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Christophe Hecquet

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Publications

jean-michel-andre

Optical, chemical, and depth characterization of Al/SiC periodic multilayers

Philippe Jonnard , Karine Le Guen , Min-Hui Hu , Jean-Michel André , Evgueni Meltchakov
EUV and X-Ray Optics: Synergy between Laboratory and Space, Apr 2009, Prague, Czech Republic. pp.73600, ⟨10.1117/12.820913⟩
Communication dans un congrès hal-00661774v1