Nicolas ROLLAND

Publications

Poster de conférence (1)

Natural Deep Eutectic Solvents Design Acceleration Using Variational Auto Encoder Rachid Laref,Mehdi Oubahmane,Nicolas Rolland,Véronique Nardello-Rataj,Adlane Sayede AI4AM 2025, Apr 2025, San Sebastian, Spain Poster de conférence hal-05268004v1

Mémoire d'étudiant (1)

Évaluation de l'impact du transfert inter-site sur la morbidité maternelle sévère pour la prise en charge des hémorragies du post-partum par embolisation des artères utérines Nicolas Rolland Sciences du Vivant [q-bio]. 2025 Mémoire d'étudiant dumas-05324724v1

Article dans une revue (13)

Interplay of structure and photophysics of individualized rod-shaped graphene quantum dots with up to 132 sp² carbon atoms Daniel Medina-Lopez,Thomas Liu,Silvio Osella,Hugo Levy-Falk,Nicolas Rollandet al. Nature Communications, 2023, 14, pp.4728. ⟨10.1038/s41467-023-40376-w⟩ Article dans une revue hal-04187762v1
Grain size effect on interfacial segregation in nanomaterials F. Danoix,K. Hoummada,P. Maugis,N. Rolland,C. Debreuxet al. Journal of Physics and Chemistry of Solids, 2022, 164, pp.110620. ⟨10.1016/j.jpcs.2022.110620⟩ Article dans une revue hal-03855610v1
Grain size effect on interfacial segregation in nanomaterials F. Danoix,K. Hoummada,P. Maugis,N. Rolland,C. Debreuxet al. Journal of Physics and Chemistry of Solids, 2022, 164, pp.110620. ⟨10.1016/j.jpcs.2022.110620⟩ Article dans une revue hal-04018877v1
A model to predict image formation in the three-dimensional field ion microscope Benjamin Klaes,Rodrigue Lardé,Fabien Delaroche,Stefan Parviainen,Nicolas Rollandet al. Computer Physics Communications, 2020, pp.107317. ⟨10.1016/j.cpc.2020.107317⟩ Article dans une revue hal-02571970v1
Impact of local electrostatic field rearrangement on field ionization Shyam Katnagallu,Michal Dagan,Stefan Parviainen,Ali Nematollahi,Blazej Grabowskiet al. Journal of Physics D: Applied Physics, 2018, 51 (10), pp.105601. ⟨10.1088/1361-6463/aaaba6⟩ Article dans une revue hal-02107446v1
Atom probe tomography for advanced nanoelectronic devices: Current status and perspectives J. Barnes,A. Grenier,I. Mouton,S. Barraud,G. Audoitet al. Scripta Materialia, 2018, 148, pp.91 - 97. ⟨10.1016/j.scriptamat.2017.05.012⟩ Article dans une revue istex hal-01765929v1
New Atom Probe Tomography Reconstruction Algorithm for Multilayered Samples: Beyond the Hemispherical Constraint Nicolas Rolland,François Vurpillot,Sébastien Duguay,Baishakhi Mazumder,James Specket al. Microscopy and Microanalysis, 2017, 23 (02), pp.247 - 254. ⟨10.1017/s1431927617000253⟩ Article dans une revue hal-01766098v1
Reconstructing APT Datasets: Challenging the Limits of the Possible François Vurpillot,David Zanuttini,Stefan Parviainen,Baishaikhi Mazumder,Nicolas Rollandet al. Microscopy and Microanalysis, 2017, 23 (S1), pp.640-641. ⟨10.1017/S1431927617003865⟩ Article dans une revue hal-02107482v1
Accuracy of analyses of microelectronics nanostructures in atom probe tomography François Vurpillot,Nicolas Rolland,Robert Estivill,Sébastien Duguay,D. Blavette Semiconductor Science and Technology, 2016, 31 (7), pp.074002. ⟨10.1088/0268-1242/31/7/074002⟩ Article dans une revue hal-01928850v1
An analytical model accounting for tip shape evolution during atom probe analysis of heterogeneous materials Nicolas Rolland,D. J. Larson,B. P. Geiser,Sébastien Duguay,François Vurpillotet al. Ultramicroscopy, 2015, 159, pp.195--201. ⟨10.1016/j.ultramic.2015.03.010⟩ Article dans une revue istex hal-01928854v1
Three dimensional imaging and analysis of a single nano-device at the ultimate scale using correlative microscopy techniques A. Grenier,Sébastien Duguay,J. P. Barnes,R. Serra,Nicolas Rollandet al. Applied Physics Letters, 2015, 106 (21), pp.213102. ⟨10.1063/1.4921352⟩ Article dans une revue hal-01928856v1
A Meshless Algorithm to Model Field Evaporation in Atom Probe Tomography Nicolas Rolland,François Vurpillot,Sébastien Duguay,Didier Blavette Microscopy and Microanalysis, 2015, 21 (6), pp.1649-1656. ⟨10.1017/S1431927615015184⟩ Article dans une revue hal-02107013v1
Dynamic evolution and fracture of multilayer field emitters in atom probe tomography: a new interpretation Nicolas Rolland,François Vurpillot,Sébastien Duguay,Didier Blavette European Physical Journal: Applied Physics, 2015, 72 (2), pp.21001. ⟨10.1051/epjap/2015150233⟩ Article dans une revue istex hal-02107622v1

Communication dans un congrès (1)

Correlative Investigations by HAADF-STEM and Atom Probe Tomography Williams Lefebvre,Florian Moyon,Antoine Normand,Nicolas Rolland,Ivan Blumet al. European Microscopy Congress, Aug 2016, Lyon, France. pp.775-776, ⟨10.1002/9783527808465.EMC2016.8364⟩ Communication dans un congrès hal-01954243v1