Nicolas MAURAN

Publications

Article dans une revue (9)

Preconditioning of p-GaN power HEMT for reproducible V measurements L. Ghizzo,David Trémouilles,Frédéric Richardeau,S. Vinnac,Lucas Moreauet al. Microelectronics Reliability, 2023, 144, pp.114955. ⟨10.1016/j.microrel.2023.114955⟩ Article dans une revue hal-04049626v1
Very high frequency probes for atomic force microscopy with silicon optomechanics L Schwab,P E Allain,Nicolas Mauran,Xavier Dollat,Laurent Mazenqet al. Microsystems & Nanoengineering, 2022, 8, pp.32. ⟨10.1038/s41378-022-00364-4⟩ Article dans une revue hal-03326075v2
A New Miniaturized Gas Sensor Based on Zener Diode Network Covered by Metal Oxide Vignesh Gunasekaran,Soffian Yjjou,Eve Hennequin,Thierry Camps,Nicolas Mauranet al. Micromachines, 2021, 12 (11), pp.1355. ⟨10.3390/mi12111355⟩ Article dans une revue hal-03417359v1
Low Latency Demodulation for High-Frequency Atomic Force Microscopy Probes Denis Lagrange,Nicolas Mauran,Lucien Schwab,Bernard Legrand IEEE Transactions on Control Systems Technology, 2021, 29 (5), pp.2264 - 2270. ⟨10.1109/TCST.2020.3028737⟩ Article dans une revue hal-02974151v1
On-chip measurement to analyze failure mechanisms of ICs under system level ESD stress Fabrice Caignet,Nicolas Nolhier,Marise Bafleur,Anqing Wang,Nicolas Mauran Microelectronics Reliability, 2013, 53 (9-11), pp.1278-1283. ⟨10.1016/j.microrel.2013.07.056⟩ Article dans une revue hal-00941840v1
An Accelerated Stress Test Method for Electrostatically Driven MEMS Devices Jinyu Jason Ruan,Nicolas Monnereau,David Trémouilles,Nicolas Mauran,Fabio Coccettiet al. IEEE Transactions on Instrumentation and Measurement, 2012, pp.456-461. ⟨10.1109/TIM.2011.2161937⟩ Article dans une revue hal-00668827v1
Integrated LC filter on silicon for DC-DC converter applications Philippe Artillan,Magali Brunet,David Bourrier,Jean-Pierre Laur,Nicolas Mauranet al. IEEE Transactions on Power Electronics, 2011, 26 (8), pp.2319-2325. ⟨10.1109/TPEL.2010.2102776⟩ Article dans une revue hal-01443073v1
A New Junction Termination Using a Deep Trench Filled With BenzoCycloButene Loïc Théolier,Hicham Mahfoz-Kotb,Karine Isoird,Frédéric Morancho,Sandrine Assié-Souleilleet al. IEEE Electron Device Letters, 2009, 30 (6), pp.687 - 689. ⟨10.1109/LED.2009.2020348⟩ Article dans une revue hal-00991660v1
Analysis and Compact Modeling of a Vertical Grounded-Base NPN Bipolar Transistor used as ESD Protection in a Smart Power Technology Géraldine Bertrand,Christelle Delage,Marise Bafleur,Nicolas Nolhier,Jean-Marie Dorkelet al. IEEE Journal of Solid-State Circuits, 2001, 36 (9), pp.1373-1381 Article dans une revue hal-00143927v1

Communication dans un congrès (14)

In-sensor computing with contactless MEMS: binary neurons for harsh environment Aleksandra Markovic,Armine Karami,Nicolas Mauran,Philippe Basset,Hervé Fanetet al. 2025 IEEE SENSORS, Oct 2025, Vancouver, Canada. pp.1-4, ⟨10.1109/SENSORS59705.2025.11330918⟩ Communication dans un congrès hal-05532759v1
High-Temperature Dual-Rail Contactless MEMS Logic for Industrial Edge Computing Aleksandra Marković,Adrian Laborde,Nicolas Mauran,Hervé Fanet,Gaël Pillonnetet al. 2025 IEEE 38th International Conference on Micro Electro Mechanical Systems (MEMS), IEEE, Jan 2025, Kaohsiung, Taiwan. pp.542-545, ⟨10.1109/MEMS61431.2025.10917966⟩ Communication dans un congrès hal-05227846v1
TOWARDS UNVEILING THE HIDDEN DYNAMICS OF BACTERIORHODOPSIN WITH MEMS-BASED ATOMIC FORCE MICROSCOPY Suyambulingam Subramanian,Nicolas Mauran,Guillaume Jourdan,Ignacio Casuso,Bernard Legrand 2025 23rd International Conference on Solid-State Sensors, Actuators and Microsystems (Transducers), Jun 2025, Orlando, United States. pp.817-820, ⟨10.1109/Transducers61432.2025.11110349⟩ Communication dans un congrès hal-05251930v1
Sondes optomécaniques : vers l'AFM aux fréquences GHz Suyambulingham Subramanian,Clément Le Fur,Lucien Schwab,Ilan Shlesinger,Pierre Allainet al. Forum de microscopie à sondes locales, Apr 2024, Lyon, France Communication dans un congrès hal-04562805v1
Self-Propagating Reaction Mechanisms in TiB2 Integrated Al/CuO Nanothermites Vidushi Singh,Richard Monflier,Nicolas Mauran,Alain Estève,Carole Rossi 2023 MRS Fall Meeting & Exhibit, Materials Research Society, Nov 2023, Boston (MA), United States Communication dans un congrès hal-04493934v1
130-MHz Optomechanical Vibrating Sensor: Towards High Bandwidth / Ultrasensitive Measurements Lucien Schwab,Pierre-Etienne Allain,Louise Banniard,Nicolas Mauran,Denis Lagrangeet al. IEEE 32nd International Conference on Micro Electro Mechanical Systems (MEMS 2019), Jan 2019, Seoul, South Korea. pp.819-822, ⟨10.1109/MEMSYS.2019.8870718⟩ Communication dans un congrès hal-02371188v1
VCSELs fabricated using self-aligned processing Ludovic Marigo-Lombart,Alexandre Arnoult,Laurent Mazenq,Pascal Dubreuil,Benjamin Reiget al. Workshop VCSEL Day 2016, Jun 2016, Darmstadt, Germany. 2p Communication dans un congrès hal-01857634v1
VCSELs fabricated using self-aligned processing Ludovic Marigo-Lombart,Laurent Mazenq,Ludovic Salvagnac,Guillaume Libaude,Bernard Roussetet al. 42nd Micro and Nano Engineering (MNE), Sep 2016, Vienna, Austria Communication dans un congrès hal-01857636v1
TLP-based Human Metal Model stress generator and analysis method of ESD generators Rémi Bèges,Fabrice Caignet,Patrice Besse,Jean-Philippe Laine,Alain Salleset al. Electrical Overstress / Electrostatic Discharge Symposium (EOS/ESD 2015), Sep 2015, Reno, United States. ⟨10.1109/EOSESD.2015.7314777⟩ Communication dans un congrès hal-01239451v1
Oscilloscope intégré sur puce appliqué à la caractérisation d'un générateur d'impulsions à 20 GHz Thomas Epert,Fabrice Caignet,Christophe Viallon,Anqing Wang,Nicolas Mauranet al. 18èmes Journées Nationales Microondes, May 2013, Paris, France. pp.4 Communication dans un congrès hal-00924176v1
Transient-TLP (T-TLP): a simple method for accurate ESD protection transient behavior measurement David Trémouilles,Antoine Delmas,Nicolas Mauran,Nicolas Nolhier,Houssam Arbesset al. EOS/ESD Symposium, Sep 2013, LAS VEGAS, United States. pp.258-267 Communication dans un congrès hal-01056511v1
Réalisation et caractérisation de diodes Schottky en diamant monocristallin protégées par plaque de champ sur Si3N4 Fabien Thion,Karine Isoird,Dominique Planson,Marie-Laure Locatelli,Henri Schneideret al. 14ème EPF, Jul 2012, Bordeaux, France. 4 p Communication dans un congrès hal-01005917v1
Accurate Transient Behavior Measurement of High- Voltage ESD Protections Based on a Very Fast Transmission-Line Pulse System Antoine Delmas,Nicolas Nolhier,David Trémouilles,Marise Bafleur,Nicolas Mauranet al. 31st Electrical Overstress/Electrostatic Discharge Symposium, 2009. EOS/ESD Symposium, Aug 2009, ANAHEIM, United States. pp.165-172 Communication dans un congrès hal-00445676v1
ENERGY SCAVENGING BASED ON TRANSIENT THERMAL GRADIENTS: APPLICATION TO STRUCTURAL HEALTH MONITORING OF AIRCRAFTS Nicolas Bailly,Jean-Marie Dilhac,Christophe Escriba,Claude Vanhecke,Nicolas Mauranet al. 8th International Workshop on Micro and Nanotechnology for Power Generation and Energy Conversion Applications (PowerMEMS 2008), Nov 2008, SENDAI, Japan. pp.205-208 Communication dans un congrès hal-00384129v1

Poster de conférence (3)

Unveiling Hidden Dynamics of Biological Process with Optomechanical AFM with sub-µs time resolution Suyambulingham Subramanian,Nicolas Mauran,Chérif Bélacel,Guillaume Jourdan,Ivan Faveroet al. Annual Meeting of the GDR MecaQ, Sep 2024, Grenoble, France. 2024 Poster de conférence hal-04819714v1
High Speed Atomic Force Microscope Nicolas Mauran,Denis Lagrange,Xavier Dollat,Laurent Mazenq,Lucien Schwabet al. NI-Week 2017, May 2017, Austin, TX, United States. , 2017 Poster de conférence hal-01529673v1
Développement de briques technologiques pour la fabrication d’un VCSEL avec un modulateur intégré verticalement Ludovic Marigo-Lombart,Alexandre Arnoult,Laurent Mazenq,Pascal Dubreuil,Jean-Baptiste Doucetet al. 15eme Journees Nano, Micro et Optoelectronique (JNMO), May 2016, Les Issambres, France. 2016 Poster de conférence hal-01857638v1

Rapport (2)

Notice d'utilisation de la station sous pointes MPI TS-2000 Nicolas Mauran Région Occitanie. 2020, pp.8 Rapport (rapport technique) hal-02573149v1
Développement d'une platine de déplacements nanométriques pour la réalisation d'un Microscope à Force Atomique (AFM) rapide Laurent Mazenq,Lucien Schwab,Nicolas Mauran,Denis Lagrange,Xavier Dollatet al. [Rapport Technique] LAAS-CNRS. 2019 Rapport (rapport technique) hal-03603368v1