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Patrick Girard

2
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On Using Cell-Aware Methodology for SRAM Bit Cell Testing

Xhesila Xhafa , Aymen Ladhar , Eric Faehn , Lorena Anghel , Gregory Di Pendina
ETS 2023 - 28th IEEE European Test Symposium, May 2023, Venezia, Italy. pp.1-4, ⟨10.1109/ETS56758.2023.10174118⟩
Communication dans un congrès hal-04164704v1
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On Using Cell-Aware Models for Representing SRAM Architecture

Xhesila Xhafa , Aymen Ladhar , Eric Faehn , Lorena Anghel , Gregory Di Pendina
16e Colloque National du GDR SoC², Jun 2022, Strasbourg, France
Communication dans un congrès lirmm-03987914v1