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Martin HYTCH

17
Documents

Présentation

Dr Martin Hytch develops quantitative electron microscopy techniques for materials science applications. After carrying out his thesis at the University of Cambridge on the quantitative analysis of high-resolution images (HRTEM) of compound semiconductors in 1991, he moved to France to work at the CECM-CNRS in Paris, where he subsequently joined the CNRS in 1995. He is notably the inventor of the Geometric Phase Analysis (GPA) technique for the determination of strain from high-resolution images and has applied the technique to a wide range of materials problems and nanostructures. He moved to the CEMES-CNRS in Toulouse in 2004 to work on aberration-corrected HRTEM and electron holography. In 2007, he invented the new technique of dark-field electron holography for the measurement of strain and in 2008, he was recipient of the prestigious European Microscopy Award (FEI-EMA), awarded every 4 years at the European Microscopy Congress. Between 2009 and 2014, he headed the nanomaterials group at the CEMES (30 permanent staff). He has authored or coauthored over 130 scientific papers and given 70 invited talks at conferences and workshops.

Publications

"florent-houdellier"
"etienne-snoeck"

Realization of a tilted reference wave for electron holography by means of a condenser biprism

Falk Röder , Florent Houdellier , Thibaud Denneulin , Etienne Snoeck , Martin Hÿtch
Ultramicroscopy, 2016, 161, pp.23 - 40. ⟨10.1016/j.ultramic.2015.11.004⟩
Article dans une revue hal-01404505v1

Development of TEM and SEM high brightness electron guns using cold-field emission from a carbon nanotip

Florent Houdellier , Ludvig de Knoop , Christophe Gatel , Aurélien Masseboeuf , S Mamishin
Ultramicroscopy, 2015, 151, pp.107--115. ⟨10.1016/j.ultramic.2014.11.021⟩
Article dans une revue hal-01430585v1
Image document

Low-noise cold-field emission current obtained between two opposed carbon cone nanotips during in situ transmission electron microscope biasing

Ludvig de Knoop , Christophe Gatel , Florent Houdellier , Marc Monthioux , Aurélien Masseboeuf
Applied Physics Letters, 2015, 106 (26), pp.263101. ⟨10.1063/1.4923245⟩
Article dans une revue hal-01430586v2
Image document

Off-Axial Aberration Correction using a B-COR for Lorentz and HREM Modes

Etienne Snoeck , Florent Houdellier , Yoshifumi Taniguch , Aurélien Masseboeuf , Christophe Gatel
Microscopy and Microanalysis, 2014, 20 (S3), pp.932--933. ⟨10.1017/S1431927614006382⟩
Article dans une revue hal-01430589v1

Dark-field electron holography for the measurement of geometric phase

Martin Hÿtch , Florent Houdellier , Florian Hüe , Etienne Snoeck
Ultramicroscopy, 2011, 111 (8), pp.1328 - 1337. ⟨10.1016/j.ultramic.2011.04.008⟩
Article dans une revue hal-01742047v1
Image document

Dark-field electron holography for the mapping of strain in nanostructures: correcting artefacts and aberrations

Martin Hÿtch , Florent Houdellier , Florian Hüe , Etienne Snoeck
Journal of Physics: Conference Series, 2010, 241, pp.012027. ⟨10.1088/1742-6596/241/1/012027⟩
Article dans une revue hal-01742031v1

Strain mapping in MOSFETS by high-resolution electron microscopy and electron holography

Florian Hüe , Martin Hÿtch , Florent Houdellier , Etienne Snoeck , Alain Claverie
Materials Science and Engineering: B, 2008, 154-155, pp.221 - 224. ⟨10.1016/j.mseb.2008.10.020⟩
Article dans une revue hal-01742010v1

Nanoscale holographic interferometry for strain measurements in electronic devices

Martin Hÿtch , Florent Houdellier , Florian Hüe , Etienne Snoeck
Nature, 2008, 453 (7198), pp.1086 - 1089. ⟨10.1038/nature07049⟩
Article dans une revue hal-01742001v1

Mapping inelastic intensities in diffraction patterns of magnetic samples using the energy spectrum imaging technique

Bénédicte Warot-Fonrose , Florent Houdellier , Martin Hÿtch , Lionel Calmels , Virginie Serin
Ultramicroscopy, 2008, 108 (5), pp.393 - 398. ⟨10.1016/j.ultramic.2007.05.013⟩
Article dans une revue hal-01707847v1
Image document

Experimental application of sum rules for electron energy loss magnetic chiral dichroism

Lionel Calmels , Florent Houdellier , Bénédicte Warot-Fonrose , Christophe Gatel , Martin Hÿtch
Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2007, 76 (6), ⟨10.1103/PhysRevB.76.060409⟩
Article dans une revue hal-01741982v1

High-resolution electron holography for the study of composition and strain in thin film semiconductors

Florent Houdellier , Martin Hÿtch , Etienne Snoeck , Marie-José Casanove
Materials Science and Engineering: B, 2006, 135 (3), pp.188 - 191. ⟨10.1016/j.mseb.2006.08.035⟩
Article dans une revue hal-01741978v1

In situ electron microscopy of hard and soft matter

Ludvig de Knoop , Florent Houdellier , Christophe Gatel , Aurélien Masseboeuf , Marc Monthioux
Joint XIII Interamerican Microscopy Congress & XVI Venezuelan Congress for Microscopy and Microanalysis 'CIASEM-2015', Oct 2015, Isla de Margarita, Venezuela
Communication dans un congrès hal-02123302v1

Development of TEM and SEM high brightness electron guns using cold field emission from a carbon nanotip

Florent Houdellier , Ludvig de Knoop , Christophe Gatel , Aurélien Masseboeuf , Shuichi Mamishin
PICO-2015, Apr 2015, Jülich, Netherlands
Communication dans un congrès hal-02123316v1

Strain Mapping of Layers and Devices Using Electron Holography

Alain Claverie , Nikolay Cherkashin , Florian Hüe , Shay Reboh , Florent Houdellier
ECS Trans. 2010, 2010, Unknown, Unknown Region. ⟨10.1149/1.3487533⟩
Communication dans un congrès hal-01736051v1

Determination of strain within Si1-yCy layers grown by CVD on a Si substrate

Nikolay Cherkashin , A. Gouye , Florian Hüe , Florent Houdellier , Martin Hÿtch
Symposium C – Quantitative Electron Microscopy for Materials Science, 2007, undetermined, France. pp.12-19, ⟨10.1557/PROC-1026-C07-03⟩
Communication dans un congrès hal-01736057v1

Dark-Field Electron Holography for Strain Mapping

Martin Hÿtch , Florent Houdellier , Nikolay Cherkashin , Shay Reboh , Elsa Javon
Alain Claverie; Mireille Mouis. Transmission Electron Microscopy in Micro-Nanoelectronics, Wiley-Blackwell, pp.81--106, 2013, ⟨10.1002/9781118579022.ch4⟩
Chapitre d'ouvrage hal-01736026v1

CHAPTER 6 - Aberration Correction With the SACTEM-Toulouse: From Imaging to Diffraction

Florent Houdellier , Martin Hÿtch , Florian Hüe , Etienne Snoeck
P.W.Hawkes. Advances in Imaging and Electron Physics vol 153, 153, Academic press, 2008, Aberration-Corrected Electron Microscopy, 978-0-12-374220-9. ⟨10.1016/S1076-5670(08)01006-9⟩
Chapitre d'ouvrage hal-01742322v1