Lila AMMOURA

Publications

Thèse (1)

Test and Reliability of In/Near-Memory Computing Architectures Lila Ammoura Micro and nanotechnologies/Microelectronics. Université de Montpellier, 2024. English. ⟨NNT : 2024UMONS057⟩ Thèse tel-05082759v1

Communication dans un congrès (6)

A Novel March Test Algorithm for Testing 8T SRAM-based IMC Architectures Lila Ammoura,Marie-Lise Flottes,Patrick Girard,Jean-Philippe Noel,Arnaud Virazel DATE 2024 - 27th Design, Automation & Test in Europe Conference & Exhibition, Mar 2024, Valence, Spain. pp.1-6, ⟨10.23919/DATE58400.2024.10546583⟩ Communication dans un congrès hal-04658584v1
Intra-cell Resistive-Open Defect Analysis on a Foundry 8T SRAM-based IMC Architecture Lila Ammoura,Marie-Lise Flottes,Patrick Girard,Jean-Philippe Noël,Arnaud Virazel ETS 2023 - 28th IEEE European Test Symposium, May 2023, Venise, Italy. pp.1-4, ⟨10.1109/ETS56758.2023.10174107⟩ Communication dans un congrès hal-04164663v1
Analysis of Resistive-Open Defects on a Foundry 8T SRAM-based IMC Architecture Lila Ammoura,Marie-Lise Flottes,Patrick Girard,Jean-Philippe Noël,Arnaud Virazel 17e Colloque National du GDR SoC², Jun 2023, Lyon, France Communication dans un congrès lirmm-04565688v1
Analysis of Read Port Short Defects in an 8T SRAM-based IMC Architecture Lila Ammoura,Marie-Lise Flottes,Patrick Girard,Jean-Philippe Noel,Arnaud Virazel 16e Colloque National du GDR SoC², Jun 2022, Strasbourg, France Communication dans un congrès lirmm-03990078v1
Preliminary Defect Analysis of 8T SRAM Cells Used for In-Memory Computing Lila Ammoura,Marie-Lise Flottes,Patrick Girard,Arnaud Virazel 15e Colloque National du GDR SoC², Jun 2021, Rennes, France Communication dans un congrès lirmm-03994467v1
Preliminary Defect Analysis of 8T SRAM Cells for In-Memory Computing Architectures Lila Ammoura,Marie-Lise Flottes,Patrick Girard,Arnaud Virazel DTIS 2021 - 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Jun 2021, Montpellier, France. ⟨10.1109/DTIS53253.2021.9505101⟩ Communication dans un congrès lirmm-03377433v1

Article dans une revue (1)

Analysis of resistive defects on a foundry 8T SRAM-based IMC architecture Lila Ammoura,Marie-Lise Flottes,Patrick Girard,Jean-Philippe Noël,Arnaud Virazel Microelectronics Reliability, 2023, 147, pp.115029. ⟨10.1016/j.microrel.2023.115029⟩ Article dans une revue hal-04129470v1