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Claude Marchand

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yann-le-bihan

Partial least square regression: an analysis tool for quantitative non-destructive testing

Yann Le Bihan , József Pávó , Claude Marchand
European Physical Journal: Applied Physics, 2014, 67 (3), pp.30901. ⟨10.1051/epjap/2014130487⟩
Article dans une revue hal-01099333v1
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Modeling of thin structures in eddy current testing with shell elements

A. Ospina , L. Santandrea , Y. Le Bihan , C. Marchand
European Physical Journal: Applied Physics, 2010, 52 (2), ⟨10.1051/epjap/2010082⟩
Article dans une revue hal-00634365v1

Modeling of thin structures in eddy current testing with shell elements

Alejandro Ospina Vargas , Laurent Santandréa , Yann Le Bihan , Claude Marchand
European Physical Journal: Applied Physics, 2010, 52 (2), pp.23303-23308. ⟨10.1051/epjap/2010082⟩
Article dans une revue hal-00555697v1

Study of the Degrees of Freedom Management of Dual Formulations for the Modelling of Thin Cracks in Eddy Current Testing

Yahya Choua , Laurent Santandréa , Yann Le Bihan , Claude Marchand
Sensor letters, 2009, 7 (5), pp. 475-479
Article dans une revue hal-00447220v1

Electromagnetic Field Computation in Magnetic and Conductive Thin sheets

Alejandro Ospina Vargas , Laurent Santandréa , Yann Le Bihan , Claude Marchand
Sensor letters, 2009, 7 (3), pp. 480-485
Article dans une revue hal-00447227v1

Non-destructive evaluation of small defects using an eddy current microcoil sensor array

Cyril Ravat , Yann Le Bihan , Pierre-Yves Joubert , Claude Marchand
Sensor letters, 2009, 7 (3), pp. 400-405
Article dans une revue hal-00447228v1

Characterization of small cracks in eddy current testing

Yann Le Bihan , J. Pavo , Claude Marchand
European Physical Journal: Applied Physics, 2008, 43 (2), pp.231-237. ⟨10.1051/epjap:2008112⟩
Article dans une revue hal-00761612v1

Comparative Study of Coil Arrangements for the EC Testing of Small Surface Breaking Defects

Cyril Ravat , Yann Le Bihan , Pierre-Yves Joubert , Claude Marchand
Studies in Applied Electromagnetics and Mechanics, 2008, 31, pp.288-293
Article dans une revue hal-00354401v1

Adaptive mesh refinement and probe signal calculation in eddy current NDT by complementary formulations

Mohamed Bensetti , Yahya Choua , Laurent Santandréa , Yann Le Bihan , Claude Marchand
IEEE Transactions on Magnetics, 2008, 44 (6), pp.1646 - 1649
Article dans une revue hal-00352639v1
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A finite element modelling tool of a buried system for glass furnace wall characterization

Laurent Santandrea , Yann Le Bihan , Claude Marchand
European Physical Journal: Applied Physics, 2007, 39, pp.179-183
Article dans une revue hal-01547605v1

Computational environment for the fast calculation of ECT probe signal by field decomposition

Yann Le Bihan , J. Pavo , Mohamed Bensetti , Claude Marchand
IEEE Transactions on Magnetics, 2006, 42 (4), pp.1411 - 1414. ⟨10.1109/TMAG.2006.872516⟩
Article dans une revue hal-03219794v1

Non-destructive evaluation of layered planar media using MLP and RBF neural network

Mohamed Bensetti , Yann Le Bihan , Claude Marchand
Studies in Applied Electromagnetics and Mechanics, 2006
Article dans une revue hal-03680511v1

Deposit characterization by eddy current nondestructive evaluation

Mohamed Bensetti , Yann Le Bihan , Claude Marchand , Jozsef Pavo
International Journal of Applied Electromagnetics and Mechanics, 2004, 19 (1-4), pp.537 - 540. ⟨10.3233/JAE-2004-622⟩
Article dans une revue hal-03219973v1

Quantitative Evaluation of Small Anomalies in Non-Destructive Testing using Partial Least Square Regression

Yann Le Bihan , Claude Marchand , Joszef Pavo
Colloque Inductique 2013, Apr 2013, Tizi-Ouzou, Algeria. pp.83-84
Communication dans un congrès hal-00932700v1

Prise en compte des milieux fins dans le CND CF grâce à la méthode overlapping

Guillaume Krebs , Yann Le Bihan , Claude Marchand , Francisco Alves
2ème Colloque National sur l'Inductique, May 2011, Béjaïa, Algérie
Communication dans un congrès hal-00712509v1

Evaluation of a Planar Coil Model Using Shell Elements

Alejandro Ospina Vargas , Laurent Santandréa , Yann Le Bihan , Claude Marchand
PIERS 2011, Mar 2011, Morocco. pp.1
Communication dans un congrès hal-00712532v1

Partial Least Square Regression for Quantitative Evaluation of Small Anomalies in Non-Destructive Testing

Yann Le Bihan , Claude Marchand , Joszef Pavo , Guillaume Krebs
CEFC 2010, May 2010, Chicago, United States. 4 p
Communication dans un congrès hal-00555707v1

Mesh Refinement in Eddy Current Testing with Separated T-R probes

Yahya Choua , Laurent Santandréa , Yann Le Bihan , Claude Marchand
COMPUMAG, Nov 2009, Florianópolis, Brazil. pp. 1048-1049
Communication dans un congrès hal-00447250v1

Modélisation en CND : de la conception à l'inversion

Yann Le Bihan , Claude Marchand , Francisco Alves
CNI'09, 2009, Algérie. pp.10
Communication dans un congrès hal-00555700v1

Analyse of different programming solutions adapted to block matrix type in electromagnetic modelling

Laurent Santandréa , Yahya Choua , Alejandro Ospina Vargas , Yann Le Bihan , Claude Marchand
COMPUMAG, Nov 2009, FLorianapolis, Brésil
Communication dans un congrès hal-00447267v1

Planar Coil Model using Shell Elements Applied to an Eddy-Current Non-Destructive Testing

Alejandro Ospina Vargas , Laurent Santandréa , Yann Le Bihan , Claude Marchand
17th Conference on the computation of electromagnetics fields, COMPUMAG 2009, Dec 2009, Florianopolis, Brésil. pp. 873-874
Communication dans un congrès hal-00447249v1

Performances d'une sonde matricielle à microbobines pour la détection par courants de Foucault de défauts débouchants de faibles dimensions

Cyril Ravat , P.-Y. Joubert , Yann Le Bihan , Claude Marchand , M. Woytazik
Journées COFREND, May 2008, Toulouse, France
Communication dans un congrès hal-00354404v1

Non destructive evaluation of small defects using an eddy current microcoil sensor array

Cyril Ravat , P.-Y. Joubert , Yann Le Bihan , Claude Marchand
EMSA 2008 Conference, Jul 2008, Caen, France
Communication dans un congrès hal-00353081v1

Study of the DOF management of dual formulations for the modelling of thin cracks in ECT

Yahya Choua , Laurent Santandréa , Yann Le Bihan , Claude Marchand
European Magnetic Sensors and Actuators Conference EMSA 2008 Conference, Jul 2008, Caen, France
Communication dans un congrès hal-00352908v1

Study on the calculation by FEM-BIM combination of the EC signal due to a crack in presence of an edge

Yann Le Bihan , Jozsef Pavo , Yahya Choua , Mohamed Bensetti , Laurent Santandrea
12th International Workshop on Electromagnetic Nondestructive Evaluation (ENDE 2007), May 2007, Cardiff, United Kingdom
Communication dans un congrès hal-03680929v1

Adaptive Mesh Refinement and Probe Signal Calculation in Eddy Current NDT by Complementary Formulations

Mohamed Bensetti , Laurent Santandrea , Yahya Choua , Yann Le Bihan , Claude Marchand
16th International Conference on the Computation of Electromagnetic Fields (COMPUMAG), Jun 2007, Aachan, Germany
Communication dans un congrès hal-03680930v1

Développement d’un outil de simulation numérique pour le CND par courants de Foucault

Yahya Choua , Laurent Santandrea , Mohamed Bensetti , Yann Le Bihan , Claude Marchand
Électrotechnique du Futur (EF’2007), Sep 2007, Toulouse, France
Communication dans un congrès hal-03680972v1

Fine modeling of a tunable micro-inductance by a FEM based approach

Mohamed Bensetti , Yann Le Bihan , Claude Marchand
The International Conference on Electrical Engineering and its Applications (ICEE’06), May 2006, Sidi-Bel-Abbes, Algeria
Communication dans un congrès hal-03680928v1

Modélisations BF et HF de bobines gravées

Yann Le Bihan , Mohamed Bensetti , Yahya Choua , Claude Marchand , Lionel Pichon
Journées de la simulation numérique, Nov 2005, Natntes, France
Communication dans un congrès hal-03680965v1

Neural networks eddy current non-destructive evaluation of a conductive plate

Mohamed Bensetti , Yann Le Bihan , Claude Marchand , Denis Premel
International Symposium on Interdisciplinary Electromagnetic, Mechanic and Biomedical problems (ISEM 2005), Sep 2005, Bad Gastein, Austria
Communication dans un congrès hal-03680927v1

Computational Environment for the Fast Calculation of ECT Probe Signal

Yann Le Bihan , Jozsef Pavo , Mohamed Bensetti , Claude Marchand
15th Conference on the Computation of Electromagnetic Fields (COMPUMAG 2005), May 2005, Shenyang, China
Communication dans un congrès hal-03680926v1

Inversion en CND par réseaux de neurones

Mohamed Bensetti , Yann Le Bihan , Claude Marchand
Les journées COFREND, May 2005, Beaune, France
Communication dans un congrès hal-03680968v1

An hybrid finite element method for the modeling of micro-inductors

Mohamed Bensetti , Yann Le Bihan , Claude Marchand , Charles-Marie Tassetti , Gaelle Lissorgues
11th Biennial IEEE Conference on Electromagnetic Field Computation (CEFC 2004), Jun 2004, Séoul, South Korea
Communication dans un congrès hal-03680923v1

Design, Modeling and Measurements of Tunable MEMS inductors

Charles-Marie Tassetti , Mohamed Bensetti , Gaelle Lissorgues , Jean-Paul Gilles , Yann Le Bihan
The international symposium on design, Test, Integration and packaging of MEMS/MOEMS, May 2004, Montreux– Switzerland, Switzerland
Communication dans un congrès hal-03680921v1

Development of an hybrid 3D finite element method for the modeling of micro-coil sensors and actuators

Mohamed Bensetti , Yann Le Bihan , Claude Marchand
The European Magnetic Sensors and Actuators, Jul 2004, Cardiff, United Kingdom
Communication dans un congrès hal-03680925v1

3D Finite Element Modelling of micro-inductors

Mohamed Bensetti , Yann Le Bihan , Claude Marchand , Elisabeth Dufour-Gergam , Jean-Paul Gilles
The 14th Conference on the Computation of Electromagnetic Fields, Jul 2003, Saratoga Springs, United States
Communication dans un congrès hal-03680917v1

Deposit characterization by eddy current nondestructive evaluation

Mohamed Bensetti , Yann Le Bihan , Claude Marchand , Jozsef Pavo
The International Symposium on Applied Electromagnetics and Mechanics, May 2003, Versailles, France
Communication dans un congrès hal-03680915v1

Non-destructive evaluation of layered planar media using MLP and RBF neural networks

Mohamed Bensetti , Yann Le Bihan , Claude Marchand , Denis Prémel
The 8th International Workshop on Electromagnetic Nondestructive Evaluation, Jun 2002, Saarbrucken, Germany
Communication dans un congrès hal-03680911v1
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Using Mortar Element Method for Eddy Current Testing Finite Element Computations

Laurent Santandrea , Yayha Choua , Yann Le Bihan , Claude Marchand
16th Biennial Conference on the Computation of Electromagnetic Fields (COMPUMAG), Jun 2007, Aachen, Germany. 2007, COMPUMAG 2007: Selected Papers from the 16th Biennial Conference on the Computation of Electromagnetic Fields (COMPUMAG)
Poster de conférence hal-01547585v1
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Adaptive mesh refinement for eddy current testing finite element computations

Laurent Santandrea , Yayha Choua , Yann Le Bihan , Claude Marchand
Sixth International Conference on Computation in Electromagnetics (CEM 2006), Apr 2006, Aachen, Germany. 2006, Proceedings - Sixth International Conference on Computational Electromagnetics, CEM 2006
Poster de conférence hal-01547509v1