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Hervé Folliot
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- herve-folliot
- IdRef : 13913266X
- 0000-0002-1392-4865
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Analysis by high-resolution electron microscopy of elastic strain in thick InAs layers embedded in Ga0.47In0.53As buffers on InP(0 0 1) substrateActa Materialia, 2010, 58 (9), pp.3238. ⟨10.1016/j.actamat.2010.01.047⟩
Article dans une revue
hal-00485656v1
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