- 5
- 2
Patrick Girard
7
Documents
Identifiants chercheurs
- patrick-girard-lirmm
- 0000-0003-0722-8772
Présentation
Publications
- 4
- 2
- 2
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 7
- 7
- 7
- 6
- 6
- 2
- 1
- 7
- 2
- 2
- 3
- 2
Neutron-Induced Multiple Bit Upsets on Two Commercial SRAMs Under Dynamic-StressIEEE Transactions on Nuclear Science, 2012, 59 (4), pp.893-899. ⟨10.1109/TNS.2012.2187218⟩
Article dans une revue
lirmm-00805031v1
|
|
Impact of Resistive-Open Defects on SRAM Error Rate Induced by Alpha Particles and NeutronsIEEE Transactions on Nuclear Science, 2011, 58 (3), pp.855-861. ⟨10.1109/TNS.2011.2123114⟩
Article dans une revue
lirmm-00805046v1
|
Dynamic-Stress Neutrons Test of Commercial SRAMsIEEE Nuclear and Space Radiation Effects Conference, Jul 2012, Las Vegas, NV, United States. pp.1-4
Communication dans un congrès
lirmm-00805349v1
|
|
Neutron-Induced Multiple Bit Upsets on Dynamically-Stressed Commercial SRAM ArraysRADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2011, Seville, Spain. pp.274-280, ⟨10.1109/RADECS.2011.6131396⟩
Communication dans un congrès
lirmm-00805314v1
|
|
Neutron Detection in Atmospheric Environment through Static and Dynamic SRAM-Based Test BenchIEEE Latin American test Workshop, Mar 2011, Porto de Galinhas, Brazil. pp.1-6
Communication dans un congrès
lirmm-00805120v1
|
|
Impact of Resistive-Open Defects on SRAM sensitivity to Soft ErrorsRADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2010, Langenfeld, Austria
Communication dans un congrès
lirmm-00566847v1
|
A Roaming Memory Test Bench for Detecting Particle Induced SEUsITC 2010 - International Test Conference, Nov 2010, Austin, TX, United States. 2010, ⟨10.1109/TEST.2010.5699302⟩
Poster de conférence
lirmm-00537879v1
|