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Jean-Marc Routoure
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Identification of Si film traps in p-channel SOI FinFETs using low temperature noise spectroscopySolid-State Electronics, 2015, 112, pp.1-6. ⟨10.1016/j.sse.2015.02.014⟩
Article dans une revue
hal-01196272v1
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Performances under saturation operation of p channel FinFETs on SOI substrates at cryogenic temperatureIEEE/CAS’2014, 2014, Sinaia, Romania. pp181-184, ⟨10.1109/SMICND.2014.6966429⟩
Communication dans un congrès
hal-01196289v1
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