Jean-Marc Galliere

Présentation

Publications

Article dans une revue (16)

Cost-Effective Analytical Models of Resistive Opens Defects in FinFET Technology Gustavo Aguirre,Freddy Forero,Victor Champac,Michel Renovell,Florence Azaïset al. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2025, 33 (3), pp.841-852. ⟨10.1109/TVLSI.2024.3479068⟩ Article dans une revue lirmm-04796404v1
Analytical Models for the Evaluation of Resistive Short Defect Detectability in Presence of Process Variations: Application to 28nm Bulk and FDSOI Technologies Amit Karel,Florence Azaïs,Mariane Comte,Jean-Marc J.-M. Galliere,Michel Renovell Journal of Electronic Testing: : Theory and Applications, 2019, 35 (1), pp.59-75. ⟨10.1007/s10836-019-05776-1⟩ Article dans une revue lirmm-02075690v1
Detectability Challenges of Bridge Defects in FinFET Based Logic Cells Freddy Forero,Jean-Marc J.-M. Galliere,Michel Renovell,Victor Champac Journal of Electronic Testing: : Theory and Applications, 2018, 34 (2), pp.123-134. ⟨10.1007/s10836-018-5714-0⟩ Article dans une revue lirmm-03109355v1
Influence of Body-Biasing, Supply Voltage, and Temperature on the Detection of Resistive Short Defects in FDSOI Technology Amit Karel,Mariane Comte,Jean-Marc J.-M. Galliere,Florence Azaïs,Michel Renovell IEEE Transactions on Nanotechnology, 2017, 16 (3), pp.417-430. ⟨10.1109/TNANO.2017.2664895⟩ Article dans une revue hal-01709588v1
Resistive Bridging Defect Detection in Bulk, FDSOI and FinFET Technologies Amit Karel,Mariane Comte,Jean-Marc J.-M. Galliere,Florence Azaïs,Michel Renovell Journal of Electronic Testing: : Theory and Applications, 2017, 33 (4), pp.515-527. ⟨10.1007/s10836-017-5674-9⟩ Article dans une revue hal-01709587v1
Testing for Gate Oxide Short Defects using the Detectability Interval Paradigm Jean-Marc J.-M. Galliere,Florence Azaïs,Mariane Comte,Michel Renovell Information Technology, 2014, 56 (4), pp.173-181. ⟨10.1515/itit-2013-1040⟩ Article dans une revue hal-01167054v1
A Silicon Diode-Based Detector for Investigations of Atmospheric Radiation Frédéric Wrobel,Jean-Roch Vaillé,Denis Pantel,Luigi Dilillo,Jean-Marc J.-M. Galliereet al. IEEE Transactions on Nuclear Science, 2013, 60 (5), pp.3603-3608. ⟨10.1109/TNS.2013.2264957⟩ Article dans une revue lirmm-01234419v1
Proton Flux Anisotropy in the Atmosphere: Experiment and Modeling Frédéric Wrobel,Jean-Roch Vaillé,Denis Pantel,Luigi Dilillo,Jean-Marc J.-M. Galliereet al. IEEE Transactions on Nuclear Science, 2013, 60 (4), pp.2386-2391. ⟨10.1109/TNS.2013.2257847⟩ Article dans une revue lirmm-01234425v1
Embedded silicon detector to investigate the natural radiative environment Denis Pantel,Jean-Roch Vaillé,Frédéric Wrobel,Luigi Dilillo,Jean-Marc J.-M. Galliereet al. Journal of Instrumentation, 2012, 7 (5), pp.1-11. ⟨10.1088/1748-0221/7/05/P05007⟩ Article dans une revue lirmm-00805011v1
Neutron-Induced Multiple Bit Upsets on Two Commercial SRAMs Under Dynamic-Stress Paolo Rech,Jean-Marc J.-M. Galliere,Patrick Girard,Alessio Griffoni,Jérôme Bochet al. IEEE Transactions on Nuclear Science, 2012, 59 (4), pp.893-899. ⟨10.1109/TNS.2012.2187218⟩ Article dans une revue lirmm-00805031v1
Impact of Resistive-Open Defects on SRAM Error Rate Induced by Alpha Particles and Neutrons Paolo Rech,Jean-Marc J.-M. Galliere,Patrick Girard,Frédéric Wrobel,Frédéric Saignéet al. IEEE Transactions on Nuclear Science, 2011, 58 (3), pp.855-861. ⟨10.1109/TNS.2011.2123114⟩ Article dans une revue lirmm-00805046v1
Experimental Characterization of Atmospheric Radiation Environment with Stratospheric Balloon Frédéric Wrobel,Jean-Roch Vaillé,Denis Pantel,Luigi Dilillo,Paolo Rechet al. IEEE Transactions on Nuclear Science, 2011, 58 (3), pp.945-951. ⟨10.1109/TNS.2011.2136359⟩ Article dans une revue lirmm-00805045v1
Delay Testing Viability of Gate Oxide Short Defect Jean-Marc J.-M. Galliere,Michel Renovell,Florence Azaïs,Yves Bertrand Journal of Computer Science and Technology, 2005, 20 (2), pp.195-200. ⟨10.1007/s11390-005-0195-x⟩ Article dans une revue istex lirmm-00105323v1
Viability of a Delay Testing of Gate Oxide Short Transistors Jean-Marc J.-M. Galliere,Michel Renovell,Florence Azaïs,Yves Bertrand Journal of Computer Science and Technology, 2005, 20 (2), pp.6. ⟨10.1007/s11390-005-0195-x⟩ Article dans une revue istex lirmm-00370370v1
A Compact DC Model of Gate Oxide Short Defect Rachid Bouchakour,Jean-Michel Portal,Jean-Marc J.-M. Galliere,Florence Azaïs,Yves Bertrandet al. Microelectronic Engineering, 2004, 72 (1-4), pp.140-148. ⟨10.1016/j.mee.2003.12.051⟩ Article dans une revue istex lirmm-00108564v1
Modeling the Random Parameter Effects in a Non-Split Model of Gate Oxide Short Michel Renovell,Jean-Marc J.-M. Galliere,Florence Azaïs,Yves Bertrand Journal of Electronic Testing: : Theory and Applications, 2003, 19 (4), pp. 377-386. ⟨10.1023/A:1024683708105⟩ Article dans une revue istex lirmm-00269754v1

Communication dans un congrès (43)

A better practice for Body Biasing Injection Geoffrey Chancel,Jean-Marc J.-M. Galliere,Philippe Maurine FDTC 2023 - Workshop on Fault Detection and Tolerance in Cryptography, Sep 2023, Prague, Czech Republic. pp.48-59, ⟨10.1109/FDTC60478.2023.00014⟩ Communication dans un congrès lirmm-04703372v1
Body Biasing Injection: To Thin or Not to Thin the Substrate? Geoffrey Chancel,Jean-Marc J.-M. Galliere,Philippe Maurine COSADE 2022 - 13th International Workshop on Constructive Side-Channel Analysis and Secure Design, Apr 2022, Leuwen, Belgium. pp.125-139, ⟨10.1007/978-3-030-99766-3_6⟩ Communication dans un congrès lirmm-04703379v1
Body Biasing Injection: Impact of substrate types on the induced disturbancesƒ Geoffrey Chancel,Jean-Marc J.-M. Galliere,Philippe Maurine FDTC 2022 - Workshop on Fault Detection and Tolerance in Cryptography, Sep 2022, Virtual, Italy. pp.50-60, ⟨10.1109/FDTC57191.2022.00015⟩ Communication dans un congrès lirmm-04703375v1
Iterative Method for Performance Prediction Improvement of Integrated Circuits Gwenaël Chaillou,Philippe Maurine,Jean-Marc J.-M. Galliere,Nadine Azemard DCIS 2021 - 36th Conference on Design of Circuits and Integrated Systems, Nov 2021, Vila do Conde, Portugal. pp.1-5, ⟨10.1109/DCIS53048.2021.9666182⟩ Communication dans un congrès lirmm-03710383v1
On the scaling of EMFI probes Julien Toulemont,Geoffrey Chancel,Jean-Marc J.-M. Galliere,Frédérick Mailly,Pascal Nouetet al. FDTC 2021 - Workshop on Fault Detection and Tolerance in Cryptography, Sep 2021, Milan, Italy. pp.67-73, ⟨10.1109/FDTC53659.2021.00019⟩ Communication dans un congrès lirmm-03476820v1
Combined analysis of supply voltage and body-bias voltage for energy management Rida Kheirallah,Jean-Marc J.-M. Galliere,Nadine Azemard,Gilles R. Ducharme PATMOS: Power And Timing Modeling, Optimization and Simulation, Jul 2018, Platja d’Aro, Spain. pp.88-91, ⟨10.1109/PATMOS.2018.8464159⟩ Communication dans un congrès lirmm-01867809v1
Exploiting Phase Information in Thermal Scans for Stealthy Trojan Detection Maxime Cozzi,Jean-Marc J.-M. Galliere,Philippe Maurine DSD 2018 - 21st Euromicro Conference on Digital System Design, Aug 2018, Prague, Slovakia. pp.573-576, ⟨10.1109/DSD.2018.00100⟩ Communication dans un congrès lirmm-01872499v1
Thermal Scans for Detecting Hardware Trojans Maxime Cozzi,Philippe Maurine,Jean-Marc J.-M. Galliere COSADE 2018 - 9th International Workshop on Constructive Side-Channel Analysis and Secure Design, Apr 2018, Singapour, Singapore. pp.117-132, ⟨10.1007/978-3-319-89641-0_7⟩ Communication dans un congrès lirmm-01823444v1
Impact of process variations on the detectability of resistive short defects: Comparative analysis between 28nm Bulk and FDSOI technologies Amit Karel,Florence Azaïs,Mariane Comte,Jean-Marc J.-M. Galliere,Michel Renovell LATS 2018 - 19th IEEE Latin American Test Symposium, Mar 2018, Sao Paulo, Brazil. ⟨10.1109/LATW.2018.8349696⟩ Communication dans un congrès lirmm-02064921v1
Detection of resistive open and short defects in FDSOI under delay-based test: Optimal VDD and body biasing conditions Amit Karel,Florence Azaïs,Mariane Comte,Jean-Marc J.-M. Galliere,Michel Renovellet al. ETS: European Test Symposium, May 2017, Limassol, Cyprus. ⟨10.1109/ETS.2017.7968208⟩ Communication dans un congrès hal-01709615v1
Comprehensive Study for Detection of Weak Resistive Open and Short Defects in FDSOI Technology Amit Karel,Florence Azaïs,Mariane Comte,Jean-Marc J.-M. Galliere,Michel Renovellet al. ISVLSI: International Symposium on Very Large Scale Integration, Jul 2017, Bochum, Germany. pp.320-325, ⟨10.1109/ISVLSI.2017.63⟩ Communication dans un congrès hal-01709614v1
Analysis of short defects in FinFET based logic cells Freddy Forero,Jean-Marc J.-M. Galliere,Michel Renovell,Víctor H. Champac LATS 2017 - 18th IEEE Latin American Test Symposium, Mar 2017, Bogota, Colombia. ⟨10.1109/LATW.2017.7906755⟩ Communication dans un congrès hal-01709620v1
Comparative study of Bulk, FDSOI and FinFET technologies in presence of a resistive short defect Amit Karel,Mariane Comte,Jean-Marc J.-M. Galliere,Florence Azaïs,Michel Renovell LATS 2016 - 17th Latin-American Test Symposium, Mar 2016, Foz do Iguacu, Brazil. pp.129-134, ⟨10.1109/LATW.2016.7483352⟩ Communication dans un congrès lirmm-01374300v1
Impact of VT and Body-Biasing on Resistive short detection in 28nm UTBB FDSOI – LVT and RVT configurations Amit Karel,Mariane Comte,Jean-Marc J.-M. Galliere,Florence Azaïs,Michel Renovell ISVLSI: International Symposium on Very Large Scale Integration, Jul 2016, Pittsburgh, PA, United States. pp.164-169, ⟨10.1109/ISVLSI.2016.102⟩ Communication dans un congrès lirmm-01374292v1
Statistical Energy Study for 28nm FDSOI Devices Rida Kheirallah,Jean-Marc J.-M. Galliere,Aida Todri-Sanial,Gilles R. Ducharme,Nadine Azemard EuroSimE: Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, Apr 2015, Budapest, Hungary. ⟨10.1109/EuroSimE.2015.7103149⟩ Communication dans un congrès lirmm-01168602v1
A toolkit to demystify CMOS Active Pixel Sensors Jean-Marc J.-M. Galliere,Jérôme Boch MSE: Microelectronic Systems Education, Jun 2013, Austin, TX, United States. ⟨10.1109/MSE.2013.6566696⟩ Communication dans un congrès hal-01709627v1
A Silicon Diode Based Detector for the Natural Radiative Environment Measurement in Altitude Denis Pantel,Jean-Roch Vaillé,Frédéric Wrobel,Luigi Dilillo,Jean-Marc J.-M. Galliereet al. IEEE (Nuclear Plasma Society) Real Time Conference, Jun 2012, Berkeley, CA, United States. pp.1-6, ⟨10.1109/RTC.2012.6418104⟩ Communication dans un congrès lirmm-00805169v1
Proton Flux Anisotropy in the Atmosphere: Experiment and Modeling Frédéric Wrobel,Jean-Roch Vaillé,Denis Pantel,Luigi Dilillo,Jean-Marc J.-M. Galliereet al. RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2012, Biarritz, France. pp.1-4 Communication dans un congrès lirmm-00805150v1
Dynamic-Stress Neutrons Test of Commercial SRAMs Paolo Rech,Jean-Marc J.-M. Galliere,Patrick Girard,Frédéric Wrobel,Frédéric Saignéet al. IEEE Nuclear and Space Radiation Effects Conference, Jul 2012, Las Vegas, NV, United States. pp.1-4 Communication dans un congrès lirmm-00805349v1
Neutron-Induced Multiple Bit Upsets on Dynamically-Stressed Commercial SRAM Arrays Paolo Rech,Jean-Marc J.-M. Galliere,Patrick Girard,Alessio Griffoni,Frédéric Wrobelet al. RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2011, Seville, Spain. pp.274-280, ⟨10.1109/RADECS.2011.6131396⟩ Communication dans un congrès lirmm-00805314v1
Versatile March Test Generator for Hands-on Memory Testing Laboratory Jean-Marc J.-M. Galliere,Luigi Dilillo MSE: Microelectronic Systems Education, Jun 2011, San Diego, CA, United States. pp.41-42, ⟨10.1109/MSE.2011.5937088⟩ Communication dans un congrès lirmm-00805300v1
Neutron Detection in Atmospheric Environment through Static and Dynamic SRAM-Based Test Bench Luigi Dilillo,Paolo Rech,Jean-Marc J.-M. Galliere,Patrick Girard,Frédéric Wrobelet al. IEEE Latin American test Workshop, Mar 2011, Porto de Galinhas, Brazil. pp.1-6 Communication dans un congrès lirmm-00805120v1
Impact of Resistive-Open Defects on SRAM sensitivity to Soft Errors Paolo Rech,Jean-Marc J.-M. Galliere,Patrick Girard,Frédéric Wrobel,Frédéric Saignéet al. RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2010, Langenfeld, Austria Communication dans un congrès lirmm-00566847v1
Neutron Detection through an SRAM-Based Test Bench Luigi Dilillo,Frédéric Wrobel,Jean-Marc J.-M. Galliere,Frédéric Saigné IWASI'09: International Workshop On Advances in Sensors and Interfaces, Jun 2009, Trani, Italy. pp.64-69, ⟨10.1109/IWASI.2009.5184769⟩ Communication dans un congrès lirmm-00438842v1
Influence of Gate Oxide Short Defects on the Stability of Minimal Sized SRAM Core-Cell by Applying Non-Split Models Jean-Marc J.-M. Galliere,Florence Azaïs,Michel Renovell,Luigi Dilillo DTIS: Design and Technology of Integrated Systems in Nanoscale Era, 2009, Cairo, Egypt. pp.225-229 Communication dans un congrès lirmm-00370798v1
Use of BOBST for the Detection of Neutrons Induced Errors in SRAM Luigi Dilillo,Frédéric Wrobel,Jean-Marc J.-M. Galliere,F. Saigné IWASI: International Workshop on Advances in Sensors and Interfaces, Jun 2009, Trani, Italy Communication dans un congrès hal-01957246v1
A mixed TCAD/Electrical simulation laboratory to open up the microelectronics teaching Jean-Marc J.-M. Galliere,Jérôme Boch MSE: Microelectronic Systems Education, Jul 2009, San Francisco, United States. ⟨10.1109/MSE.2009.5270836⟩ Communication dans un congrès hal-01709636v1
A 2-D VHDL-AMS Model for Disk-Shape Piezoelectric Transducers Jean-Marc J.-M. Galliere,Philippe Papet,Laurent Latorre BMAS 2008 - IEEE International Workshop on Behavioral Modeling and Simulation, Sep 2008, San Jose, United States. pp.148-152, ⟨10.1109/BMAS.2008.4751257⟩ Communication dans un congrès lirmm-00370390v1
Stream Manager, Easy CAD Tools Switching in Academic Context Jean-Marc J.-M. Galliere,Guy Cathébras MSE: Microelectronic Systems Education, Jun 2007, San Diego, United States. ⟨10.1109/MSE.2007.77⟩ Communication dans un congrès hal-01709640v1
Programmable Analog Array in Control-Systems Laboratory Jean-Marc J.-M. Galliere IEEE Mediterranean Conference on Control and Automation, Jun 2007, Athens, Greece, pp.5 Communication dans un congrès lirmm-00370394v1
A Unified Electrical SPICE Model for Piezoelectric Transducers Jean-Marc J.-M. Galliere,Philippe Papet,Laurent Latorre BMAS: Behavioral Modeling and Simulation, Sep 2007, San Jose, SA, United States. ⟨10.1109/BMAS.2007.4437540⟩ Communication dans un congrès lirmm-00370388v1
Stream Manager, Easy CAD Tools Switching in Academic Context Jean-Marc J.-M. Galliere,Guy Cathébras IEEE Conference on Microelectronic Systems Education, Jun 2007, San Diego, USA, pp.2 Communication dans un congrès lirmm-00370396v1
Stream Manager: Une Assistance à la Gestion des Projets Microélectroniques Guy Cathébras,Jean-Marc J.-M. Galliere CNFM'06 : 9èmes Journées Pédagogiques, Nov 2006, Saint-Malo (France), pp.5-8 Communication dans un congrès lirmm-00117324v1
Stream Manager, an Answer to Academic Project Policy Jean-Marc J.-M. Galliere,Guy Cathébras AQTR: Automation, Quality and Testing, Robotics, May 2006, Cluj-Napoca, Romania. ⟨10.1109/AQTR.2006.254614⟩ Communication dans un congrès hal-01709644v1
Resistive Bridge Fault Model Evolution From Conventional to Ultra Deep Submicron Technologies I. Polian,Kundu Sandip,Jean-Marc J.-M. Galliere,P. Engelke,Michel Renovellet al. VTS'05: 23rd IEEE VLSI Test Symposium, May 2005, Palm Springs, CA (USA), pp.343-348 Communication dans un congrès lirmm-00105997v1
Impact of Gate Oxide Reduction Failure on Analog Applications: Example of the Current Mirror S. Bernardini,P. Masson,Jean-Michel Portal,Jean-Marc J.-M. Galliere,Michel Renovell LATW: Latin American Test Workshop, Mar 2004, Cartagena, Spain. pp.12-17 Communication dans un congrès lirmm-00108659v1
Delay Testing of MOS Transistor with Gate Oxide Short Michel Renovell,Jean-Marc J.-M. Galliere,Florence Azaïs,Yves Bertrand ATS: Asian Test Symposium, Nov 2003, Xian, China. pp.168-173 Communication dans un congrès lirmm-00269641v1
GOSMOS: A Gate Oxide Short Defect Embedded in a MOS Compact Model Michel Renovell,Jean-Marc J.-M. Galliere,Florence Azaïs,Yves Bertrand,Jean-Michel Portalet al. LATW: Latin American Test Workshop, Feb 2003, Natal, Brazil Communication dans un congrès lirmm-00269604v1
Low Voltage Testing of Gate Oxide Short in CMOS Technology Michel Renovell,Jean-Marc J.-M. Galliere,Florence Azaïs,Yves Bertrand DDECS: Design and Diagnostics of Electronic Circuits and Systems, 2002, Brno, Czech Republic. pp.168-174 Communication dans un congrès lirmm-00268526v1
A Non-Split Model for Realistic Gate Oxide Short in CMOS Technology Michel Renovell,Jean-Marc J.-M. Galliere,Florence Azaïs,Yves Bertrand DCIS: Design of Circuits and Integrated Systems, 2002, Santander, Spain. pp.197-204 Communication dans un congrès lirmm-00268432v1
Non-Linear and Non-Split Transistor MOS Model for Gate Oxyde Short Michel Renovell,Jean-Marc J.-M. Galliere,Florence Azaïs,Yves Bertrand DBT: Defect Based Testing, Apr 2002, Monterey, CA, United States. pp.11-16 Communication dans un congrès lirmm-00269333v1
Modeling Gate Oxide Short Defects in CMOS Minimum Transistors Michel Renovell,Jean-Marc J.-M. Galliere,Florence Azaïs,Yves Bertrand ETW: European Test Workshop, 2002, Corfu, Greece. pp.15-20 Communication dans un congrès lirmm-00268527v1
Boolean and Current Detection of MOS Transistor with Gate Oxide Short Michel Renovell,Jean-Marc J.-M. Galliere,Florence Azaïs,Yves Bertrand IEEE International Test Conference, Oct 2001, Baltimore, USA, pp.10 Communication dans un congrès lirmm-00370400v1

Poster de conférence (2)

Méthode Itérative pour l’Amélioration de la Prédiction des Performances des Circuits Intégrés Gwenaël Chaillou,Philippe Maurine,Jean-Marc J.-M. Galliere,Nadine Azemard 15e Colloque National du GDR SoC², Jun 2021, Rennes, France Poster de conférence lirmm-03358670v1
A Roaming Memory Test Bench for Detecting Particle Induced SEUs Jean-Marc J.-M. Galliere,Paolo Rech,Patrick Girard,Luigi Dilillo ITC 2010 - International Test Conference, Nov 2010, Austin, TX, United States. 2010, ⟨10.1109/TEST.2010.5699302⟩ Poster de conférence lirmm-00537879v1

Pré-publication, Document de travail (1)

A Simple Protocol to Compare EMFI platforms Julien Toulemont,Nasr-Eddine Ouldei-Tebina,Jean-Marc J.-M. Galliere,Pascal Nouet,Eric Bourbaoet al. 2020 Pré-publication, Document de travail lirmm-03626807v1

Rapport (1)

A Compact Model for Electrical Simulation of MOS Transistor with Gate Oxide Short Defect Michel Renovell,Jean-Marc J.-M. Galliere,Florence Azaïs,Yves Bertrand,Jean-Michel Portal [Research Report] 04080, Lirmm, University of Montpellier. 2004 Rapport (rapport de recherche) lirmm-00109221v1