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Sylvain Feruglio
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Documents
Affiliations actuelles
- 541703
- 233
Identifiants chercheurs
- feruglio
- 0000-0002-6444-2671
- IdRef : 098578944
Publications
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Low-Temperature Electrical Characterization of Fully Depleted eXtra-strained SOI n-MOSFETs with TiN/HfO2 Gate Stack for the 32-nm Technology NodeCryogenics, 2009, 49 (11), pp.605-610. ⟨10.1016/j.cryogenics.2008.12.004⟩
Article dans une revue
hal-01198843v1
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In-depth Electrical Characterization of sub-45nm fully depleted strained SOI MOSFETs with TiN/HfO2 gate stackSolid-State Electronics, 2008, 55, 489 (4), ⟨10.1016/j.sse.2007.10.039⟩
Article dans une revue
hal-00391693v1
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