Douglas Almeida dos Santos

Identifiants chercheurs

IdHAL :

douglas-almeida-dos-santos

ORCID :

0000-0002-6502-4682

IdRef :

278861342

Publications

Communication dans un congrès (23)

Design and Reliability Analysis of a Pipeline RISC-V Processor Core Douglas A Santos,Wesley Grignani,Carolina Imianosky,Douglas R Melo,Luigi Dilillo 27th IEEE Latin American Test Symposium, Mar 2026, Florianopolis, Brazil Communication dans un congrès hal-05481356v1
HARV-SoC - A Fault-tolerant RISC-V Microcontroller for Dependable Applications Douglas Almeida dos Santos,Wesley Grignani,Carolina Imianosky,Luigi Dilillo 3rd TWIN-RELECT Training School on Fault-Tolerant AI Systems, Jan 2026, Manchester (UK), United Kingdom Communication dans un congrès hal-05481410v1
Characterization of a Fault-Tolerant RISC-V SoC in an SRAM-based FPGA under Proton Irradiation Wesley Grignani,Douglas A Santos,Carolina Imianosky,Douglas R Melo,Frédéric Wrobelet al. 27th IEEE Latin American Test Symposium, Mar 2026, Florianopolis, Brazil Communication dans un congrès hal-05481332v1
Characterization of HARV-SoC for Reliable Avionics Applications Wesley Grignani,Douglas A Santos,Carolina Imianosky,Maria Kastriotou,Carlo Cazzanigaet al. Workshop on Reliable and Secure RISC-V architectures (RESCUER), May 2025, Tallinn, Estonia Communication dans un congrès hal-05017062v1
Reliability Analysis of Neural Network Inference on a Fault-Tolerant RISC-V SoC with Vector Extension Carolina Imianosky,Douglas A Santos,Wesley Grignani,Luigi Dilillo Radiation and its Effects on Components and Systems Conference, Sep 2025, Antwerp, Belgium Communication dans un congrès hal-05127945v1
HARV - Hardened RISC-V System-on-Chip Douglas A Santos,Carolina Imianosky,Luigi Dilillo 2nd RISC-V in Space Workshop, Apr 2025, Gothenburg, Sweden Communication dans un congrès hal-04984377v1
HARV-SoC Evaluation on SmartFusion2 and PolarFire FPGAs Under Neutron Radiation Wesley Grignani,Douglas A Santos,Maria Kastriotou,Carlo Cazzaniga,Douglas R Meloet al. Radiation and its Effects on Components and Systems Conference, Sep 2025, Antwerp, Belgium Communication dans un congrès hal-05128008v1
Efficient TinyML Inference on a Fault-Tolerant RISC-V SoC with Vector Extension Carolina Imianosky,Douglas A Santos,Luigi Dilillo International Workshop on Advances in Sensors and Interface (IWASI), Jul 2025, Manfredonia, Italy. pp.1-6, ⟨10.1109/IWASI66786.2025.11121981⟩ Communication dans un congrès hal-05127892v1
Special Session Paper: Simulation Methodologies and Experiments for Reliability Analysis of Devices in Radiation Harsh Environments Nikoloas Chatzivangelis,Nikoloas Zazatis,Wesley Grignani,Georgios-Ioannis Paliaroutis,Douglas A Santoset al. 38th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2025, Barcelona, Spain Communication dans un congrès hal-05371489v1
Implementation and Reliability Evaluation of a ChaCha20 Stream Cipher Hardware Accelerator Wesley Grignani,Khalil G Q Santana,Douglas Almeida dos Santos,Luigi Dilillo,Douglas R Melo 37th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2024, Oxfordshire, United Kingdom Communication dans un congrès hal-04715408v1
Reliability Analysis of a Low-Cost CCSDS 123 Hyperspectral Image Compressor Wesley Grignani,Douglas A Santos,Luigi Dilillo,Douglas R Melo 37th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2024, Oxfordshire, United Kingdom Communication dans un congrès hal-04715407v1
Reliability and Performance Evaluation of a RISC-V Vector Extension Unit for Vector Multiplication Carolina Imianosky,Douglas A Santos,Douglas R Melo,Felipe Viel,Luigi Dilillo 37th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2024, Oxfordshire, United Kingdom Communication dans un congrès hal-04715405v1
Hybrid Hardening Approach for a Fault-Tolerant RISC-V System-on-Chip Douglas Almeida dos Santos,Pablo M. Aviles,André Martins Pio de Mattos,Mario García Valderas,Luis Entrenaet al. RADECS 2023 - 23rd European Conference on Radiation and Its Effects on Components and Systems, Sep 2023, Toulouse, France Communication dans un congrès hal-04266891v1
Investigation on Radiation-Induced Single-Event Latch-up in SRAM Memories on-Board PROBA-V André Martins Pio de Mattos,Douglas Almeida dos Santos,Viyas Gupta,Thomas Borel,Luigi Dilillo RADECS 2023 - European Conference on Radiation and Its Effects on Components and Systems, Sep 2023, Toulouse, France Communication dans un congrès hal-04266897v1
Using HARV-SoC for Reliable Sensing Applications in Radiation Harsh Environments André Martins Pio de Mattos,Douglas Almeida dos Santos,Carolina Imianosky,Douglas Rossi Melo,Luigi Dilillo IWASI 2023 - 9th IEEE International Workshop on Advances in Sensors and Interfaces, Jun 2023, Bari, Italy. pp.227-232, ⟨10.1109/IWASI58316.2023.10164578⟩ Communication dans un congrès hal-04266899v1
Hybrid Radiation Hardening Approach: a RISC-V System-on-Chip case study Luigi Dilillo,Douglas Almeida dos Santos,Lucas Matana Luza,André Martins Pio de Mattos,Douglas Rossi de Meloet al. G-RADNEXT Workshop, Nov 2023, Geneva, Switzerland Communication dans un congrès hal-04296178v1
Radiation-induced SEL in a COTS SRAM memory - test and flight data Douglas Almeida dos Santos,Lucas Matana Luza,André Martins Pio de Mattos,Thomas Borel,Viyas Guptaet al. TEC-QEC Final Presentation Days, Jun 2023, Noordwijk, Netherlands Communication dans un congrès hal-04295893v1
Neutron Irradiation Testing and Analysis of a Fault-Tolerant RISC-V System-on-Chip Douglas Almeida dos Santos,André Martins Pio de Mattos,Lucas Matana Luza,Carlo Cazzaniga,Maria Kastriotouet al. DFT 2022 - 35th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2022, Austin, United States. pp.1-6, ⟨10.1109/DFT56152.2022.9962335⟩ Communication dans un congrès lirmm-03833983v1
Effects of High-Energy Protons on a Self-Refresh DRAM Lucas Matana Luza,Carolina Imianosky,André Martins Pio de Mattos,Douglas Almeida dos Santos,Daniel Söderströmet al. SELSE 2022 - 18th IEEE Workshop on Silicon Errors in Logic – System Effects, May 2022, Virtual Event, Italy Communication dans un congrès lirmm-03832662v1
Characterization of a RISC-V System-on-Chip under Neutron Radiation Douglas Almeida dos Santos,Lucas Matana Luza,Maria Kastriotou,Carlo Cazzaniga,Cesar A Zeferinoet al. DTIS 2021 - 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Jun 2021, Montpellier, France. ⟨10.1109/DTIS53253.2021.9505054⟩ Communication dans un congrès lirmm-03357515v1
A Low-Cost Fault-Tolerant RISC-V Processor for Space Systems Douglas Almeida dos Santos,Lucas Matana Luza,Cesar Albenes Zeferino,Luigi Dilillo,Douglas Rossi de Melo DTIS 2020 - 15th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Apr 2020, Marrakech, Morocco. pp.1-5, ⟨10.1109/DTIS48698.2020.9081185⟩ Communication dans un congrès lirmm-03026132v1
Characterization of a RISC-V Microcontroller Through Fault Injection Dario Asciolla,Luigi Dilillo,Douglas Almeida dos Santos,Douglas Melo,Alessandra Menicucciet al. APPLEPIES 2019 - International Conference on Applications in Electronics Pervading Industry, Environment and Society, Sep 2019, Pisa, Italy. pp.91-101, ⟨10.1007/978-3-030-37277-4_11⟩ Communication dans un congrès lirmm-03025657v1
On-board Compressing of Hyperspectral Images using CCSDS 123 Douglas Almeida dos Santos,Cesar Albenes Zeferino,Eduardo Augusto Bezerra,Luigi Dilillo,Douglas Rossi Melo COTB 2020 - Anais do XI Computer on the Beach, Sep 2020, Balneário Camboriú, Brazil. pp.332-336, ⟨10.14210/cotb.v11n1.p332-336⟩ Communication dans un congrès lirmm-03025767v1

Article dans une revue (13)

Reliability Analysis of Baremetal and FreeRTOS Applications on Microchip PolarFire SoC RISC-V Multiprocessors Using High-Energy Protons André M P Mattos,Douglas A Santos,Luigi Dilillo IEEE Access, 2025, 13, pp.19922 - 19936. ⟨10.1109/access.2024.3524726⟩ Article dans une revue hal-05069554v1
Implementation and characterization of a fault-tolerant CCSDS 123 hardware accelerator under neutron radiation Wesley Grignani,Douglas A Santos,Maria Kastriotou,Carlo Cazzaniga,Luigi Dililloet al. Microprocessors and Microsystems: Embedded Hardware Design , 2025, 117, pp.105184. ⟨10.1016/j.micpro.2025.105184⟩ Article dans une revue hal-05350791v1
SRAM-based heavy ion beam flux and LET dosimetry Andrea Coronetti,Rubén García-Alía,Luigi Dilillo,Carolina Imianosky,Douglas Almeida dos Santoset al. IEEE Transactions on Nuclear Science, 2025, 72 (8), pp.2458-2465. ⟨10.1109/TNS.2024.3487647⟩ Article dans une revue hal-04715265v1
A Fault-Tolerant CCSDS 123 Hardware Accelerator for Space Applications Wesley Grignani,Felipe Viel,Douglas A Santos,Luigi Dilillo,Douglas R Melo Integration, the VLSI Journal, 2025, 104, pp.102465. ⟨10.1016/j.vlsi.2025.102465⟩ Article dans une revue hal-05151664v1
Standard instrumentation for single-event effect qualification of systems-on-chip: a robust, low-cost, and open-source proposal André M. P. Mattos,Mauricio R Alas,Douglas A. Santos,Luigi Dilillo Journal of Instrumentation, 2025, 20 (06), pp.P06009. ⟨10.1088/1748-0221/20/06/P06009⟩ Article dans une revue hal-05023660v1
A Dependable and Low-Cost CCSDS 123 Hyperspectral Image Compressor Wesley Grignani,Douglas A Santos,Felipe Viel,Luigi Dilillo,Douglas R Melo IEEE Embedded Systems Letters, In press, ⟨10.1109/les.2024.3420934⟩ Article dans une revue hal-04666210v1
Investigation of Single-Event Effects for Space Applications: Instrumentation for In-Depth System Monitoring André Martins Pio de Mattos,Douglas Almeida dos Santos,Lucas Matana Luza,Viyas Gupta,Luigi Dilillo Electronics, 2024, 13 (10), pp.1822. ⟨10.3390/electronics13101822⟩ Article dans une revue hal-04666202v1
Characterization of Single-Event Effects in a Microcontroller with an Artificial Neural Network Accelerator Carolina Imianosky,André Martins Pio de Mattos,Douglas Almeida dos Santos,Douglas Rossi de Melo,Maria Kastriotouet al. Electronics, 2024, 13 (22), ⟨10.3390/electronics13224461⟩ Article dans une revue hal-04811422v1
Investigation on Radiation-Induced Latch-Ups in COTS SRAM Memories On-Board PROBA-V André Martins Pio de Mattos,Douglas Almeida dos Santos,Lucas Matana Luza,Viyas Gupta,Thomas Borelet al. IEEE Transactions on Nuclear Science, 2024, 71 (8), pp.1614-1622. ⟨10.1109/tns.2024.3378668⟩ Article dans une revue hal-04526731v1
Hybrid Hardening Approach for a Fault-Tolerant RISC-V System-on-Chip Douglas Almeida dos Santos,Pablo M. Aviles,André Martins Pio de Mattos,Mario García-Valderas,Luis Entrenaet al. IEEE Transactions on Nuclear Science, In press, ⟨10.1109/tns.2024.3406021⟩ Article dans une revue hal-04666207v1
Enhancing Fault Awareness and Reliability of a Fault-Tolerant RISC-V System-on-Chip Douglas Almeida dos Santos,André Martins Pio de Mattos,Douglas Melo,Luigi Dilillo Electronics, 2023, 12 (12), pp.2557. ⟨10.3390/electronics12122557⟩ Article dans une revue hal-04120525v1
A Survey of the RISC-V Architecture Software Support Benjamin William Mezger,Douglas Almeida dos Santos,Luigi Dilillo,Cesar A Zeferino,Douglas Rossi de Melo IEEE Access, 2022, 10, pp.51394-51411. ⟨10.1109/ACCESS.2022.3174125⟩ Article dans une revue lirmm-03737820v1
Reliability analysis of a fault-tolerant RISC-V system-on-chip Douglas Almeida dos Santos,Lucas Matana Luza,Luigi Dilillo,Cesar Albenes Zeferino,Douglas Rossi de Melo Microelectronics Reliability, 2021, 125, pp.#114346. ⟨10.1016/j.microrel.2021.114346⟩ Article dans une revue lirmm-03358839v1

Thèse (1)

Development of a hardened processor for harsh environment applications on RISC-V architecture. Douglas Almeida dos Santos Micro and nanotechnologies/Microelectronics. Université de Montpellier, 2023. English. ⟨NNT : 2023UMONS089⟩ Thèse tel-04612443v1

Poster de conférence (2)

A Performance Evaluation of a Fault-tolerant RISC-V with Vector Instruction Support to Space Applications Carolina Imianosky,Douglas Almeida dos Santos,Douglas Rossi de Melo,Luigi Dilillo,Cesar Albenes Zeferinoet al. LASSS/LACW 2022 - Joint 3rd IAA Latin American Symposium on Small Satellites and 5th IAA Latin American CubeSat Workshop, Nov 2022, Brasilia, Brazil. , 2022 Poster de conférence lirmm-03834121v1
Assessing the Reliability of a Network-on-Chip through Physical Validation Gustavo S. Mafra,Thiago H. Rausch,Douglas Almeida dos Santos,Luigi Dilillo,Eduardo Augusto Bezerraet al. LASSS/LACW 2022 - Joint 3rd IAA Latin American Symposium on Small Satellites and 5th IAA Latin American CubeSat Workshop, Nov 2022, Brasilia, Brazil. , 2022 Poster de conférence lirmm-03834119v1