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Jean-Marc Routoure
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Documents
Publications
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Meyer-Neldel parameter as a figure of merit for quality of thin film transistor active layer?Thin Solid Films, 2003, 427, pp.350-354
Article dans une revue
hal-00913090v1
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Meyer-Neldel parameter as a figure of merit for quality of thin film transistor active layerE-MRS 2002, Spring Meeting Poster, Jun 2002, Strasbourg, France
Communication dans un congrès
hal-00958688v1
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