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Epitaxie en phase vapeur par pyrolyse d'organométalliques (EPVOM) des solutions solides ternaires Ga1-xAl xSb, Ga1-xInxSb et GaAsySb1-y sur substrats de GaSb

G. Bougnot , J. Bougnot , F. Delannoy , A. Foucaran , P. Grosse , et al.
Revue de Physique Appliquée, 1987, 22 (8), pp.837-844. ⟨10.1051/rphysap:01987002208083700⟩
Article dans une revue jpa-00245617v1

Highly sensitive nanohall sensors on GaAlAs/GaAs heterojunctions

C. Chaubet , B. Chenaud , F. Pascal , A. Hoffmann , N. Feltin
2013 22nd International Conference on Noise and Fluctuations (ICNF), Jun 2013, Montpellier, France. pp.1-4, ⟨10.1109/ICNF.2013.6578883⟩
Communication dans un congrès hal-00940145v1

Measurement and characterization of low frequency noise collector current in 0.13 µm SiGe:C HBTs

M. Seif , F. Pascal , B. Sagnes , A. Hoffmann , S. Haendler , et al.
2015 International Conference on Noise and Fluctuations (ICNF), 2015, Xian, China
Communication dans un congrès hal-01907409v1

Screen printing of thick PZT layers for piezo and pyroelectric power generation

D. Lapeine , Benoit Charlot , F. Very , J.-Y. Ferrandis , D. Laux , et al.
Conference JNRSE 2015, 2015, Paris, France
Communication dans un congrès hal-01907451v1

Improvement of the crystalline, optical and electrical quality of MOVPE GaInSb layers

G. Bougnot , F. Delannoy , F. Pascal , P. Grosse , Alain Giani , et al.
Journal of Crystal Growth, 1991, 107 (1-4), pp.502-508. ⟨10.1016/0022-0248(91)90511-3⟩
Article dans une revue istex hal-02048002v1

Parasitic back-inferface conduction in planar and triple-gate SOI transistors

R. Ritzenthaler , F. Lime , M. Ricoma , F. Martinez , O. Faynot , et al.
2010 IEEE International SOI Conference, Oct 2010, San Diego, California, United States
Communication dans un congrès hal-00604642v1

I-V and Low frequency noise characterization of Polysilicon and Amorphous Ti- and Co- salicide resistors

Jérémy Raoult , Fabien Pascal , Cédric Leyris
Thin Solid Films, 2010, 518 (9), pp.2497-2500. ⟨10.1016/j.tsf.2009.09.158⟩
Article dans une revue istex hal-01894480v1

Characterization and modeling of low frequency noise in 0.13 µm BiCMOS SiGe: C heterojunction bipolar trasnsistors

M. Seif , F. Pascal , B. Sagnes , S. Haendler
10th Conference on Ph. D. Research in Microelectronics and Electronics - PRIME 2014, 2014, Grenoble, France
Communication dans un congrès hal-01906169v1

Noise measurements in electronic devices

F. Pascal , A. Hoffmann , F. Martinez
International Instrumentation and Measurement Technology Conference, 2014., 2014, Montevideo, Uruguay
Communication dans un congrès hal-01906177v1

1∕f noise, transport and percolation in carbon nanotube film field-effect transistors: simulation and experiments

S. Soliverès , Frédéric Martinez , A. Hoffmann , F. Pascal
NOISE AND FLUCTUATIONS: 20th International Conference on Noice and Fluctuations (ICNF-2009), 2009, Pisa (Italy), France. pp.85-88, ⟨10.1063/1.3140564⟩
Communication dans un congrès hal-02064889v1

Radar Detection in Compund-Gaussian Clutter

F. Pascal , J.P. Ovarlez , Philippe Forster , Pascal Larzabal
2004, Toulouse, France
Communication dans un congrès halshs-00158397v1

I-V and Low frequency noise characterization of Polysilicon and Amorphous Ti- and Co- salicide resistors

Jérémy Raoult , F. Pascal , Cédric Leyris
EMRS, Jun 2009, Strasbourg, France
Communication dans un congrès hal-01894349v1

Comparison of low frequency noise in III-V and Si/SiGe HBTs

F. Pascal , C. Chay , M.J. Deen , Sylvie Jarrix , C. Delseny , et al.
IEE Proceedings Circuits Devices and Systems, 2004, 151 (2), pp.138-147. ⟨10.1049/ip-cds:20040505⟩
Article dans une revue hal-00330545v1

Dc and Low Frequency Noise analysis of hot-carrier induced degradation of low complexity 0.13 µm CMOS bipolar transistors, Microelectronics Reliability

Pascal Benoit , Jérémy Raoult , C. Delseny , F. Pascal , L. Snadny , et al.
Microelectronics Reliability, 2005, 45, pp.1800-1806. ⟨10.1016/j.microrel.2005.07.097⟩
Article dans une revue istex hal-00329201v1

1/f noise and ballistic mobility in GaN/AlGaN heterostructure field effect transistors in high magnetic fields

S.L. Rumyantsev , M. Shur , W. Knap , N. Dyakonova , F. Pascal , et al.
2004, pp.277-85
Communication dans un congrès hal-00141970v1

Simulation of transport and 1/f noise in carbon nanotube films

S. Soliverès , Frédéric Martinez , A Hoffmann , F. Pascal
Edison, 2009, Montpellier, France. pp.012117, ⟨10.1088/1742-6596/193/1/012117⟩
Communication dans un congrès hal-02063024v1

Sensitivity and noise of micro-Hall magnetic sensors based on InGaAs quantum wells

Boris Chenaud , A. Segovia-Mera , Adrien Delgard , N. Feltin , A. Hoffmann , et al.
Journal of Applied Physics, 2016, 119 (2), pp.024501. ⟨10.1063/1.4939288⟩
Article dans une revue hal-01293089v1

Etude du bruit basse fréquence dans les TBH Si/SiGeC (noeud 0.13µm) à émetteur métallique

Fabien Pascal , Jérémy Raoult , Mathieu Marin
JNMO, Jun 2008, Ile d'Oléron, France
Communication dans un congrès hal-01894338v1

Fabrication, characterization and test of acoustic sensors for detection of pollutants in aquatic environments

D. Lapeine , F. Very , D. Laux , J.-Y. Ferrandis , Benoit Charlot , et al.
2015 Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP), 2015, Montpellier, France
Communication dans un congrès hal-01906213v1

Etude du bruit basse fréquence dans les transistors bipolaires à hétérojonction Si/SiGe:C développés pour des applications MMW et Terahertz

M. Seif , B. Sagnes , F. Pascal , A. Hoffmann , S. Haendler , et al.
18èmes Journées Nationales Microondes, 2013, Paris, France
Communication dans un congrès hal-01906129v1

Comparison of the effects of different surfactants on electrical parameters in Carbon Nanotube thin films

G. Sassine , Frédéric Martinez , F. Pascal , A. Hoffmann , E. Anglaret
2011 21st International Conference on Noise and Fluctuations (ICNF), Jun 2011, Toronto, France. pp.472-475, ⟨10.1109/ICNF.2011.5994372⟩
Communication dans un congrès hal-02066670v1

A physical compact DC drain current model for long-channel undoped ultra-thin body (UTB) SOI and asymmetric double-gate (DG) MOSFETs with independent gate operation

F. Lime , R. Ritzenthaler , M. Ricoma , F. Martinez , F. Pascal , et al.
Solid-State Electronics, 2011, 57 (1), pp.61 - 66. ⟨10.1016/j.sse.2010.11.034⟩
Article dans une revue istex hal-01653010v1

Low frequency noise characterization and modeling of SiGe HBT featuring LASER annealing in a 55-nm CMOS node

J. Elbeyrouthy , A. Vauthelin , Bruno Sagnes , F. Pascal , Alain Hoffmann , et al.
25th International Conference on Noise and Fluctuations (ICNF 2019), Jun 2019, Neuchâtel, Switzerland. ⟨10.5075/epfl-ICLAB-ICNF-269248⟩
Communication dans un congrès hal-02381453v1

Metal Organic Chemical Vapor Deposition (MOCVD) Growth Of Ga1-XInxAsySb1-y : First Electrical And Optical Characterization Of Materials And Devices

Georges Bougnot , Alain Brenac , Frederique Delannoy , Fabien Pascal , Fabien Roumanille , et al.
1987 Symposium on the Technologies for Optoelectronics, 1987, Cannes, France. ⟨10.1117/12.943586⟩
Communication dans un congrès hal-01787467v1

1/f noise and percolation in carbon nanotube random networks

S. Soliverès , J. Gyani , C. Delseny , A. Hoffmann , F. Pascal
Applied Physics Letters, 2007, 90 (8), pp.082107.1-082107.3. ⟨10.1063/1.2709853⟩
Article dans une revue hal-00327129v1

Dispersion study of DC and Low Frequency Noise in SiGe:C Heterojunction Bipolar Transistors used for mm-Wave to Terahertz applications

Marcelino Seif , F. Pascal , Bruno Sagnes , Alain Hoffmann , S. Haendler , et al.
25th EUROPEAN SYMPOSIUM ON RELIABILITY OF ELECTRON DEVICES, FAILURE PHYSICS AND ANALYSIS - ESREF 2014, Sep 2014, Berlin, Germany
Communication dans un congrès hal-02053281v1

Caractérisation de contacts et de matériaux par la mesure du bruit Basse Fréquence

Fabien Pascal , Jérémy Raoult , Bruno Sagnes , Marcelino Seif , Frédéric Martinez , et al.
13èmes Journées de la Matière Condensée - JMC13, Aug 2012, Montpellier, France
Communication dans un congrès hal-02053302v1
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Low frequency noise study of X-ray irradiated Si/SiGe:C BiCMOS technology bipolar transistors

A Adebabay Belie , J El Beyrouthy , Fabien Pascal , J Boch , T Maraine , et al.
26th International Conference on Noise and Fluctuations, Oct 2023, Grenoble, France
Communication dans un congrès hal-04296176v1

Improvement of 1/f noise in advanced 0.13 µm BiCMOS SiGe:C Heterojunction Bipolar Transistors

F. Pascal , Jérémy Raoult , Bruno Sagnes , Alain Hoffmann , Sebastien Haendler
ICNF, Jun 2011, Toronto, Canada
Communication dans un congrès hal-01894345v1

Study of the Low Frequency Noise of Metallic Emitter SiGeC Heterojunction Bipolar Transistors

F. Pascal , Jérémy Raoult , Cédric Leyris
ICNF, Jun 2009, Pise, Italy
Communication dans un congrès hal-01894346v1