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Domaines de recherche
Sciences de l'ingénieur [physics]
Compétences
AFM
SPM
Publications
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Conducting Probe Atomic Force Microscope as a Relevant Tool for Studying Some Phenomena in MEMS SwitchesSensing and Imaging: An International Journal, 2015, 16, pp.21. ⟨10.1007/s11220-015-0124-1⟩
Article dans une revue
hal-01235862v1
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Conducting probe atomic force microscope as a relevant tool for studying some phenomena in MEMS switchesGreenBAN 2014, Nov 2014, Paris, France. Proceedings of the International Workshop on Green Solutions for Body Area Networks, pp.63 - 66
Poster de conférence
hal-01099238v1
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