Marcello TRAIOLA

Présentation

Publications

Article dans une revue (13)

A genetic approach for automatic AxC design exploration at RTL based on assertion mining and fault analysis Alberto Bosio,Samuele Germiniani,Graziano Pravadelli,Marcello Traiola IEEE Transactions on Emerging Topics in Computing, 2025, pp.1-15. ⟨10.1109/TETC.2025.3609050⟩ Article dans une revue hal-05333873v1
Syntactic and Semantic Analysis of Temporal Assertions to Support the Approximation of RTL Designs Alberto Bosio,Samuele Germiniani,Graziano Pravadelli,Marcello Traiola Journal of Electronic Testing: : Theory and Applications, 2024, 40 (2), pp.199-214. ⟨10.1007/s10836-024-06115-9⟩ Article dans une revue hal-04726657v1
Impact of High-Level-Synthesis on Reliability of Artificial Neural Network Hardware Accelerators Marcello Traiola,Fernando Fernandes dos Santos,Paolo Rech,Carlo Cazzaniga,Olivier Sentieyset al. IEEE Transactions on Nuclear Science, 2024, pp.1-9. ⟨10.1109/TNS.2024.3377596⟩ Article dans une revue hal-04514579v1
A Survey on Deep Learning Resilience Assessment Methodologies Annachiara Ruospo,Ernesto Sanchez,Lucas Matana Luza,Luigi Dilillo,Marcello Traiolaet al. Computer, 2023, 56, pp.57-66. ⟨10.1109/MC.2022.3217841⟩ Article dans une revue lirmm-03834128v1
A Genetic-algorithm-based Approach to the Design of DCT Hardware Accelerators Mario Barbareschi,Salvatore Barone,Alberto Bosio,Jie Han,Marcello Traiola ACM Journal on Emerging Technologies in Computing Systems, 2022, 18 (3), pp.1-25. ⟨10.1145/3501772⟩ Article dans une revue hal-03553505v1
Towards the Integration of Reliability and Security Mechanisms to Enhance the Fault Resilience of Neural Networks Nikolaos Deligiannis,Riccardo Cantoro,Matteo Sonza Reorda,Marcello Traiola,Emanuele Valea IEEE Access, 2021, pp.10.1109/ACCESS.2021.3129149. ⟨10.1109/ACCESS.2021.3129149⟩ Article dans une revue cea-03452247v1
Investigating data representation for efficient and reliable Convolutional Neural Networks Annachiara Ruospo,Ernesto Sanchez,Marcello Traiola,Ian O'Connor,Alberto Bosio Microprocessors and Microsystems: Embedded Hardware Design , 2021, pp.104318. ⟨10.1016/j.micpro.2021.104318⟩ Article dans une revue hal-03320356v1
Multi-Objective Application-driven Approximate Design Method Salvatore Barone,Marcello Traiola,Mario Barbareschi,Alberto Bosio IEEE Access, 2021, 9, pp.86975-86993. ⟨10.1109/ACCESS.2021.3087858⟩ Article dans une revue hal-03257706v1
A Survey of Testing Techniques for Approximate Integrated Circuits Marcello Traiola,Arnaud Virazel,Patrick Girard,Mario Barbareschi,Alberto Bosio Proceedings of the IEEE, 2020, 108 (12), pp.2178-2194. ⟨10.1109/JPROC.2020.2999613⟩ Article dans une revue lirmm-02395609v1
A Test Pattern Generation Technique for Approximate Circuits Based on an ILP-Formulated Pattern Selection Procedure Marcello Traiola,Arnaud Virazel,Patrick Girard,Mario Barbareschi,Alberto Bosio IEEE Transactions on Nanotechnology, 2019, 18, pp.849-857. ⟨10.1109/TNANO.2019.2923040⟩ Article dans une revue lirmm-02395306v1
Probabilistic estimation of the application-level impact of precision scaling in approximate computing applications Marcello Traiola,Alessandro Savino,Stefano Di Carlo Microelectronics Reliability, 2019, 102, pp.#113309. ⟨10.1016/j.microrel.2019.06.002⟩ Article dans une revue hal-03094543v1
Test and Reliability in Approximate Computing Lorena Anghel,Mounir Benabdenbi,Alberto Bosio,Marcello Traiola,Elena Ioana Vatajelu Journal of Electronic Testing: : Theory and Applications, 2018, 34 (4), pp.375-387. ⟨10.1007/s10836-018-5734-9⟩ Article dans une revue hal-01961787v1
Estimating dynamic power consumption for memristor-based CiM architecture Marcello Traiola,Mario Barbareschi,Alberto Bosio Microelectronics Reliability, 2018, 80, pp.241-248. ⟨10.1016/j.microrel.2017.12.009⟩ Article dans une revue hal-03094521v1

Communication dans un congrès (56)

KAN-SAs: Efficient Acceleration of Kolmogorov-Arnold Networks on Systolic Arrays Sohaib Errabii,Olivier Sentieys,Marcello Traiola DATE 2026 - IEEE/ACM Design, Automation & Test in Europe Conference, Apr 2026, Verona, Italy Communication dans un congrès hal-05372642v1
ENFOR-SA: End-to-end Cross-layer Transient Fault Injector for Efficient and Accurate DNN Reliability Assessment on Systolic Arrays Rafael Billig Tonetto,Marcello Traiola,Fernando Fernandes,Angeliki Kritikakou VTS 2026 - IEEE VLSI Test Symposium, Apr 2026, Napa Valley, CA, United States Communication dans un congrès hal-05487559v1
Scalable Reliability Assessment of DNNs through Simultaneous Fault Injection Rafael Billig Tonetto,Marcello Traiola,Fernando Fernandes,Angeliki Kritikakou DAC 2026 - IEEE/ACM Design Automation Conference, ACM/IEEE, Jul 2026, Long Beach (CA), United States Communication dans un congrès hal-05525686v3
European Test Symposium Teams : an Anniversary Snapshot Maksim Jenihhin,Jaan Raik,Artur Jutman,Natalia Cherezova,Raimund Ubaret al. ETS 2025 - 30th IEEE European Test Symposium, May 2025, Tallinn, Estonia. pp.1-48, ⟨10.1109/ETS63895.2025.11049652⟩ Communication dans un congrès hal-05173907v1
When ETS Became Approximated: the French connection Alberto Bosio,Bastien Deveautour,Marcello Traiola,Arnaud Virazel,Patrick Girard ETS 2025 - Anniversary Forum 30th IEEE European Test Symposium, May 2025, Tallinn, Estonia Communication dans un congrès lirmm-05568621v1
Automatic generation of input-aware approximate arithmetic circuits Mario Barbareschi,Salvatore Barone,Alberto Bosio,Bastien Deveautour,Ali Piriet al. DDECS 2025 - IEEE 28th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, May 2025, Lyon, France. pp.139-144, ⟨10.1109/DDECS63720.2025.11006680⟩ Communication dans un congrès hal-05333876v1
Special Sessions -Emerging Scope and Design Challenges for Approximate Computing: Optimizing Accuracy-PPA trade-offs and Beyond Siva Satyendra Sahoo,Bastien Deveautour,Marcello Traiola,Chongyan Gu,Yun Wuet al. ESWEEK 2025 - Embedded Systems Week, Tei-Wei Kuo; Andy Pimentel, Sep 2025, TAIPEI, Taiwan. pp.11-20, ⟨10.1145/3742872.375705⟩ Communication dans un congrès hal-05404759v1
SERA-Float: A Soft Error Resilient Approximate Floating-Point Computing Format Vishesh Mishra,Marcello Traiola,Angeliki Kritikakou,Olivier Sentieys,Urbi Chatterjee ICCAD 2025 - ACM/IEEE International Conference On Computer Aided Design, Oct 2025, Munich (Allemagne), Germany. pp.1-9 Communication dans un congrès hal-05333255v1
MaxiMals: A Low-cost Hardening Technique for Large Vision Transformers Lucas Roquet,Fernando Fernandes dos Santos,Paolo Rech,Marcello Traiola,Olivier Sentieyset al. RADECS 2024 - Conference is an annual on RADiation Effects on Components and Systems, RADECS Association, Sep 2024, Maspalomas, Canary Islands, Spain. pp.1-5 Communication dans un congrès hal-04736704v1
Special Session: Reliability Assessment Recipes for DNN Accelerators Mohammad Hasan Ahmadilivani,Alberto Bosio,Bastien Deveautour,Fernando Fernandes dos Santos,Juan David Guerrero Balagueraet al. VTS 2024 - IEEE VLSI Test Symposium, Apr 2024, Tempe AZ USA, United States. pp.131788 - 131828, ⟨10.1109/access.2022.3229767⟩ Communication dans un congrès hal-04572731v1
Approximate Fault-Tolerant Neural Network Systems Marcello Traiola,Salvatore Pappalardo,Ali Piri,Annachiara Ruospo,Bastien Deveautouret al. ETS 2024 - 29th IEEE European Test Symposium, May 2024, La Haye, Netherlands. pp.1-10, ⟨10.1109/ETS61313.2024.10567290⟩ Communication dans un congrès hal-04674818v1
Special Session: Impact of Compiler Optimizations on the Reliability of a RISC-V-Based Core Pegdwende Romaric Nikiema,Marcello Traiola,Angeliki Kritikakou 2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), Oct 2024, Didcot, France. pp.1-6, ⟨10.1109/DFT63277.2024.10753502⟩ Communication dans un congrès hal-05269345v1
Combining Fault Simulation and Beam Data for CNN Error Rate Estimation on RISC-V Commercial Platforms Fernando Fernandes dos Santos,Marcello Traiola,Angeliki Kritikakou IOLTS 2024 - 30th IEEE International Symposium on On-Line Testing and Robust System Design, INRIA/IRISA Rennes, Jul 2024, Rennes, France. pp.1-8 Communication dans un congrès hal-04638468v1
Approximate Computing for Test and Test of Approximate Computing Mario Barbareschi,Alberto Bosio,Patrick Girard,Bastien Deveautour,Marcello Traiolaet al. IEEE Workshop on Top Picks in VLSI Test and Reliability, Nov 2024, San Diego, United States. pp.1-2 Communication dans un congrès lirmm-04738424v1
Reliability Assessment of Large DNN Models: Trading Off Performance and Accuracy Junchao Chen,Giuseppe Esposito,Fernando Fernandes dos Santos,Juan-David Guerrero-Balaguera,Angeliki Kritikakouet al. VLSI-SoC 2024 - IFIP/IEEE International Conference on Very Large Scale Integration, Delft University of Technology and University of Abdelmalek Saadi University, Oct 2024, Tanger, Morocco. pp.1-10, ⟨10.5286/ISIS.E.RB2300036)⟩ Communication dans un congrès hal-04736733v1
Impact of Compiler Optimizations on the Reliability of a RISC-V-based Core Romaric Pegdwende Nikiema,Marcello Traiola,Angeliki Kritikakou DFT 2024 - 37th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2024, Oxfordshire, United Kingdom. pp.1-1 Communication dans un congrès hal-04731794v1
Reliability and Security of AI Hardware Dennis Gnad,Jonas Krautter,Angeliki Kritikakou,Vincent Meyers,Paolo Rechet al. ETS 2024 - 29th IEEE European Test Symposium, May 2024, The Hague, Netherlands. pp.1-10 Communication dans un congrès hal-04577494v1
Cross-Layer Reliability Evaluation and Efficient Hardening of Large Vision Transformers Models Lucas Roquet,Fernando Fernandes dos Santos,Paolo Rech,Marcello Traiola,Olivier Sentieyset al. Design Automation Conference (DAC), Jun 2024, San Francisco, United States Communication dans un congrès hal-04456702v1
Efficient Neural Networks: from SW optimization to specialized HW accelerators Marcello Traiola,Angeliki Kritikakou,Silviu-Ioan Filip,Olivier Sentieys CASES 2024 - International Conference on Compilers, Architecture, and Synthesis for Embedded Systems, Sep 2024, Raleigh (NC), United States. pp.1-2, ⟨10.1109/CASES60062.2024.00009⟩ Communication dans un congrès hal-04732044v1
Design with low complexity fine-grained Dual Core Lock-Step (DCLS) RISC-V processors Pegdwende Romaric Nikiema,Angeliki Kritikakou,Marcello Traiola,Olivier Sentieys,Olivier Sentieys DSN 2023 - 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks, Jun 2023, Porto, Portugal. pp.224-229, ⟨10.1109/DSN-S58398.2023.00062⟩ Communication dans un congrès hal-04397673v1
Towards Dependable RISC-V Cores for Edge Computing Devices Pegdwende Romaric Nikiema,Alessandro Palumbo,Allan Aasma,Luca Cassano,Angeliki Kritikakouet al. IOLTS 2023 – IEEE 29th International Symposium on On-Line Testing and Robust System Design, Jul 2023, Crete, Greece. ⟨10.1109/iolts59296.2023.10224862⟩ Communication dans un congrès hal-04685617v1
A machine-learning-guided framework for fault-tolerant DNNs Marcello Traiola,Angeliki Kritikakou,Olivier Sentieys DATE 2023 – 26th IEEE/ACM Design, Automation and Test in Europe, Apr 2023, Antwerp, Belgium. pp.1-2 Communication dans un congrès hal-03887681v1
Exploiting assertions mining and fault analysis to guide RTL-level approximation Alberto Bosio,Samuele Germiniani,Graziano Pravadelli,Marcello Traiola DATE 2023 – 26th IEEE/ACM Design, Automation and Test in Europe, Apr 2023, Antwerp, Belgium. ⟨10.23919/DATE56975.2023.10136949⟩ Communication dans un congrès hal-03887685v1
Impact of High-Level-Synthesis on Reliability of Neural Network Hardware Accelerators Marcello Traiola,Fernando Fernandes Dos Santos,Olivier Sentieys,Angeliki Kritikakou NSREC 2023 - IEEE Nuclear & Space Radiation Effects Conference, Jul 2023, Kansas City (US), United States. pp.1-5 Communication dans un congrès hal-04113282v2
Impact of Transient Faults on Timing Behavior and Mitigation with Near-Zero WCET Overhead Pegdwende Romaric Nikiema,Angeliki Kritikakou,Marcello Traiola,Olivier Sentieys ECRTS 2023 - 35th Euromicro Conference on Real-Time Systems, Jul 2023, Vienna, Austria. pp.1-22, ⟨10.4230/LIPIcs.ECRTS.2023.15⟩ Communication dans un congrès hal-04397374v1
Input-aware accuracy characterization for approximate circuits Ali Piri,Salvatore Pappalardo,Salvatore Barone,Mario Barbareschi,Bastien Deveautouret al. DSN-W 2023 - 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops, Jun 2023, Porto, Portugal. pp.179-182, ⟨10.1109/DSN-W58399.2023.00050⟩ Communication dans un congrès hal-04399159v1
harDNNing: a machine-learning-based framework for fault tolerance assessment and protection of DNNs Marcello Traiola,Angeliki Kritikakou,Olivier Sentieys ETS 2023 - IEEE European Test Symposium, May 2023, Venise, Italy. pp.1-6 Communication dans un congrès hal-04087375v1
Improving the Fault Resilience of Neural Network Applications Through Security Mechanisms Nikolaos Deligiannis,Riccardo Cantoro,Matteo Sonza Reorda,Marcello Traiola,Emanuele Valea DSN 2022 - The 52nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks, Jun 2022, Baltimore, United States. ⟨10.1109/DSN-S54099.2022.00017⟩ Communication dans un congrès hal-03887704v1
Assertion-aware approximate computing design exploration on behavioral models Alberto Bosio,Moreno Bragaglio,Samuele Germiniani,Samuele Mori,Graziano Pravadelliet al. LATS 2022 - IEEE 23rd Latin American Test Symposium, Sep 2022, Montevideo, Uruguay. pp.1-6, ⟨10.1109/LATS57337.2022.9936945⟩ Communication dans un congrès hal-03887690v1
Selective Hardening of Critical Neurons in Deep Neural Networks Annachiara Ruospo,Gabriele Gavarini,Ilaria Bragaglia,Marcello Traiola,Alberto Bosioet al. DDECS 2022 - 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Apr 2022, Prague, Czech Republic. pp.136-141, ⟨10.1109/DDECS54261.2022.9770168⟩ Communication dans un congrès hal-03888005v1
A Design Space Exploration Framework for Memristor-Based Crossbar Architecture Mario Barbareschi,Alberto Bosio,Ian O'Connor,Petr Fiser,Marcello Traiola DDECS 2022 - 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Apr 2022, Prague, Czech Republic. pp.38-43, ⟨10.1109/DDECS54261.2022.9770145⟩ Communication dans un congrès hal-03888009v1
Input-Aware Approximate Computing Ali Piri,Sepide Saeedi,Mario Barbareschi,Bastien Deveautour,Stefano Di Carloet al. AQTR 2022 - IEEE International Conference on Automation, Quality and Testing, Robotics, May 2022, Cluj-Napoca, Romania. pp.1-6, ⟨10.1109/AQTR55203.2022.9801944⟩ Communication dans un congrès hal-03887997v1
Emerging Technologies: Challenges and Opportunities for Logic Synthesis Alberto Bosio,Mayeul Cantan,Cédric Marchand,Ian O'Connor,Petr Fiseret al. 2021 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Apr 2021, Vienna (virtual), Austria. pp.93-98, ⟨10.1109/DDECS52668.2021.9417062⟩ Communication dans un congrès hal-03266914v1
Reducing Overprovision of Triple Modular Reduncancy Owing to Approximate Computing Bastien Deveautour,Marcello Traiola,Arnaud Virazel,Patrick Girard IOLTS 2021 - 27th IEEE International Symposium on On-Line Testing and Robust System Design, Jun 2021, Torino, Italy. pp.1-7, ⟨10.1109/IOLTS52814.2021.9486699⟩ Communication dans un congrès lirmm-03380025v1
Emerging Computing Devices: Challenges and Opportunities for Test and Reliability Alberto Bosio,Ian O'Connor,Marcello Traiola,Jorge Echavarria,Jürgen Teichet al. ETS 2021 - 26th IEEE European Test Symposium, May 2021, Bruges, Belgium. pp.1-10, ⟨10.1109/ETS50041.2021.9465409⟩ Communication dans un congrès lirmm-03379074v1
Efficient Neural Network Approximation via Bayesian Reasoning Alessandro Savino,Marcello Traiola,Stefano Di Carlo,Alberto Bosio 2021 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Apr 2021, Vienna, Austria. pp.45-50, ⟨10.1109/DDECS52668.2021.9417057⟩ Communication dans un congrès hal-03266825v1
Design Space Exploration of Approximation-Based Quadruple Modular Redundancy Circuits Marcello Traiola,Jorge Echavarria,Alberto Bosio,Jurgen Teich,Ian O'Connor 2021 IEEE/ACM International Conference On Computer Aided Design (ICCAD), Nov 2021, Munich, Germany. pp.1-9, ⟨10.1109/ICCAD51958.2021.9643561⟩ Communication dans un congrès hal-03537351v2
Pros and Cons of Fault Injection Approaches for the Reliability Assessment of Deep Neural Networks Annachiara Ruospo,Lucas Matana Luza,Alberto Bosio,Marcello Traiola,Luigi Dililloet al. LATS 2021 - 22nd IEEE Latin American Test Symposium, Oct 2021, Punta del Este, Uruguay. pp.1-5, ⟨10.1109/LATS53581.2021.9651807⟩ Communication dans un congrès lirmm-03435567v1
Maximizing Yield for Approximate Integrated Circuits Marcello Traiola,Arnaud Virazel,Patrick Girard,Mario Barbareschi,Alberto Bosio DATE 2020 - 23rd Design, Automation and Test in Europe Conference and Exhibition, Mar 2020, Grenoble, France. pp.810-815, ⟨10.23919/DATE48585.2020.9116341⟩ Communication dans un congrès lirmm-03036002v1
Evaluating the Code Encryption Effects on Memory Fault Resilience Riccardo Cantoro,Nikolaos Deligiannis,Matteo Sonza Reorda,Marcello Traiola,Emanuele Valea LATS 2020 - 21st IEEE Latin American Test Symposium, Mar 2020, Maceio, Brazil. pp.1-6, ⟨10.1109/LATS49555.2020.9093670⟩ Communication dans un congrès hal-03094594v1
QAMR: an Approximation-Based FullyReliable TMR Alternative for Area Overhead Reduction Bastien Deveautour,Marcello Traiola,Arnaud Virazel,Patrick Girard ETS 2020 - 25th IEEE European Test Symposium, May 2020, Tallinn, Estonia. pp.1-6, ⟨10.1109/ETS48528.2020.9131574⟩ Communication dans un congrès lirmm-03035640v1
Evaluating Data Encryption Effects on the Resilience of an Artificial Neural Network Riccardo Cantoro,Nikolaos Deligiannis,Matteo Sonza Reorda,Marcello Traiola,Emanuele Valea DFT 2020 - 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2020, Frascati (on line), Italy. pp.1-4, ⟨10.1109/DFT50435.2020.9250869⟩ Communication dans un congrès hal-03094602v1
A Novel Test Flow for Approximate Digital Circuits Marcello Traiola,Arnaud Virazel,Patrick Girard,Mario Barbareschi,Alberto Bosio DATE 2020 - EDAA/IEEE/ACM Design Automation & Test in Europe Conference, PhD Forum, Mar 2020, Grenoble, France Communication dans un congrès lirmm-03993654v1
Design, Verification, Test and In-Field Implications of Approximate Computing Systems Alberto Bosio,Stefano Di Carlo,Patrick Girard,Ernesto Sanchez,Alessandro Savinoet al. ETS 2020 - 25th IEEE European Test Symposium, May 2020, Tallinn, Estonia. pp.1-10, ⟨10.1109/ETS48528.2020.9131557⟩ Communication dans un congrès lirmm-03035724v1
Investigation of Mean-Error Metrics for Testing Approximate Integrated Circuits Marcello Traiola,Arnaud Virazel,Patrick Girard,Mario Barbarcschi,Alberto Bosio DFT 2018 - 31st IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2018, Chicago, United States. pp.1-6, ⟨10.1109/DFT.2018.8602939⟩ Communication dans un congrès lirmm-02099895v1
Testing Approximate Digital Circuits: Challenges and Opportunities Marcello Traiola,Arnaud Virazel,Patrick Girard,Mario Barbareschi,Alberto Bosio LATS 2018 - 19th IEEE Latin American Test Symposium, Mar 2018, Sao Paulo, Brazil. pp.1-6, ⟨10.1109/LATW.2018.8349681⟩ Communication dans un congrès lirmm-03033024v1
Predicting the Impact of Functional Approximation: from Component- to Application-Level Marcello Traiola,Alessandro Savino,Mario Barbareschi,Stefano Di Carlo,Alberto Bosio 24th International Symposium on On-Line Testing And Robust System Design (IOLTS), Jul 2018, Platja d'Aro, Spain. pp.61-64, ⟨10.1109/IOLTS.2018.8474072⟩ Communication dans un congrès hal-03094581v1
Synthesis of Finite State Machines on Memristor Crossbars Umberto Ferrandino,Marcello Traiola,Mario Barbareschi,Antonino Mazzeo,Petr Fišer‬et al. DDECS 2018 - 1st International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Apr 2018, Budapest, Hungary. pp.107-112, ⟨10.1109/DDECS.2018.000-3⟩ Communication dans un congrès hal-03094575v1
Special session: How approximate computing impacts verification, test and reliability Lukas Sekanina,Zdeněk Vašíček,Alberto Bosio,Marcello Traiola,Paolo Rechet al. 36th VLSI Test Symposium (VTS), Apr 2018, San Francisco, CA, United States. ⟨10.1109/VTS.2018.8368628⟩ Communication dans un congrès lirmm-02421106v1
On the Comparison of Different ATPG approaches for Approximate Integrated Circuits Marcello Traiola,Arnaud Virazel,Patrick Girard,Mario Barbareschi,Alberto Bosio DDECS 2018 - 1st International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Apr 2018, Budapest, Hungary. pp.85-90, ⟨10.1109/DDECS.2018.00022⟩ Communication dans un congrès lirmm-03032856v1
Can we Approximate the Test of Integrated Circuits? Imran Wali,Marcello Traiola,Arnaud Virazel,Patrick Girard,Mario Barbareschiet al. WAPCO: Workshop On Approximate Computing, Jan 2017, Stockholm, Sweden Communication dans un congrès lirmm-02004418v1
Towards digital circuit approximation by exploiting fault simulation Marcello Traiola,Arnaud Virazel,Patrick Girard,Mario Barbareschi,Alberto Bosio EWDTS: East-West Design & Test Symposium, Sep 2017, Novi Sad, Serbia. ⟨10.1109/EWDTS.2017.8110108⟩ Communication dans un congrès lirmm-01718583v1
Memristive devices: Technology, Design Automation and Computing Frontiers Mario Barbareschi,Alberto Bosio,Hoang Anh Du Nguyen,Said Hamdioui,Marcello Traiolaet al. DTIS 2017 - 12th International Conference on Design Technology of Integrated Systems In Nanoscale Era, Apr 2017, Palma de Mallorca, Spain. ⟨10.1109/DTIS.2017.7930178⟩ Communication dans un congrès hal-01525719v1
Towards approximation during test of Integrated Circuits Imran Wali,Marcello Traiola,Arnaud Virazel,Patrick Girard,Mario Barbareschiet al. DDECS 2017 - 20th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Apr 2017, Dresden, Germany. pp.28-33, ⟨10.1109/DDECS.2017.7934574⟩ Communication dans un congrès lirmm-01718580v1
Formal Design Space Exploration for memristor-based crossbar architecture Marcello Traiola,Mario Barbareschi,Alberto Bosio DDECS 2017 - 20th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Apr 2017, Dresden, Germany. pp.145-150, ⟨10.1109/DDECS.2017.7934557⟩ Communication dans un congrès hal-03094567v1
XbarGen: A memristor based boolean logic synthesis tool Marcello Traiola,Mario Barbareschi,Antonino Mazzeo,Alberto Bosio IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC), Sep 2016, Tallinn, Estonia. ⟨10.1109/VLSI-SoC.2016.7753567⟩ Communication dans un congrès hal-03094562v1

Chapitre d'ouvrage (3)

Automatic Approximation of Computer Systems Through Multi-objective Optimization Mario Barbareschi,Salvatore Barone,Alberto Bosio,Marcello Traiola Design and Applications of Emerging Computer Systems, Springer Nature Switzerland, pp.383-420, 2024, ⟨10.1007/978-3-031-42478-6_15⟩ Chapitre d'ouvrage hal-04396685v1
Test and Reliability of Approximate Hardware Marcello Traiola,Bastien Deveautour,Alberto Bosio,Patrick Girard,Arnaud Virazel Approximate Computing, Springer International Publishing, pp.233-266, 2022, ⟨10.1007/978-3-030-98347-5_10⟩ Chapitre d'ouvrage hal-03888016v1
Design, Verification, Test, and In-Field Implications of Approximate Digital Integrated Circuits Alberto Bosio,Stefano Di Carlo,Patrick Girard,Annachiara Ruospo,Ernesto Sanchezet al. Approximate Computing Techniques, Springer International Publishing, pp.349-385, 2022, ⟨10.1007/978-3-030-94705-7_12⟩ Chapitre d'ouvrage hal-03888027v1

Pré-publication, Document de travail (2)

PC-Posits: Enhanced Soft Error Resilience of Posit Arithmetic Through Analytical Modeling Vishesh Mishra,Marcello Traiola,Angeliki Kritikakou,Fernando Fernandes dos Santos,Urbi Chatterjee 2026 Pré-publication, Document de travail hal-05569142v1
Increasing the Lifetime of HPC Machines: Issues, Implications, and Open Challenges Robin Boëzennec,Fernando Fernandes dos Santos,Brice Goglin,Angeliki Kritikakou,Guillaume Pallezet al. 2025 Pré-publication, Document de travail hal-05312072v1

Thèse (1)

TEST TECHNIQUES FOR APPROXIMATE DIGITAL CIRCUITS Marcello Traiola Micro and nanotechnologies/Microelectronics. Université Montpellier, 2019. English. ⟨NNT : 2019MONTS060⟩ Thèse tel-02485781v1