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Marcello TRAIOLA

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Documents

Presentation

I obtained my “laurea” degrees (BSc and MSc) in Computer Engineering - cum laude - both from the University of Naples “Federico II” , in Italy, in 2012 and 2016, respectively. In 2019, I obtained my Ph.D. degree in Computer Engineering from the University of Montpellier , working at the Laboratory of Computer Science, Robotics and Microelectronics of Montpellier (LIRMM) , in France. In 2013, I was at Fiat Chrysler Automobiles (now part of the group Stellantis ) Information Technology, Excellence and Methods S.p.A. (FCA ITEM), Pomigliano d’arco (Naples, Italy), as a software engineer intern. From October 2019 to January 2020, I was in the United States for a four-months internship at the semiconductor company MediaTek USA Inc , as an R&D engineer. From February 2020 to September 2021, I was with the Heterogeneous Systems Design team at the Lyon Institute of Nanotechnology (Institut des Nanotechnologies de Lyon, INL), in France, as a post-doctoral researcher. Since October 2021, I am with the TARAN research group (ex CAIRN) at the Inria research center at Rennes University , in France, first as a post-doctoral researcher and then as Inria permanent researcher (CRCN), since October 2022 My fields of research concern mainly emerging computing paradigms, with a focus on hardware digital design, testing, and reliability. I am an IEEE member.

Publications

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Impact of High-Level-Synthesis on Reliability of Artificial Neural Network Hardware Accelerators

Marcello Traiola , Fernando Fernandes dos Santos , Paolo Rech , Carlo Cazzaniga , Olivier Sentieys
IEEE Transactions on Nuclear Science, 2024, pp.1-9. ⟨10.1109/TNS.2024.3377596⟩
Journal articles hal-04514579v1
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A Survey on Deep Learning Resilience Assessment Methodologies

Annachiara Ruospo , Ernesto Sanchez , Lucas Matana Luza , Luigi Dilillo , Marcello Traiola
Computer, 2023, 56, pp.57-66. ⟨10.1109/MC.2022.3217841⟩
Journal articles lirmm-03834128v1
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A Genetic-algorithm-based Approach to the Design of DCT Hardware Accelerators

Mario Barbareschi , Salvatore Barone , Alberto Bosio , Jie Han , Marcello Traiola
ACM Journal on Emerging Technologies in Computing Systems, 2022, 18 (3), pp.1-25. ⟨10.1145/3501772⟩
Journal articles hal-03553505v1
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Towards the Integration of Reliability and Security Mechanisms to Enhance the Fault Resilience of Neural Networks

Nikolaos Deligiannis , Riccardo Cantoro , Matteo Sonza Reorda , Marcello Traiola , Emanuele Valea
IEEE Access, 2021, pp.10.1109/ACCESS.2021.3129149. ⟨10.1109/ACCESS.2021.3129149⟩
Journal articles cea-03452247v1
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Multi-Objective Application-driven Approximate Design Method

Salvatore Barone , Marcello Traiola , Mario Barbareschi , Alberto Bosio
IEEE Access, 2021, 9, pp.86975-86993. ⟨10.1109/ACCESS.2021.3087858⟩
Journal articles hal-03257706v1
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Investigating data representation for efficient and reliable Convolutional Neural Networks

Annachiara Ruospo , Ernesto Sanchez , Marcello Traiola , Ian O'Connor , Alberto Bosio
Microprocessors and Microsystems: Embedded Hardware Design , 2021, pp.104318. ⟨10.1016/j.micpro.2021.104318⟩
Journal articles hal-03320356v1
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A Survey of Testing Techniques for Approximate Integrated Circuits

Marcello Traiola , Arnaud Virazel , Patrick Girard , Mario Barbareschi , Alberto Bosio
Proceedings of the IEEE, 2020, 108 (12), pp.2178-2194. ⟨10.1109/JPROC.2020.2999613⟩
Journal articles lirmm-02395609v1
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Probabilistic estimation of the application-level impact of precision scaling in approximate computing applications

Marcello Traiola , Alessandro Savino , Stefano Di Carlo
Microelectronics Reliability, 2019, 102, pp.#113309. ⟨10.1016/j.microrel.2019.06.002⟩
Journal articles hal-03094543v1

A Test Pattern Generation Technique for Approximate Circuits Based on an ILP-Formulated Pattern Selection Procedure

Marcello Traiola , Arnaud Virazel , Patrick Girard , Mario Barbareschi , Alberto Bosio
IEEE Transactions on Nanotechnology, 2019, 18, pp.849-857. ⟨10.1109/TNANO.2019.2923040⟩
Journal articles lirmm-02395306v1

Test and Reliability in Approximate Computing

Lorena Anghel , Mounir Benabdenbi , Alberto Bosio , Marcello Traiola , Elena Ioana Vatajelu
Journal of Electronic Testing: : Theory and Applications, 2018, 34 (4), pp.375-387. ⟨10.1007/s10836-018-5734-9⟩
Journal articles hal-01961787v1
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Estimating dynamic power consumption for memristor-based CiM architecture

Marcello Traiola , Mario Barbareschi , Alberto Bosio
Microelectronics Reliability, 2018, 80, pp.241-248. ⟨10.1016/j.microrel.2017.12.009⟩
Journal articles hal-03094521v1
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Special Session: Reliability Assessment Recipes for DNN Accelerators

Mohammad Hasan Ahmadilivani , Alberto Bosio , Bastien Deveautour , Fernando Fernandes dos Santos , Juan David Guerrero Balaguera
VTS 2024 - IEEE VLSI Test Symposium, Apr 2024, Tempe AZ USA, United States. pp.131788 - 131828, ⟨10.1109/access.2022.3229767⟩
Conference papers hal-04572731v1
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Cross-Layer Reliability Evaluation and Efficient Hardening of Large Vision Transformers Models

Lucas Roquet , Fernando Fernandes dos Santos , Paolo Rech , Marcello Traiola , Olivier Sentieys
Design Automation Conference (DAC), Jun 2024, San Fracisco, United States
Conference papers hal-04456702v1
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Reliability and Security of AI Hardware

Dennis Gnad , Jonas Krautter , Angeliki Kritikakou , Vincent Meyers , Paolo Rech
ETS 2024 - 29th IEEE European Test Symposium, May 2024, The Hague, Netherlands. pp.1-10
Conference papers hal-04577494v1

Exploiting assertions mining and fault analysis to guide RTL-level approximation

Alberto Bosio , Samuele Germiniani , Graziano Pravadelli , Marcello Traiola
DATE 2023 – 26th IEEE/ACM Design, Automation and Test in Europe, Apr 2023, Antwerp, Belgium. ⟨10.23919/DATE56975.2023.10136949⟩
Conference papers hal-03887685v1
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Impact of High-Level-Synthesis on Reliability of Neural Network Hardware Accelerators

Marcello Traiola , Fernando Fernandes Dos Santos , Olivier Sentieys , Angeliki Kritikakou
NSREC 2023 - IEEE Nuclear & Space Radiation Effects Conference, Jul 2023, Kansas City (US), United States. pp.1-5
Conference papers hal-04113282v2
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Impact of Transient Faults on Timing Behavior and Mitigation with Near-Zero WCET Overhead

Pegdwende Romaric Nikiema , Angeliki Kritikakou , Marcello Traiola , Olivier Sentieys
ECRTS 2023 - 35th Euromicro Conference on Real-Time Systems, Jul 2023, Vienna, Austria. pp.1-22, ⟨10.4230/LIPIcs.ECRTS.2023.15⟩
Conference papers hal-04397374v1
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A machine-learning-guided framework for fault-tolerant DNNs

Marcello Traiola , Angeliki Kritikakou , Olivier Sentieys
DATE 2023 – 26th IEEE/ACM Design, Automation and Test in Europe, Apr 2023, Antwerp, Belgium. pp.1-2
Conference papers hal-03887681v1
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Design with low complexity fine-grained Dual Core Lock-Step (DCLS) RISC-V processors

Pegdwende Romaric Nikiema , Angeliki Kritikakou , Marcello Traiola , Olivier Sentieys , Olivier Sentieys
DSN 2023 - 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks, Jun 2023, Porto, Portugal. pp.224-229, ⟨10.1109/DSN-S58398.2023.00062⟩
Conference papers hal-04397673v1
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harDNNing: a machine-learning-based framework for fault tolerance assessment and protection of DNNs

Marcello Traiola , Angeliki Kritikakou , Olivier Sentieys
ETS 2023 - IEEE European Test Symposium, May 2023, Venise, Italy. pp.1-6
Conference papers hal-04087375v1
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Input-aware accuracy characterization for approximate circuits

Ali Piri , Salvatore Pappalardo , Salvatore Barone , Mario Barbareschi , Bastien Deveautour
DSN-W 2023 - 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops, Jun 2023, Porto, Portugal. pp.179-182, ⟨10.1109/DSN-W58399.2023.00050⟩
Conference papers hal-04399159v1

Assertion-aware approximate computing design exploration on behavioral models

Alberto Bosio , Moreno Bragaglio , Samuele Germiniani , Samuele Mori , Graziano Pravadelli
LATS 2022 - IEEE 23rd Latin American Test Symposium, Sep 2022, Montevideo, Uruguay. pp.1-6, ⟨10.1109/LATS57337.2022.9936945⟩
Conference papers hal-03887690v1
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Selective Hardening of Critical Neurons in Deep Neural Networks

Annachiara Ruospo , Gabriele Gavarini , Ilaria Bragaglia , Marcello Traiola , Alberto Bosio
DDECS 2022 - 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Apr 2022, Prague, Czech Republic. pp.136-141, ⟨10.1109/DDECS54261.2022.9770168⟩
Conference papers hal-03888005v1
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Improving the Fault Resilience of Neural Network Applications Through Security Mechanisms

Nikolaos Deligiannis , Riccardo Cantoro , Matteo Sonza Reorda , Marcello Traiola , Emanuele Valea
DSN 2022 - The 52nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks, Jun 2022, Baltimore, United States. ⟨10.1109/DSN-S54099.2022.00017⟩
Conference papers hal-03887704v1

Input-Aware Approximate Computing

Ali Piri , Sepide Saeedi , Mario Barbareschi , Bastien Deveautour , Stefano Di Carlo
AQTR 2022 - IEEE International Conference on Automation, Quality and Testing, Robotics, May 2022, Cluj-Napoca, Romania. pp.1-6, ⟨10.1109/AQTR55203.2022.9801944⟩
Conference papers hal-03887997v1
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A Design Space Exploration Framework for Memristor-Based Crossbar Architecture

Mario Barbareschi , Alberto Bosio , Ian O'Connor , Petr Fiser , Marcello Traiola
DDECS 2022 - 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Apr 2022, Prague, Czech Republic. pp.38-43, ⟨10.1109/DDECS54261.2022.9770145⟩
Conference papers hal-03888009v1
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Emerging Computing Devices: Challenges and Opportunities for Test and Reliability

Alberto Bosio , Ian O'Connor , Marcello Traiola , Jorge Echavarria , Jürgen Teich
ETS 2021 - 26th IEEE European Test Symposium, May 2021, Bruges, Belgium. pp.1-10, ⟨10.1109/ETS50041.2021.9465409⟩
Conference papers lirmm-03379074v1
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Reducing Overprovision of Triple Modular Reduncancy Owing to Approximate Computing

Bastien Deveautour , Marcello Traiola , Arnaud Virazel , Patrick Girard
IOLTS 2021 - 27th IEEE International Symposium on On-Line Testing and Robust System Design, Jun 2021, Torino, Italy. pp.1-7, ⟨10.1109/IOLTS52814.2021.9486699⟩
Conference papers lirmm-03380025v1
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Design Space Exploration of Approximation-Based Quadruple Modular Redundancy Circuits

Marcello Traiola , Jorge Echavarria , Alberto Bosio , Jurgen Teich , Ian O'Connor
2021 IEEE/ACM International Conference On Computer Aided Design (ICCAD), Nov 2021, Munich, Germany. pp.1-9, ⟨10.1109/ICCAD51958.2021.9643561⟩
Conference papers hal-03537351v2
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Pros and Cons of Fault Injection Approaches for the Reliability Assessment of Deep Neural Networks

Annachiara Ruospo , Lucas Matana Luza , Alberto Bosio , Marcello Traiola , Luigi Dilillo
LATS 2021 - IEEE 22nd Latin American Test Symposium, Oct 2021, Punta del Este, Uruguay. pp.1-5, ⟨10.1109/LATS53581.2021.9651807⟩
Conference papers lirmm-03435567v1

Efficient Neural Network Approximation via Bayesian Reasoning

Alessandro Savino , Marcello Traiola , Stefano Di Carlo , Alberto Bosio
2021 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Apr 2021, Vienna, Austria. pp.45-50, ⟨10.1109/DDECS52668.2021.9417057⟩
Conference papers hal-03266825v1
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Emerging Technologies: Challenges and Opportunities for Logic Synthesis

Alberto Bosio , Mayeul Cantan , Cédric Marchand , Ian O'Connor , Petr Fiser
2021 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Apr 2021, Vienna (virtual), Austria. pp.93-98, ⟨10.1109/DDECS52668.2021.9417062⟩
Conference papers hal-03266914v1
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QAMR: an Approximation-Based FullyReliable TMR Alternative for Area Overhead Reduction

Bastien Deveautour , Marcello Traiola , Arnaud Virazel , Patrick Girard
ETS 2020 - 25th IEEE European Test Symposium, May 2020, Tallinn, Estonia. pp.1-6, ⟨10.1109/ETS48528.2020.9131574⟩
Conference papers lirmm-03035640v1
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Evaluating Data Encryption Effects on the Resilience of an Artificial Neural Network

Riccardo Cantoro , Nikolaos Deligiannis , Matteo Sonza Reorda , Marcello Traiola , Emanuele Valea
DFT 2020 - 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2020, Frascati (on line), Italy. pp.1-4, ⟨10.1109/DFT50435.2020.9250869⟩
Conference papers hal-03094602v1
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A Novel Test Flow for Approximate Digital Circuits

Marcello Traiola , Arnaud Virazel , Patrick Girard , Mario Barbareschi , Alberto Bosio
DATE 2020 - EDAA/IEEE/ACM Design Automation & Test in Europe Conference, PhD Forum, Mar 2020, Grenoble, France
Conference papers lirmm-03993654v1
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Evaluating the Code Encryption Effects on Memory Fault Resilience

Riccardo Cantoro , Nikolaos Deligiannis , Matteo Sonza Reorda , Marcello Traiola , Emanuele Valea
LATS 2020 - 21st IEEE Latin American Test Symposium, Mar 2020, Maceio, Brazil. pp.1-6, ⟨10.1109/LATS49555.2020.9093670⟩
Conference papers hal-03094594v1
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Design, Verification, Test and In-Field Implications of Approximate Computing Systems

Alberto Bosio , Stefano Di Carlo , Patrick Girard , Ernesto Sanchez , Alessandro Savino
ETS 2020 - 25th IEEE European Test Symposium, May 2020, Tallinn, Estonia. pp.1-10, ⟨10.1109/ETS48528.2020.9131557⟩
Conference papers lirmm-03035724v1
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Maximizing Yield for Approximate Integrated Circuits

Marcello Traiola , Arnaud Virazel , Patrick Girard , Mario Barbareschi , Alberto Bosio
DATE 2020 - 23rd Design, Automation and Test in Europe Conference and Exhibition, Mar 2020, Grenoble, France. pp.810-815, ⟨10.23919/DATE48585.2020.9116341⟩
Conference papers lirmm-03036002v1
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Testing Approximate Digital Circuits: Challenges and Opportunities

Marcello Traiola , Arnaud Virazel , Patrick Girard , Mario Barbareschi , Alberto Bosio
LATS 2018 - 19th IEEE Latin American Test Symposium, Mar 2018, Sao Paulo, Brazil. pp.1-6, ⟨10.1109/LATW.2018.8349681⟩
Conference papers lirmm-03033024v1
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Predicting the Impact of Functional Approximation: from Component- to Application-Level

Marcello Traiola , Alessandro Savino , Mario Barbareschi , Stefano Di Carlo , Alberto Bosio
24th International Symposium on On-Line Testing And Robust System Design (IOLTS), Jul 2018, Platja d'Aro, Spain. pp.61-64, ⟨10.1109/IOLTS.2018.8474072⟩
Conference papers hal-03094581v1

Special session: How approximate computing impacts verification, test and reliability

Lukas Sekanina , Zdeněk Vašíček , Alberto Bosio , Marcello Traiola , Paolo Rech
36th VLSI Test Symposium (VTS), Apr 2018, San Francisco, CA, United States. ⟨10.1109/VTS.2018.8368628⟩
Conference papers lirmm-02421106v1
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Synthesis of Finite State Machines on Memristor Crossbars

Umberto Ferrandino , Marcello Traiola , Mario Barbareschi , Antonino Mazzeo , Petr Fišer‬
DDECS 2018 - 1st International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Apr 2018, Budapest, Hungary. pp.107-112, ⟨10.1109/DDECS.2018.000-3⟩
Conference papers hal-03094575v1
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Investigation of Mean-Error Metrics for Testing Approximate Integrated Circuits

Marcello Traiola , Arnaud Virazel , Patrick Girard , Mario Barbarcschi , Alberto Bosio
DFT 2018 - 31st IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2018, Chicago, United States. pp.1-6, ⟨10.1109/DFT.2018.8602939⟩
Conference papers lirmm-02099895v1
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On the Comparison of Different ATPG approaches for Approximate Integrated Circuits

Marcello Traiola , Arnaud Virazel , Patrick Girard , Mario Barbareschi , Alberto Bosio
DDECS 2018 - 1st International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Apr 2018, Budapest, Hungary. pp.85-90, ⟨10.1109/DDECS.2018.00022⟩
Conference papers lirmm-03032856v1

Towards digital circuit approximation by exploiting fault simulation

Marcello Traiola , Arnaud Virazel , Patrick Girard , Mario Barbareschi , Alberto Bosio
EWDTS: East-West Design & Test Symposium, Sep 2017, Novi Sad, Serbia. ⟨10.1109/EWDTS.2017.8110108⟩
Conference papers lirmm-01718583v1
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Towards approximation during test of Integrated Circuits

Imran Wali , Marcello Traiola , Arnaud Virazel , Patrick Girard , Mario Barbareschi
DDECS 2017 - 20th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Apr 2017, Dresden, Germany. pp.28-33, ⟨10.1109/DDECS.2017.7934574⟩
Conference papers lirmm-01718580v1
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Memristive devices: Technology, Design Automation and Computing Frontiers

Mario Barbareschi , Alberto Bosio , Hoang Anh Du Nguyen , Said Hamdioui , Marcello Traiola
DTIS 2017 - 12th International Conference on Design Technology of Integrated Systems In Nanoscale Era, Apr 2017, Palma de Mallorca, Spain. ⟨10.1109/DTIS.2017.7930178⟩
Conference papers hal-01525719v1
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Can we Approximate the Test of Integrated Circuits?

Imran Wali , Marcello Traiola , Arnaud Virazel , Patrick Girard , Mario Barbareschi
WAPCO: Workshop On Approximate Computing, Jan 2017, Stockholm, Sweden
Conference papers lirmm-02004418v1
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Formal Design Space Exploration for memristor-based crossbar architecture

Marcello Traiola , Mario Barbareschi , Alberto Bosio
DDECS 2017 - 20th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Apr 2017, Dresden, Germany. pp.145-150, ⟨10.1109/DDECS.2017.7934557⟩
Conference papers hal-03094567v1
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XbarGen: A memristor based boolean logic synthesis tool

Marcello Traiola , Mario Barbareschi , Antonino Mazzeo , Alberto Bosio
IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC), Sep 2016, Tallinn, Estonia. ⟨10.1109/VLSI-SoC.2016.7753567⟩
Conference papers hal-03094562v1
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TEST TECHNIQUES FOR APPROXIMATE DIGITAL CIRCUITS

Marcello Traiola
Micro and nanotechnologies/Microelectronics. Université Montpellier, 2019. English. ⟨NNT : 2019MONTS060⟩
Theses tel-02485781v1