Luigi Dilillo

Identifiants chercheurs

IdHAL :

luigi-dilillo

ORCID :

0000-0002-1295-2688

IdRef :

18891885X

Présentation

Publications

Article dans une revue (79)

Design and Characterization of a Radiation Tolerant Wireless Physical Layer for Control Applications in CERN Particle Accelerators Antonio Scialdone,Rudy Ferraro,Salvatore Danzeca,Frederic Saigne,Jerome Bochet al. IEEE Transactions on Nuclear Science, 2025, pp.1-1. ⟨10.1109/TNS.2025.3537402⟩ Article dans une revue hal-04928274v1
Implementation and characterization of a fault-tolerant CCSDS 123 hardware accelerator under neutron radiation Wesley Grignani,Douglas A Santos,Maria Kastriotou,Carlo Cazzaniga,Luigi Dililloet al. Microprocessors and Microsystems: Embedded Hardware Design , 2025, 117, pp.105184. ⟨10.1016/j.micpro.2025.105184⟩ Article dans une revue hal-05350791v1
Physical Explanation for the Higher Sensitivity to Ion-Induced Burnout in SiC Schottky Diodes Compared to Si Schottky Diodes C M Marques,A. Michez,F. Wrobel,S. Kuboyama,F. Saignéet al. IEEE Transactions on Nuclear Science, 2025, pp.1-1. ⟨10.1109/TNS.2025.3561917⟩ Article dans une revue hal-05046464v1
Reliability Analysis of Baremetal and FreeRTOS Applications on Microchip PolarFire SoC RISC-V Multiprocessors Using High-Energy Protons André M P Mattos,Douglas A Santos,Luigi Dilillo IEEE Access, 2025, 13, pp.19922 - 19936. ⟨10.1109/access.2024.3524726⟩ Article dans une revue hal-05069554v1
SRAM-based heavy ion beam flux and LET dosimetry Andrea Coronetti,Rubén García-Alía,Luigi Dilillo,Carolina Imianosky,Douglas Almeida dos Santoset al. IEEE Transactions on Nuclear Science, 2025, 72 (8), pp.2458-2465. ⟨10.1109/TNS.2024.3487647⟩ Article dans une revue hal-04715265v1
A Fault-Tolerant CCSDS 123 Hardware Accelerator for Space Applications Wesley Grignani,Felipe Viel,Douglas A Santos,Luigi Dilillo,Douglas R Melo Integration, the VLSI Journal, 2025, 104, pp.102465. ⟨10.1016/j.vlsi.2025.102465⟩ Article dans une revue hal-05151664v1
Standard instrumentation for single-event effect qualification of systems-on-chip: a robust, low-cost, and open-source proposal André M. P. Mattos,Mauricio R Alas,Douglas A. Santos,Luigi Dilillo Journal of Instrumentation, 2025, 20 (06), pp.P06009. ⟨10.1088/1748-0221/20/06/P06009⟩ Article dans une revue hal-05023660v1
Evaluation of a Simplified Modeling Approach for SEE Cross-Section Prediction: A Case Study of SEU on 6T SRAM Cells Cleiton Marques,Frédéric Wrobel,Ygor Aguiar,Alain Michez,Frédéric Saignéet al. Electronics, 2024, 13 (10), pp.1954. ⟨10.3390/electronics13101954⟩ Article dans une revue hal-04607285v1
CRaTeBo: a high-speed, radiation-tolerant and versatile testing platform for FPGA radiation qualification for high-energy particle accelerator applications Antonio Scialdone,Panagiotis Gkountoumis,Rudy Ferraro,Manoel Barros Marin,Luigi Dililloet al. Journal of Instrumentation, 2024, 19 (01), pp.P01012. ⟨10.1088/1748-0221/19/01/P01012⟩ Article dans une revue hal-04412765v1
The CELESTA CubeSat In-Flight Radiation Measurements and their Comparison with Ground Facilities Predictions Andrea Coronetti,Alessandro Zimmaro,Rubén García Alía,Salvatore Danzeca,Alessandro Masiet al. IEEE Transactions on Nuclear Science, In press, ⟨10.1109/TNS.2024.3376749⟩ Article dans une revue hal-04526716v1
A Dependable and Low-Cost CCSDS 123 Hyperspectral Image Compressor Wesley Grignani,Douglas A Santos,Felipe Viel,Luigi Dilillo,Douglas R Melo IEEE Embedded Systems Letters, In press, ⟨10.1109/les.2024.3420934⟩ Article dans une revue hal-04666210v1
Investigation of Single-Event Effects for Space Applications: Instrumentation for In-Depth System Monitoring André Martins Pio de Mattos,Douglas Almeida dos Santos,Lucas Matana Luza,Viyas Gupta,Luigi Dilillo Electronics, 2024, 13 (10), pp.1822. ⟨10.3390/electronics13101822⟩ Article dans une revue hal-04666202v1
Characterization of Single-Event Effects in a Microcontroller with an Artificial Neural Network Accelerator Carolina Imianosky,André Martins Pio de Mattos,Douglas Almeida dos Santos,Douglas Rossi de Melo,Maria Kastriotouet al. Electronics, 2024, 13 (22), ⟨10.3390/electronics13224461⟩ Article dans une revue hal-04811422v1
Investigation on Radiation-Induced Latch-Ups in COTS SRAM Memories On-Board PROBA-V André Martins Pio de Mattos,Douglas Almeida dos Santos,Lucas Matana Luza,Viyas Gupta,Thomas Borelet al. IEEE Transactions on Nuclear Science, 2024, 71 (8), pp.1614-1622. ⟨10.1109/tns.2024.3378668⟩ Article dans une revue hal-04526731v1
Hybrid Hardening Approach for a Fault-Tolerant RISC-V System-on-Chip Douglas Almeida dos Santos,Pablo M. Aviles,André Martins Pio de Mattos,Mario García-Valderas,Luis Entrenaet al. IEEE Transactions on Nuclear Science, In press, ⟨10.1109/tns.2024.3406021⟩ Article dans une revue hal-04666207v1
Enhancement of System Observability During System-Level Radiation Testing Through Total Current Consumption Monitoring Ivan Slipukhin,Andrea Coronetti,Rubén García Alía,Frédéric Saigné,Jérôme Bochet al. IEEE Transactions on Nuclear Science, 2024, 71 (8), pp.1948-1955. ⟨10.1109/TNS.2024.3424201⟩ Article dans une revue hal-04715015v1
Technology Dependence of Stuck Bits and Single-Event Upsets in 110-, 72-, and 63-nm SDRAMs Daniel Söderström,Lucas Matana Luza,André Martins Pio de Mattos,Thierry Gil,Heikki Kettunenet al. IEEE Transactions on Nuclear Science, 2023, 70 (8), pp.1861-1869. ⟨10.1109/TNS.2023.3295435⟩ Article dans une revue hal-04192915v1
Exploring Radiation-Induced Vulnerabilities in RFICs through Traditional RF Metrics Antonio Scialdone,Rudy Ferraro,Luigi Dilillo,Frédéric Saigné,Jérôme Bochet al. IEEE Transactions on Nuclear Science, 2023, 70 (8), pp.2068-2075. ⟨10.1109/TNS.2023.3270206⟩ Article dans une revue hal-04120913v1
A Survey on Deep Learning Resilience Assessment Methodologies Annachiara Ruospo,Ernesto Sanchez,Lucas Matana Luza,Luigi Dilillo,Marcello Traiolaet al. Computer, 2023, 56, pp.57-66. ⟨10.1109/MC.2022.3217841⟩ Article dans une revue lirmm-03834128v1
Enhancing Fault Awareness and Reliability of a Fault-Tolerant RISC-V System-on-Chip Douglas Almeida dos Santos,André Martins Pio de Mattos,Douglas Melo,Luigi Dilillo Electronics, 2023, 12 (12), pp.2557. ⟨10.3390/electronics12122557⟩ Article dans une revue hal-04120525v1
Emulating the Effects of Radiation-Induced Soft-Errors for the Reliability Assessment of Neural Networks Lucas Matana Luza,Annachiara Ruospo,Daniel Soderstrom,Carlo Cazzaniga,Maria Kastriotouet al. IEEE Transactions on Emerging Topics in Computing, 2022, 10 (4), pp.1867-1882. ⟨10.1109/TETC.2021.3116999⟩ Article dans une revue lirmm-03382380v1
A Survey of the RISC-V Architecture Software Support Benjamin William Mezger,Douglas Almeida dos Santos,Luigi Dilillo,Cesar A Zeferino,Douglas Rossi de Melo IEEE Access, 2022, 10, pp.51394-51411. ⟨10.1109/ACCESS.2022.3174125⟩ Article dans une revue lirmm-03737820v1
Neutron-Induced Effects on a Self-Refresh DRAM Lucas Matana Luza,Daniel Söderström,Helmut Puchner,Rubén García Alía,Manon Leticheet al. Microelectronics Reliability, 2022, 128, pp.#114406. ⟨10.1016/j.microrel.2021.114406⟩ Article dans une revue lirmm-03435635v1
Electron-Induced Upsets and Stuck Bits in SDRAMs in the Jovian Environment Daniel Söderström,Lucas Matana Luza,Heikki Kettunen,Arto Javanainen,Wilfrid Faraboliniet al. IEEE Transactions on Nuclear Science, 2021, 68 (5), pp.716-723. ⟨10.1109/TNS.2021.3068186⟩ Article dans une revue lirmm-03358914v1
Reliability analysis of a fault-tolerant RISC-V system-on-chip Douglas Almeida dos Santos,Lucas Matana Luza,Luigi Dilillo,Cesar Albenes Zeferino,Douglas Rossi de Melo Microelectronics Reliability, 2021, 125, pp.#114346. ⟨10.1016/j.microrel.2021.114346⟩ Article dans une revue lirmm-03358839v1
On the evaluation of FPGA radiation benchmarks Gaetan Bricas,Georgios Tsiligiannis,Antoine Touboul,Jérôme Boch,Maria Kastriotouet al. Microelectronics Reliability, 2021, 126, pp.#114276. ⟨10.1016/j.microrel.2021.114276⟩ Article dans une revue lirmm-03382368v1
COTS Optocoupler Radiation Qualification Process for LHC Applications Based on Mixed-Field Irradiations Rudy Ferraro,Gilles Foucard,Angelo Infantino,Luigi Dilillo,Markus Bruggeret al. IEEE Transactions on Nuclear Science, 2020, 67 (7), pp.1395-1403. ⟨10.1109/TNS.2020.2972777⟩ Article dans une revue hal-02911961v1
Maximizing the Inner Resilience of a Network-on-Chip through Router Controllers Design Douglas Rossi de Melo,Cesar A. Zeferino,Luigi Dilillo,Eduardo Augusto Bezerra Sensors, 2019, 19 (24), pp.5416-5439. ⟨10.3390/s19245416⟩ Article dans une revue lirmm-02547726v1
Improvement of the Tolerated Raw Bit Error Rate in NAND Flash-based SSDs with Selective Refresh Emna Farjallah,Jean-Marc Armani,Valentin Gherman,Luigi Dilillo Microelectronics Reliability, 2019, 96, pp.37-45. ⟨10.1016/j.microrel.2019.01.014⟩ Article dans une revue lirmm-02008002v1
Pre-flight qualification test procedure for nanosatellites using sounding rockets Leonardo Kessler Slongo,João Gabriel Reis,Daniel Gaiki,Pedro von Hohendorff Seger,Bruno Vale Barbosa Eitereret al. Acta Astronautica, 2019, 159, pp.564-577. ⟨10.1016/j.actaastro.2019.01.035⟩ Article dans une revue lirmm-02415535v1
Study of the impact of the LHC radiation environments on the Synergistic Displacement Damage and Ionizing Dose Effect on Electronic Components Rudy Ferraro,Salvatore Danzeca,Chiara Cangialosi,Rubén García Alía,Francesco Ceruttiet al. IEEE Transactions on Nuclear Science, 2019, 66 (7), pp.1548-1556. ⟨10.1109/TNS.2019.2902441⟩ Article dans une revue lirmm-02016480v1
Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random Access Memory Alexandre Louis Bosser,Viyas Gupta,Arto Javanainen,Georgios Tsiligiannis,Stephen D. Lalumondiereet al. IEEE Transactions on Nuclear Science, 2018, 65 (8), pp.1708-1714. ⟨10.1109/TNS.2018.2797543⟩ Article dans une revue lirmm-02007922v1
A calculation method to estimate single event upset cross section Frédéric Wrobel,Antoine Touboul,Vincent Pouget,Luigi Dilillo,Jérôme Bochet al. Microelectronics Reliability, 2017, 76-77, pp.644-649. ⟨10.1016/j.microrel.2017.07.056⟩ Article dans une revue hal-01636059v1
Design of a radiation tolerant system for total ionizing dose monitoring using floating gate and RadFET dosimeters Rudy Ferraro,Salvatore Danzeca,Matteo Brucoli,Alessandro Masi,Markus Bruggeret al. Journal of Instrumentation, 2017, 12 (4), pp.#C04007. ⟨10.1088/1748-0221/12/04/C04007⟩ Article dans une revue lirmm-01513884v1
Design for Test and Diagnosis of Power Switches Miroslav Valka,Alberto Bosio,Luigi Dilillo,Patrick Girard,Arnaud Virazelet al. Journal of Circuits, Systems, and Computers, 2016, 25 (3), pp.1640013. ⟨10.1142/S0218126616400132⟩ Article dans une revue lirmm-01272986v1
Proton-Induced Single-Event Degradation in SDRAMs Axel Rodriguez,Frédéric Wrobel,Anne Samaras,Francoise Bezerra,Benjamin Vandeveldeet al. IEEE Transactions on Nuclear Science, 2016, 63 (4), pp.2115-2121. ⟨10.1109/TNS.2016.2551733⟩ Article dans une revue lirmm-01382563v1
The Power Law Shape of Heavy Ions Experimental Cross Section Frédéric Wrobel,Antoine Touboul,Vincent Pouget,Luigi Dilillo,Eric Lorfèvreet al. IEEE Transactions on Nuclear Science, 2016, 64 (1), pp.427-433. ⟨10.1109/TNS.2016.2608004⟩ Article dans une revue lirmm-01382480v1
Methodologies for the Statistical Analysis of Memory Response to Radiation Alexandre Louis Bosser,Viyas Gupta,Georgios Tsiligiannis,Christopher Frost,Ali Mohammad Zadehet al. IEEE Transactions on Nuclear Science, 2016, 63 (4), pp.2122-2128. ⟨10.1109/TNS.2016.2527781⟩ Article dans une revue lirmm-01382508v1
Heavy-Ion Radiation Impact on a 4 Mb FRAM Under Different Test Modes and Conditions Viyas Gupta,Alexandre Louis Bosser,Georgios Tsiligiannis,Ali Mohammad Zadeh,Arto Javanainenet al. IEEE Transactions on Nuclear Science, 2016, 63 (4), pp.2010-2015. ⟨10.1109/TNS.2016.2559943⟩ Article dans une revue lirmm-01382552v1
Soft errors in commercial off-the-shelf static random access memories Luigi Dilillo,Georgios Tsiligiannis,Viyas Gupta,Alexandre Louis Bosser,Frédéric Saignéet al. Semiconductor Science and Technology, 2016, Special Issue on Radiation Effects in Semiconductor Devices, 32 (1), ⟨10.1088/1361-6641/32/1/013006⟩ Article dans une revue lirmm-01434747v1
SEE on Different Layers of Stacked-SRAMs Viyas Gupta,Alexandre Louis Bosser,Georgios Tsiligiannis,Mathias Rousselet,Ali Mohammad Zadehet al. IEEE Transactions on Nuclear Science, 2015, 62 (6), pp.2673-2678. ⟨10.1109/TNS.2015.2496725⟩ Article dans une revue lirmm-01254148v1
Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs Alexandre Louis Bosser,Viyas Gupta,Georgios Tsiligiannis,Arto Javanainen,Heikki Kettunenet al. IEEE Transactions on Nuclear Science, 2015, 62 (6), pp.2620-2626. ⟨10.1109/TNS.2015.2496874⟩ Article dans une revue lirmm-01254157v1
A Complete Resistive-Open Defect Analysis for Thermally Assisted Switching MRAMs João Azevedo,Arnaud Virazel,Alberto Bosio,Luigi Dilillo,Patrick Girardet al. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2014, 22 (11), pp.2326-2335. ⟨10.1109/TVLSI.2013.2294080⟩ Article dans une revue lirmm-01248578v1
Determining Realistic Parameters for the Double Exponential Law that Models Transient Current Pulses Frédéric Wrobel,Luigi Dilillo,Antoine Touboul,Vincent Pouget,Frédéric Saigné IEEE Transactions on Nuclear Science, 2014, 61 (4), pp.1813-1818. ⟨10.1109/TNS.2014.2299762⟩ Article dans une revue lirmm-01234429v1
Dynamic Test Methods for COTS SRAMs Georgios Tsiligiannis,Luigi Dilillo,Viyas Gupta,Alberto Bosio,Patrick Girardet al. IEEE Transactions on Nuclear Science, 2014, 61 (6), pp.3095-3102. ⟨10.1109/TNS.2014.2363123⟩ Article dans une revue lirmm-01234463v1
A New Hybrid Fault-Tolerant Architecture for Digital CMOS Circuits and Systems Ahn Duc Tran,Alberto Bosio,Luigi Dilillo,Patrick Girard,Arnaud Virazelet al. Journal of Electronic Testing: : Theory and Applications, 2014, 30 (4), pp.401-413. ⟨10.1007/s10836-014-5459-3⟩ Article dans une revue lirmm-01272958v1
Evaluating a Radiation Monitor for Mixed-Field Environments based on SRAM Technology Georgios Tsiligiannis,Luigi Dilillo,Alberto Bosio,Patrick Girard,Serge Pravossoudovitchet al. Journal of Instrumentation, 2014, 9 (5), pp.#C05052. ⟨10.1088/1748-0221/9/05/C05052⟩ Article dans une revue lirmm-01234448v1
An SRAM Based Monitor for Mixed-Field Radiation Environments Georgios Tsiligiannis,Luigi Dilillo,Alberto Bosio,Patrick Girard,Serge Pravossoudovitchet al. IEEE Transactions on Nuclear Science, 2014, 61 (4), pp.1663-1670. ⟨10.1109/TNS.2014.2299733⟩ Article dans une revue lirmm-01234441v1
90 nm SRAM Static and Dynamic Mode Real-Time Testing at Concordia Station in Antarctica Georgios Tsiligiannis,Luigi Dilillo,Alberto Bosio,Patrick Girard,Serge Pravossoudovitchet al. IEEE Transactions on Nuclear Science, 2014, 61 (6), pp.3389-3394. ⟨10.1109/TNS.2014.2363120⟩ Article dans une revue hal-04056468v1
Dynamic Compact Model of Self-Referenced Magnetic Tunnel Junction João Azevedo,Arnaud Virazel,Alberto Bosio,Luigi Dilillo,Patrick Girardet al. IEEE Transactions on Electron Devices, 2014, 61 (11), pp.3877-3882. ⟨10.1109/TED.2014.2355418⟩ Article dans une revue lirmm-01272978v1
Intra-Cell Defects Diagnosis Zhenzhou Sun,Alberto Bosio,Luigi Dilillo,Patrick Girard,Serge Pravossoudovitchet al. Journal of Electronic Testing: : Theory and Applications, 2014, 30 (5), pp.541-555. ⟨10.1007/s10836-014-5481-5⟩ Article dans une revue lirmm-01272964v1
On the Test and Mitigation of Malfunctions in Low-Power SRAMs Leonardo B. Zordan,Alberto Bosio,Luigi Dilillo,Patrick Girard,Arnaud Virazelet al. Journal of Electronic Testing: : Theory and Applications, 2014, 30 (5), pp.611-627. ⟨10.1007/s10836-014-5479-z⟩ Article dans une revue lirmm-01238443v1
Gate Voltage Contribution to Neutron-Induced SEB of Trench Gate Fieldstop IGBT Lionel Foro,Antoine Touboul,Alain Michez,Frédéric Wrobel,Paolo Rechet al. IEEE Transactions on Nuclear Science, 2014, 61 (4), pp.1739-1746. ⟨10.1109/TNS.2014.2332813⟩ Article dans une revue lirmm-01237646v1
Globally Constrained Locally Optimized 3-D Power Delivery Networks Aida Todri-Sanial,Sandip Kundu,Patrick Girard,Alberto Bosio,Luigi Dililloet al. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2014, 22 (10), pp.2131-2144. ⟨10.1109/TVLSI.2013.2283800⟩ Article dans une revue lirmm-01255754v1
Heavy Ion SEU Cross Section Calculation Based on Proton Experimental Data, and Vice Versa Frédéric Wrobel,Antoine Touboul,Vincent Pouget,Luigi Dilillo,Robert Ecoffetet al. IEEE Transactions on Nuclear Science, 2014, 61 (6), pp.3564-3571. ⟨10.1109/TNS.2014.2368613⟩ Article dans une revue lirmm-01234461v1
Use of CCD to Detect Terrestrial Cosmic Rays at Ground Level: Altitude vs. Underground Experiments, Modeling and Numerical Monte Carlo Simulation Tarek Saad Saoud,Soilihi Moindjie,Jean-Luc Autran,Daniela Munteanu,Frédéric Wrobelet al. IEEE Transactions on Nuclear Science, 2014, 61 (6), pp.3380-3388. ⟨10.1109/TNS.2014.2365038⟩ Article dans une revue lirmm-01234455v1
Multiple Cell Upset Classification in Commercial SRAMs Georgios Tsiligiannis,Luigi Dilillo,Alberto Bosio,Patrick Girard,Serge Pravossoudovitchet al. IEEE Transactions on Nuclear Science, 2014, 61 (4), pp.1747-1754. ⟨10.1109/TNS.2014.2313742⟩ Article dans une revue lirmm-01234446v1
Uncorrelated Power Supply Noise and Ground Bounce Consideration for Test Pattern Generation Aida Todri-Sanial,Alberto Bosio,Luigi Dilillo,Patrick Girard,Arnaud Virazel IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2013, 21 (5), pp.958-970. ⟨10.1109/TVLSI.2012.2197427⟩ Article dans une revue lirmm-00806774v1
Proton Flux Anisotropy in the Atmosphere: Experiment and Modeling Frédéric Wrobel,Jean-Roch Vaillé,Denis Pantel,Luigi Dilillo,Jean-Marc J.-M. Galliereet al. IEEE Transactions on Nuclear Science, 2013, 60 (4), pp.2386-2391. ⟨10.1109/TNS.2013.2257847⟩ Article dans une revue lirmm-01234425v1
Testing a Commercial MRAM under Neutron and Alpha Radiation in Dynamic Mode Georgios Tsiligiannis,Luigi Dilillo,Alberto Bosio,Patrick Girard,Aida Todri-Sanialet al. IEEE Transactions on Nuclear Science, 2013, 60 (4), pp.2617-2622. ⟨10.1109/TNS.2013.2239311⟩ Article dans une revue lirmm-00805005v1
A Study of Tapered 3-D TSVs for Power and Thermal Integrity Aida Todri-Sanial,Sandip Kundu,Patrick Girard,Alberto Bosio,Luigi Dililloet al. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2013, 21 (2), pp.306-319. ⟨10.1109/TVLSI.2012.2187081⟩ Article dans une revue lirmm-00806776v1
Fast Power Evaluation for Effective Generation of Test Programs Maximizing Peak Power Consumption Paolo Bernardi,Mauricio de Carvalho,Ernesto Sanchez,Matteo Sonza Reorda,Alberto Bosioet al. Journal of Low Power Electronics, 2013, 9 (2), pp.253-263. ⟨10.1166/jolpe.2013.1259⟩ Article dans une revue lirmm-00934937v1
Soft Error Triggering Criterion Based on Simplified Electrical Model of the SRAM cell Frédéric Wrobel,Antoine Touboul,Luigi Dilillo,Frédéric Saigné IEEE Transactions on Nuclear Science, 2013, 60 (4), pp.2537-2541. ⟨10.1109/TNS.2012.2235148⟩ Article dans une revue lirmm-00805001v1
A Silicon Diode-Based Detector for Investigations of Atmospheric Radiation Frédéric Wrobel,Jean-Roch Vaillé,Denis Pantel,Luigi Dilillo,Jean-Marc J.-M. Galliereet al. IEEE Transactions on Nuclear Science, 2013, 60 (5), pp.3603-3608. ⟨10.1109/TNS.2013.2264957⟩ Article dans une revue lirmm-01234419v1
Impact of Resistive-Bridging Defects in SRAM at Different Technology Nodes Renan Alves Fonseca,Luigi Dilillo,Alberto Bosio,Patrick Girard,Serge Pravossoudovitchet al. Journal of Electronic Testing: : Theory and Applications, 2012, 28 (3), pp.317-329. ⟨10.1007/s10836-012-5291-6⟩ Article dans une revue istex lirmm-00805017v1
Analysis and Fault Modeling of Actual Resistive Defects in ATMELtm eFlash Memories Pierre-Didier Mauroux,Arnaud Virazel,Alberto Bosio,Luigi Dilillo,Patrick Girardet al. Journal of Electronic Testing: : Theory and Applications, 2012, 28 (2), pp.215-228. ⟨10.1007/s10836-012-5277-4⟩ Article dans une revue istex lirmm-00806773v1
Embedded silicon detector to investigate the natural radiative environment Denis Pantel,Jean-Roch Vaillé,Frédéric Wrobel,Luigi Dilillo,Jean-Marc J.-M. Galliereet al. Journal of Instrumentation, 2012, 7 (5), pp.1-11. ⟨10.1088/1748-0221/7/05/P05007⟩ Article dans une revue lirmm-00805011v1
Neutron-Induced Multiple Bit Upsets on Two Commercial SRAMs Under Dynamic-Stress Paolo Rech,Jean-Marc J.-M. Galliere,Patrick Girard,Alessio Griffoni,Jérôme Bochet al. IEEE Transactions on Nuclear Science, 2012, 59 (4), pp.893-899. ⟨10.1109/TNS.2012.2187218⟩ Article dans une revue lirmm-00805031v1
Neutron-Induced Failure in Silicon IGBTs, Silicon Super-Junction and SiC MOSFETs Alessio Griffoni,Jeroen van Duivenbode,Dimitri Linten,Eddy Simoen,Paolo Rechet al. IEEE Transactions on Nuclear Science, 2012, 59 (4), pp.866-871. ⟨10.1109/TNS.2011.2180924⟩ Article dans une revue lirmm-00805039v1
Experimental Characterization of Atmospheric Radiation Environment with Stratospheric Balloon Frédéric Wrobel,Jean-Roch Vaillé,Denis Pantel,Luigi Dilillo,Paolo Rechet al. IEEE Transactions on Nuclear Science, 2011, 58 (3), pp.945-951. ⟨10.1109/TNS.2011.2136359⟩ Article dans une revue lirmm-00805045v1
Impact of Resistive-Open Defects on SRAM Error Rate Induced by Alpha Particles and Neutrons Paolo Rech,Jean-Marc J.-M. Galliere,Patrick Girard,Frédéric Wrobel,Frédéric Saignéet al. IEEE Transactions on Nuclear Science, 2011, 58 (3), pp.855-861. ⟨10.1109/TNS.2011.2123114⟩ Article dans une revue lirmm-00805046v1
SoC Yield Improvement - Using TMR Architectures for Manufacturing Defect Tolerance in Logic Cores Julien Vial,Arnaud Virazel,Alberto Bosio,Luigi Dilillo,Patrick Girardet al. International Journal On Advances in Systems and Measurements, 2010, 3 (1/2), pp.1-10 Article dans une revue lirmm-00553567v1
A Comprehensive Analysis of Transition Fault Coverage and Test Power Dissipation for LOS and LOC Schemes Fangmei Wu,Luigi Dilillo,Alberto Bosio,Patrick Girard,Serge Pravossoudovitchet al. Journal of Low Power Electronics, 2010, 6 (2), pp.359-374. ⟨10.1166/jolpe.2010.1086⟩ Article dans une revue lirmm-00553548v1
New March Elements for Address Decoder Open and Resistive Open Fault Detection in SRAM Memories Luigi Dilillo,Patrick Girard,Serge Pravossoudovitch,Arnaud Virazel,Simone Borriet al. Journal of Integrated Circuits and Systems, 2008, 3 (1), pp.7-12. ⟨10.29292/jics.v3i1.276⟩ Article dans une revue lirmm-00341793v1
Analysis and Test of Resistive-Open Defects in SRAM Pre-Charge Circuits Luigi Dilillo,Patrick Girard,Serge Pravossoudovitch,Arnaud Virazel,Magali Bastian Hage-Hassan Journal of Electronic Testing: : Theory and Applications, 2007, 23 (3), pp.435-444. ⟨10.1007/s10836-007-5003-9⟩ Article dans une revue lirmm-00194254v1
ADOFs and Resistive-ADOFs in SRAM Address Decoders: Test Conditions and March Solutions Patrick Girard,Luigi Dilillo,Serge Pravossoudovitch,Arnaud Virazel,Magali Bastian Hage-Hassanet al. Journal of Electronic Testing: : Theory and Applications, 2006, 22 (3), pp.287-296. ⟨10.1007/s10836-006-7761-1⟩ Article dans une revue istex lirmm-00134769v1
Reducing Power Dissipation in SRAM During Test Luigi Dilillo,Paul Rosinger,Bashir Al-Hashimi,Patrick Girard Journal of Low Power Electronics, 2006, 2 (2), pp.271-280. ⟨10.1166/jolpe.2006.062⟩ Article dans une revue lirmm-00137590v1
Efficient March Test Procedure for Dynamic Read Destructive Fault Detection in SRAM Memories Luigi Dilillo,Patrick Girard,Serge Pravossoudovitch,Arnaud Virazel,Simone Borriet al. Journal of Electronic Testing: : Theory and Applications, 2005, 21 (5), pp.551-561. ⟨10.1007/s10836-005-1169-1⟩ Article dans une revue istex lirmm-00105314v1
Analysis of Dynamic Faults in Embedded-SRAMs: Implications for Memory Test Simone Borri,Magali Bastian Hage-Hassan,Luigi Dilillo,Patrick Girard,Serge Pravossoudovitchet al. Journal of Electronic Testing: : Theory and Applications, 2005, 21 (2), pp.169-179. ⟨10.1007/s10836-005-6146-1⟩ Article dans une revue lirmm-00105313v1

Communication dans un congrès (233)

Resilience Analysis of a Fault-Tolerant MPSoC Interconnection Architecture under SEU Fault Injection Thiago H Rausch,Wesley Grignani,Luigi Dilillo,Douglas R Melo 27th IEEE Latin American Test Symposium, Mar 2026, Florianopolis, Brazil Communication dans un congrès hal-05481310v1
Characterization of a Fault-Tolerant RISC-V SoC in an SRAM-based FPGA under Proton Irradiation Wesley Grignani,Douglas A Santos,Carolina Imianosky,Douglas R Melo,Frédéric Wrobelet al. 27th IEEE Latin American Test Symposium, Mar 2026, Florianopolis, Brazil Communication dans un congrès hal-05481332v1
HARV-SoC - A Fault-tolerant RISC-V Microcontroller for Dependable Applications Douglas Almeida dos Santos,Wesley Grignani,Carolina Imianosky,Luigi Dilillo 3rd TWIN-RELECT Training School on Fault-Tolerant AI Systems, Jan 2026, Manchester (UK), United Kingdom Communication dans un congrès hal-05481410v1
Design and Reliability Analysis of a Pipeline RISC-V Processor Core Douglas A Santos,Wesley Grignani,Carolina Imianosky,Douglas R Melo,Luigi Dilillo 27th IEEE Latin American Test Symposium, Mar 2026, Florianopolis, Brazil Communication dans un congrès hal-05481356v1
Leadership and strategic management Luigi Dilillo 2nd Research Management & Administration Workshop, Jul 2025, Volos (Greece), Greece Communication dans un congrès hal-05381582v1
TWIN-RELECT: Twinning for Excellence in Reliable Electronics Marko Andjelkovic,Fabian Vargas,Milos Krstic,Luigi Dilillo,Alain Michezet al. Design, Automation and Test in Europe Conference, Mar 2025, Lyon, France Communication dans un congrès hal-04919286v1
Hardening an AMBA-AXI Network Interface for a Reliable Network-on-Chip Thiago H Rausch,Wesley Grignani,Gustavo H S Müller,Douglas A Santos,Luigi Dililloet al. IEEE Latin American Symposium on Circuits and Systems (LASCAS), Feb 2025, Bento Goncalves, Brazil. pp.1-5, ⟨10.1109/LASCAS64004.2025.10966348⟩ Communication dans un congrès hal-04930198v1
Reliability and Performance Evaluation of a Fault-Tolerant MPSoC Interconnection Architecture Thiago H Rausch,Wesley Grignani,Luigi Dilillo,Douglas R Melo 38th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2025, Barcelona, Spain Communication dans un congrès hal-05170292v1
Reliability Analysis of Neural Network Inference on a Fault-Tolerant RISC-V SoC with Vector Extension Carolina Imianosky,Douglas A Santos,Wesley Grignani,Luigi Dilillo Radiation and its Effects on Components and Systems Conference, Sep 2025, Antwerp, Belgium Communication dans un congrès hal-05127945v1
Characterization of HARV-SoC for Reliable Avionics Applications Wesley Grignani,Douglas A Santos,Carolina Imianosky,Maria Kastriotou,Carlo Cazzanigaet al. Workshop on Reliable and Secure RISC-V architectures (RESCUER), May 2025, Tallinn, Estonia Communication dans un congrès hal-05017062v1
Analysis of In-System Performance of Point-of-Load Power Converters During System-Level Irradiation Ivan Slipukhin,Rubén García Alía,Frédéric Saigné,Jérôme Boch,Luigi Dililloet al. Radiation and its Effects on Components and Systems Conference (RADECS 2025), Sep 2025, Antwerp, Belgium Communication dans un congrès hal-05148723v1
HARV - Hardened RISC-V System-on-Chip Douglas A Santos,Carolina Imianosky,Luigi Dilillo 2nd RISC-V in Space Workshop, Apr 2025, Gothenburg, Sweden Communication dans un congrès hal-04984377v1
HARV-SoC Evaluation on SmartFusion2 and PolarFire FPGAs Under Neutron Radiation Wesley Grignani,Douglas A Santos,Maria Kastriotou,Carlo Cazzaniga,Douglas R Meloet al. Radiation and its Effects on Components and Systems Conference, Sep 2025, Antwerp, Belgium Communication dans un congrès hal-05128008v1
Efficient TinyML Inference on a Fault-Tolerant RISC-V SoC with Vector Extension Carolina Imianosky,Douglas A Santos,Luigi Dilillo International Workshop on Advances in Sensors and Interface (IWASI), Jul 2025, Manfredonia, Italy. pp.1-6, ⟨10.1109/IWASI66786.2025.11121981⟩ Communication dans un congrès hal-05127892v1
Special Session Paper: Simulation Methodologies and Experiments for Reliability Analysis of Devices in Radiation Harsh Environments Nikoloas Chatzivangelis,Nikoloas Zazatis,Wesley Grignani,Georgios-Ioannis Paliaroutis,Douglas A Santoset al. 38th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2025, Barcelona, Spain Communication dans un congrès hal-05371489v1
Compact SER Models for Line-Source-Induced Charge Collection Using Model Order Reduction Pavlos Stoikos,Olympia Axelou,Pelopidas Tsoumanis,Georgios-Ioannis Paliaroutis,Luigi Dililloet al. 38th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2025, Barcelona, Spain Communication dans un congrès hal-05351202v1
Physical Explanation for the Higher Sensitivity to Ion-Induced Burnout in SiC Schottky Diodes Compared to Si Schottky Diodes Cleiton Marques,Alain Michez,Frédéric Wrobel,S. Kuboyama,Frédéric Saignéet al. RADiation Effects on Components and Systems (RADECS), Sep 2024, Maspalomas, Canary Islands, Spain Communication dans un congrès hal-04715410v1
Implementation and Reliability Evaluation of a ChaCha20 Stream Cipher Hardware Accelerator Wesley Grignani,Khalil G Q Santana,Douglas Almeida dos Santos,Luigi Dilillo,Douglas R Melo 37th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2024, Oxfordshire, United Kingdom Communication dans un congrès hal-04715408v1
Reliability Analysis of a Low-Cost CCSDS 123 Hyperspectral Image Compressor Wesley Grignani,Douglas A Santos,Luigi Dilillo,Douglas R Melo 37th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2024, Oxfordshire, United Kingdom Communication dans un congrès hal-04715407v1
Reliability and Performance Evaluation of a RISC-V Vector Extension Unit for Vector Multiplication Carolina Imianosky,Douglas A Santos,Douglas R Melo,Felipe Viel,Luigi Dilillo 37th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2024, Oxfordshire, United Kingdom Communication dans un congrès hal-04715405v1
Hardening a Real-Time Operating System for a Dependable RISC-V System-on-Chip Benjamin Mezger,Douglas Santos,Luigi Dilillo,Douglas Melo DFT 2023 - 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2023, Juan-Les-Pins, France. pp.1-6, ⟨10.1109/DFT59622.2023.10313566⟩ Communication dans un congrès hal-04266886v1
A Low-Cost Hardware Accelerator for CCSDS 123 Lossless Hyperspectral Image Compression Wesley Grignani,Douglas Santos,Luigi Dilillo,Felipe Viel,Douglas Melo DFT 2023 - 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2023, Juan-les-Pins, France. pp.1-6, ⟨10.1109/DFT59622.2023.10313567⟩ Communication dans un congrès hal-04266881v1
Characterization of a Fault-Tolerant RISC-V System-on-Chip for Space Environments Douglas Santos,André Martins Pio de Mattos,Douglas Melo,Luigi Dilillo DFT 2023 - 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2023, Juan-Les-Pins, France. pp.1-6, ⟨10.1109/DFT59622.2023.10313549⟩ Communication dans un congrès hal-04266887v1
Implementation and Reliability Evaluation of a RISC-V Vector Extension Unit Carolina Imianosky,Douglas Santos,Douglas Melo,Felipe Viel,Luigi Dilillo DFT 2023 - 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2023, Juan-Les-Pins, France. pp.1-6, ⟨10.1109/DFT59622.2023.10313569⟩ Communication dans un congrès hal-04266888v1
Hybrid Hardening Approach for a Fault-Tolerant RISC-V System-on-Chip Douglas Almeida dos Santos,Pablo M. Aviles,André Martins Pio de Mattos,Mario García Valderas,Luis Entrenaet al. RADECS 2023 - 23rd European Conference on Radiation and Its Effects on Components and Systems, Sep 2023, Toulouse, France Communication dans un congrès hal-04266891v1
Enhancement of System Observability During System-Level Radiation Testing through Total Current Consumption Monitoring Ivan Slipukhin,Andrea Coronetti,Rubén García Alía,Frédéric Saigné,Jérôme Bochet al. 2023 European Conference on Radiation and Its Effects on Components and Systems, Sep 2023, Toulouse, France Communication dans un congrès hal-04266900v1
Investigation on Radiation-Induced Single-Event Latch-up in SRAM Memories on-Board PROBA-V André Martins Pio de Mattos,Douglas Almeida dos Santos,Viyas Gupta,Thomas Borel,Luigi Dilillo RADECS 2023 - European Conference on Radiation and Its Effects on Components and Systems, Sep 2023, Toulouse, France Communication dans un congrès hal-04266897v1
Using HARV-SoC for Reliable Sensing Applications in Radiation Harsh Environments André Martins Pio de Mattos,Douglas Almeida dos Santos,Carolina Imianosky,Douglas Rossi Melo,Luigi Dilillo IWASI 2023 - 9th IEEE International Workshop on Advances in Sensors and Interfaces, Jun 2023, Bari, Italy. pp.227-232, ⟨10.1109/IWASI58316.2023.10164578⟩ Communication dans un congrès hal-04266899v1
CRATEBO: A High-speed, Radiation-Tolerant and Versatile Testing Platform for FPGA Radiation Qualification for High-Energy Particle Accelerator applications Antonio Scialdone,Rudy Ferraro,Panagiotis Gkountoumis,Salvatore Danzeca,Luigi Dililloet al. TWEPP 2023 Topical Workshop on Electronics for Particle Physics, Oct 2023, Geremeas, Italy Communication dans un congrès hal-04122431v1
Hybrid Radiation Hardening Approach: a RISC-V System-on-Chip case study Luigi Dilillo,Douglas Almeida dos Santos,Lucas Matana Luza,André Martins Pio de Mattos,Douglas Rossi de Meloet al. G-RADNEXT Workshop, Nov 2023, Geneva, Switzerland Communication dans un congrès hal-04296178v1
Radiation-induced SEL in a COTS SRAM memory - test and flight data Douglas Almeida dos Santos,Lucas Matana Luza,André Martins Pio de Mattos,Thomas Borel,Viyas Guptaet al. TEC-QEC Final Presentation Days, Jun 2023, Noordwijk, Netherlands Communication dans un congrès hal-04295893v1
Objectives and outcomes of WP6 in the second year of RADNEXT: Methodologies for Radiation Test of Systems Luigi Dilillo,Luis Entrena RADNEXT 2nd Annual Meeting, May 2023, Seville, Spain Communication dans un congrès hal-04296158v1
Neutron Irradiation Testing and Analysis of a Fault-Tolerant RISC-V System-on-Chip Douglas Almeida dos Santos,André Martins Pio de Mattos,Lucas Matana Luza,Carlo Cazzaniga,Maria Kastriotouet al. DFT 2022 - 35th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2022, Austin, United States. pp.1-6, ⟨10.1109/DFT56152.2022.9962335⟩ Communication dans un congrès lirmm-03833983v1
Qualification methodology for Radio Frequency Integrated Circuit for wireless-based platforms in radiation environments Antonio Scialdone,Rudy Ferraro,Luigi Dilillo,Frédéric Saigné,Jérôme Bochet al. RADECS 2022 - 22nd European Conference on Radiation and Its Effects on Components and Systems, Oct 2022, Venice, Italy Communication dans un congrès hal-04124165v1
Effects of High-Energy Protons on a Self-Refresh DRAM Lucas Matana Luza,Carolina Imianosky,André Martins Pio de Mattos,Douglas Almeida dos Santos,Daniel Söderströmet al. SELSE 2022 - 18th IEEE Workshop on Silicon Errors in Logic – System Effects, May 2022, Virtual Event, Italy Communication dans un congrès lirmm-03832662v1
Impact of Atmospheric and Space Radiation on Sensitive Electronic Devices Lucas Matana Luza,Frédéric Wrobel,Luis Entrena,Luigi Dilillo ETS 2022 - 27th IEEE European Test Symposium, May 2022, Barcelona, Spain. pp.1-10, ⟨10.1109/ets54262.2022.9810454⟩ Communication dans un congrès lirmm-03833958v1
Objectives and outcomes of WP6 in the first year of RADNEXT Methodologies for Radiation test of Systems Luigi Dilillo RADNEXT DAYS 2022 - 1st Annual Meeting, Jun 2022, Geneva, Switzerland Communication dans un congrès hal-04295913v1
A Model-Based Framework to Assess the Reliability of Safety-Critical Applications Lucas Matana Luza,Annachiara Ruospo,Alberto Bosio,Ernesto Sanchez,Luigi Dilillo DDECS 2021 - 24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Apr 2021, Vienna (virtual), Austria. pp.41-44, ⟨10.1109/DDECS52668.2021.9417059⟩ Communication dans un congrès hal-03266848v1
Design and Evaluation of Implementation Impact on a Fault-Tolerant Network-on-Chip Router Douglas Rossi de Melo,Cesar Albenes Zeferino,Eduardo Augusto Bezerra,Luigi Dilillo DTIS 2021 - 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Jun 2021, Montpellier, France. ⟨10.1109/DTIS53253.2021.9505053⟩ Communication dans un congrès lirmm-03358975v1
Characterization of a RISC-V System-on-Chip under Neutron Radiation Douglas Almeida dos Santos,Lucas Matana Luza,Maria Kastriotou,Carlo Cazzaniga,Cesar A Zeferinoet al. DTIS 2021 - 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Jun 2021, Montpellier, France. ⟨10.1109/DTIS53253.2021.9505054⟩ Communication dans un congrès lirmm-03357515v1
Technology Impact on Neutron-Induced Effects in SDRAMs: A Comparative Study Lucas Matana Luza,Daniel Söderström,André Martins Pio de Mattos,Eduardo Augusto Bezerra,Carlo Cazzanigaet al. DTIS 2021 - 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Jun 2021, Montpellier, France. ⟨10.1109/DTIS53253.2021.9505143⟩ Communication dans un congrès lirmm-03357444v1
Pros and Cons of Fault Injection Approaches for the Reliability Assessment of Deep Neural Networks Annachiara Ruospo,Lucas Matana Luza,Alberto Bosio,Marcello Traiola,Luigi Dililloet al. LATS 2021 - 22nd IEEE Latin American Test Symposium, Oct 2021, Punta del Este, Uruguay. pp.1-5, ⟨10.1109/LATS53581.2021.9651807⟩ Communication dans un congrès lirmm-03435567v1
A Low-Cost Fault-Tolerant RISC-V Processor for Space Systems Douglas Almeida dos Santos,Lucas Matana Luza,Cesar Albenes Zeferino,Luigi Dilillo,Douglas Rossi de Melo DTIS 2020 - 15th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Apr 2020, Marrakech, Morocco. pp.1-5, ⟨10.1109/DTIS48698.2020.9081185⟩ Communication dans un congrès lirmm-03026132v1
COTS Optocoupler radiation qualification process for LHC applications based on mixed-energy neutron irradiations Rudy Ferraro,Gilles Foucard,Angelo Infantino,Luigi Dilillo,Markus Bruggeret al. RADECS 2019 - 19th European Conference on Radiation and Its Effects on Components and Systems, Sep 2019, Montpellier, France. pp.1395-1403, ⟨10.1109/TNS.2020.2972777⟩ Communication dans un congrès hal-03363644v1
Characterization of a RISC-V Microcontroller Through Fault Injection Dario Asciolla,Luigi Dilillo,Douglas Almeida dos Santos,Douglas Melo,Alessandra Menicucciet al. APPLEPIES 2019 - International Conference on Applications in Electronics Pervading Industry, Environment and Society, Sep 2019, Pisa, Italy. pp.91-101, ⟨10.1007/978-3-030-37277-4_11⟩ Communication dans un congrès lirmm-03025657v1
Electron-Induced Upsets and Stuck Bits in SDRAMs in the Jovian Environment Daniel Soderstrom,Lucas Matana Luza,Heikki Kettunen,Arto Javanainen,Wilfrid Faraboliniet al. NSREC 2020 - IEEE Nuclear and Space Radiation Effects Conference, Nov 2020, Santa Fe (virtual), United States Communication dans un congrès lirmm-03028881v1
Investigating the Impact of Radiation-Induced Soft Errors on the Reliability of Approximate Computing Systems Lucas Matana Luza,Daniel Soderstrom,Georgios Tsiligiannis,Helmut Puchner,Carlo Cazzanigaet al. DFT 2020 - 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2020, Frascati, Italy. pp.1-6, ⟨10.1109/DFT50435.2020.9250865⟩ Communication dans un congrès lirmm-03025736v1
Effects of Thermal Neutron Irradiation on a Self-Refresh DRAM Lucas Matana Luza,Daniel Soderstrom,Helmut Puchner,Ruben Garcia Alia,Manon Leticheet al. DTIS 2020 - 15th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Apr 2020, Marrakech, Morocco. pp.1-6, ⟨10.1109/DTIS48698.2020.9080918⟩ Communication dans un congrès lirmm-03025721v1
On-board Compressing of Hyperspectral Images using CCSDS 123 Douglas Almeida dos Santos,Cesar Albenes Zeferino,Eduardo Augusto Bezerra,Luigi Dilillo,Douglas Rossi Melo COTB 2020 - Anais do XI Computer on the Beach, Sep 2020, Balneário Camboriú, Brazil. pp.332-336, ⟨10.14210/cotb.v11n1.p332-336⟩ Communication dans un congrès lirmm-03025767v1
Stuck and Weakened Bits in SDRAM from a Heavy-Ion Microbeam Daniel Söderström,Lucas Matana Luza,Alexandre Bosser,Thierry Gil,Kay-Obbe Vosset al. RADECS 2019 - 19th European Conference on Radiation and Its Effects on Components and Systems, Sep 2019, Montpellier, France. ⟨10.1109/RADECS47380.2019.9745715⟩ Communication dans un congrès lirmm-03359010v1
Vertical Line Fault Mechanism Induced by Heavy Ions in an SLC NAND Flash Viyas Gupta,Alexandre Louis Bosser,Lucas Matana Luza,Daniel Söderström,Arto Javanainenet al. RADECS 2019 - 19th European Conference on Radiation and Its Effects on Components and Systems, Sep 2019, Montpellier, France. ⟨10.1109/RADECS47380.2019.9745668⟩ Communication dans un congrès lirmm-03358989v1
Effects of Heavy Ion and Proton Irradiation on a SLC NAND Flash Memory Lucas Matana Luza,Alexandre Bosser,Viyas Gupta,Arto Javanainen,Ali Mohammadzadehet al. DFT 2019 - 32th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2019, Noordwijk, Netherlands. pp.1-6, ⟨10.1109/DFT.2019.8875475⟩ Communication dans un congrès lirmm-03025660v1
Design and Implementation of a Flexible Interface for TID Detector Iacopo Fara,Lucas Matana Luza,Jérôme Boch,Gianluca Furano,Marco Ottaviet al. IWASI 2019 - 8th IEEE International Workshop on Advances in Sensors and Interfaces, Jun 2019, Otranto, Italy. pp.158-162, ⟨10.1109/IWASI.2019.8791299⟩ Communication dans un congrès lirmm-02415559v1
Analyzing the Error Propagation in a Parameterizable Network-on-Chip Router Douglas Rossi de Melo,Cesar Zeferino,Luigi Dilillo,Eduardo Augusto Bezerra LATS 2019 - 20th IEEE Latin American Test Symposium, Mar 2019, Santiago, Chile. ⟨10.1109/LATW.2019.8704580⟩ Communication dans un congrès lirmm-02008414v1
A Fault-Tolerant Reconfigurable Platform for Communication Modules of Satellites Cézar Antônio Rigo,Lucas Matana Luza,Elder Dominghini Tramontin,Victor Martins,Sara Vega Martinezet al. LATS 2019 - 20th IEEE Latin American Test Symposium, Mar 2019, Santiago, Chile. ⟨10.1109/LATW.2019.8704551⟩ Communication dans un congrès lirmm-02008436v1
Study of the Impact of the LHC Radiation Environments on the Synergistic Displacement Damage and Ionizing Dose Effect on Electronic Components Rudy Ferraro,Salvatore Danzeca,Luigi Dilillo,Chiara Cangialosi,Rubén García Alíaet al. RADECS: Radiation Effects on Components and Systems, Sep 2018, Göteborg, Sweden Communication dans un congrès lirmm-02008384v1
Evaluation of the temperature influence on SEU vulnerability of DICE and 6T-SRAM cells Emna Farjallah,Valentin Gherman,Jean-Marc Armani,Luigi Dilillo DTIS 2018 - 13th International Conference on Design and Technology of Integrated Systems in Nanoscale Era, LIRMM, Apr 2018, Taormina, Italy. ⟨10.1109/DTIS.2018.8368578⟩ Communication dans un congrès lirmm-02008214v1
Implementation of fault tolerance techniques for integrated network interfaces Douglas Rossi de Melo,Cesar Zeferino,Antonio Ramos,Luigi Dilillo,Eduardo Augusto Bezerra 3rd IAA Latin American CubeSat Workshop (IAA-LACW 2018), Dec 2018, Ubatuba, Brazil Communication dans un congrès lirmm-02008453v1
Enabling deep-space CubeSat missions through state-of-the-art radiation-hardened technologies Lucas Matana Luza,Cézar Antônio Rigo,Elder Dominghini Tramontin,Victor Manuel Goncalves Martins,Sara Vega Martinezet al. 3rd IAA Latin American CubeSat Workshop (IAA-LACW 2018), Dec 2018, Ubatuba, Brazil Communication dans un congrès lirmm-02008460v1
A calculation method to estimate single event upset cross section Frédéric Wrobel,Antoine Touboul,Vincent Pouget,Luigi Dilillo,Jérôme Bochet al. ESREF 2017 - 28th European Symposium on Reliability of Electron devices, Failure physics and analysis, Sep 2017, Bordeaux, France. pp.644-649, ⟨10.1016/j.microrel.2017.07.056⟩ Communication dans un congrès hal-01929212v1
Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random- Access Memory Alexandre Louis Bosser,Viyas Gupta,Arto Javanainen,Georgios Tsiligiannis,Stephen D. Lalumondiereet al. RADECS: Radiation and Its Effects on Components and Systems, Oct 2017, Genève, Switzerland Communication dans un congrès hal-01929267v1
Improvement of the tolerated raw bit-error rate in NAND Flash-based SSDs with the help of embedded statistics Valentin Gherman,Emna Farjallah,Jean-Marc Armani,Marcelino Seif,Luigi Dilillo ITC 2017 - 48th International Test Conference, Oct 2017, Fort Worth, United States. ⟨10.1109/TEST.2017.8242066⟩ Communication dans un congrès lirmm-01582185v1
Refresh frequency reduction of data stored in SSDs based on A-timer and timestamps Marcelino Seif,Emna Farjallah,Franck Badets,Emna Chabchoub,Christophe Layeret al. ETS 2017 - 22nd IEEE European Test Symposium, May 2017, Limassol, Cyprus. pp.7968233, ⟨10.1109/ETS.2017.7968233⟩ Communication dans un congrès lirmm-01687675v1
The Power Law Shape of Heavy Ions Experimental Cross Section Frédéric Wrobel,Antoine Touboul,Vincent Pouget,Luigi Dilillo,Eric Lorfèvreet al. NSREC: Nuclear and Space Radiation Effects Conference, IEEE NPSS (Nuclear & Plasma Sciences Society ), Jul 2016, Portland, United States Communication dans un congrès lirmm-01298421v1
Muon effects on SRAMs Luigi Dilillo RADSOL: Electronique et rayonnements naturels au niveau du sol, CNRS - GDR ERRATA, Jun 2016, Paris, France Communication dans un congrès lirmm-01382532v1
An effective BIST architecture for power-gating mechanisms in low-power SRAMs Alberto Bosio,Luigi Dilillo,Patrick Girard,Arnaud Virazel,Leonardo B. Zordan ISQED 2016 - 17th International Symposium on Quality Electronic Design, Mar 2016, Santa Clara, CA, United States. pp.185-191, ⟨10.1109/ISQED.2016.7479198⟩ Communication dans un congrès lirmm-01457424v1
MTCube project: COTS memory SEE ground-test results and in-orbit error rate prediction Viyas Gupta,Alexandre Louis Bosser,Frédéric Wrobel,Frédéric Saigné,Laurent Dusseauet al. 4S: Small Satellites Systems and Services Symposium, Centre national d'études spatiales (CNES); European Space Agency (ESA), May 2016, La Valletta, Malta Communication dans un congrès lirmm-01298423v1
Design of a Radiation Tolerant System for Total Ionizing Dose Monitoring Using Floating Gate and RadFET Dosimeters Rudy Ferraro,Salvatore Danzeca,Matteo Brucoli,Alessandro Masi,Markus Bruggeret al. TWEPP: Topical Workshop on Electronics for Particle Physics, Sep 2016, Karlsruhe, Germany Communication dans un congrès lirmm-01382578v1
Comparison of the Effects of Muon and Low-Energy Proton Irradiation on a 65 nm Low-Power SRAM Alexandre Louis Bosser,Viyas Gupta,Arto Javanainen,Georgios Tsiligiannis,Helmut Puchneret al. RADECS: Radiation and Its Effects on Components and Systems, Sep 2016, Bremen, Germany Communication dans un congrès lirmm-01337405v1
An effective hybrid fault-tolerant architecture for pipelined cores Imran Wali,Arnaud Virazel,Alberto Bosio,Luigi Dilillo,Patrick Girard ETS: European Test Symposium, May 2015, Cluj-Napoca, Romania. ⟨10.1109/ETS.2015.7138733⟩ Communication dans un congrès lirmm-01272730v1
An effective ATPG flow for Gate Delay Faults Alberto Bosio,Luigi Dilillo,Patrick Girard,Arnaud Virazel,Paolo Bernardiet al. DTIS: Design and Technology of Integrated Systems in Nanoscale Era, Apr 2015, Naples, Italy. ⟨10.1109/DTIS.2015.7127350⟩ Communication dans un congrès lirmm-01272719v1
Real-Time SRAM Based Particle Detector Luigi Dilillo,Alexandre Louis Bosser,Viyas Gupta,Frédéric Wrobel,Frédéric Saigné IWASI: International Workshop on Advances in Sensors and Interfaces, Politecnico di Bari, Jun 2015, Gallipoli, Italy. pp.58-62, ⟨10.1109/IWASI.2015.7184968⟩ Communication dans un congrès lirmm-01238435v1
Exploring the impact of functional test programs re-used for power-aware testing Aymen Touati,Alberto Bosio,Luigi Dilillo,Patrick Girard,Arnaud Virazelet al. DATE 2015 - 18th Design, Automation and Test in Europe Conference and Exhibition, Mar 2015, Grenoble, France. pp.1277-1280, ⟨10.7873/DATE.2015.1031⟩ Communication dans un congrès lirmm-01272937v1
Proton-Induced SDRAM Cell Degradation Axel Rodriguez,Frédéric Wrobel,Anne Samaras,Francoise Bezerra,Benjamin Vandeveldeet al. RADECS: Radiation and Its Effects on Components and Systems, Sep 2015, Moscou, Russia. ⟨10.1109/RADECS.2015.7365650⟩ Communication dans un congrès lirmm-01238408v1
Scan-chain intra-cell defects grading Aymen Touati,Alberto Bosio,Luigi Dilillo,Patrick Girard,Arnaud Virazelet al. DTIS: Design and Technology of Integrated Systems in Nanoscale Era, Apr 2015, Naples, Italy. ⟨10.1109/DTIS.2015.7127349⟩ Communication dans un congrès lirmm-01272696v1
Methods for radiation test of memories Luigi Dilillo RADSOL: Electronique et rayonnements naturels au niveau du sol, GDR ERRATA (CNRS), Jun 2015, Paris, France Communication dans un congrès lirmm-01238437v1
A Methodology for the Analysis of Memory Response to Radiation through Bitmap Superposition and Slicing Alexandre Louis Bosser,Viyas Gupta,Georgios Tsiligiannis,Rudy Ferraro,Christopher Frostet al. RADECS: Radiation and Its Effects on Components and Systems, Sep 2015, Moscou, Russia. ⟨10.1109/RADECS.2015.7365578⟩ Communication dans un congrès lirmm-01238397v1
Design-for-Diagnosis Architecture for Power Switches Miroslav Valka,Alberto Bosio,Luigi Dilillo,Patrick Girard,Arnaud Virazelet al. DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2015, Belgrade, Serbia. pp.43-48, ⟨10.1109/DDECS.2015.18⟩ Communication dans un congrès lirmm-01272684v1
An ATPG Flow to Generate Crosstalk-Aware Path Delay Pattern Anu Asokan,Alberto Bosio,Arnaud Virazel,Luigi Dilillo,Patrick Girardet al. ISVLSI: International Symposium on Very Large Scale Integration, Jul 2015, Montpellier, France. pp.515-520, ⟨10.1109/ISVLSI.2015.99⟩ Communication dans un congrès lirmm-01272933v1
Impact of Stacked-Layer Structure on SEE Rate of SRAMs Viyas Gupta,Alexandre Louis Bosser,Georgios Tsiligiannis,Ali Mohammadzadeh,Arto Javanainenet al. NSREC: Nuclear and Space Radiation Effects Conference, IEEE / NPSS, Jul 2015, Boston, United States Communication dans un congrès lirmm-01238384v1
Heavy-ion radiation impact on a 4Mb FRAM under Different Test Conditions Viyas Gupta,Alexandre Louis Bosser,Georgios Tsiligiannis,Ali Mohammadzadeh,Arto Javanainenet al. RADECS: Radiation and Its Effects on Components and Systems, Sep 2015, Moscou, Russia. ⟨10.1109/RADECS.2015.7365617⟩ Communication dans un congrès lirmm-01238392v1
Generic Analytic Expression of Heavy Ion SEU Cross Section Derived from Monte-Carlo Diffusion-Based Prediction Code Frédéric Wrobel,Antoine Touboul,Vincent Pouget,Luigi Dilillo,Robert Ecoffetet al. NSREC: Nuclear and Space Radiation Effects Conference, IEEE / NPSS, Jul 2015, Boston, United States Communication dans un congrès lirmm-01238388v1
Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs Alexandre Louis Bosser,Viyas Gupta,Georgios Tsiligiannis,Arto Javanainen,Heikki Kettunenet al. NSREC: Nuclear and Space Radiation Effects Conference, Jul 2015, Boston, MA, United States. ⟨10.1109/TNS.2015.2496874⟩ Communication dans un congrès hal-01932433v1
On the Generation of Diagnostic Test Set for Intra-cell Defects Zhenzhou Sun,Alberto Bosio,Luigi Dilillo,Patrick Girard,Arnaud Virazelet al. ATS: Asian Test Symposium, Nov 2014, Hangzhou, China. pp.312-317, ⟨10.1109/ATS.2014.57⟩ Communication dans un congrès lirmm-01272539v1
Test and diagnosis of power switches Miroslav Valka,Alberto Bosio,Luigi Dilillo,Aida Todri-Sanial,Arnaud Virazelet al. DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. pp.213-218, ⟨10.1109/DDECS.2014.6868792⟩ Communication dans un congrès lirmm-01248590v1
Use of CCD to Detect Terrestrial Cosmic Rays at Ground Level: Altitude Vs. Underground Experiments, Modeling and Numerical Monte Carlo Simulation Tarek Saad Saoud,Soilihi Moindjie,Jean-Luc Autran,Daniela Munteanu,Frédéric Wrobelet al. NSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France Communication dans un congrès lirmm-01237717v1
A Delay Probability Metric for Input Pattern Ranking Under Process Variation and Supply Noise Anu Asokan,Aida Todri-Sanial,Alberto Bosio,Luigi Dilillo,Patrick Girardet al. ISVLSI: International Symposium on Very Large Scale Integration, Jul 2014, Tampa, FL, United States. pp.226-231, ⟨10.1109/ISVLSI.2014.42⟩ Communication dans un congrès lirmm-01248592v1
Test of 90nm SRAMs at Concordia Station in Antarctica Luigi Dilillo RADSOL: Electronique et rayonnements naturels au niveau du sol, GDR ERRATA (CNRS); Institut Carnot STAR (Marseille), Jun 2014, Paris, France Communication dans un congrès lirmm-01238438v1
Single Event Upset Prediction from Heavy Ions Cross Sections with No Parameters Frédéric Wrobel,Antoine Touboul,Vincent Pouget,Luigi Dilillo,Frédéric Saigné NSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France Communication dans un congrès lirmm-01237668v1
Path delay test in the presence of multi-aggressor crosstalk, power supply noise and ground bounce Anu Asokan,Aida Todri-Sanial,Alberto Bosio,Luigi Dilillo,Patrick Girardet al. DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. pp.207-212, ⟨10.1109/DDECS.2014.6868791⟩ Communication dans un congrès lirmm-01248599v1
Timing-aware ATPG for critical paths with multiple TSVs Carolina Momo Metzler,Aida Todri-Sanial,Alberto Bosio,Luigi Dilillo,Patrick Girardet al. DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. pp.116-121, ⟨10.1109/DDECS.2014.6868774⟩ Communication dans un congrès lirmm-01248600v1
Radiation Study of a 4Mbit Ferroelectric RAM for Space Applications Helmut Puchner,Georgios Tsiligiannis,Luigi Dilillo SEE: Single Event Effects, Aeroflex Corporation, the Aerospace Corporation, Brigham Young University, Lockheed Martin, the NASA Electronic Parts and Packaging Program, the Naval Research Laboratory, Sandia National Laboratories, and Vanderbilt University, May 2014, San Diego, United States Communication dans un congrès lirmm-01297441v1
Experimental Heavy-Ion SEU Cross-Sections Of Sram Memory Components Alexandre Louis Bosser,Luigi Dilillo,Viyas Gupta,Arto Javanainen,Heikki Kettunenet al. Physics Days, Finnish Physical Society, Tampere University of Technology (TUT), and Tavicon Ltd., Mar 2014, Tampere, Finland Communication dans un congrès lirmm-01238439v1
An intra-cell defect grading tool Alberto Bosio,Luigi Dilillo,Patrick Girard,Aida Todri-Sanial,Stefano Bernaboviet al. DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. pp.298-301, ⟨10.1109/DDECS.2014.6868814⟩ Communication dans un congrès lirmm-01248591v1
TSV aware timing analysis and diagnosis in paths with multiple TSVs Carolina Momo Metzler,Aida Todri-Sanial,Alberto Bosio,Luigi Dilillo,Patrick Girardet al. VTS: VLSI Test Symposium, Apr 2014, Napa, CA, United States. ⟨10.1109/VTS.2014.6818772⟩ Communication dans un congrès lirmm-01248594v1
Presentation of the MTCube CubeSat Project Viyas Gupta,Luigi Dilillo,Frédéric Wrobel,Ali Mohammad Zadeh,Muriel Bernardet al. 4S Symposium 2014 - Small Satellites Systems and Services, European Space Agency (ESA); Centre National d'Etudes Spatiales (CNES), May 2014, Majorca, Spain Communication dans un congrès lirmm-01272951v1
A Comprehensive Evaluation of Functional Programs for Power-Aware Test Aymen Touati,Alberto Bosio,Luigi Dilillo,Patrick Girard,Aida Todri-Sanialet al. NATW: North Atlantic Test Workshop, May 2014, Johnson City, NY, United States. pp.69-72, ⟨10.1109/NATW.2014.23⟩ Communication dans un congrès lirmm-01248597v1
Power supply noise-aware workload assignments for homogeneous 3D MPSoCs with thermal consideration Yuanqing Cheng,Aida Todri-Sanial,Alberto Bosio,Luigi Dilillo,Patrick Girardet al. ASP-DAC: Asia and South Pacific Design Automation Conference, Jan 2014, Singapore, Singapore. pp.544-549, ⟨10.1109/ASPDAC.2014.6742948⟩ Communication dans un congrès lirmm-01248596v1
iBoX — Jitter based Power Supply Noise sensor Miroslav Valka,Alberto Bosio,Luigi Dilillo,Aida Todri-Sanial,Arnaud Virazelet al. ETS: European Test Symposium, May 2014, Paderborn, United States. ⟨10.1109/ETS.2014.6847830⟩ Communication dans un congrès lirmm-01248601v1
Real-Time Testing of 90nm COTS SRAMs at Concordia Station in Antarctica Georgios Tsiligiannis,Luigi Dilillo,Alberto Bosio,Patrick Girard,Serge Pravossoudovitchet al. NSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France Communication dans un congrès lirmm-01237709v1
Efficient Dynamic Test Methods for COTS SRAMs Under Heavy Ion Irradiation Georgios Tsiligiannis,Luigi Dilillo,Viyas Gupta,Alberto Bosio,Patrick Girardet al. NSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France Communication dans un congrès lirmm-01237660v1
Protecting combinational logic in pipelined microprocessor cores against transient and permanent faults Imran Wali,Arnaud Virazel,Alberto Bosio,Luigi Dilillo,Patrick Girardet al. DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. pp.223-225, ⟨10.1109/DDECS.2014.6868794⟩ Communication dans un congrès lirmm-01248598v1
SEU Cross Section Calculation Based on Experimental Data of Another kind of Particle Annelise Touboul,Antoine Touboul,Frédéric Wrobel,V. Pouget,Luigi Dililloet al. NSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France Communication dans un congrès hal-01934616v1
Computing Detection Probability of Delay Defects in Signal Line TSVs Carolina Momo Metzler,Aida Todri-Sanial,Alberto Bosio,Luigi Dilillo,Patrick Girardet al. ETS: European Test Symposium, May 2013, Avignon, France. ⟨10.1109/ETS.2013.6569349⟩ Communication dans un congrès lirmm-00839044v1
A Built-in Scheme for Testing and Repairing Voltage Regulators of Low-Power SRAMs Leonardo B. Zordan,Alberto Bosio,Luigi Dilillo,Patrick Girard,Aida Todri-Sanialet al. VTS: VLSI Test Symposium, Apr 2013, Berkeley, CA, United States. pp.1-6, ⟨10.1109/VTS.2013.6548894⟩ Communication dans un congrès lirmm-00805366v1
An Integrated Solid Detector For Onboard Detection Of Natural Radiations In Atmosphere Frédéric Wrobel,Jean-Roch Vaillé,Antoine Touboul,Luigi Dilillo,Frédéric Saigné iWoRID: International Workshop on Radiation Imaging Detectors, SOLEIL synchrotron, Jun 2013, Paris, France Communication dans un congrès lirmm-01238432v1
On the Reuse of Read and Write Assist Circuits to Improve Test Efficiency in Low-Power SRAMs Leonardo B. Zordan,Alberto Bosio,Luigi Dilillo,Patrick Girard,Aida Todri-Sanialet al. ITC: International Test conference, Sep 2013, Anaheim, CA, United States. pp.1-10, ⟨10.1109/TEST.2013.6651927⟩ Communication dans un congrès lirmm-00818977v1
Gate voltage contribution to neutron-induced SEB of Trench Gate Fieldstop IGBT Lionel Foro,Antoine Touboul,Frédéric Wrobel,Paolo Rech,Luigi Dililloet al. RADECS: Radiation and Its Effects on Components and Systems, Sep 2013, Oxford, United Kingdom. ⟨10.1109/RADECS.2013.6937428⟩ Communication dans un congrès lirmm-01237617v1
Analyzing resistive-open defects in SRAM core-cell under the effect of process variability Elena Ioana Vatajelu,Alberto Bosio,Luigi Dilillo,Patrick Girard,Aida Todri-Sanialet al. ETS: European Test Symposium, May 2013, Avignon, France. ⟨10.1109/ETS.2013.6569373⟩ Communication dans un congrès lirmm-01921630v1
Characterization of an SRAM Based Particle Detector For Mixed-Field Radiation Environments Georgios Tsiligiannis,Luigi Dilillo,Alberto Bosio,Patrick Girard,Serge Pravossoudovitchet al. IWASI: International Workshop on Advances in Sensors and Interfaces, Jun 2013, Bari, Italy. pp.75-80, ⟨10.1109/IWASI.2013.6576070⟩ Communication dans un congrès lirmm-00839046v1
Performance Characterization of TAS-MRAM Architectures in Presence of Capacitive Defects João Azevedo,Arnaud Virazel,Yuanqing Cheng,Alberto Bosio,Luigi Dililloet al. VALID: Advances in System Testing and Validation Lifecycle, Oct 2013, Venice, Italy. pp.39-44 Communication dans un congrès lirmm-01433308v1
Test Solution for Data Retention Faults in Low-Power SRAMs Leonardo B. Zordan,Alberto Bosio,Luigi Dilillo,Patrick Girard,Aida Todri-Sanialet al. DATE 2013 - 16th Design, Automation and Test in Europe Conference, Mar 2013, Grenoble, France. pp.442-447, ⟨10.7873/DATE.2013.099⟩ Communication dans un congrès lirmm-00805140v1
A novel method to mitigate TSV electromigration for 3D ICs Yuanqing Cheng,Aida Todri-Sanial,Alberto Bosio,Luigi Dilillo,Patrick Girardet al. ISVLSI: IEEE Computer Society Annual Symposium on VLSI, Aug 2013, Natal, Brazil. pp.121-126, ⟨10.1109/ISVLSI.2013.6654633⟩ Communication dans un congrès lirmm-01248617v1
On the correlation between Static Noise Margin and Soft Error Rate evaluated for a 40nm SRAM cell Elena Ioana Vatajelu,Georgios Tsiligiannis,Luigi Dilillo,Alberto Bosio,Patrick Girardet al. DFT: Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2013, New York, United States. pp.143-148, ⟨10.1109/DFT.2013.6653597⟩ Communication dans un congrès lirmm-01238413v1
Comparison of the transient current shapes obtained with the diffusion model and the double exponential law — Impact on the SER Frédéric Wrobel,Luigi Dilillo,Antoine Touboul,Frédéric Saigné RADECS: Radiation and Its Effects on Components and Systems, Sep 2013, Oxford, United Kingdom. ⟨10.1109/RADECS.2013.6937441⟩ Communication dans un congrès lirmm-01237599v1
SRAM Soft Error Rate Evaluation Under Atmospheric Neutron Radiation and PVT variations Georgios Tsiligiannis,Elena Ioana Vatajelu,Luigi Dilillo,Alberto Bosio,Patrick Girardet al. IOLTS: International On-Line Testing Symposium, Jul 2013, Chania, Crete, Greece. pp.145-150, ⟨10.1109/IOLTS.2013.6604066⟩ Communication dans un congrès lirmm-00818955v1
Temperature Impact on the Neutron SER of a Commercial 90nm SRAM Georgios Tsiligiannis,Luigi Dilillo,Alberto Bosio,Patrick Girard,Serge Pravossoudovitchet al. NSREC: Nuclear and Space Radiation Effects Conference, Jul 2013, San Francisco, Ca, United States. pp.1-4 Communication dans un congrès lirmm-00805291v1
Multiple-Cell-Upsets on a commercial 90nm SRAM in Dynamic Mode Georgios Tsiligiannis,Luigi Dilillo,Alberto Bosio,Patrick Girard,Serge Pravossoudovitchet al. RADECS: Radiation and Its Effects on Components and Systems, Sep 2013, Oxford, United Kingdom. pp.1-4, ⟨10.1109/RADECS.2013.6937429⟩ Communication dans un congrès lirmm-00839062v1
Effect-Cause Intra-Cell Diagnosis at Transistor Level Zhenzhou Sun,Alberto Bosio,Luigi Dilillo,Patrick Girard,Aida Todri-Sanialet al. ISQED 2013 - 14th International Symposium on Quality Electronic Design, Mar 2013, Santa Clara, CA, United States. pp.460-467, ⟨10.1109/ISQED.2013.6523652⟩ Communication dans un congrès lirmm-00817224v1
Fast and Accurate Electro-Thermal Analysis of Three-Dimensional Power Delivery Networks Aida Todri-Sanial,Alberto Bosio,Luigi Dilillo,Patrick Girard,Arnaud Virazel EuroSimE: Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, Apr 2013, Wroclaw, Poland. pp.1-4, ⟨10.1109/EuroSimE.2013.6529956⟩ Communication dans un congrès lirmm-00839043v1
Mitigate TSV Electromigration for 3D ICs - From the Architecture Perspective Yuanqing Cheng,Aida Todri-Sanial,Alberto Bosio,Luigi Dilillo,Patrick Girardet al. International Symposium on VLSI, Natale, Brazil. pp.6 Communication dans un congrès lirmm-00839052v1
Evaluating An SEU Monitor For Mixed-Field Radiation Environments Georgios Tsiligiannis,Luigi Dilillo,Alberto Bosio,Patrick Girard,Serge Pravossoudovitchet al. iWoRID: International Workshop on Radiation Imaging Detectors, SOLEIL Synchrotron, Jun 2013, Paris, France Communication dans un congrès lirmm-01238433v1
Worst-Case Power Supply Noise and Temperature Distribution Analysis for 3D PDNs with Multiple Clock Domains Aida Todri-Sanial,Alberto Bosio,Luigi Dilillo,Patrick Girard,Serge Pravossoudovitchet al. NEWCAS: New Circuits and Systems, Jun 2013, Paris, France. ⟨10.1109/NEWCAS.2013.6573628⟩ Communication dans un congrès lirmm-00839042v1
Analyzing the effect of concurrent variability in the core cells and sense amplifiers on SRAM read access failures Elena Ioana Vatajelu,Alberto Bosio,Luigi Dilillo,Patrick Girard,Aida Todri-Sanialet al. DTIS: Design and Technology of Integrated Systems in Nanoscale Era, Mar 2013, Abu Dhabi, United Arab Emirates. pp.39-44, ⟨10.1109/DTIS.2013.6527775⟩ Communication dans un congrès lirmm-01248603v1
SEU Monitoring in Mixed-Field Radiation Environments of Particle Accelerators Georgios Tsiligiannis,Luigi Dilillo,Alberto Bosio,Patrick Girard,Serge Pravossoudovitchet al. RADECS: Radiation and Its Effects on Components and Systems, Sep 2013, Oxford, United Kingdom. pp.1-4, ⟨10.1109/RADECS.2013.6937419⟩ Communication dans un congrès lirmm-00839085v1
Improving Defect Localization Accuracy by means of Effect-Cause Intra-Cell Diagnosis at Transistor Level Zhenzhou Sun,Alberto Bosio,Luigi Dilillo,Patrick Girard,Aida Todri-Sanialet al. SDD: Silicon Debug and Diagnosis, Sep 2013, Anaheim, CA, United States Communication dans un congrès lirmm-00806872v1
Why and How Controlling Power Consumption During Test: A Survey Alberto Bosio,Luigi Dilillo,Patrick Girard,Aida Todri-Sanial,Arnaud Virazel ATS: Asian Test Symposium, Nov 2012, Niigata, Japan. pp. 221-226, ⟨10.1109/ATS.2012.30⟩ Communication dans un congrès lirmm-00818984v1
Impacts of Resistive-Open Defects in the Word-Line Selection of TAS-MRAMs João Azevedo,Arnaud Virazel,Alberto Bosio,Luigi Dilillo,Patrick Girardet al. Colloque GDR SoC-SiP, 2012, Paris, France Communication dans un congrès lirmm-00806842v1
Through-Silicon-Via Resistive-Open Defect Analysis Carolina Momo Metzler,Aida Todri-Sanial,Alberto Bosio,Luigi Dilillo,Patrick Girardet al. ETS: European Test Symposium, May 2012, Annecy, France. ⟨10.1109/ETS.2012.6233037⟩ Communication dans un congrès lirmm-00806848v1
An Error Resilient Platform for Data Transfer and Power Management for a Distributed SRAM-based Neutron Detection Test Bench Luigi Dilillo RADSOL: Electronique et rayonnements naturels au niveau du sol, Jun 2012, Paris, France Communication dans un congrès lirmm-00805398v1
Complete Framework for the Estimation of the SRAM Core-Cell Resilience to Radiation Georgios Tsiligiannis,Luigi Dilillo,Alberto Bosio,Patrick Girard,Aida Todri-Sanialet al. RADECS: Radiation and its Effects on Components and Systems, Sep 2012, Biarritz, France Communication dans un congrès hal-01935785v1
SRAM testing under Neutron Radiation for the evaluation of different algorithms stress Georgios Tsiligiannis,Luigi Dilillo,Alberto Bosio,Patrick Girard,Aida Todri-Sanialet al. 15ème Journées Nationales du Réseau Doctoral en Microélectronique, Jun 2012, Marseille, France Communication dans un congrès lirmm-00807054v1
Peak Power Estimation: A Case Study on CPU Cores Paolo Bernardi,Mauricio de Carvalho,Ernesto Sanchez,Matteo Sonza Reorda,Alberto Bosioet al. IEEE Asian Test Symposium, Nov 2012, Niigata, Japan. pp.167-172, ⟨10.1109/ATS.2012.58⟩ Communication dans un congrès lirmm-00805389v1
A Silicon Diode Based Detector for the Natural Radiative Environment Measurement in Altitude Denis Pantel,Jean-Roch Vaillé,Frédéric Wrobel,Luigi Dilillo,Jean-Marc J.-M. Galliereet al. IEEE (Nuclear Plasma Society) Real Time Conference, Jun 2012, Berkeley, CA, United States. pp.1-6, ⟨10.1109/RTC.2012.6418104⟩ Communication dans un congrès lirmm-00805169v1
Power Supply Noise Sensor Based on Timing Uncertainty Measurements Miroslav Valka,Alberto Bosio,Luigi Dilillo,Patrick Girard,Aida Todri-Sanialet al. ATS: Asian Test Symposium, Nov 2012, Niigata, Japan. pp.161-166, ⟨10.1109/ATS.2012.46⟩ Communication dans un congrès lirmm-00806890v1
Low-power SRAMs Power Mode Control Logic: Failure Analysis and Test Solutions Leonardo B. Zordan,Alberto Bosio,Luigi Dilillo,Patrick Girard,Aida Todri-Sanialet al. ITC'2012: International Test Conference, Nov 2012, Anaheim, CA, United States. pp.1-10, ⟨10.1109/TEST.2012.6401578⟩ Communication dans un congrès lirmm-00805143v1
On Using Address Scrambling for Defect Tolerance in SRAMs Renan Alves Fonseca,Luigi Dilillo,Alberto Bosio,Patrick Girard,Serge Pravossoudovitchet al. International test Conference, Sep 2011, Anaheim, CA, United States. pp.1-8, ⟨10.1109/TEST.2011.6139149⟩ Communication dans un congrès lirmm-00805334v1
Resistive-Open Defects Affecting Bit-Line Selection in TAS-MRAM Architectures João Azevedo,Arnaud Virazel,Alberto Bosio,Luigi Dilillo,Patrick Girardet al. JNRDM: Journées Nationales du Réseau Doctoral en Microélectronique, 2012, Paris, France Communication dans un congrès lirmm-00806827v1
Characteristics of the Transient Currents Induced by Atmospheric Neutrons on a 40nm Electrode of an NMOS Transistor Frédéric Wrobel,Luigi Dilillo,Antoine Touboul,Jean-Roch Vaillé,Frédéric Saigné NSREC: Nuclear and Space Radiation Effects Conference, Jul 2012, Miami, Florida, United States. pp.1-4 Communication dans un congrès lirmm-00805275v1
A Novel Framework for Evaluating the SRAM Core-Cell Sensitivity to Neutrons Georgios Tsiligiannis,Luigi Dilillo,Alberto Bosio,Patrick Girard,Aida Todri-Sanialet al. RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2012, Biarritz, France. pp.1-4 Communication dans un congrès lirmm-00805163v1
Impact of Resistive-Open Defects on the Heat Current of TAS-MRAM Architectures João Azevedo,Arnaud Virazel,Alberto Bosio,Luigi Dilillo,Patrick Girardet al. DATE 2012 - 15th Design, Automation and Test in Europe Conference and Exhibition, Mar 2012, Dresden, Germany. pp.532-537, ⟨10.1109/DATE.2012.6176526⟩ Communication dans un congrès lirmm-00689024v1
Fault Localization Improvement through an Intra-Cell Diagnosis Approach Zhenzhou Sun,Alberto Bosio,Luigi Dilillo,Patrick Girard,Aida Todri-Sanialet al. ISTFA 2012 - 38th International Symposium for Testing and Failure Analysis, Nov 2012, Phoenix, AZ, United States. pp.509-519 Communication dans un congrès lirmm-00806863v1
Radiation Induced Effects on Electronic Systems and ICs Georgios Tsiligiannis,Luigi Dilillo,Alberto Bosio,Patrick Girard,Serge Pravossoudovitchet al. SETS: South European Test Seminar, Mar 2012, Sauze d'Oulx, Italy Communication dans un congrès lirmm-00807055v1
Dynamic Mode Test of a Commercial 4Mb Toggle MRAM under Neutron Radiation Georgios Tsiligiannis,Luigi Dilillo,Alberto Bosio,Patrick Girard,Aida Todri-Sanialet al. RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2012, Biarritz, France. pp.1-4 Communication dans un congrès lirmm-00805165v1
Alpha particle-induced transient currents in 65 nm and 40 nm technologies Frédéric Wrobel,Luigi Dilillo,Antoine Touboul,Frédéric Saigné SEE'2012: Single Event Effects Symposium, Apr 2012, San Diego, CA, United States. pp.1 Communication dans un congrès lirmm-00805378v1
Defect Localization Through an Effect-Cause based Intra-Cell Diagnosis Zhenzhou Sun,Alberto Bosio,Luigi Dilillo,Patrick Girard,Aida Todri-Sanialet al. Colloque GDR SoC-SiP, 2012, Paris, France Communication dans un congrès lirmm-00806841v1
Proton Flux Anisotropy in the Atmosphere: Experiment and Modeling Frédéric Wrobel,Jean-Roch Vaillé,Denis Pantel,Luigi Dilillo,Jean-Marc J.-M. Galliereet al. RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2012, Biarritz, France. pp.1-4 Communication dans un congrès lirmm-00805150v1
Electro-Thermal Analysis of 3D Power Delivery Networks Aida Todri-Sanial,Alberto Bosio,Luigi Dilillo,Patrick Girard,Arnaud Virazel DAC: Design Automation Conference, 2012, San Francisco, United States Communication dans un congrès lirmm-00806836v1
Dynamic Mode Testing of SRAMS under Neutron Radiation Georgios Tsiligiannis,Luigi Dilillo,Alberto Bosio,Patrick Girard,Aida Todri-Sanialet al. Sixième colloque du GDR SOC-SIP du CNRS, Jun 2012, Paris, France Communication dans un congrès lirmm-00807053v1
Resistive-Open Defect Analysis for Through-Silicon-Vias Carolina Momo Metzler,Aida Todri-Sanial,Alberto Bosio,Luigi Dilillo,Patrick Girardet al. DCIS 2012 - 27th Conference on Design of Circuits and Integrated Systems, Nov 2012, Avignon, France Communication dans un congrès lirmm-00806803v1
Defect Analysis in Power Mode Control Logic of Low-Power SRAMs Leonardo B. Zordan,Alberto Bosio,Luigi Dilillo,Patrick Girard,Aida Todri-Sanialet al. ETS: European Test Symposium, May 2012, Annecy, France. ⟨10.1109/ETS.2012.6233033⟩ Communication dans un congrès lirmm-00805374v1
Impact of Resistive-Bridge Defects in TAS-MRAM Architectures João Azevedo,Arnaud Virazel,Alberto Bosio,Luigi Dilillo,Patrick Girardet al. ATS: Asian Test Symposium, Nov 2012, Niigata, Japan. pp.125-130, ⟨10.1109/ATS.2012.37⟩ Communication dans un congrès lirmm-00806809v1
A Pseudo-Dynamic Comparator for Error Detection in Fault Tolerant Architectures Ahn Duc Tran,Arnaud Virazel,Alberto Bosio,Luigi Dilillo,Patrick Girardet al. VTS: VLSI Test Symposium, Apr 2012, Hawaii, United States. pp.50-55, ⟨10.1109/VTS.2012.6231079⟩ Communication dans un congrès lirmm-00806778v1
Advanced Test Methods for SRAMs Alberto Bosio,Luigi Dilillo,Patrick Girard,Serge Pravossoudovitch,Arnaud Virazel VTS: VLSI Test Symposium, Apr 2012, Hyatt Maui, HI, United States. pp.300-301, ⟨10.1109/VTS.2012.6231070⟩ Communication dans un congrès lirmm-00805049v1
Evaluation of Test Algorithms Stress Effect on SRAMs under Neutron Radiation Georgios Tsiligiannis,Luigi Dilillo,Alberto Bosio,Patrick Girard,Aida Todri-Sanialet al. IOLTS: International On-Line Testing Symposium, Jun 2012, Sitges, Spain. pp.212-222, ⟨10.1109/IOLTS.2012.6313853⟩ Communication dans un congrès lirmm-00805373v1
Adaptive Voltage Scaling via Effective On-Chip Timing Uncertainty Measurements Miroslav Valka,Alberto Bosio,Luigi Dilillo,Patrick Girard,Aida Todri-Sanialet al. Colloque GDR SoC-SiP, 2012, Paris, France Communication dans un congrès lirmm-00806859v1
Analysis of Resistive-Open Defects in TAS-MRAM Array João Azevedo,Arnaud Virazel,Alberto Bosio,Luigi Dilillo,Patrick Girardet al. ITC: International Test Conference, Sep 2011, Anaheim, CA, United States Communication dans un congrès lirmm-00679524v1
Simultaneous Power and Thermal Integrity Analysis for 3D Integrated Systems Aida Todri-Sanial,Alberto Bosio,Luigi Dilillo,Patrick Girard,Serge Pravossoudovitchet al. LPonTR'11: IEEE International Workshop on the Impact of Low Power on Test and Reliability, Trondheim, Norway Communication dans un congrès lirmm-00651802v1
Robust Structure for Data Collection and Transfer in a Distributed SRAM Based Neutron Test Bench Luigi Dilillo,Alberto Bosio,Patrick Girard,Serge Pravossoudovitch,Arnaud Virazel Workshop on Dependability Issues in Deep-Submicron Technologies, Trondheim, Norway Communication dans un congrès lirmm-00651796v1
Robustness Improvement of Digital Circuits A New Hybrid Fault Tolerant Architecture Ahn Duc Tran,Arnaud Virazel,Alberto Bosio,Luigi Dilillo,Patrick Girardet al. JNRDM'11: Journées Nationales du Réseau Doctoral de Microélectronique, Paris, France Communication dans un congrès lirmm-00679509v1
Mapping Test Power to Functional Power through Smart X-Filling for LOS Scheme Fangmei Wu,Luigi Dilillo,Alberto Bosio,Patrick Girard,Serge Pravossoudovitchet al. LPonTR'11: IEEE International Workshop on the Impact of Low Power on Test and Reliability, Trondheim, Norway Communication dans un congrès lirmm-00651905v1
Failure Analysis and Test Solutions for Low-Power SRAMs Leonardo B. Zordan,Alberto Bosio,Luigi Dilillo,Patrick Girard,Serge Pravossoudovitchet al. ATS: Asian Test Symposium, Nov 2011, New Delhi, India. pp.459-460, ⟨10.1109/ATS.2011.97⟩ Communication dans un congrès lirmm-00805123v1
Error Resilient Infrastructure for Data Transfer in a Distributed Neutron Detector Luigi Dilillo,Alberto Bosio,Miroslav Valka,Patrick Girard,Serge Pravossoudovitchet al. DFT 2011 - International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2011, Vancouver, Canada. pp.294-301, ⟨10.1109/DFT.2011.41⟩ Communication dans un congrès lirmm-00651226v1
Dynamic-Stress Neutrons Test of Commercial SRAMs Paolo Rech,Jean-Marc J.-M. Galliere,Patrick Girard,Frédéric Wrobel,Frédéric Saignéet al. IEEE Nuclear and Space Radiation Effects Conference, Jul 2012, Las Vegas, NV, United States. pp.1-4 Communication dans un congrès lirmm-00805349v1
A Hybrid Fault Tolerant Architecture for Robustness Improvement of Digital Circuits Ahn Duc Tran,Arnaud Virazel,Alberto Bosio,Luigi Dilillo,Patrick Girardet al. ATS 2011 - 20th IEEE Asian Test Symposium, Nov 2011, New Delhi, India. pp.136-141, ⟨10.1109/ATS.2011.89⟩ Communication dans un congrès lirmm-00651238v1
Effective Launch-to-Capture Power Reduction for LOS Scheme with Adjacent-Probability-Based X-Filling Kohei Miyase,Yuta Uchinodan,Kazunari Enokimoto,Yuta Yamato,Xiaoqing Wenet al. ATS: Asian Test Symposium, 2011, New Delhi, India. pp.21-23 Communication dans un congrès lirmm-00651247v1
On using a SPICE-like TSTAC™ eFlash model for design and test Pierre-Didier Mauroux,Arnaud Virazel,Alberto Bosio,Luigi Dilillo,Patrick Girardet al. DDECS: Design and Diagnostics of Electronic Circuits ans Systems, Apr 2011, Cottbus, Germany. pp.359-370, ⟨10.1109/DDECS.2011.5783111⟩ Communication dans un congrès lirmm-00592203v1
Variability Analysis of an SRAM Test Chip Renan Alves Fonseca,Luigi Dilillo,Alberto Bosio,Patrick Girard,Serge Pravossoudovitchet al. ETS: European Test Symposium, May 2011, Trondheim, Norway Communication dans un congrès lirmm-00651791v1
A DfT Solution for Oxide Thickness Varitions in ATMEL eFlash Technology Pierre-Didier Mauroux,Arnaud Virazel,Alberto Bosio,Luigi Dilillo,Patrick Girardet al. DTIS: Design and Technology of Integrated Systems in Nanoscale Era, 2011, Athènes, Greece Communication dans un congrès lirmm-00647750v1
Power Reduction Through X-filling of Transition Fault Test Vectors for LOS Testing Fangmei Wu,Luigi Dilillo,Alberto Bosio,Patrick Girard,Serge Pravossoudovitchet al. DTIS: Design and Technology of Integrated Systems in Nanoscale Era, 2011, Athènes, Greece. ⟨10.1109/DTIS.2011.5941434⟩ Communication dans un congrès lirmm-00647760v1
A Hybrid Fault Tolerant Architecture for Robustness Improvement of Digital Circuits Ahn Duc Tran,Arnaud Virazel,Alberto Bosio,Luigi Dilillo,Patrick Girardet al. GDR SOC-SIP'11 : Colloque GDR SoC-SiP, Lyon, France Communication dans un congrès lirmm-00679513v1
Neutron-Induced Multiple Bit Upsets on Dynamically-Stressed Commercial SRAM Arrays Paolo Rech,Jean-Marc J.-M. Galliere,Patrick Girard,Alessio Griffoni,Frédéric Wrobelet al. RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2011, Seville, Spain. pp.274-280, ⟨10.1109/RADECS.2011.6131396⟩ Communication dans un congrès lirmm-00805314v1
Optimized March Test Flow for Detecting Memory Faults in SRAM Devices Under Bit Line Coupling Leonardo B. Zordan,Alberto Bosio,Luigi Dilillo,Patrick Girard,Serge Pravossoudovitchet al. GDR SOC-SIP'11 : Colloque GDR SoC-SiP, Lyon, France Communication dans un congrès lirmm-00679522v1
Neutron-Induced Failure in Super-Junction, IGBT, and SiC Power Devices Alessio Griffoni,Jeroen van Duivenbode,Dimitri Linten,Eddy Simoen,Paolo Rechet al. RADECS: Radiation and Its Effects on Components and Systems, Sep 2011, Seville, Spain. pp.226-231, ⟨10.1109/RADECS.2011.6131395⟩ Communication dans un congrès lirmm-00805339v1
Impact of Atmospheric Neutrons on SRAMs through a Modular Test Bench Luigi Dilillo RADSOL - Electronique et rayonnements naturels au niveau du sol, Jun 2011, Paris, France Communication dans un congrès lirmm-00805407v1
Test and Reliability of Magnetic Random Access Memories João Azevedo,Arnaud Virazel,Alberto Bosio,Luigi Dilillo,Patrick Girardet al. GDR SOC-SIP'11: Colloque GDR SoC-SiP, Lyon, France Communication dans un congrès lirmm-00679516v1
Versatile March Test Generator for Hands-on Memory Testing Laboratory Jean-Marc J.-M. Galliere,Luigi Dilillo MSE: Microelectronic Systems Education, Jun 2011, San Diego, CA, United States. pp.41-42, ⟨10.1109/MSE.2011.5937088⟩ Communication dans un congrès lirmm-00805300v1
A Functional Power Evaluation Flow for Defining Test Power Limits during At-Speed Delay Testing Miroslav Valka,Alberto Bosio,Luigi Dilillo,Patrick Girard,Serge Pravossoudovitchet al. ETS 2011 - 16th IEEE European Test Symposium, May 2011, Trondheim, Norway. pp.153-158, ⟨10.1109/ETS.2011.21⟩ Communication dans un congrès lirmm-00647822v1
Robust Data Collection and Transfer Framework for a Distributed SRAM Based Neutron Sensor Luigi Dilillo,Alberto Bosio,Paolo Rech,Patrick Girard,Frédéric Wrobelet al. IEEE International Workshop on Advances in Sensors and Interfaces, Jun 2011, Savelletri di Fasano, Italy. pp.176-180, ⟨10.1109/IWASI.2011.6004712⟩ Communication dans un congrès lirmm-00805394v1
Neutron Detection in Atmospheric Environment through Static and Dynamic SRAM-Based Test Bench Luigi Dilillo,Paolo Rech,Jean-Marc J.-M. Galliere,Patrick Girard,Frédéric Wrobelet al. IEEE Latin American test Workshop, Mar 2011, Porto de Galinhas, Brazil. pp.1-6 Communication dans un congrès lirmm-00805120v1
Power-Aware Test Pattern Generation for At-Speed LOS Testing Alberto Bosio,Luigi Dilillo,Patrick Girard,Aida Todri-Sanial,Arnaud Virazelet al. ATS: Asian Test Symposium, Nov 2011, New Delhi, India. pp.506-510 Communication dans un congrès lirmm-00651917v1
On Using Address Scrambling to Implement Defect Tolerance in SRAMs Renan Alves Fonseca,Luigi Dilillo,Alberto Bosio,Patrick Girard,Serge Pravossoudovitchet al. ITC'2011: International Test Conference, Sep 2011, Anaheim, CA, United States. pp.N/A Communication dans un congrès lirmm-00647773v1
Power Supply Noise and Ground Bounce Aware Pattern Generation for Delay Testing Aida Todri-Sanial,Alberto Bosio,Luigi Dilillo,Patrick Girard,Serge Pravossoudovitchet al. NEWCAS: International New Circuits and Systems Conference, Jun 2011, Bordeaux, France. pp.73-76, ⟨10.1109/NEWCAS.2011.5981222⟩ Communication dans un congrès lirmm-00647815v1
Optimized March Test Flow for Detecting Memory Faults in SRAM Devices Under Bit Line Coupling Leonardo B. Zordan,Alberto Bosio,Luigi Dilillo,Patrick Girard,Serge Pravossoudovitchet al. DDECS'11: 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits ans Systems, Netherlands. pp.353-358 Communication dans un congrès lirmm-00592182v1
A Study of Path Delay Variations in the Presence of Uncorrelated Power and Ground Supply Noise Aida Todri-Sanial,Alberto Bosio,Luigi Dilillo,Patrick Girard,Serge Pravossoudovitchet al. DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2011, Cottbus, Germany. pp.189-194, ⟨10.1109/DDECS.2011.5783078⟩ Communication dans un congrès lirmm-00592000v1
A Statistical Simulation Method for Reliability Analysis of SRAM Core-Cells Renan Alves Fonseca,Luigi Dilillo,Alberto Bosio,Patrick Girard,Serge Pravossoudovitchet al. DAC: Design Automation Conference, Jun 2010, Anaheim, United States. pp.853-856 Communication dans un congrès lirmm-00553619v1
A Comprehensive System-on-Chip Logic Diagnosis Youssef Benabboud,Alberto Bosio,Luigi Dilillo,Patrick Girard,Serge Pravossoudovitchet al. ATS: Asian Test Symposium, 2010, Shanghai, China. pp.237-242 Communication dans un congrès lirmm-00545131v1
Detecting NBTI Induced Failures in SRAM Core-Cells Renan Alves Fonseca,Luigi Dilillo,Alberto Bosio,Patrick Girard,Serge Pravossoudovitchet al. VTS'10: VLSI Test Symposium, Santa Cruz, CA, United States. pp.75-80 Communication dans un congrès lirmm-00553612v1
Test Relaxation and X-filling to Reduce Peak Power During At-Speed LOS Testing Fangmei Wu,Luigi Dilillo,Alberto Bosio,Patrick Girard,Serge Pravossoudovitchet al. GDR SOC-SIP'10 : Colloque GDR SoC-SiP, Cergy, France Communication dans un congrès lirmm-00553989v1
Setting Test Conditions for Improving SRAM Reliability Renan Alves Fonseca,Luigi Dilillo,Alberto Bosio,Patrick Girard,Serge Pravossoudovitchet al. ETS: European Test Symposium, May 2010, Prague, Czech Republic. pp.257-262 Communication dans un congrès lirmm-00492741v1
Impact of Resistive-Open Defects on SRAM sensitivity to Soft Errors Paolo Rech,Jean-Marc J.-M. Galliere,Patrick Girard,Frédéric Wrobel,Frédéric Saignéet al. RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2010, Langenfeld, Austria Communication dans un congrès lirmm-00566847v1
X-Identification of Transition Delay Fault Tests for Launch-off Shift Scheme Kohei Miyase,Fangmei Wu,Luigi Dilillo,Alberto Bosio,Patrick Girardet al. WRTLT'10: 11th IEEE Workshop On RTL and High Level Testing, Shanghai, China. pp.N/A Communication dans un congrès lirmm-00566869v1
Analysis of Root Causes of Alpha Sensitivity Variations on Microprocessors Manufactured using Different Cell Layouts Paolo Rech,Michelangelo Grosso,Fabio Melchiori,Domenico Loparco,Davide Appelloet al. IOLTS: International On-Line Testing Symposium, Jul 2010, Corfu, Greece. pp.29-34, ⟨10.1109/IOLTS.2010.5560236⟩ Communication dans un congrès lirmm-00559034v1
Tolérance aux fautes et rendement de fabrication Ahn Duc Tran,Arnaud Virazel,Alberto Bosio,Luigi Dilillo,Patrick Girardet al. GDR SOC-SIP'10 : Colloque GDR SoC-SiP, Cergy, France Communication dans un congrès lirmm-00553995v1
A Two-Layer SPICE Model of the ATMEL TSTAC eFlash Memory Technology for Defect Injection and Faulty Behavior Prediction Pierre-Didier Mauroux,Arnaud Virazel,Alberto Bosio,Luigi Dilillo,Patrick Girardet al. ETS: European Test Symposium, May 2010, Prague, Czech Republic. pp.81-86 Communication dans un congrès lirmm-00493204v1
Analysis of Resistive-Bridging Defects in SRAM Core-Cells: a Comparative Study from 90nm down to 40nm Technology Nodes Renan Alves Fonseca,Luigi Dilillo,Alberto Bosio,Patrick Girard,Serge Pravossoudovitchet al. ETS: European Test Symposium, May 2010, Prague, Czech Republic. pp.132-137 Communication dans un congrès lirmm-00493236v1
Impact of Resistive-Bridging Defects in SRAM Core-Cell Renan Alves Fonseca,Luigi Dilillo,Alberto Bosio,Patrick Girard,Serge Pravossoudovitchet al. DELTA'10: International Symposium on Electronic Design, Test & Applications, Ho Chi Minh, Vietnam. pp.265-270 Communication dans un congrès lirmm-00553592v1
Power Reduction Through X-filling of Transition Fault Test Vectors for LOS Testing Fangmei Wu,Luigi Dilillo,Alberto Bosio,Patrick Girard,Serge Pravossoudovitchet al. LPonTR: Impact of Low-Power design on Test and Reliability, May 2010, Prague, Czech Republic Communication dans un congrès lirmm-00553930v1
A Memory Fault Simulator for Radiation-Induced Effects in SRAMs Paolo Rech,Alberto Bosio,Patrick Girard,Serge Pravossoudovitch,Arnaud Virazelet al. ATS: Asian Test Symposium, 2010, Shanghai, China. pp.100-105 Communication dans un congrès lirmm-00545102v1
Analysis of Power Consumption and Transition Fault Coverage for LOS and LOC Testing Schemes Wu Fangmei,Luigi Dilillo,Alberto Bosio,Patrick Girard,Serge Pravossoudovitchet al. DDECS'10: 13th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Apr 2010, Vienna, Austria. pp.376-381 Communication dans un congrès lirmm-00475734v1
Analyse et modélisation des défauts résistifs affectant les mémoires Flash Pierre-Didier Mauroux,Arnaud Virazel,Alberto Bosio,Luigi Dilillo,Patrick Girardet al. GDR SOC-SIP'10 : Colloque GDR SoC-SiP, Cergy, France Communication dans un congrès lirmm-00553947v1
Analysis and Fault Modeling of Actual Resistive Defects in Flash Memories Pierre-Didier Mauroux,Arnaud Virazel,Alberto Bosio,Luigi Dilillo,Patrick Girardet al. JNRDM'10 : Journées Nationales du Réseau Doctoral de Microélectronique, Montpellier, France Communication dans un congrès lirmm-00553935v1
Setting Test Conditions for Detecting Faults Induced by Random Dopant Fluctuation in SRAM Core-Cells Renan Alves Fonseca,Luigi Dilillo,Alberto Bosio,Patrick Girard,Serge Pravossoudovitchet al. VARI: Workshop on CMOS Variability, 2010, Montpellier, France Communication dans un congrès lirmm-00553626v1
Delay Fault Diagnosis in Sequential Circuits Youssef Benabboud,Alberto Bosio,Luigi Dilillo,Patrick Girard,Serge Pravossoudovitchet al. ATS: Asian Test Symposium, Nov 2009, Taichung, Taiwan. pp.355-360 Communication dans un congrès lirmm-00406968v1
Neutron Detection through an SRAM-Based Test Bench Luigi Dilillo,Frédéric Wrobel,Jean-Marc J.-M. Galliere,Frédéric Saigné IWASI'09: International Workshop On Advances in Sensors and Interfaces, Jun 2009, Trani, Italy. pp.64-69, ⟨10.1109/IWASI.2009.5184769⟩ Communication dans un congrès lirmm-00438842v1
Influence of Gate Oxide Short Defects on the Stability of Minimal Sized SRAM Core-Cell by Applying Non-Split Models Jean-Marc J.-M. Galliere,Florence Azaïs,Michel Renovell,Luigi Dilillo DTIS: Design and Technology of Integrated Systems in Nanoscale Era, 2009, Cairo, Egypt. pp.225-229 Communication dans un congrès lirmm-00370798v1
Use of BOBST for the Detection of Neutrons Induced Errors in SRAM Luigi Dilillo,Frédéric Wrobel,Jean-Marc J.-M. Galliere,F. Saigné IWASI: International Workshop on Advances in Sensors and Interfaces, Jun 2009, Trani, Italy Communication dans un congrès hal-01957246v1
A Fault-Simulation-Based Approach for Logic Diagnosis Youssef Benabboud,Alberto Bosio,Patrick Girard,Serge Pravossoudovitch,Arnaud Virazelet al. DTIS: Design and Technology of Integrated Systems in Nanoscale Era, Apr 2009, Cairo, Egypt. pp.216-221 Communication dans un congrès lirmm-00371377v1
Trade-off Between Power Dissipation and Delay Fault Coverage For LOS and LOC Testing Schemes Fangmei Wu,Luigi Dilillo,Alberto Bosio,Patrick Girard,Serge Pravossoudovitchet al. Impact of Low-Power Design on Test and Reliability, Spain Communication dans un congrès lirmm-00435005v1
Comprehensive Bridging Fault Diagnosis based on the SLAT Paradigm Youssef Benabboud,Alberto Bosio,Luigi Dilillo,Patrick Girard,Arnaud Virazelet al. DDECS'09: 12th IEEE Symposium on Design and Diagnostics of Electronic Systems, pp.264-269 Communication dans un congrès lirmm-00371198v1
A New Design-for-Test Technique for SRAM Core-Cell Stability Faults Alexandre Ney,Luigi Dilillo,Patrick Girard,Serge Pravossoudovitch,Arnaud Virazelet al. DATE: Design, Automation and Test in Europe, Apr 2009, Nice, France. pp.1344-1348, ⟨10.1109/DATE.2009.5090873⟩ Communication dans un congrès lirmm-00371374v1
Using TMR Architectures for SoC Yield Improvement Julien Vial,Arnaud Virazel,Alberto Bosio,Luigi Dilillo,Patrick Girardet al. VALID'09: The First International Conference on Advances in System Testing and Validation Lifecycle, 2009, Porto, Portugal. pp.155-160 Communication dans un congrès lirmm-00406967v1
A History-Based Diagnosis Technique for Static and Dynamic Faults in SRAMs Alexandre Ney,Alberto Bosio,Luigi Dilillo,Patrick Girard,Serge Pravossoudovitchet al. ITC'2008: International Test Conference, Oct 2008, Santa Clara, CA, United States. pp.1-10, ⟨10.1109/TEST.2008.4700555⟩ Communication dans un congrès lirmm-00341798v1
A History-Based Technique for Faults Diagnosis in SRAMs Alexandre Ney,Alberto Bosio,Luigi Dilillo,Patrick Girard,Serge Pravossoudovitchet al. Colloque GDR SoC-SiP, France Communication dans un congrès lirmm-00341821v1
A Signature-based Approach for Diagnosis of Dynamic Faults in SRAMs Alexandre Ney,Alberto Bosio,Luigi Dilillo,Patrick Girard,Serge Pravossoudovitchet al. DTIS: Design and Technology of Integrated Systems in Nanoscale Era, Mar 2008, Tunis, Tunisia. pp.001-006, ⟨10.1109/DTIS.2008.4540243⟩ Communication dans un congrès lirmm-00324143v1
Impact of Technology Scaling on Defects and Parameter Deviations in Embedded SRAMs Luigi Dilillo,Patrick Girard,Christian Landrault,Serge Pravossoudovitch,Arnaud Virazelet al. VLSI Test Symposium, Apr 2008, San Diego, California, United States. pp.336 Communication dans un congrès lirmm-00324151v1
March CRF: an Efficient Test for Complex Read Faults in SRAM Memories Luigi Dilillo,Bashir M. Al Hashimi DDECS: Design and Diagnostics of Electronic Circuits and Systems, IEEE, Apr 2007, Cracovie, Poland. ⟨10.1109/DDECS.2007.4295276⟩ Communication dans un congrès lirmm-01239052v1
March Pre: an Efficient Test for Resistive-Open Defects in the SRAM Pre-charge Circuit Luigi Dilillo,Patrick Girard,Magali Bastian Hage-Hassan,Serge Pravossoudovitch,Arnaud Virazel DDECS'06: Design and Diagnostics of Electronic Circuits and Systems, Apr 2006, Prague, République Tchèque, pp.256-261 Communication dans un congrès lirmm-00134776v1
Minimizing Test Power in SRAM through Pre-charge Activity Reduction Luigi Dilillo,Paul Rosinger,Patrick Girard,Bashir Al-Hashimi DATE: Design, Automation and Test in Europe, Mar 2006, Munich, Germany. pp.1159-1165, ⟨10.1109/DATE.2006.244016⟩ Communication dans un congrès lirmm-00137598v1
Leakage Read Fault in Nanoscale SRAM: Analysis, Test and Diagnosis Luigi Dilillo,Bashir Al-Hashimi,Paul Rosinger,Patrick Girard IDT'06: IEEE International Design and Test Workshop, Nov 2006, Dubai, United Arab Emirates. pp.110-115 Communication dans un congrès lirmm-00137603v1
Incidence des Défauts Résistifs dans les Circuits de Précharge des Mémoires SRAM Luigi Dilillo,Patrick Girard,Serge Pravossoudovitch,Arnaud Virazel,Magali Bastian Hage-Hassan JNRDM 2005 - 8e Journées Nationales du Réseau Doctoral de Microélectronique, May 2005, Paris, France Communication dans un congrès lirmm-00106529v1
Resistive-Open Defect Injection in SRAM Core-Cell: Analysis and Comparison Between 0.13 um and 90 nm Technologies Luigi Dilillo,Patrick Girard,Serge Pravossoudovitch,Arnaud Virazel,Magali Bastian Hage-Hassan DAC: Design Automation Conference, Jun 2005, Anaheim, CA, United States. pp.857-862 Communication dans un congrès lirmm-00136906v1
Data Retention Fault in SRAM Memories: Analysis and Detection Procedures Luigi Dilillo,Patrick Girard,Serge Pravossoudovitch,Arnaud Virazel,Magali Bastian Hage-Hassan VTS 2005 - 23rd IEEE VLSI Test Symposium, May 2005, Palm Springs, CA, United States. pp.183-188, ⟨10.1109/VTS.2005.37⟩ Communication dans un congrès lirmm-00105995v1
Resistive-Open Defect Influence in SRAM Pre-Charge Circuits: Analysis and Characterization Luigi Dilillo,Patrick Girard,Serge Pravossoudovitch,Arnaud Virazel,Magali Bastian Hage-Hassan ETS: European Test Symposium, May 2005, Tallinn, Estonia. pp.116-121, ⟨10.1109/ETS.2005.33⟩ Communication dans un congrès lirmm-00106010v1
Efficient Test of Dynamic Read Destructive Faults in SRAM Memories Luigi Dilillo,Patrick Girard,Serge Pravossoudovitch,Arnaud Virazel,Magali Bastian Hage-Hassan LATW: Latin American Test Workshop, Mar 2005, Salvador, Bahia, Brazil. pp.40-45 Communication dans un congrès lirmm-00106515v1
Resistive-Open Defect Injection in SRAM Core-Cell: Analysis and Comparison between 0.13μm and 90nm Technologies Luigi Dilillo,Patrick Girard,Serge Pravossoudovitch,Arnaud Virazel,Magali Bastian Hage-Hassan DAC: Design Automation Conference, May 2005, Anaheim, CA, United States. pp.857-862, ⟨10.1145/1065579.1065804⟩ Communication dans un congrès lirmm-00106558v1
Dynamic Read Destructive Faults in Embedded-SRAMs: Analysis and March Test Solution Luigi Dilillo,Patrick Girard,Serge Pravossoudovitch,Arnaud Virazel,Simone Borriet al. ETS: European Test Symposium, May 2004, Ajaccio, Corsica, France. pp.140-145 Communication dans un congrès lirmm-00108795v1
March iC-: An Improved Version of March C- for ADOFs Detection Luigi Dilillo,Patrick Girard,Serge Pravossoudovitch,Arnaud Virazel,Simone Borri VTS: VLSI Test Symposium, Apr 2004, Napa Valley, CA, United States. pp.129-134, ⟨10.1109/VTEST.2004.1299236⟩ Communication dans un congrès lirmm-00108772v1
An A/D Interface for Resonant Piezoresistive MEMS Sensor Luigi Dilillo,Vincent Beroulle,Norbert Dumas,Laurent Latorre,Pascal Nouet ISIE 2004 - IEEE International Symposium on Industrial Electronics, May 2004, Ajaccio, France. pp.83-88, ⟨10.1109/ISIE.2004.1571786⟩ Communication dans un congrès lirmm-00108896v1
Resistive-Open Defects in Embedded-SRAM Core Cells: Analysis and March Test Solution Luigi Dilillo,Patrick Girard,Serge Pravossoudovitch,Arnaud Virazel,Simone Borriet al. ATS: Asian Test Symposium, Nov 2004, Kenting, Taiwan. pp.266-271 Communication dans un congrès lirmm-00108800v1
March Tests Improvements for Address Decoder Open and Resistive Open Fault Detection Luigi Dilillo,Patrick Girard,Serge Pravossoudovitch,Arnaud Virazel,Simone Borriet al. LATW: Latin American Test Workshop, Mar 2004, Cartagena, Colombia. pp.31-36 Communication dans un congrès lirmm-00108642v1
Test March pour la Détection des Fautes Dynamiques dans les Décodeurs de Mémoires SRAM Luigi Dilillo,Patrick Girard,Serge Pravossoudovitch,Arnaud Virazel,Simone Borriet al. JNRDM'04 : 7ièmes Journées Nationales du Réseau Doctoral de Microélectronique, May 2004, Marseille, France. pp.495-497 Communication dans un congrès lirmm-00108644v1
Comparison of open and resistive-open defect test conditions in SRAM address decoders Luigi Dilillo,Patrick Girard,Serge Pravossoudovitch,Arnaud Virazel,Simone Borriet al. ATS: Asian Test Symposium, Nov 2003, Xian, China. pp.250-255, ⟨10.1109/ATS.2003.1250818⟩ Communication dans un congrès lirmm-01238821v1

Poster de conférence (20)

Machine learning application to space particle discrimination from multiple-cell upsets in a memory device Andrea Coronetti,Lucas Matana Luza,Sanaa Barik,Alexandre Bosser,Ruben Garcia Aliaet al. RADECS 2022 - 22nd European Conference on Radiation and Its Effects on Components and Systems, Oct 2022, Venice, Italy. , 2022 Poster de conférence lirmm-03837246v1
Technology Dependence of Stuck Bits and Single Event Upsets in 110, 72, and 63-nm SDRAMs Daniel Söderström,Lucas Matana Luza,André Martins Pio de Mattos,Thierry Gil,Heikki Kettunenet al. RADECS 2022 - 22nd European Conference on Radiation and Its Effects on Components and Systems, Oct 2022, Venice, Italy. Poster de conférence lirmm-03834026v1
A Performance Evaluation of a Fault-tolerant RISC-V with Vector Instruction Support to Space Applications Carolina Imianosky,Douglas Almeida dos Santos,Douglas Rossi de Melo,Luigi Dilillo,Cesar Albenes Zeferinoet al. LASSS/LACW 2022 - Joint 3rd IAA Latin American Symposium on Small Satellites and 5th IAA Latin American CubeSat Workshop, Nov 2022, Brasilia, Brazil. , 2022 Poster de conférence lirmm-03834121v1
Assessing the Reliability of a Network-on-Chip through Physical Validation Gustavo S. Mafra,Thiago H. Rausch,Douglas Almeida dos Santos,Luigi Dilillo,Eduardo Augusto Bezerraet al. LASSS/LACW 2022 - Joint 3rd IAA Latin American Symposium on Small Satellites and 5th IAA Latin American CubeSat Workshop, Nov 2022, Brasilia, Brazil. , 2022 Poster de conférence lirmm-03834119v1
Interconnection Architecture for Dependable Multicore Systems Douglas Rossi de Melo,Cesar Zeferino,Luigi Dilillo,Eduardo Augusto Bezerra PhD Forum - 26th IFIP/IEEE International Conference on Very Large Scale Integration, Oct 2018, Torino, Italy. 2018 Poster de conférence lirmm-02008476v1
Fault-Effect Propagation Based Intra-cell Scan Chain Diagnosis Zhenzhou Sun,Alberto Bosio,Luigi Dilillo,Patrick Girard,Aida Todri-Sanialet al. Colloque GDR SoC-SiP, Jun 2013, Lyon, France. 2013 Poster de conférence lirmm-00839113v1
Performance Evaluation of Capacitive defects on TAS-MRAMs João Azevedo,Arnaud Virazel,Alberto Bosio,Luigi Dilillo,Patrick Girardet al. Colloque GDR SoC-SiP, 2013, Lyon, France. 2013 Poster de conférence lirmm-00839093v1
Investigating Multiple-Cell-Upsets on a 90mn SRAM Georgios Tsiligiannis,Luigi Dilillo,Alberto Bosio,Patrick Girard,Serge Pravossoudovitchet al. Colloque GDR SoC-SiP, 2013, Lyon, France. 2013 Poster de conférence lirmm-00839108v1
Coupling-Based Resistive-Open Defects in TAS-MRAM Architectures João Azevedo,Arnaud Virazel,Alberto Bosio,Luigi Dilillo,Patrick Girardet al. ETS: European Test Symposium, May 2012, Annecy, France. Test Symposium (ETS), 2012 17th IEEE European, 2012, ⟨10.1109/ETS.2012.6233034⟩ Poster de conférence lirmm-00806793v1
Resistive Open Defect Analysis for Through-Silicon-Vias Carolina Momo Metzler,Aida Todri-Sanial,Arnaud Virazel,Alberto Bosio,Luigi Dililloet al. ETS: European Test Symposium, May 2012, Annecy, France. 17th IEEE European Test Symposium, pp.183, 2012 Poster de conférence lirmm-00806795v1
A Roaming Memory Test Bench for Detecting Particle Induced SEUs Jean-Marc J.-M. Galliere,Paolo Rech,Patrick Girard,Luigi Dilillo ITC 2010 - International Test Conference, Nov 2010, Austin, TX, United States. 2010, ⟨10.1109/TEST.2010.5699302⟩ Poster de conférence lirmm-00537879v1
Parity Prediction Synthesis for Nano-Electronic Gate Designs Ahn Duc Tran,Arnaud Virazel,Alberto Bosio,Luigi Dilillo,Patrick Girardet al. ITC'2010: International Test Conference, Nov 2010, Austin, Texas, United States. pp.N/A, 2010 Poster de conférence lirmm-00537938v1
Is Test Power Reduction Through X-Filling Good Enough? Fangmei Wu,Luigi Dilillo,Alberto Bosio,Patrick Girard,Serge Pravossoudovitchet al. ITC'2010: International Test Conference, Nov 2010, Austin, Texas, United States. 2010 Poster de conférence lirmm-00537926v1
SoC Yield Improvement for Future Nanoscale Technologies Julien Vial,Arnaud Virazel,Alberto Bosio,Luigi Dilillo,Patrick Girardet al. ETS 2009 - 14th IEEE European Test Symposium | PhD Forum, May 2009, Sevilla, Spain. 2009 Poster de conférence lirmm-00433798v1
A Logic Diagnosis Approach for Sequential Circuits Youssef Benabboud,Alberto Bosio,Luigi Dilillo,Patrick Girard,Serge Pravossoudovitchet al. ETS 2009 - 14th IEEE European Test Symposium, May 2009, Sevilla, Spain. , 2009, Ph. D. Forum Poster de conférence lirmm-00433792v1
Analysis of Resistive-Bridging Defects in SRAM Core-Cell: Impact within the Core-Cell and in the Memory Array Renan Alves Fonseca,Luigi Dilillo,Alberto Bosio,Patrick Girard,Serge Pravossoudovitchet al. ETS: European Test Symposium, May 2009, Sevilla, Spain. 14th IEEE European Test Symposium, 2009 Poster de conférence lirmm-00433796v1
SRAM Core-cell Quality Metrics Renan Alves Fonseca,Luigi Dilillo,Alberto Bosio,Patrick Girard,Serge Pravossoudovitchet al. GDR SOC SIP, France. 2009 Poster de conférence lirmm-00434962v1
NAND Flash Testing: A Preliminary Study on Actual Defects Pierre-Didier Mauroux,Arnaud Virazel,Alberto Bosio,Luigi Dilillo,Patrick Girardet al. ITC: International Test Conference, Nov 2009, Austin, TX, United States. 2009, ⟨10.1109/TEST.2009.5355898⟩ Poster de conférence lirmm-00433765v1
Trade-off Between Power Dissipation and Delay Fault Coverage for LOS and LOC Testing Schemes Fangmei Wu,Luigi Dilillo,Alberto Bosio,Patrick Girard,Serge Pravossoudovitchet al. GDR SOC SIP, France. 2009 Poster de conférence lirmm-00434959v1
Test des Mémoires FLASH NAND Pierre-Didier Mauroux,Arnaud Virazel,Alberto Bosio,Luigi Dilillo,Patrick Girardet al. Colloque GDR SoC-SiP, France. 2009 Poster de conférence lirmm-00433770v1

Ouvrages (1)

Advanced Test Methods for SRAMs - Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies Alberto Bosio,Luigi Dilillo,Patrick Girard,Serge Pravossoudovitch,Arnaud Virazel Springer, 171 p., 2009, 978-1-4419-0937-4 Ouvrages lirmm-00371359v1

Chapitre d'ouvrage (2)

Space Radiation Effects in Electronics Luigi Dilillo,Alexandre Louis Bosser,Arto Javanainen,Ari Virtanen Rad-hard Semiconductor Memories, Series in Electronic Materials and Devices, River Publishers, pp.1-56, 2018, 9788770220200 Chapitre d'ouvrage lirmm-02007913v1
Electromigration Alleviation Techniques for 3D Integrated Circuits Yuanqing Cheng,Aida Todri-Sanial,Alberto Bosio,Luigi Dilillo,Patrick Girardet al. Chao Wang. High Performance Computing for Big Data: Methodologies and Applications, CRC Press, pp.37-58, 2017, 9781498783996 Chapitre d'ouvrage lirmm-01800220v1

Autre publication scientifique (1)

Effect of space radiation on COTS memories: the MTCUBE project Luigi Dilillo 2019 Autre publication scientifique lirmm-02008210v1

Rapport (5)

Rapport Technique intermédiaire, Contrat TOETS CT 302, Programme CEE CATRENE Patrick Girard,Serge Bernard,Florence Azaïs,Alberto Bosio,Luigi Dililloet al. 2011 Rapport (rapport contrat/projet) lirmm-00679018v1
Rapport Technique de fin d'année, Contrat TOETS CT 302, Programme CEE CATRENE Patrick Girard,Serge Bernard,Florence Azaïs,Alberto Bosio,Luigi Dililloet al. 2011 Rapport (rapport contrat/projet) lirmm-00679022v1
Contrat TOETS CT 302 - Programme CEE CATRENE (Rapport Intermédiaire) Patrick Girard,Serge Bernard,Florence Azaïs,Alberto Bosio,Luigi Dililloet al. 2010 Rapport (rapport contrat/projet) lirmm-00504873v1
TOETS CT302 - Programme CEE CATRENE - Summary Technical Report 2S-2009 - Rapport Technique de Fin d'année Patrick Girard,Florence Azaïs,Serge Bernard,Alberto Bosio,Luigi Dililloet al. 2010 Rapport (rapport contrat/projet) lirmm-00461745v1
Rapport Technique de fin de Contrat NanoTEST 2A702, Programme CEE MEDEA+ Patrick Girard,Serge Bernard,Alberto Bosio,Luigi Dilillo,Marie-Lise Flotteset al. 2009 Rapport (rapport contrat/projet) lirmm-00406974v1

HDR (1)

Test and Reliability of Electronic Circuits in Natural and Radiative Environment Luigi Dilillo Electronics. Université de Montpellier, 2015 HDR tel-01259002v1