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Mariane Comte
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- mariane-comte
- IdRef : 078523052
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Analytical Models for the Evaluation of Resistive Short Defect Detectability in Presence of Process Variations: Application to 28nm Bulk and FDSOI TechnologiesJournal of Electronic Testing: : Theory and Applications, 2019, 35 (1), pp.59-75. ⟨10.1007/s10836-019-05776-1⟩
Article dans une revue
lirmm-02075690v1
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Resistive Bridging Defect Detection in Bulk, FDSOI and FinFET TechnologiesJournal of Electronic Testing: : Theory and Applications, 2017, 33 (4), pp.515-527. ⟨10.1007/s10836-017-5674-9⟩
Article dans une revue
hal-01709587v1
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Influence of Body-Biasing, Supply Voltage, and Temperature on the Detection of Resistive Short Defects in FDSOI TechnologyIEEE Transactions on Nanotechnology, 2017, 16 (3), pp.417-430. ⟨10.1109/TNANO.2017.2664895⟩
Article dans une revue
hal-01709588v1
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Testing for Gate Oxide Short Defects using the Detectability Interval ParadigmInformation Technology, 2014, 56 (4), pp.173-181. ⟨10.1515/itit-2013-1040⟩
Article dans une revue
hal-01167054v1
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