Denis Mencaraglia
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Publications
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Novel Wideband Eddy Current Device for the Conductivity Measurement of SemiconductorsIEEE Sensors Journal, 2016, 16 (11), pp.4151-4152. ⟨10.1109/JSEN.2016.2544403⟩
Article dans une revue
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Contactless conductivity measurement for ITO nanolayers on AsGa substrats over a wide frequency rangeIEEE SENSORS 2018, Oct 2018, New delhi, India. ⟨10.1109/icsens.2018.8589554⟩
Communication dans un congrès
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Model-Based Eddy Current Determination of the Electrical Conductivity of Semiconductors2016 IEEE Conference on Electromagnetic Field Computation (CEFC), Nov 2016, Miami, United States. ⟨10.1109/cefc.2016.7816375⟩
Communication dans un congrès
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Contactless device for the fast conductivity characterization of a large range semiconductorsInternational Symposium on Semiconductor Manufacturing (ISSM 2016), Dec 2016, Tokyo, Japan. 4p., ⟨10.1109/issm.2016.7934522⟩
Communication dans un congrès
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Tunable Eddy Current Device for the Contactless Characterization of a Large Variety of Semiconductor Materials2015 IEEE SENSORS, Nov 2015, Busan, South Korea. ⟨10.1109/ICSENS.2015.7370427⟩
Poster de conférence
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Contactless measurement of the conductivity of semiconductors using a multicarrier frequency test signalUnited States, Patent n° : 10429435. 2019
Brevet
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Contactless measurement of the conductivity of semiconductors using a multicarrier frequency test signalÉtats-Unis, N° de brevet: US20180100887. 2018
Brevet
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MESURE SANS CONTACT DE LA CONDUCTIVITÉ DE SEMI-CONDUCTEURSFrance, N° de brevet: EP3283891. 2018
Brevet
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Mesure sans contact de la conductivité de semiconducteursFrance, N° de brevet: FR 1553392. 2015
Brevet
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