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Philippe Leray

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benoit-delahaye
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Graphical event model learning and verification for security assessment

Dimitri Antakly , Benoit Delahaye , Philippe Leray
32th International Conference on Industrial, Engineering, Other Applications of Applied Intelligent Systems (IEA/AIE 2019), 2019, Graz, Austria. pp.245-252, ⟨10.1007/978-3-030-22999-3_22⟩
Communication dans un congrès hal-02129161v1