|
|
Epitaxie en phase vapeur par pyrolyse d'organométalliques (EPVOM) des solutions solides ternaires Ga1-xAl xSb, Ga1-xInxSb et GaAsySb1-y sur substrats de GaSb
G. Bougnot
,
J. Bougnot
,
F. Delannoy
,
A. Foucaran
,
P. Grosse
,
et al.
Article dans une revue
jpa-00245617v1
|
Partager
Gmail
Facebook
X
LinkedIn
More
|
|
|
Highly sensitive nanohall sensors on GaAlAs/GaAs heterojunctions
C. Chaubet
,
B. Chenaud
,
F. Pascal
,
A. Hoffmann
,
N. Feltin
2013 22nd International Conference on Noise and Fluctuations (ICNF), Jun 2013, Montpellier, France. pp.1-4, ⟨10.1109/ICNF.2013.6578883⟩
Communication dans un congrès
hal-00940145v1
|
Partager
Gmail
Facebook
X
LinkedIn
More
|
|
|
Measurement and characterization of low frequency noise collector current in 0.13 µm SiGe:C HBTs
M. Seif
,
F. Pascal
,
B. Sagnes
,
A. Hoffmann
,
S. Haendler
,
et al.
2015 International Conference on Noise and Fluctuations (ICNF), 2015, Xian, China
Communication dans un congrès
hal-01907409v1
|
Partager
Gmail
Facebook
X
LinkedIn
More
|
|
|
Screen printing of thick PZT layers for piezo and pyroelectric power generation
D. Lapeine
,
Benoit Charlot
,
F. Very
,
J.-Y. Ferrandis
,
D. Laux
,
et al.
Conference JNRSE 2015, 2015, Paris, France
Communication dans un congrès
hal-01907451v1
|
Partager
Gmail
Facebook
X
LinkedIn
More
|
|
|
Improvement of the crystalline, optical and electrical quality of MOVPE GaInSb layers
G. Bougnot
,
F. Delannoy
,
F. Pascal
,
P. Grosse
,
Alain Giani
,
et al.
Article dans une revue
istex
hal-02048002v1
|
Partager
Gmail
Facebook
X
LinkedIn
More
|
|
|
Parasitic back-inferface conduction in planar and triple-gate SOI transistors
R. Ritzenthaler
,
F. Lime
,
M. Ricoma
,
F. Martinez
,
O. Faynot
,
et al.
2010 IEEE International SOI Conference, Oct 2010, San Diego, California, United States
Communication dans un congrès
hal-00604642v1
|
Partager
Gmail
Facebook
X
LinkedIn
More
|
|
|
I-V and Low frequency noise characterization of Polysilicon and Amorphous Ti- and Co- salicide resistors
Jérémy Raoult
,
Fabien Pascal
,
Cédric Leyris
Article dans une revue
istex
hal-01894480v1
|
Partager
Gmail
Facebook
X
LinkedIn
More
|
|
|
Characterization and modeling of low frequency noise in 0.13 µm BiCMOS SiGe: C heterojunction bipolar trasnsistors
M. Seif
,
F. Pascal
,
B. Sagnes
,
S. Haendler
10th Conference on Ph. D. Research in Microelectronics and Electronics - PRIME 2014, 2014, Grenoble, France
Communication dans un congrès
hal-01906169v1
|
Partager
Gmail
Facebook
X
LinkedIn
More
|
|
|
Noise measurements in electronic devices
F. Pascal
,
A. Hoffmann
,
F. Martinez
International Instrumentation and Measurement Technology Conference, 2014., 2014, Montevideo, Uruguay
Communication dans un congrès
hal-01906177v1
|
Partager
Gmail
Facebook
X
LinkedIn
More
|
|
|
1∕f noise, transport and percolation in carbon nanotube film field-effect transistors: simulation and experiments
S. Soliverès
,
Frédéric Martinez
,
A. Hoffmann
,
F. Pascal
NOISE AND FLUCTUATIONS: 20th International Conference on Noice and Fluctuations (ICNF-2009), 2009, Pisa (Italy), France. pp.85-88, ⟨10.1063/1.3140564⟩
Communication dans un congrès
hal-02064889v1
|
Partager
Gmail
Facebook
X
LinkedIn
More
|
|
|
Radar Detection in Compund-Gaussian Clutter
F. Pascal
,
J.P. Ovarlez
,
Philippe Forster
,
Pascal Larzabal
2004, Toulouse, France
Communication dans un congrès
halshs-00158397v1
|
Partager
Gmail
Facebook
X
LinkedIn
More
|
|
|
I-V and Low frequency noise characterization of Polysilicon and Amorphous Ti- and Co- salicide resistors
Jérémy Raoult
,
F. Pascal
,
Cédric Leyris
EMRS, Jun 2009, Strasbourg, France
Communication dans un congrès
hal-01894349v1
|
Partager
Gmail
Facebook
X
LinkedIn
More
|
|
|
Comparison of low frequency noise in III-V and Si/SiGe HBTs
F. Pascal
,
C. Chay
,
M.J. Deen
,
Sylvie Jarrix
,
C. Delseny
,
et al.
Article dans une revue
hal-00330545v1
|
Partager
Gmail
Facebook
X
LinkedIn
More
|
|
|
Dc and Low Frequency Noise analysis of hot-carrier induced degradation of low complexity 0.13 µm CMOS bipolar transistors, Microelectronics Reliability
Pascal Benoit
,
Jérémy Raoult
,
C. Delseny
,
F. Pascal
,
L. Snadny
,
et al.
Article dans une revue
istex
hal-00329201v1
|
Partager
Gmail
Facebook
X
LinkedIn
More
|
|
|
1/f noise and ballistic mobility in GaN/AlGaN heterostructure field effect transistors in high magnetic fields
S.L. Rumyantsev
,
M. Shur
,
W. Knap
,
N. Dyakonova
,
F. Pascal
,
et al.
2004, pp.277-85
Communication dans un congrès
hal-00141970v1
|
Partager
Gmail
Facebook
X
LinkedIn
More
|
|
|
Simulation of transport and 1/f noise in carbon nanotube films
S. Soliverès
,
Frédéric Martinez
,
A Hoffmann
,
F. Pascal
Communication dans un congrès
hal-02063024v1
|
Partager
Gmail
Facebook
X
LinkedIn
More
|
|
|
Sensitivity and noise of micro-Hall magnetic sensors based on InGaAs quantum wells
Boris Chenaud
,
A. Segovia-Mera
,
Adrien Delgard
,
N. Feltin
,
A. Hoffmann
,
et al.
Article dans une revue
hal-01293089v1
|
Partager
Gmail
Facebook
X
LinkedIn
More
|
|
|
Etude du bruit basse fréquence dans les TBH Si/SiGeC (noeud 0.13µm) à émetteur métallique
Fabien Pascal
,
Jérémy Raoult
,
Mathieu Marin
JNMO, Jun 2008, Ile d'Oléron, France
Communication dans un congrès
hal-01894338v1
|
Partager
Gmail
Facebook
X
LinkedIn
More
|
|
|
Fabrication, characterization and test of acoustic sensors for detection of pollutants in aquatic environments
D. Lapeine
,
F. Very
,
D. Laux
,
J.-Y. Ferrandis
,
Benoit Charlot
,
et al.
2015 Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP), 2015, Montpellier, France
Communication dans un congrès
hal-01906213v1
|
Partager
Gmail
Facebook
X
LinkedIn
More
|
|
|
Etude du bruit basse fréquence dans les transistors bipolaires à hétérojonction Si/SiGe:C développés pour des applications MMW et Terahertz
M. Seif
,
B. Sagnes
,
F. Pascal
,
A. Hoffmann
,
S. Haendler
,
et al.
18èmes Journées Nationales Microondes, 2013, Paris, France
Communication dans un congrès
hal-01906129v1
|
Partager
Gmail
Facebook
X
LinkedIn
More
|
|
|
Comparison of the effects of different surfactants on electrical parameters in Carbon Nanotube thin films
G. Sassine
,
Frédéric Martinez
,
F. Pascal
,
A. Hoffmann
,
E. Anglaret
2011 21st International Conference on Noise and Fluctuations (ICNF), Jun 2011, Toronto, France. pp.472-475, ⟨10.1109/ICNF.2011.5994372⟩
Communication dans un congrès
hal-02066670v1
|
Partager
Gmail
Facebook
X
LinkedIn
More
|
|
|
A physical compact DC drain current model for long-channel undoped ultra-thin body (UTB) SOI and asymmetric double-gate (DG) MOSFETs with independent gate operation
F. Lime
,
R. Ritzenthaler
,
M. Ricoma
,
F. Martinez
,
F. Pascal
,
et al.
Article dans une revue
istex
hal-01653010v1
|
Partager
Gmail
Facebook
X
LinkedIn
More
|
|
|
Low frequency noise characterization and modeling of SiGe HBT featuring LASER annealing in a 55-nm CMOS node
J. Elbeyrouthy
,
A. Vauthelin
,
Bruno Sagnes
,
F. Pascal
,
Alain Hoffmann
,
et al.
Communication dans un congrès
hal-02381453v1
|
Partager
Gmail
Facebook
X
LinkedIn
More
|
|
|
Metal Organic Chemical Vapor Deposition (MOCVD) Growth Of Ga1-XInxAsySb1-y : First Electrical And Optical Characterization Of Materials And Devices
Georges Bougnot
,
Alain Brenac
,
Frederique Delannoy
,
Fabien Pascal
,
Fabien Roumanille
,
et al.
1987 Symposium on the Technologies for Optoelectronics, 1987, Cannes, France. ⟨10.1117/12.943586⟩
Communication dans un congrès
hal-01787467v1
|
Partager
Gmail
Facebook
X
LinkedIn
More
|
|
|
1/f noise and percolation in carbon nanotube random networks
S. Soliverès
,
J. Gyani
,
C. Delseny
,
A. Hoffmann
,
F. Pascal
Article dans une revue
hal-00327129v1
|
Partager
Gmail
Facebook
X
LinkedIn
More
|
|
|
Dispersion study of DC and Low Frequency Noise in SiGe:C Heterojunction Bipolar Transistors used for mm-Wave to Terahertz applications
Marcelino Seif
,
F. Pascal
,
Bruno Sagnes
,
Alain Hoffmann
,
S. Haendler
,
et al.
25th EUROPEAN SYMPOSIUM ON RELIABILITY OF ELECTRON DEVICES, FAILURE PHYSICS AND ANALYSIS - ESREF 2014, Sep 2014, Berlin, Germany
Communication dans un congrès
hal-02053281v1
|
Partager
Gmail
Facebook
X
LinkedIn
More
|
|
|
Caractérisation de contacts et de matériaux par la mesure du bruit Basse Fréquence
Fabien Pascal
,
Jérémy Raoult
,
Bruno Sagnes
,
Marcelino Seif
,
Frédéric Martinez
,
et al.
13èmes Journées de la Matière Condensée - JMC13, Aug 2012, Montpellier, France
Communication dans un congrès
hal-02053302v1
|
Partager
Gmail
Facebook
X
LinkedIn
More
|
|
|
Low frequency noise study of X-ray irradiated Si/SiGe:C BiCMOS technology bipolar transistors
A Adebabay Belie
,
J El Beyrouthy
,
Fabien Pascal
,
J Boch
,
T Maraine
,
et al.
26th International Conference on Noise and Fluctuations, Oct 2023, Grenoble, France
Communication dans un congrès
hal-04296176v1
|
Partager
Gmail
Facebook
X
LinkedIn
More
|
|
|
Improvement of 1/f noise in advanced 0.13 µm BiCMOS SiGe:C Heterojunction Bipolar Transistors
F. Pascal
,
Jérémy Raoult
,
Bruno Sagnes
,
Alain Hoffmann
,
Sebastien Haendler
ICNF, Jun 2011, Toronto, Canada
Communication dans un congrès
hal-01894345v1
|
Partager
Gmail
Facebook
X
LinkedIn
More
|
|
|
Study of the Low Frequency Noise of Metallic Emitter SiGeC Heterojunction Bipolar Transistors
F. Pascal
,
Jérémy Raoult
,
Cédric Leyris
ICNF, Jun 2009, Pise, Italy
Communication dans un congrès
hal-01894346v1
|
Partager
Gmail
Facebook
X
LinkedIn
More
|