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Martin HYTCH

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Présentation

Dr Martin Hytch develops quantitative electron microscopy techniques for materials science applications. After carrying out his thesis at the University of Cambridge on the quantitative analysis of high-resolution images (HRTEM) of compound semiconductors in 1991, he moved to France to work at the CECM-CNRS in Paris, where he subsequently joined the CNRS in 1995. He is notably the inventor of the Geometric Phase Analysis (GPA) technique for the determination of strain from high-resolution images and has applied the technique to a wide range of materials problems and nanostructures. He moved to the CEMES-CNRS in Toulouse in 2004 to work on aberration-corrected HRTEM and electron holography. In 2007, he invented the new technique of dark-field electron holography for the measurement of strain and in 2008, he was recipient of the prestigious European Microscopy Award (FEI-EMA), awarded every 4 years at the European Microscopy Congress. Between 2009 and 2014, he headed the nanomaterials group at the CEMES (30 permanent staff). He has authored or coauthored over 130 scientific papers and given 70 invited talks at conferences and workshops.

Publications

florent-houdellier
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Optimization of off-axis electron holography performed with femtosecond electron pulses

Florent Houdellier , Giuseppe Mario Caruso , Sébastien J. Weber , M.J. Hÿtch , Christophe Gatel
Article dans une revue hal-02080673v1

Unlimited acquisition time in electron holography by automated feedback control of transmission electron microscope

Christophe Gatel , Julien Dupuy , Florent Houdellier , Martin J. Hÿtch
Applied Physics Letters, 2018, 113 (13), ⟨10.1063/1.5050906⟩
Article dans une revue hal-01884057v1

Differential phase-contrast dark-field electron holography for strain mapping

Thibaud Denneulin , Florent Houdellier , Martin Hÿtch
Ultramicroscopy, 2016, 160, pp.98-109. ⟨10.1016/j.ultramic.2015.10.002⟩
Article dans une revue hal-01723740v1
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Quantitative 3D electromagnetic field determination of 1D nanostructures from single projection

Charudatta Phatak , Ludvig de Knoop , Florent Houdellier , Christophe Gatel , Martin Hÿtch
Ultramicroscopy, 2016, 164, pp.24--30. ⟨10.1016/j.ultramic.2016.03.005⟩
Article dans une revue hal-01430579v1

Realization of a tilted reference wave for electron holography by means of a condenser biprism

Falk Röder , Florent Houdellier , Thibaud Denneulin , Etienne Snoeck , Martin Hÿtch
Ultramicroscopy, 2016, 161, pp.23 - 40. ⟨10.1016/j.ultramic.2015.11.004⟩
Article dans une revue hal-01404505v1
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Low-noise cold-field emission current obtained between two opposed carbon cone nanotips during in situ transmission electron microscope biasing

Ludvig de Knoop , Christophe Gatel , Florent Houdellier , Marc Monthioux , Aurélien Masseboeuf
Applied Physics Letters, 2015, 106 (26), pp.263101. ⟨10.1063/1.4923245⟩
Article dans une revue hal-01430586v2

Development of TEM and SEM high brightness electron guns using cold-field emission from a carbon nanotip

Florent Houdellier , Ludvig de Knoop , Christophe Gatel , Aurélien Masseboeuf , S Mamishin
Ultramicroscopy, 2015, 151, pp.107--115. ⟨10.1016/j.ultramic.2014.11.021⟩
Article dans une revue hal-01430585v1
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Off-Axial Aberration Correction using a B-COR for Lorentz and HREM Modes

Etienne Snoeck , Florent Houdellier , Yoshifumi Taniguch , Aurélien Masseboeuf , Christophe Gatel
Microscopy and Microanalysis, 2014, 20 (S3), pp.932--933. ⟨10.1017/S1431927614006382⟩
Article dans une revue hal-01430589v1

Determining the work function of a carbon-cone cold-field emitter by in situ electron holography

Ludvig de Knoop , Florent Houdellier , Christophe Gatel , Aurélien Masseboeuf , Marc Monthioux
Micron, 2014, 63, pp.2--8. ⟨10.1016/j.micron.2014.03.005⟩
Article dans une revue hal-01430588v1

Dynamical effects in strain measurements by dark-field electron holography

Elsa Javon , Axel Lubk , Robin Cours , Shay Reboh , Nikolay Cherkashin
Ultramicroscopy, 2014, 147, pp.70-85. ⟨10.1016/j.ultramic.2014.06.005⟩
Article dans une revue hal-01721158v1

Mechanics of silicon nitride thin-film stressors on a transistor-like geometry

Shay Reboh , P. Morin , Martin Hÿtch , Florent Houdellier , Alain Claverie
APL Materials, 2013, 1 (4), ⟨10.1063/1.4826545⟩
Article dans une revue hal-01724108v1

A new linear transfer theory and characterization method for image detectors. Part II: Experiment

Axel Lubk , Falk Röder , Tore Niermann , Christophe Gatel , Sébastien Joulié
Ultramicroscopy, 2012, 115, pp.78 - 87. ⟨10.1016/j.ultramic.2012.01.011⟩
Article dans une revue hal-01742051v1
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New carbon cone nanotip for use in a highly coherent cold field emission electron microscope

Florent Houdellier , Aurélien Masseboeuf , Marc Monthioux , Martin Hÿtch
Carbon, 2012, 50 (5), pp.2037-2044. ⟨10.1016/j.carbon.2012.01.023⟩
Article dans une revue hal-00678407v1

Dark-field electron holography for the measurement of geometric phase

Martin Hÿtch , Florent Houdellier , Florian Hüe , Etienne Snoeck
Ultramicroscopy, 2011, 111 (8), pp.1328 - 1337. ⟨10.1016/j.ultramic.2011.04.008⟩
Article dans une revue hal-01742047v1

Strain mapping in layers and devices by electron holography

Martin Hÿtch , Nikolay Cherkashin , Shay Reboh , Florent Houdellier , Alain Claverie
physica status solidi (a), 2011, 208 (3), pp.580-583. ⟨10.1002/pssa.201000281⟩
Article dans une revue hal-01736038v1
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Dark-field electron holography for the mapping of strain in nanostructures: correcting artefacts and aberrations

Martin Hÿtch , Florent Houdellier , Florian Hüe , Etienne Snoeck
Journal of Physics: Conference Series, 2010, 241, pp.012027. ⟨10.1088/1742-6596/241/1/012027⟩
Article dans une revue hal-01742031v1

Visualising alloy fluctuations by spherical-aberration–corrected HRTEM

Marie-José Casanove , Nicolas Combe , Florent Houdellier , Martin Hÿtch
EPL - Europhysics Letters, 2010, 91 (3), ⟨10.1209/0295-5075/91/36001⟩
Article dans une revue hal-01742039v1
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End of range defects in Ge

S. Koffel , Nikolay Cherkashin , Florent Houdellier , Martin Hÿtch , Gérard Benassayag
Journal of Applied Physics, 2009, 105, pp.126110. ⟨10.1063/1.3153985⟩
Article dans une revue hal-01736054v1
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Strain mapping of tensiley strained silicon transistors with embedded Si1−yCy source and drain by dark-field holography

Florian Hüe , Martin Hÿtch , Florent Houdellier , Hugo Bender , Alain Claverie
Applied Physics Letters, 2009, 95 (7), pp.73103 - 73103. ⟨10.1063/1.3192356⟩
Article dans une revue hal-01742020v1

Selective growth of tensily strained Si1−yCy films on patterned Si substrates

A. Gouye , Florian Hüe , A. Halimaoui , O. Kermarrec , Y. Campidelli
Materials Science in Semiconductor Processing, 2009, 12 (1-2), pp.34 - 39. ⟨10.1016/j.mssp.2009.07.006⟩
Article dans une revue hal-01742015v1
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On the influence of elastic strain on the accommodation of carbon atoms into substitutional sites in strained Si:C layers grown on Si substrates

Nikolay Cherkashin , Martin Hÿtch , Florent Houdellier , Florian Hüe , Vincent Paillard
Applied Physics Letters, 2009, 94 (14), pp.141910. ⟨10.1063/1.3116648⟩
Article dans une revue hal-00417300v1

Mapping inelastic intensities in diffraction patterns of magnetic samples using the energy spectrum imaging technique

Bénédicte Warot-Fonrose , Florent Houdellier , Martin Hÿtch , Lionel Calmels , Virginie Serin
Ultramicroscopy, 2008, 108 (5), pp.393 - 398. ⟨10.1016/j.ultramic.2007.05.013⟩
Article dans une revue hal-01707847v1
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Direct Mapping of Strain in a Strained Silicon Transistor by High-Resolution Electron Microscopy

Florian Hüe , Martin Hÿtch , Hugo Bender , Florent Houdellier , Alain Claverie
Physical Review Letters, 2008, 100 (15), ⟨10.1103/PhysRevLett.100.156602⟩
Article dans une revue hal-01741994v1

Strain mapping in MOSFETS by high-resolution electron microscopy and electron holography

Florian Hüe , Martin Hÿtch , Florent Houdellier , Etienne Snoeck , Alain Claverie
Materials Science and Engineering: B, 2008, 154-155, pp.221 - 224. ⟨10.1016/j.mseb.2008.10.020⟩
Article dans une revue hal-01742010v1
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Lateral epitaxial growth of germanium on silicon oxide

D. Cammilleri , V. Yam , F. Fossard , C. Renard , D. Bouchier
Applied Physics Letters, 2008, 93 (4), pp.43110 - 43110. ⟨10.1063/1.2963363⟩
Article dans une revue hal-01742002v1

Diffracted phase and amplitude measurements by energy-filtered convergent-beam holography (CHEF)

Florent Houdellier , Martin Hÿtch
Ultramicroscopy, 2008, 108 (3), pp.285 - 294. ⟨10.1016/j.ultramic.2007.08.016⟩
Article dans une revue hal-01707842v1

Nanoscale holographic interferometry for strain measurements in electronic devices

Martin Hÿtch , Florent Houdellier , Florian Hüe , Etienne Snoeck
Nature, 2008, 453 (7198), pp.1086 - 1089. ⟨10.1038/nature07049⟩
Article dans une revue hal-01742001v1

Lateral growth of monocrystalline Ge on silicon oxide by ultrahigh vacuum chemical vapor deposition

V. D. Cammilleri , V. Yam , F. Fossard , C. Renard , D. Bouchier
Materials Science in Semiconductor Processing, 2008, 11 (5-6), pp.214-216. ⟨10.1016/j.mssp.2008.07.003⟩
Article dans une revue hal-01293141v1
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Experimental application of sum rules for electron energy loss magnetic chiral dichroism

Lionel Calmels , Florent Houdellier , Bénédicte Warot-Fonrose , Christophe Gatel , Martin Hÿtch
Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2007, 76 (6), ⟨10.1103/PhysRevB.76.060409⟩
Article dans une revue hal-01741982v1

Mapping stress and strain in nanostructures by high-resolution transmission electron microscopy

Florent Houdellier , Martin Hÿtch
Microelectronic Engineering, 2007, 84 (3), pp.460 - 463. ⟨10.1016/j.mee.2006.10.062⟩
Article dans une revue hal-01741980v1

High-resolution electron holography for the study of composition and strain in thin film semiconductors

Florent Houdellier , Martin Hÿtch , Etienne Snoeck , Marie-José Casanove
Materials Science and Engineering: B, 2006, 135 (3), pp.188 - 191. ⟨10.1016/j.mseb.2006.08.035⟩
Article dans une revue hal-01741978v1

Development of TEM and SEM high brightness electron guns using cold field emission from a carbon nanotip

Florent Houdellier , Ludvig de Knoop , Christophe Gatel , Aurélien Masseboeuf , Shuichi Mamishin
PICO-2015, Apr 2015, Jülich, Netherlands
Communication dans un congrès hal-02123316v1

In situ electron microscopy of hard and soft matter

Ludvig de Knoop , Florent Houdellier , Christophe Gatel , Aurélien Masseboeuf , Marc Monthioux
Joint XIII Interamerican Microscopy Congress & XVI Venezuelan Congress for Microscopy and Microanalysis 'CIASEM-2015', Oct 2015, Isla de Margarita, Venezuela
Communication dans un congrès hal-02123302v1

Measurement of crystalline lattice strain by transmission electron microscopy”

Nikolay Cherkashin , Florent Houdellier , Martin Hÿtch , Maxim Korytov
14ème colloque de la Société Française des Microscopies, Jun 2015, Nice, France
Communication dans un congrès hal-01763051v1

Synthesis and applications of individual carbon-nanotube-supported carbon nanocones

Marc Monthioux , Mathieu Delmas , Florent Houdellier , Thierry Ondarçuhu , Aurélien Masseboeuf
IEEE Nanotechnology Materials and Devices Conference, Oct 2014, Aci Castello, Italy
Communication dans un congrès hal-02123308v1

Strain Mapping of Layers and Devices Using Electron Holography

Alain Claverie , Nikolay Cherkashin , Florian Hüe , Shay Reboh , Florent Houdellier
ECS Trans. 2010, 2010, Unknown, Unknown Region. ⟨10.1149/1.3487533⟩
Communication dans un congrès hal-01736051v1

Critical Analysis of Different Techniques for Measuring Strain in Si1-yCy Layers Grown by CVD on a Si Substrate

Nikolay Cherkashin , Adrien Gouye , Florian Hüe , Florent Houdellier , Martin Hÿtch
ECS Transactions, May 2008, Unknown, Unknown Region. ⟨10.1149/1.2911510⟩
Communication dans un congrès hal-01736065v1

Determination of strain within Si1-yCy layers grown by CVD on a Si substrate

Nikolay Cherkashin , A. Gouye , Florian Hüe , Florent Houdellier , Martin Hÿtch
Symposium C – Quantitative Electron Microscopy for Materials Science, 2007, undetermined, France. pp.12-19, ⟨10.1557/PROC-1026-C07-03⟩
Communication dans un congrès hal-01736057v1

Dark-Field Electron Holography for Strain Mapping

Martin Hÿtch , Florent Houdellier , Nikolay Cherkashin , Shay Reboh , Elsa Javon
Alain Claverie; Mireille Mouis. Transmission Electron Microscopy in Micro-Nanoelectronics, Wiley-Blackwell, pp.81--106, 2013, ⟨10.1002/9781118579022.ch4⟩
Chapitre d'ouvrage hal-01736026v1

CHAPTER 6 - Aberration Correction With the SACTEM-Toulouse: From Imaging to Diffraction

Florent Houdellier , Martin Hÿtch , Florian Hüe , Etienne Snoeck
P.W.Hawkes. Advances in Imaging and Electron Physics vol 153, 153, Academic press, 2008, Aberration-Corrected Electron Microscopy, 978-0-12-374220-9. ⟨10.1016/S1076-5670(08)01006-9⟩
Chapitre d'ouvrage hal-01742322v1