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Marise Bafleur

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Documents

Présentation

**M. Bafleur** received her Ph.D. degree and the State Doctorate degree in 1982 and 1987, respectively, from Paul Sabatier University, Toulouse, France. During her Ph.D. thesis, she worked on defect characterization of molecular beam epitaxy grown GaAs layers. Since 1983, she joined the Centre National de la Recherche Scientifique (CNRS) at the Laboratory of Analysis and Architecture of Systems (LAAS-CNRS) in Toulouse, France. From the mid eighties to 1994, she developed research activities in the emerging field of smart power IC's design and technologies. Since 1997, she has been leading at LAAS-CNRS a research activity in the field of Electrostatic Discharge (ESD) in CMOS and smart power technologies. From 2005 to 2012, she has been managing the “Integration of Systems for Energy Management” research group at LAAS-CNRS whose activities focus on the integration of advanced power devices, passive components and DC-DC converters, energy-autonomous wireless sensor networks as well as on providing integrated ESD protection solutions for advanced CMOS and smart power technologies. Since the end of 2014, she is leading “SYNERGY” strategic research at LAAS-CNRS dedicated to systems for smart energy management. Since 2007, she started research activities in the field of the energy autonomy of wireless sensors for aeronautics applications, in particular, within cooperative projects with AIRBUS Group. She is author and co-author of more than 240 articles in international journals and conferences and owns 7 patents. *Senior Member, IEEE N°40081234, active since 1994*

Publications

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Impact of non-linear capacitances on transient waveforms during system level ESD stress

Fabien Escudié , Fabrice Caignet , Nicolas Nolhier , Marise Bafleur
Microelectronics Reliability, 2016, Proceedings of the 27th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 64, pp.88 - 92. ⟨10.1016/j.microrel.2016.07.046⟩
Article dans une revue hal-01497515v1
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From quasi-static to transient system level ESD simulation: Extraction of turn-on elements

Fabien Escudié , Fabrice Caignet , Nicolas Nolhier , Marise Bafleur
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2016 38th, ESD Association, Sep 2016, Anaheim, United States. pp.1 - 10, ⟨10.1109/EOSESD.2016.7592563⟩
Communication dans un congrès hal-01387072v1