François Vurpillot

Publications

Article dans une revue (138)

Stochastic ion emission perturbation mechanisms in atom probe tomography: Linking simulations to experiment Aslam Shaikh,Tero Mäkinen,François Vurpillot,Mikko Alava,Ivan Lomakin Physical Review Materials, 2026, 10 (3), pp.033802. ⟨10.1103/tg1g-s7r2⟩ Article dans une revue hal-05535424v1
Exploring Mechanisms Leading to Composition Errors in Monazite (CePO4) Analyzed With Atom Probe Tomography Tom Veret,Fabien Delaroche,Ivan Blum,Jonathan Houard,Benjamin Klaeset al. Microscopy and Microanalysis, 2026, 32 (2), ⟨10.1093/mam/ozag009⟩ Article dans une revue hal-05560238v1
A Survey of AI in System of Systems With a Focus on Power Electronic Systems—Part I: Design and Control Kambiz Tehrani,Noman Khan,Chouaib Djaghloul,Tanveer Abbas,Pierre Bonnetet al. IEEE Systems Journal, 2025, 19 (4), pp.1011-1024. ⟨10.1109/JSYST.2025.3641535⟩ Article dans une revue hal-05524892v1
Spatial resolution(s) in atom probe tomography Baptiste Gault,Frédéric de Geuser,Christoph Freysoldt,Benjamin Klaes,François Vurpillot Microscopy and Microanalysis, 2025, 16 (1), pp.99-110. ⟨10.1017/S1431927609991267⟩ Article dans une revue hal-05410426v1
Effect of Dynamic Reconstruction on Particle Size and Morphology in Atom Probe Tomography Constantinos Hatzoglou,Paraskevas Kontis,Heena Khanchandani,Gérald da Costa,Baptiste Gaultet al. Microscopy and Microanalysis, 2025, 31 (2), ⟨10.1093/mam/ozaf006⟩ Article dans une revue hal-05524841v1
Open-circuit fault detection in a 5-level cascaded H-bridge inverter using 1D CNN and ISTM Chouaib Djaghloul,Kambiz Tehrani,François Vurpillot Energies, 2025, 18 (18), pp.5004. ⟨10.3390/en18185004⟩ Article dans une revue hal-05283279v1
A Survey of AI in System of Systems With a Focus on Power Electronic Systems—Part II: Maintenance and Forecasting Kambiz Tehrani,Noman Khan,Chouaib Djaghloul,Tanveer Abbas,Pierre Bonnetet al. IEEE Systems Journal, 2025, 19 (4), pp.1025-1037. ⟨10.1109/JSYST.2025.3641439⟩ Article dans une revue hal-05524901v1
Stacking Fault Segregation Imaging With Analytical Field Ion Microscopy Felipe F. Morgado,Leigh T Stephenson,Shalini Bhatt,Christoph Freysoldt,Steffen Neumeieret al. Microscopy and Microanalysis, 2025, 31 (1), ⟨10.1093/mam/ozae105⟩ Article dans une revue hal-05524849v1
Bringing atom probe tomography to transmission electron microscopes Gérald da Costa,Celia Castro,Antoine Normand,Charly Vaudolon,Aidar Zakirovet al. Nature Communications, 2024, 15 (1), pp.9870. ⟨10.1038/s41467-024-54169-2⟩ Article dans une revue hal-04885414v1
Isotopic Correction of Compositional Inaccuracies in the Atom Probe Analysis of LaB 6 S. Ndiaye,O. Bhorade,Ivan Blum,Benjamin Klaes,Christian Bacchiet al. Journal of Physical Chemistry C, 2024, 128 (7), pp.2937-2947. ⟨10.1021/acs.jpcc.3c07595⟩ Article dans une revue hal-04695353v1
Crystallographic Dependence of Field Evaporation Energy Barrier in Metals Using Field Evaporation Energy Loss Spectroscopy Mapping François Vurpillot,Constantinos Hatzoglou,Benjamin Klaes,Loic Rousseau,Jean-Baptiste Mailletet al. Microscopy and Microanalysis, 2024, 30 (6), pp.1091-1099. ⟨10.1093/mam/ozae083⟩ Article dans une revue hal-05524874v1
On the iron content of Mn-Ni-Si-rich clusters that form in reactor pressure vessel steels during exposure to neutron irradiation Benjamin M Jenkins,Aidar Zakirov,François Vurpillot,Auriane Etienne,Cristelle Pareigeet al. Acta Materialia, 2024, 281, pp.120384. ⟨10.1016/j.actamat.2024.120384⟩ Article dans une revue hal-04698441v1
In-Situ Pulsed Hydrogen Implantation in Atom Probe Tomography Jean-Baptiste Maillet,Gérald da Costa,Benjamin Klaes,Christian Bacchi,Antoine Normandet al. Microscopy and Microanalysis, 2024, ⟨10.1093/mam/ozae040⟩ Article dans une revue hal-04582888v1
Atom probe tomography of hyper-doped Ge layers synthesized by Sb in-diffusion by pulsed laser melting Samba Ndiaye,Sébastien Duguay,François Vurpillot,Chiara Carraro,Gianluigi Maggioniet al. Materials Science in Semiconductor Processing, 2023, 164 (11), pp.107641. ⟨10.1016/j.mssp.2023.107641⟩ Article dans une revue hal-04125505v1
Introducing a Dynamic Reconstruction Methodology for Multilayered Structures in Atom Probe Tomography Constantinos Hatzoglou,Gérald da Costa,Peter Wells,Xiaochen Ren,Brian Geiseret al. Microscopy and Microanalysis, 2023, 29 (3), pp.1124-1136. ⟨10.1093/micmic/ozad054⟩ Article dans une revue hal-04152106v1
Beyond Atom Mapping in Atom Probe Tomography Using Field Evaporation Energy Loss Spectroscopy François Vurpillot,Loïc Rousseau,C. Hatzoglou,Antoine Normand,Baptiste Gaultet al. Microscopy and Microanalysis, 2023, 29 (Supplement_1), pp.605-606. ⟨10.1093/micmic/ozad067.293⟩ Article dans une revue hal-04346766v1
Synthesis of relaxed Ge0.9Sn0.1/Ge by nanosecond pulsed laser melting Enrico Di Russo,Francesco Sgarbossa,Pierpaolo Ranieri,Gianluigi Maggioni,Samba Ndiayeet al. Applied Surface Science, 2023, 612, pp.155817. ⟨10.1016/j.apsusc.2022.155817⟩ Article dans une revue hal-03885778v1
Alloy distribution and compositional metrology of epitaxial ScAlN by atom probe tomography Samba Ndiaye,Caroline Elias,Aissatou Diagne,Hélène Rotella,Frédéric Georgiet al. Applied Physics Letters, 2023, 123, pp.162102. ⟨10.1063/5.0167855⟩ Article dans une revue hal-04351608v1
A Quantitative Investigation of Functionalized Glazing Stacks by Atom Probe Tomography Jacques Perrin Toinin,Constantinos Hatzoglou,Justine Voronkoff,Hervé Montigaud,Denis Guimardet al. Advanced Materials Technologies, 2023, 8 (3), pp.2200922. ⟨10.1002/admt.202200922⟩ Article dans une revue hal-04351630v1
Improving Spatial and Elemental Associations in Analytical Field Ion Microscopy Felipe F Morgado,Leigh Stephenson,Loïc Rousseau,François Vurpillot,Simon Evertzet al. Microscopy and Microanalysis, 2023, 29, pp.1077-1086. ⟨10.1093/micmic/ozad039⟩ Article dans une revue hal-04056079v1
Surface Dynamics of Field Evaporation in Silicon Carbide Samba Ndiaye,Christian Bacchi,Benjamin Klaes,Mariaconcetta Canino,François Vurpillotet al. Journal of Physical Chemistry C, 2023, 127 (11), pp.5467-5478. ⟨10.1021/acs.jpcc.2c08908⟩ Article dans une revue hal-04344583v1
Mesoscopic modeling of field evaporation on atom probe tomography Constantinos Hatzoglou,Benjamin Klaes,Fabien Delaroche,Gérald da Costa,Brian Geiseret al. Journal of Physics D: Applied Physics, 2023, 56 (37), pp.375301. ⟨10.1088/1361-6463/acd649⟩ Article dans une revue hal-04344607v1
Introducing field evaporation energy loss spectroscopy Loïc Rousseau,Antoine Normand,Felipe Morgado,Hanne-Sofie Marie Scisly Søreide,Leigh Stephensonet al. Communications Physics, 2023, 6 (1), pp.100. ⟨10.1038/s42005-023-01203-2⟩ Article dans une revue hal-04106937v1
Combining Structure, Chemistry and Properties at the Nanoscale with Correlative Tomography Approaches Williams Lefebvre,Gérald da Costa,Celia Castro,François Vurpillot Microscopy and Microanalysis, 2023, 29 (Supplement_1), pp.611-611. ⟨10.1093/micmic/ozad067.296⟩ Article dans une revue hal-04324995v1
Correlating laser energy with compositional and atomic-level information of oxides in atom probe tomography K.A. Hunnestad,C. Hatzoglou,François Vurpillot,I.-E. Nylund,Z. Yanet al. Materials Characterization, 2023, 203, pp.113085. ⟨10.1016/j.matchar.2023.113085⟩ Article dans une revue hal-04132732v1
Mysterious Field Evaporation Behavior of Hydrogen in Aluminium Based Material Analyzed with Atom Probe Tomography Loïc Rousseau,Jean-Baptiste Maillet,Leigh Stephenson,Benoit Gervais,Baptiste Gaultet al. Microscopy and Microanalysis, 2022, 28 (S1), pp.690-691. ⟨10.1017/S1431927622003233⟩ Article dans une revue hal-03855834v1
Development of an Energy-Sensitive Detector for the Atom Probe Tomography Christian Bacchi,Gérald da Costa,Emmanuel Cadel,Fabien Cuvilly,Jonathan Houardet al. Microscopy Microanal., 2022, 28 (4), pp.1076-1091. ⟨10.1017/S1431927621012708⟩ Article dans une revue hal-03178516v1
Revealing atomic-scale vacancy-solute interaction in nickel Felipe Morgado,Shyam Katnagallu,Christoph Freysoldt,Benjamin Klaes,François Vurpillotet al. Scripta Materialia, 2021, 203, pp.114036. ⟨10.1016/j.scriptamat.2021.114036⟩ Article dans une revue hal-03474754v1
Surface Microscopy of Atomic and Molecular Hydrogen from Field-Evaporating Semiconductors Lorenzo Rigutti,Enrico Di Russo,Florian Chabanais,Ivan Blum,Jonathan Houardet al. Journal of Physical Chemistry C, 2021, 125 (31), pp.17078-17087. ⟨10.1021/acs.jpcc.1c04778⟩ Article dans une revue hal-03448318v1
In Situ Spectroscopic Study of the Optomechanical Properties of Evaporating Field Ion Emitters P. Dalapati,G. Beainy,Enrico Di Russo,Ivan Blum,Jonathan Houardet al. Physical Review Applied, 2021, 15 (2), ⟨10.1103/physrevapplied.15.024014⟩ Article dans une revue hal-03138523v1
A Tomographic Atom Probe laser assisted by a flexible optical system Jonathan Houard,Angela Vella,Gérald da Costa,Ivan Blum,Fabien Delarocheet al. Microscopy and Microanalysis, 2021, 27 (S1), pp.1260 - 1261. ⟨10.1017/s1431927621004724⟩ Article dans une revue hal-04360365v1
Development of Wide Field of View Three-Dimensional Field Ion Microscopy and High-Fidelity Reconstruction Algorithms to the Study of Defects in Nuclear Materials Benjamin Klaes,Rodrigue Lardé,Fabien Delaroche,Constantinos Hatzoglou,Stefan Parviainenet al. Microscopy and Microanalysis, 2021, 27 (2), pp.365-384. ⟨10.1017/S1431927621000131⟩ Article dans une revue hal-03474668v1
Influence of field conditions on quantitative analysis of single crystal thorium dioxide by atom probe tomography Amrita Sen,Mukesh Bachhav,François Vurpillot,J. Matthew Mann,Phyllis Morganet al. Ultramicroscopy, 2021, 220, pp.113167. ⟨10.1016/j.ultramic.2020.113167⟩ Article dans une revue hal-04355448v1
Analytical Three-Dimensional Field Ion Microscopy of an Amorphous Glass FeBSi Benjamin Klaes,Jeoffrey Renaux,Rodrigue Lardé,Fabien Delaroche,Felipe Morgadoet al. Microscopy and Microanalysis, 2021, pp.1-9. ⟨10.1017/S1431927621012629⟩ Article dans une revue hal-03474770v1
Reflections on the Spatial Performance of Atom Probe Tomography in the Analysis of Atomic Neighborhoods Baptiste Gault,Benjamin Klaes,Felipe F Morgado,Christoph Freysoldt,Yue Liet al. Microscopy and Microanalysis, 2021, ⟨10.1017/S1431927621012952⟩ Article dans une revue hal-03388125v1
Characterization of Pd and Pd@Au core-shell nanoparticles using atom probe tomography and field evaporation simulation Se-Ho Kim,Kyuseon Jang,Phil Woong Kang,Jae-Pyoung Ahn,Jae-Bok Seolet al. Journal of Alloys and Compounds, 2020, 831, pp.154721. ⟨10.1016/j.jallcom.2020.154721⟩ Article dans une revue hal-02571984v1
Interpreting nanovoids in atom probe tomography data for accurate local compositional measurements Xing Wang,Constantinos Hatzoglou,Brian Sneed,Zhe Fan,Wei Guoet al. Nature Communications, 2020, 11 (1), ⟨10.1038/s41467-020-14832-w⟩ Article dans une revue hal-02571976v1
A model to predict image formation in the three-dimensional field ion microscope Benjamin Klaes,Rodrigue Lardé,Fabien Delaroche,Stefan Parviainen,Nicolas Rollandet al. Computer Physics Communications, 2020, pp.107317. ⟨10.1016/j.cpc.2020.107317⟩ Article dans une revue hal-02571970v1
Dynamic Effects in Voltage Pulsed Atom Probe Loïc Rousseau,Antoine Normand,Felipe Morgado,Leigh Stephenson,Baptiste Gaultet al. Microscopy and Microanalysis, 2020, 26 (6), pp.1133-1146. ⟨10.1017/S1431927620024587⟩ Article dans une revue hal-03013684v1
Detecting Dissociation Dynamics of Phosphorus Molecular Ions by Atom Probe Tomography Enrico Di Russo,Ivan Blum,Ivan Rivalta,Jonathan Houard,Gérald da Costaet al. Journal of Physical Chemistry A, 2020, 124 (52), pp.10977-10988. ⟨10.1021/acs.jpca.0c09259⟩ Article dans une revue hal-03120561v1
Super-resolution Optical Spectroscopy of Nanoscale Emitters within a Photonic Atom Probe Enrico Di Russo,Pradip Dalapati,Jonathan Houard,Linda Venturi,Ivan Blumet al. Nano Letters, 2020, ⟨10.1021/acs.nanolett.0c03584⟩ Article dans une revue hal-03024946v1
Preferential evaporation in atom probe tomography: an analytical approach Constantinos Hatzoglou,Solène Rouland,Bertrand Radiguet,Auriane Etienne,Gérald da Costaet al. Microscopy and Microanalysis, 2020, 26 (4), pp.689-698. ⟨10.1017/S1431927620001749⟩ Article dans une revue hal-02917595v1
Analysis of nanoscale fluid inclusions in geomaterials by atom probe tomography: Experiments and numerical simulations R. Dubosq,B. Gault,C. Hatzoglou,K. Schweinar,François Vurpillotet al. Ultramicroscopy, 2020, 218, pp.113092. ⟨10.1016/j.ultramic.2020.113092⟩ Article dans une revue hal-02921985v1
A Photonic Atom Probe coupling 3D Atomic Scale Analysis with in situ Photoluminescence Spectroscopy Jonathan Houard,Antoine Normand,Enrico Di Russo,Christian Bacchi,P Dalapatiet al. Review of Scientific Instruments, 2020, 91, pp.083704. ⟨10.1063/5.0012359⟩ Article dans une revue hal-02902892v1
Spatial and Compositional Biases Introduced by Position Sensitive Detection Systems in APT: A Simulation Approach Christian Bacchi,Gérald da Costa,François Vurpillot Microscopy and Microanalysis, 2019, 25, pp.418-424. ⟨10.1017/S143192761801629X⟩ Article dans une revue hal-02107336v1
Enhancing Element Identification by Expectation–Maximization Method in Atom Probe Tomography François Vurpillot,Constantinos Hatzoglou,Bertrand Radiguet,Gérald da Costa,Fabien Delarocheet al. Microscopy and Microanalysis, 2019, 25, pp.367-377. ⟨10.1017/S1431927619000138⟩ Article dans une revue hal-02107329v1
Unraveling the metastability of C n 2+ ( n = 2–4) Clusters Zirong Peng,David Zanuttini,Benoit Gervais,Emmanuelle Jacquet,Ivan Blumet al. Journal of Physical Chemistry Letters, 2019, 10 (3), pp.581-588. ⟨10.1021/acs.jpclett.8b03449⟩ Article dans une revue hal-02107343v1
An Automated Computational Approach for Complete In-Plane Compositional Interface Analysis by Atom Probe Tomography Zirong Peng,Yifeng Lu,Constantinos Hatzoglou,Alisson Kwiatkowski da Silva,François Vurpillotet al. Microscopy and Microanalysis, 2019, 25, pp.389-400. ⟨10.1017/S1431927618016112⟩ Article dans une revue hal-02107351v1
Imaging individual solute atoms at crystalline imperfections in metals Shyam Katnagallu,Leigh T. Stephenson,Isabelle Mouton,Christoph Freysoldt,Aparna P.A. Subramanyamet al. New Journal of Physics, 2019, 21 (12), pp.123020. ⟨10.1088/1367-2630/ab5cc4⟩ Article dans une revue hal-02097141v1
La sonde atomique tomographique Lorenzo Rigutti,François Vurpillot,Williams Lefebvre,Angela Vella Reflets de la Physique, 2019, 62, pp.4-10. ⟨10.1051/refdp/201962004⟩ Article dans une revue hal-03260708v1
Enhanced dynamic reconstruction for atom probe tomography Constantinos Hatzoglou,Gérald da Costa,François Vurpillot Ultramicroscopy, 2019, 197, pp.72-82. ⟨10.1016/j.ultramic.2018.11.010⟩ Article dans une revue hal-02107358v1
Kron–Branin modelling of ultra-short pulsed signal microelectrode Zhifei Xu,Blaise Elysée Guy Ravelo,Yang Liu,Lu Zhao,Fabien Delarocheet al. European Physical Journal: Applied Physics, 2018, 81 (2), pp.21001. ⟨10.1051/epjap/2018170383⟩ Article dans une revue istex hal-02611693v1
Impact of local electrostatic field rearrangement on field ionization Shyam Katnagallu,Michal Dagan,Stefan Parviainen,Ali Nematollahi,Blazej Grabowskiet al. Journal of Physics D: Applied Physics, 2018, 51 (10), pp.105601. ⟨10.1088/1361-6463/aaaba6⟩ Article dans une revue hal-02107446v1
Green electroluminescence from radial m -plane InGaN quantum wells grown on GaN wire sidewalls by metal–organic vapor phase epitaxy Akanksha Kapoor,Nan Guan,Martin Vallo,Agnès Messanvi,Lorenzo Manciniet al. ACS photonics, 2018, 5 (11), pp.4330-4337. ⟨10.1021/acsphotonics.8b00520⟩ Article dans une revue hal-01986657v1
Dissociation of GaN$^{2+}$ and AlN$^{2+}$ in APT: Electronic structure and stability in strong DC field David Zanuttini,François Vurpillot,J. Douady,E. Jacquet,P.-M. Angladeet al. The Journal of Chemical Physics, 2018, 149 (13), pp.134310. ⟨10.1063/1.5036933⟩ Article dans une revue hal-02061759v1
Composition Metrology of Ternary Semiconductor Alloys Analyzed by Atom Probe Tomography Enrico Di Russo,F. Moyon,N. Gogneau,L. Largeau,E. Giraudet al. Journal of Physical Chemistry C, 2018, 122 (29), pp.16704--16714. ⟨10.1021/acs.jpcc.8b03223⟩ Article dans une revue hal-01928844v1
Interpreting the Presence of an Additional Oxide Layer in Analysis of Metal Oxides–Metal Interfaces in Atom Probe Tomography Mukesh Bachhav,Gorakh Pawar,François Vurpillot,Raphaële Danoix,Frederic Danoixet al. Journal of Physical Chemistry C, 2018, 123 (2), pp.1313-1319. ⟨10.1021/acs.jpcc.8b10895⟩ Article dans une revue hal-02106738v1
On the detection of multiple events in atom probe tomography Zirong Peng,François Vurpillot,Pyuck-Pa Choi,Yujiao Li,Dierk Raabeet al. Ultramicroscopy, 2018, 189, pp.54-60. ⟨10.1016/j.ultramic.2018.03.018⟩ Article dans une revue hal-02061736v1
A chemical composition correction model for nanoclusters observed by APT - Application to ODS steel nanoparticles Constantinos Hatzoglou,Bertrand Radiguet,François Vurpillot,Philippe Pareige Journal of Nuclear Materials, 2018, 505, pp.240-248. ⟨10.1016/j.jnucmat.2018.03.057⟩ Article dans une revue hal-02061493v1
Atom probe tomography for advanced nanoelectronic devices: Current status and perspectives J. Barnes,A. Grenier,I. Mouton,S. Barraud,G. Audoitet al. Scripta Materialia, 2018, 148, pp.91 - 97. ⟨10.1016/j.scriptamat.2017.05.012⟩ Article dans une revue istex hal-01765929v1
Simulation tools for atom probe tomography: A path for diagnosis and treatment of image degradation François Vurpillot,Stefan Parviainen,Fluyra Djurabekova,David Zanuttini,Benoit Gervais Materials Characterization, 2018, 146, pp.336-346. ⟨10.1016/j.matchar.2018.04.024⟩ Article dans une revue hal-02061494v1
New Atom Probe Tomography Reconstruction Algorithm for Multilayered Samples: Beyond the Hemispherical Constraint Nicolas Rolland,François Vurpillot,Sébastien Duguay,Baishakhi Mazumder,James Specket al. Microscopy and Microanalysis, 2017, 23 (02), pp.247 - 254. ⟨10.1017/s1431927617000253⟩ Article dans une revue hal-01766098v1
Reconstructing APT Datasets: Challenging the Limits of the Possible François Vurpillot,David Zanuttini,Stefan Parviainen,Baishaikhi Mazumder,Nicolas Rollandet al. Microscopy and Microanalysis, 2017, 23 (S1), pp.640-641. ⟨10.1017/S1431927617003865⟩ Article dans une revue hal-02107482v1
Simulation of field-induced molecular dissociation in atom-probe tomography: Identification of a neutral emission channel David Zanuttini,Ivan Blum,Lorenzo Rigutti,François Vurpillot,Julie Douadyet al. Physical Review A : Atomic, molecular, and optical physics [1990-2015], 2017, 95 (6), ⟨10.1103/PhysRevA.95.061401⟩ Article dans une revue hal-02107497v1
Analysis of Radiation Damage in Light Water Reactors: Comparison of Cluster Analysis Methods for the Analysis of Atom Probe Data Jonathan Hyde,Gérald da Costa,Constantinos Hatzoglou,Hannah Weekes,Bertrand Radiguetet al. Microscopy and Microanalysis, 2017, 23 (02), pp.366 - 375. ⟨10.1017/s1431927616012678⟩ Article dans une revue hal-01765920v1
True Atomic-Scale Imaging in Three Dimensions: A Review of the Rebirth of Field-Ion Microscopy François Vurpillot,Frederic Danoix,Matthieu Gilbert,Sebastian Koelling,Michal Daganet al. Microscopy and Microanalysis, 2017, 23 (02), pp.210 - 220. ⟨10.1017/s1431927617000198⟩ Article dans une revue hal-01766137v1
Electronic structure and stability of the SiO 2+ dications produced in tomographic atom probe experiments D. Zanuttini,Ivan Blum,Lorenzo Rigutti,François Vurpillot,Julie Douadyet al. The Journal of Chemical Physics, 2017, 147 (16), pp.164301. ⟨10.1063/1.5001113⟩ Article dans une revue hal-03345835v1
Optimizing Atom Probe Analysis with Synchronous Laser Pulsing and Voltage Pulsing Lu Zhao,Antoine Normand,Jonathan Houard,Ivan Blum,Fabien Delarocheet al. Microscopy and Microanalysis, 2017, 23 (2), pp.221-226. ⟨10.1017/S1431927616012666⟩ Article dans une revue hal-02611781v1
Recent Reconstruction Developments in IVAS Brian Geiser,François Vurpillot,Yimeng Chen,Katherine Rice,Stuart Wrightet al. Microscopy and Microanalysis, 2017, 23 (S1), pp.638-639. ⟨10.1017/S1431927617003853⟩ Article dans une revue hal-02107488v1
Carrier Localization in GaN/AlN Quantum Dots As Revealed by Three-Dimensional Multimicroscopy Lorenzo Mancini,Florian Moyon,David Hernàndez-Maldonado,Ivan Blum,Jonathan Houardet al. Nano Letters, 2017, 17 (7), pp.4261 - 4269. ⟨10.1021/acs.nanolett.7b01189⟩ Article dans une revue hal-01765951v1
Atom probe tomography analysis of SiGe fins embedded in SiO$_2$: Facts and artefacts D. Melkonyan,C. Fleischmann,L. Arnoldi,J. Demeulemeester,A. Kumaret al. Ultramicroscopy, 2017, 179, pp.100 - 107. ⟨10.1016/j.ultramic.2017.04.006⟩ Article dans une revue hal-01765926v1
Multi-excitonic emission from Stranski-Krastanov GaN/AlN quantum dots inside a nanoscale tip L. Mancini,F. Moyon,Jonathan Houard,Ivan Blum,Williams Lefebvreet al. Applied Physics Letters, 2017, 111 (24), ⟨10.1063/1.5004417⟩ Article dans une revue hal-01766091v1
Atomistic Simulations of Surface Effects Under High Electric Fields Stefan Parviainen,Michal Dagan,Shyam Katnagallu,Baptiste Gault,Michael Moodyet al. Microscopy and Microanalysis, 2017, 23 (S1), pp.644-645. ⟨10.1017/S1431927617003889⟩ Article dans une revue hal-02107478v1
Dissociation Dynamics of Molecular Ions in High Dc Electric Field Ivan Blum,Lorenzo Rigutti,François Vurpillot,Angela Vella,Aurore Gaillardet al. Journal of Physical Chemistry A, 2016, 120 (20), pp.3654-3662. ⟨10.1021/acs.jpca.6b01791⟩ Article dans une revue hal-01954242v1
Dissociation of Molecular Ions During the DC Field Evaporation ZnO in Atom Probe Tomography Ivan Blum,David Zanuttini,Lorenzo Rigutti,François Vurpillot,Julie Douadyet al. Microscopy and Microanalysis, 2016, 22 (S3), pp.662-663. ⟨10.1017/S1431927616004165⟩ Article dans une revue hal-02107558v1
Field Evaporation Behavior of Metal Oxide/Metal Interfaces Mukesh Bachhav,François Vurpillot,Frederic Danoix,Raphaële Danoix,Béatrice Hannoyeret al. Microscopy and Microanalysis, 2016, 22 (S3), pp.678-679. ⟨10.1017/S1431927616004244⟩ Article dans une revue hal-02107553v1
Statistical correction of atom probe tomography data of semiconductor alloys combined with optical spectroscopy: The case of Al0.25Ga0.75N Lorenzo Rigutti,L. Mancini,Daniel Hernandez Maldonado,Williams Lefebvre,E. Giraudet al. Journal of Applied Physics, 2016, 119 (10), pp.105704. ⟨10.1063/1.4943612⟩ Article dans une revue hal-01928851v1
Multi-Microscopy Study of the Influence of Stacking Faults and Three-Dimensional In Distribution on the Optical Properties of m-Plane InGaN Quantum Wells Grown on Microwire Sidewalls L. Mancini,Daniel Hernandez Maldonado,Williams Lefebvre,Jonathan Houard,Ivan Blumet al. Applied Physics Letters, 2016, 108 (4), pp.042102. ⟨10.1063/1.4940748⟩ Article dans une revue hal-01954240v1
Assessing the Composition of Wide Bandgap Compound Semiconductors by Atom Probe Tomography: A Metrological Problem Lorenzo Rigutti,L. Mancini,Enrico Di Russo,Ivan Blum,F. Moyonet al. Microscopy and Microanalysis, 2016, 22 (S3), pp.650-651. ⟨10.1017/S1431927616004104⟩ Article dans une revue hal-01954232v1
Nanoscale photoconductive switching effect applied to atom probe tomography Lu Zhao,Antoine Normand,Jonathan Houard,Ivan Blum,Fabien Delarocheet al. American Journal of Physics, 2016, 116, pp.2. ⟨10.1209/0295-5075/116/27002⟩ Article dans une revue istex hal-01719197v1
Accuracy of analyses of microelectronics nanostructures in atom probe tomography François Vurpillot,Nicolas Rolland,Robert Estivill,Sébastien Duguay,D. Blavette Semiconductor Science and Technology, 2016, 31 (7), pp.074002. ⟨10.1088/0268-1242/31/7/074002⟩ Article dans une revue hal-01928850v1
RF pulse signal integrity analysis for nonlinear ended microstrip line atom-probe tomography Lu Zhao,A. Delamare,Antoine Normand,Fabien Delaroche,O. Latryet al. IOP Conference Series: Materials Science and Engineering, 2016, 120, pp.012006. ⟨10.1088/1757-899X/120/1/012006⟩ Article dans une revue hal-01954239v1
Advanced Volume Reconstruction and Data Mining Methods in Atom Probe Tomography François Vurpillot,Williams Lefebvre,J.M. Cairney,C. Oberdorfer,B.P. Geiseret al. MRS Bulletin, 2016, 41 (01), pp.46-52. ⟨10.1557/mrs.2015.312⟩ Article dans une revue hal-01954244v1
Statistical nanoscale study of localised radiative transitions in GaN/AlGaN quantum wells and AlGaN epitaxial layers Lorenzo Rigutti,L. Mancini,Williams Lefebvre,Jonathan Houard,Daniel Hernandez Maldonadoet al. Semiconductor Science and Technology, 2016, 31 (9), pp.095009. ⟨10.1088/0268-1242/31/9/095009⟩ Article dans une revue hal-01928848v1
Challenges in the study of Fe/MgO/Fe interfaces using 3D Atom Probe B. Mazumder,Viswas Purohit,M. Gruber,Angela Vella,François Vurpillotet al. Thin Solid Films, 2015, 589, pp.38-46. ⟨10.1016/j.tsf.2015.04.079⟩ Article dans une revue istex hal-02107626v1
Role of the resistivity of insulating field emitters on the energy of field-ionised and field-evaporated atoms L. Arnoldi,Elena Silaeva,François Vurpillot,Bernard Deconihout,E. Cadelet al. Ultramicroscopy, 2015, 159, pp.139--146. ⟨10.1016/j.ultramic.2014.11.018⟩ Article dans une revue hal-01929137v1
An analytical model accounting for tip shape evolution during atom probe analysis of heterogeneous materials Nicolas Rolland,D. J. Larson,B. P. Geiser,Sébastien Duguay,François Vurpillotet al. Ultramicroscopy, 2015, 159, pp.195--201. ⟨10.1016/j.ultramic.2015.03.010⟩ Article dans une revue istex hal-01928854v1
Quantitative analysis of Si/SiGeC superlattices using atom probe tomography Robert Estivill,Adeline Grenier,Sébastien Duguay,François Vurpillot,Tanguy Terlieret al. Ultramicroscopy, 2015, 159, pp.223-231. ⟨10.1016/j.ultramic.2015.03.014⟩ Article dans une revue hal-02107589v1
Three dimensional imaging and analysis of a single nano-device at the ultimate scale using correlative microscopy techniques A. Grenier,Sébastien Duguay,J. P. Barnes,R. Serra,Nicolas Rollandet al. Applied Physics Letters, 2015, 106 (21), pp.213102. ⟨10.1063/1.4921352⟩ Article dans une revue hal-01928856v1
Ion energy spread in laser-assisted atom probe tomography Nicolas Sevelin-Radiguet,L. Arnoldi,François Vurpillot,Antoine Normand,Bernard Deconihoutet al. EPL - Europhysics Letters, 2015, 109 (3), pp.37009. ⟨10.1209/0295-5075/109/37009⟩ Article dans une revue istex hal-02109749v1
Quantitative investigation of SiGeC layers using atom probe tomography Robert Estivill,Adeline Grenier,Sébastien Duguay,François Vurpillot,Tanguy Terlieret al. Ultramicroscopy, 2015, 150, pp.23--29. ⟨10.1016/j.ultramic.2014.11.020⟩ Article dans une revue istex hal-01928855v1
Modeling Atom Probe Tomography: A review François Vurpillot,C. Oberdorfer Ultramicroscopy, 2015, 159, pp.202-216. ⟨10.1016/j.ultramic.2014.12.013⟩ Article dans une revue hal-02107615v1
Dynamic evolution and fracture of multilayer field emitters in atom probe tomography: a new interpretation Nicolas Rolland,François Vurpillot,Sébastien Duguay,Didier Blavette European Physical Journal: Applied Physics, 2015, 72 (2), pp.21001. ⟨10.1051/epjap/2015150233⟩ Article dans une revue istex hal-02107622v1
Nanoscale Microstructural and Chemical Analysis of SiO 2 -Zn 1− x Al x O Nanocomposites: Towards a Better Understanding of Si and Al Substitution in ZnO Matthieu Gilbert,Céline Byl,David Bérardan,Alexandre Gloter,Nita Dragoeet al. Journal of the American Ceramic Society, 2015, 98 (12), pp.3948-3955. ⟨10.1111/jace.13848⟩ Article dans une revue istex hal-02107584v1
A Meshless Algorithm to Model Field Evaporation in Atom Probe Tomography Nicolas Rolland,François Vurpillot,Sébastien Duguay,Didier Blavette Microscopy and Microanalysis, 2015, 21 (6), pp.1649-1656. ⟨10.1017/S1431927615015184⟩ Article dans une revue hal-02107013v1
Pulse shaping optimization for improving atom probe tomography Lu Zhao,Antoine Normand,Fabien Delaroche,B. Ravelo,François Vurpillot International Journal of Mass Spectrometry, 2015, 386, pp.47-53. ⟨10.1016/j.ijms.2015.06.012⟩ Article dans une revue istex hal-02177749v1
HAADF–STEM atom counting in atom probe tomography specimens: Towards quantitative correlative microscopy Williams Lefebvre,Daniel Hernandez Maldonado,F. Moyon,Fabien Cuvilly,Charly Vaudolonet al. Ultramicroscopy, 2015, 159, pp.403-412. ⟨10.1016/j.ultramic.2015.02.011⟩ Article dans une revue istex hal-02107619v1
Composition of Wide Bandgap Semiconductor Materials and Nanostructures Measured by Atom Probe Tomography and Its Dependence on the Surface Electric Field Lorenzo Mancini,Nooshin Amirifar,Deodatta Shinde,Ivan Blum,Matthieu Gilbertet al. Journal of Physical Chemistry C, 2014, 118 (41), pp.24136-24151. ⟨10.1021/jp5071264⟩ Article dans une revue hal-01163403v1
3D analysis of advanced nano-devices using electron and atom probe tomography A. Grenier,Sébastien Duguay,J. P. Barnes,R. Serra,G. Haberfehlneret al. Ultramicroscopy, 2014, 136, pp.185--192. ⟨10.1016/j.ultramic.2013.10.001⟩ Article dans une revue hal-01929139v1
Correlation of Microphotoluminescence Spectroscopy, Scanning Transmission Electron Microscopy, and Atom Probe Tomography on a Single Nano-object Containing an InGaN/GaN Multiquantum Well System Lorenzo Rigutti,Ivan Blum,Deodatta Shinde,David Hernandez-Maldonado,Williams Lefebvreet al. Nano Letters, 2014, 14 (1), pp.107-114. ⟨10.1021/nl4034768⟩ Article dans une revue hal-01986734v1
Atom probe tomography spatial reconstruction: Status and directions D.J. Larson,B. Gault,B.P. Geiser,F. de Geuser,François Vurpillot Current Opinion in Solid State and Materials Science, 2013, 17 (5), pp.236-247. ⟨10.1016/j.cossms.2013.09.002⟩ Article dans une revue hal-00935033v1
A model to predict image formation in Atom probeTomography François Vurpillot,A. Gaillard,Gérald da Costa,Bernard Deconihout Ultramicroscopy, 2013, 132, pp.152-157. ⟨10.1016/j.ultramic.2012.12.007⟩ Article dans une revue istex hal-02108150v1
Coupling atom probe tomography and photoluminescence spectroscopy: Exploratory results and perspectives Lorenzo Rigutti,Angela Vella,François Vurpillot,Aurore Gaillard,Nicolas Sevelin-Radiguetet al. Ultramicroscopy, 2013, 132, pp.75-80. ⟨10.1016/j.ultramic.2013.02.002⟩ Article dans une revue istex hal-02109344v1
Numerical study of femtosecond laser assisted atom probe tomography E. Silaeva,Nikita Shcheblanov,Tatiana Itina,Angela Vella,Jonathan Houardet al. Applied physics. A, Materials science & processing, 2013, 110 (3), pp.703-707. ⟨10.1007/s00339-012-7189-7⟩ Article dans une revue istex ujm-00866898v1
Nanometer scale tomographic investigation of fine scale precipitates in a CuFeNi granular system by three-dimensional field ion microscopy Sophie Cazottes,François Vurpillot,Abdeslem Fnidiki,Dany Lemarchand,Marcello Bariccoet al. Microscopy and Microanalysis, 2012, 18 (5), pp.1129--1134. ⟨10.1017/S1431927612000517⟩ Article dans une revue hal-01829269v1
Atomic-scale imaging and analysis of single layer GP zones in a model steel Frédéric Danoix,T. Epicier,François Vurpillot,D. Blavette Journal of Materials Science, 2012, 47 (3), pp.1567-1571. ⟨10.1007/s10853-011-6008-4⟩ Article dans une revue istex hal-01834903v1
Three-dimensional thermal response of a metal subwavelength tip under femtosecond laser illumination Jonathan Houard,Angela Vella,François Vurpillot,Bernard Deconihout Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2011, 84 (3), ⟨10.1103/PhysRevB.84.033405⟩ Article dans une revue hal-02109350v1
Application of Delaunay tessellation for the characterization of solute-rich clusters in atom probe tomography W Lefebvre,Thomas Philippe,F. Vurpillot Ultramicroscopy, 2011, 111 (3), pp.200-206. ⟨10.1016/j.ultramic.2010.11.034⟩ Article dans une revue istex hal-03035627v1
Pragmatic reconstruction methods in atom probe tomography François Vurpillot,M. Gruber,Gérald da Costa,I. Martin,L. Renaudet al. Ultramicroscopy, 2011, 111 (8), pp.1286-1294. ⟨10.1016/j.ultramic.2011.04.001⟩ Article dans une revue istex hal-02108161v1
Atom probe tomography: 3D imaging at the atomic level D. Blavette,François Vurpillot,Bernard Deconihout,A. Menand Advanced Structured Materials, 2011, 10, pp.201--222. ⟨10.1007/978-3-642-17782-8_9⟩ Article dans une revue istex hal-01928872v1
Optical near-field absorption at a metal tip far from plasmonic resonance Jonathan Houard,Angela Vella,François Vurpillot,Bernard Deconihout Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2010, 81 (12), ⟨10.1103/PhysRevB.81.125411⟩ Article dans une revue hal-02109352v1
Three-dimensional atomic-scale imaging of boron clusters in implanted silicon O. Cojocaru-Mirédin,Emmanuel Cadel,François Vurpillot,Dominique Mangelinck,D. Blavette Scripta Materialia, 2009, 60 (5), pp.285-288. ⟨10.1016/j.scriptamat.2008.10.008⟩ Article dans une revue istex hal-01953258v1
Ultrafast emission of ions during laser ablation of metal for 3D atom probe Angela Vella,Jonathan Houard,François Vurpillot,Bernard Deconihout Applied Surface Science, 2009, 255 (10), pp.5154-5158. ⟨10.1016/j.apsusc.2008.08.109⟩ Article dans une revue istex hal-02109356v1
Conditions to cancel the laser polarization dependence of a subwavelength tip Jonathan Houard,Angela Vella,François Vurpillot,Bernard Deconihout Applied Physics Letters, 2009, 94 (12), pp.121905. ⟨10.1063/1.3095829⟩ Article dans une revue hal-02109355v1
Investigation at the atomic scale of the Co spatial distribution in Zn(Co)O magnetic semiconductor oxide Rodrigue Lardé,Etienne Talbot,François Vurpillot,Philippe Pareige,G. Schmerberet al. Journal of Applied Physics, 2009, 105 (12), pp.126107. ⟨10.1063/1.3152579⟩ Article dans une revue hal-01633464v1
Thermal response of a field emitter subjected to ultra-fast laser illumination François Vurpillot,Jonathan Houard,Angela Vella,Bernard Deconihout Journal of Physics D: Applied Physics, 2009, 42 (12), pp.125502. ⟨10.1088/0022-3727/42/12/125502⟩ Article dans une revue istex hal-02109353v1
Depth resolution function of the laser assisted tomographic atom probe in the investigation of semiconductors Emmanuel Cadel,François Vurpillot,Rodrigue Lardé,Sébastien Duguay,Bernard Deconihout Journal of Applied Physics, 2009, 106 (4), pp.044908. ⟨10.1063/1.3186617⟩ Article dans une revue hal-01929144v1
Evidence of atomic-scale arsenic clustering in highly doped silicon Sébastien Duguay,François Vurpillot,Thomas Philippe,E. Cadel,Rodrigue Lardéet al. Journal of Applied Physics, 2009, 106 (10), pp.106102. ⟨10.1063/1.3257178⟩ Article dans une revue hal-01929143v1
Laser-assisted atom probe tomography and nanosciences Didier Blavette,Talaat Al Kassab,Emmanuel Cadel,Alexander Mackel,François Vurpillotet al. International Journal of Materials Research, 2008, 99 (5), pp.454--460. ⟨10.3139/146.101672⟩ Article dans une revue hal-01929148v1
3D atom probe assisted by femtosecond laser pulses Bernard Deconihout,Angela Vella,François Vurpillot,Gérald da Costa,A. Bostel Applied physics. A, Materials science & processing, 2008, 93 (4), pp.995-1003. ⟨10.1007/s00339-008-4774-x⟩ Article dans une revue istex hal-02108177v1
Nanostructure and properties of a Cu-Cr composite processed by severe plastic deformation. Xavier Sauvage,Peter Jessner,François Vurpillot,Reinhard Pippan Scripta Materialia, 2008, 58, pp.1125. ⟨10.1016/j.scriptamat.2008.02.010⟩ Article dans une revue hal-00276105v1
Correlated field evaporation as seen by atom probe tomography F. de Geuser,B. Gault,A. Bostel,François Vurpillot Surface Science : A Journal Devoted to the Physics and Chemistry of Interfaces, 2007, 601 (2), pp.536 - 543. ⟨10.1016/j.susc.2006.10.019⟩ Article dans une revue hal-00408087v1
Structural investigation of TbCo2/Fe magnetostrictive thin films by tomographic atom probe and Mössbauer spectrometry A. Grenier,R. Lardé,E. Cadel,J.M. Le Breton,J. Juraszeket al. Journal of Magnetism and Magnetic Materials, 2007, 310, pp.2215-2216. ⟨10.1016/j.jmmm.2006.10.1102⟩ Article dans une revue istex hal-00285631v1
Optical and thermal processes involved in ultrafast laser pulse interaction with a field emitter B. Gault,A. Vella,François Vurpillot,A. Menand,D. Blavetteet al. Ultramicroscopy, 2007, 107 (9), pp.713--719. ⟨10.1016/j.ultramic.2007.02.004⟩ Article dans une revue istex hal-01928886v1
Atomic scale study of TbCo2.5/Fe multilayers by laser-assisted tomographic atom probe A. Grenier,R. Larde,E. Cadel,F. Vurpillot,J. Juraszeket al. Journal of Applied Physics, 2007, 102, pp.033912-1-4. ⟨10.1063/1.2761825⟩ Article dans une revue hal-00255798v1
An improved reconstruction procedure for the correction of local magnification effects in three-dimensional atom-probe F. de Geuser,Williams Lefebvre,Frédéric Danoix,François Vurpillot,B. Forbordet al. Surface and Interface Analysis, 2007, 39 (2-3), pp.268--272. ⟨10.1002/sia.2489⟩ Article dans une revue hal-00408094v1
The New Laser assisted Wide Angle Tomographic Atom Probe L Renaud,P Monsallut,P. Benard,P Saliot,Gérald da Costaet al. Microscopy and Microanalysis, 2006, 12 (S02), pp.1726-1727. ⟨10.1017/S1431927606063410⟩ Article dans une revue hal-02108563v1
Design of a femtosecond laser assisted tomographic atom probe B. Gault,François Vurpillot,A. Vella,M. Gilbert,A. Menandet al. Review of Scientific Instruments, 2006, 77 (4), ⟨10.1063/1.2194089⟩ Article dans une revue hal-01928897v1
Design of a delay-line position-sensitive detector with improved performance Gérald da Costa,François Vurpillot,A. Bostel,M. Bouet,Bernard Deconihout Review of Scientific Instruments, 2005, 76 (1), pp.013304. ⟨10.1063/1.1829975⟩ Article dans une revue hal-02108204v1
Application of Fourier transform and autocorrelation to cluster identification in the three-dimensional atom probe François Vurpillot,F. de Geuser,Gérald da Costa,D. Blavette Journal of Microscopy, 2004, 216 (3), pp.234--240. ⟨10.1111/j.0022-2720.2004.01413.x⟩ Article dans une revue hal-01928905v1
A new step towards the lattice reconstruction in 3DAP François Vurpillot,Ludovic Renaud,D. Blavette Ultramicroscopy, 2003, 95, pp.223--229. ⟨10.1016/S0304-3991(02)00320-0⟩ Article dans une revue istex hal-01928911v1
A new approach to the interpretation of atom probe field-ion microscopy images François Vurpillot,A. Bostel,D. Blavette Ultramicroscopy, 2001, 89 (1-3), pp.137--144. ⟨10.1016/S0304-3991(01)00097-3⟩ Article dans une revue istex hal-01928921v1
A model accounting for spatial overlaps in 3D atom-probe microscopy D. Blavette,François Vurpillot,Philippe Pareige,A. Menand Ultramicroscopy, 2001, 89 (1-3), pp.145--153. ⟨10.1016/S0304-3991(01)00120-6⟩ Article dans une revue istex hal-01928919v1
Structural analyses in three-dimensional atom probe: A Fourier transform approach François Vurpillot,Gérald da Costa,A. Menand,D. Blavette Journal of Microscopy, 2001, 203 (3), pp.295--302. ⟨10.1046/j.1365-2818.2001.00923.x⟩ Article dans une revue hal-01928923v1
The spatial resolution of 3D atom probe in the investigation of single-phase materials François Vurpillot,A. Bostel,E. Cadel,D. Blavette Ultramicroscopy, 2000, 84 (3-4), pp.213--224. ⟨10.1016/S0304-3991(00)00035-8⟩ Article dans une revue istex hal-01928928v1
Trajectory overlaps and local magnification in three-dimensional atom probe François Vurpillot,A. Bostel,D. Blavette Applied Physics Letters, 2000, 76 (21), pp.3127--3129. ⟨10.1063/1.126545⟩ Article dans une revue hal-01928929v1
Trajectories of field emitted ions in 3D atom-probe François Vurpillot,A. Bostel,A. Menand,D. Blavette European Physical Journal: Applied Physics, 1999, 6 (2), pp.217--221. ⟨10.1051/epjap:1999173⟩ Article dans une revue istex hal-01928938v1
The shape of field emitters and the ion trajectories in three- dimensional atom probes François Vurpillot,A. Bostel,D. Blavette Journal of Microscopy, 1999, 196 (3), pp.332--336. ⟨10.1046/j.1365-2818.1999.00637.x⟩ Article dans une revue hal-01928937v1

Communication dans un congrès (23)

A High Kinetic Energy Atom Probe Design to Improve Instrument Performances in Voltage Pulse Mode François Vurpillot,Antoine Normand,Matin Brault,Sylvain Nulli,Gérald da Costaet al. Microscopy and Microanalysis, Jul 2024, Cleveland, United States. ⟨10.1093/mam/ozae044.041⟩ Communication dans un congrès hal-04734921v1
Characterization of a High Voltage and High Frequency pulse generator configuration for Atom Probe Loïc Rousseau,Antoine Normand,Tehrani Kambiz,François Vurpillot 2020 IEEE 15th International Conference of System of Systems Engineering (SoSE), Jun 2020, Budapest, France. pp.193-198, ⟨10.1109/SoSE50414.2020.9130486⟩ Communication dans un congrès hal-02889710v1
Design of A Multistage Marx Generator topology based on SiC-MOSFET Device for Atomic Probe Tomography Applications Kambiz Tehrani,Yunbi Liu,Loic Rousseau,Antoine Normand,François Vurpillot 2020 IEEE 15th International Conference of System of Systems Engineering (SoSE), Jun 2020, Budapest, Hungary. pp.000423-000428, ⟨10.1109/SoSE50414.2020.9130521⟩ Communication dans un congrès hal-02964346v1
Design of A Multistage Marx Generator topology based on SiC-MOSFET Device for Atomic Probe Tomography Applications Kambiz Tehrani,Yunbi Liu,Loïc Rousseau,Antoine Normand,François Vurpillot 2020 IEEE 15th International Conference of System of Systems Engineering (SoSE), Jun 2020, Budapest, France. pp.000423-000428, ⟨10.1109/SoSE50414.2020.9130521⟩ Communication dans un congrès hal-02889711v1
Revisiting Field Ion Microscopy B. Gault,M. Dagan,S. Katnagallu,F. de Geuser,François Vurpillotet al. TMS conference, 2017, San Diego, United States Communication dans un congrès hal-01838871v1
Analysis of transient electric-field emitted by atom-probe tomography electrode Z. Xu,Y. Liu,B. Ravelo,O. Maurice,L. Zhaoet al. 2017 International Symposium on Electromagnetic Compatibility (EMC EUROPE), Sep 2017, Angers, France. ⟨10.1109/emceurope.2017.8094618⟩ Communication dans un congrès hal-01765924v1
Correlative Investigations by HAADF-STEM and Atom Probe Tomography Williams Lefebvre,Florian Moyon,Antoine Normand,Nicolas Rolland,Ivan Blumet al. European Microscopy Congress, Aug 2016, Lyon, France. pp.775-776, ⟨10.1002/9783527808465.EMC2016.8364⟩ Communication dans un congrès hal-01954243v1
RF transient pulse signal integrity with ns-duration for atom-probe tomography Lu Zhao,A. Delamare,Antoine Normand,Fabien Delaroche,O. Latryet al. 2015 IEEE Radio and Antenna Days of the Indian Ocean (RADIO), Sep 2015, Belle Mare, France. pp.1-2, ⟨10.1109/RADIO.2015.7323403⟩ Communication dans un congrès hal-02107624v1
Asymmetrical PCB Interconnect Tree Modelling with Coupling Effect B. Ravelo,François Vurpillot,A K Jastrzebski EMC Europe 2014, Sep 2014, Gothenburg, Sweden Communication dans un congrès hal-02485771v1
Atom probe tomography: An imaging tool at the atomic scale using ltrafast laser pulses Bernard Deconihout,François Vurpillot,Gérald da Costa,Jonathan Houard,Philippe Pareigeet al. CLEO: Applications and Technology, CLEO_AT 2013, 2013, Unknown, Unknown Region Communication dans un congrès hal-01928864v1
Numerical study of femtosecond laser-assisted atom probe tomography Elena Silaeva,N. Shcheblanov,Tatiana Itina,Angela Vella,N. Sévelin-Radiguetet al. 11th International Conference on Laser Ablation, Nov 2011, Playa del Carmen, Mexico. pp.133 Communication dans un congrès ujm-00710834v1
Methods for the study of clustering and precipitation in Al-based alloys by APT Williams Lefebvre,François Vurpillot,M. Torsaeter,F. de Geuser International Conference on Aluminium Alloys (ICAA 12), 2010, Yokohama, Japan Communication dans un congrès hal-01838921v1
Modeling artifacts in the analysis of test semiconductor structures in atom probe tomography François Vurpillot,M. Gruber,S. Duguay,E. Cadel,Bernard Deconihout AIP Conference Proceedings, 2009, Unknown, Unknown Region. pp.175--180, ⟨10.1063/1.3251216⟩ Communication dans un congrès hal-01929146v1
Toward a laser assisted wide-angle tomographic atom-probe Bernard Deconihout,François Vurpillot,B. Gault,Gérald da Costa,M. Bouetet al. Surface and Interface Analysis, 2007, Unknown, Unknown Region. pp.278--282, ⟨10.1002/sia.2491⟩ Communication dans un congrès istex hal-01928893v1
Analyse d'une multicouche magnétostrictive TbCo2/Fe par sonde atomique tomographique assistée par laser A. Grenier,E. Cadel,F. Vurpillot,R. Larde,Nicolas Tiercelinet al. 10èmes Journées de la Matière Condensée, JMC10, 2006, Toulouse, France Communication dans un congrès hal-00241168v1
Investigation of TbCo2Fe magnetostrictive multilayers by laser assisted tomographic atom probe (LATAP) A. Grenier,E. Cadel,F. Vurpillot,R. Iarde,Nicolas Tiercelinet al. 2006, pp.187 Communication dans un congrès hal-00152962v1
Atom probe tomography study of homogeneous and heterogeneous precipitation of niobium carbides in a model ferritic steel Frédéric Danoix,E. Bémont,Philippe Maugis,François Vurpillot,D. Blavette IVNC and IFES 2006 - Technical Digest - l9th International Vacuum Nanoelectronics Conference and 50th International Field Emission Symposium, 2006, Unknown, Unknown Region. pp.91, ⟨10.1109/IVNC.2006.335372⟩ Communication dans un congrès hal-01928902v1
Laser atom probe tomography: Some applications D. Blavette,E. Cadel,Dominique Mangelinck,K. Hoummada,Rodrigue Lardéet al. IVNC and IFES 2006 - Technical Digest - l9th International Vacuum Nanoelectronics Conference and 50th International Field Emission Symposium, 2006, Unknown, Unknown Region. pp.61--62, ⟨10.1109/IVNC.2006.335352⟩ Communication dans un congrès hal-01928901v1
The tomographic atom probe: Salient results and recent breakthroughs A. Menand,Bernard Deconihout,P. Pareige,François Vurpillot,D. Blavette Microscopy and Microanalysis, 2005, Unknown, Unknown Region. pp.96--97, ⟨10.1017/S1431927605501545⟩ Communication dans un congrès hal-01928903v1
Modeling image distortions in 3DAP François Vurpillot,A. Cerezo,D. Blavette,D. J. Larson Microscopy and Microanalysis, 2004, Unknown, Unknown Region. pp.384--390, ⟨10.1017/S1431927604040486⟩ Communication dans un congrès hal-01928907v1
An improved reconstruction procedure for the correction of local magnification effects in 3D Atom Probe Frederic de Geuser,W. Lefebvre,Frédéric Danoix,François Vurpillot,B. Forbordet al. 49th International Field Emission Symposium (IFES), 2004, Graz, Austria Communication dans un congrès hal-01838942v1
Local magnification in 3DAP Didier Blavette,François Vurpillot,Frederic de Geuser,Emilie Bémont 49th International Field Emission Symposium (IFES), 2004, Graz, Austria Communication dans un congrès hal-01838941v1
3D atom probe: Chemical analysis with (near) atomic resolution Frédéric Danoix,François Vurpillot,Williams Lefebvre,D. Blavette Microscopy and Microanalysis, 2003, Unknown, Unknown Region. pp.568--569 Communication dans un congrès hal-01928912v1

Poster de conférence (2)

Why do We Need a High Performance Position Sensitive Detector in Atom Probe Tomography? François Vurpillot,Gérald da Costa,F. de Geuser,B. Gault,Bernard Deconihout 50th International Field Emission Symposium (IFES), 2006, Guilin, China. 2006 Poster de conférence hal-01838932v1
Composition measurements in 3DAP: a Bayesian approach François Vurpillot,Alain Bostel,Frederic de Geuser,Bernard Deconihout 49th International Field Emission Symposium (IFES), 2004, Graz, Austria. 2004 Poster de conférence hal-01838939v1

Chapitre d'ouvrage (4)

Time-of-Flight Mass Spectrometry and Composition Measurements Cristelle Pareige,W. Lefebvre-Ulrikson,François Vurpillot,Xavier Sauvage Atom Probe Tomography, Elsevier, pp.123-154, 2016, 978-0-12-804647-0. ⟨10.1016/B978-0-12-804647-0.00005-X⟩ Chapitre d'ouvrage hal-01954224v1
Basics of Field Ion Microscopy Frédéric Danoix,François Vurpillot Atom Probe Tomography, Elsevier, pp.73-95, 2016, 978-0-12-804647-0. ⟨10.1016/B978-0-12-804647-0.00003-6⟩ Chapitre d'ouvrage hal-01954245v1
Chapter Seven - Three-Dimensional Reconstruction in Atom Probe Tomography: Basics and Advanced Approaches François Vurpillot Atom Probe Tomography Put Theory into practice, Elsevier, pp.183-249, 2016, ⟨10.1016/B978-0-12-804647-0.00007-3⟩ Chapitre d'ouvrage hal-02107614v1
Field Ion Emission Mechanisms François Vurpillot Atom Probe Tomography Put Theory Into Practice, Elsevier, pp.17-72, 2016, ⟨10.1016/B978-0-12-804647-0.00002-4⟩ Chapitre d'ouvrage hal-02107609v1

Pré-publication, Document de travail (7)

Compositional Metrology of Atom Probe Applied to non-Metallic Materials Enrico Di Russo,François Vurpillot,Lorenzo Rigutti 2026 Pré-publication, Document de travail hal-05533361v1
Determination of electric field in the vicinity of polarized atom probe tomography specimens using scanning transmission electron microscopy Mohammed Ilhami,Juan Macchi,Celia Castro,Gérald da Costa,François Vurpillotet al. 2025 Pré-publication, Document de travail hal-05388042v1
Exploring mechanisms leading to composition errors in monazite (CePO4) analysed with atom probe tomography Tom Veret,Fabien Delaroche,Ivan Blum,Jonathan Houard,Benjamin Klaeset al. 2026 Pré-publication, Document de travail hal-05546893v1
Crystallographic dependence of Field Evaporation Energy Barrier in metals using Field Evaporation Energy Loss Spectroscopy mapping François Vurpillot,C. Hatzoglou,Benjamin Klaes,Loic Rousseau,Jean-Baptiste Mailletet al. 2024 Pré-publication, Document de travail hal-04530255v1
Bringing Atom Probe Tomography to Transmission Electron Microscopes Gérald da Costa,Celia Castro,Antoine Normand,Charly Vaudolon,Aidar Zakirovet al. 2024 Pré-publication, Document de travail hal-04734951v1
Reflections on the spatial performance of atom probe tomography in the analysis of atomic neighbourhoods Baptiste Gault,Benjamin Klaes,Felipe F. Morgado,Christoph Freysoldt,Yue Liet al. 2021 Pré-publication, Document de travail hal-03474777v1
Numeric modeling of synchronous laser pulsing and voltage pulsing field evaporation Lu Zhao,Antoine Normand,Jonathan Houard,Ivan Blum,Fabien Delarocheet al. 2019 Pré-publication, Document de travail hal-02127790v1