. ⟨10.1002/xrs.1350⟩
Article dans une revue
hal-00642782v1
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Optical, chemical, and depth characterization of Al/SiC periodic multilayersEUV and X-Ray Optics: Synergy between Laboratory and Space, Apr 2009, Prague, Czech Republic. pp.73600, ⟨10.1117/12.820913⟩
Communication dans un congrès
hal-00661774v1
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