Christophe Hecquet
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Publications
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Nanometer-designed Al/SiC periodic multilayers: characterization by a multi-technique approachSurface and Interface Analysis, 2010, 42 (6-7), pp.653-657
Article dans une revue
hal-00648606v1
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Optical, chemical, and depth characterization of Al/SiC periodic multilayersEUV and X-Ray Optics: Synergy between Laboratory and Space, Apr 2009, Prague, Czech Republic. pp.73600, ⟨10.1117/12.820913⟩
Communication dans un congrès
hal-00661774v1
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