Resonant-Contact Atomic Force Microscopy
Richard Arinero
AFM School, “AFM characterization of wood mechanical properties” , Sep 2014, Zvolen, Slovakia
Communication dans un congrès
hal-01814142v1
Actions
Partager
Gmail
Facebook
X
LinkedIn
More
Heavy ion-induced latent defects dependence on oxide thickness: The reason why Post Gate Stress are especially dedicated to Power MOSFETs
A.M.J.F. Carvalho
,
Antoine Touboul
,
M. Marinoni
,
R. Arinero
,
Frédéric Saigné
,
et al.
7th Symposium SIO2 Advanced Dielectrics an Related Devices , 2008, Saint-Etienne, France
Communication dans un congrès
hal-01822739v1
Actions
Partager
Gmail
Facebook
X
LinkedIn
More
New Insights into Dielectric Nanocomposites by EFM Imaging and Spectroscopy
R. Arinero
,
D. El Khoury
,
J. Castellon
IEEE Nanotechnology Materials and Devices Conference NMDC 2018, on-line proceedings , 2018, Portland, United States
Communication dans un congrès
hal-02007254v1
Actions
Partager
Gmail
Facebook
X
LinkedIn
More
Contrast inversion in electrostatic force microscopy imaging of trapped charges: tip–sample distance and dielectric constant dependence
C. Riedel
,
A. Alegria
,
R. Arinero
,
J. Colmenero
,
J J Sáenz
Article dans une revue
istex
hal-01632610v1
Actions
Partager
Gmail
Facebook
X
LinkedIn
More
Vibration of the cantilever in Force Modulation Microscopy analysis by a finite element model
R. Arinero
,
Gaëtan Lévêque
Article dans une revue
hal-00327957v1
Actions
Partager
Gmail
Facebook
X
LinkedIn
More
Mise en évidence des propriétés élastiques de la paroi cellulaire du bois par microscopie à force atomique
Richard Arinero
,
Gérard Leveque
,
Bruno Clair
,
Michel Ramonda
Forum des microscopies à sondes locales , Mar 2001, La Baume-les-Aix, France
Communication dans un congrès
hal-01815449v1
Actions
Partager
Gmail
Facebook
X
LinkedIn
More
Pedestal formation of all-semiconductor gratings through GaSb oxidation for mid-IR plasmonics
Mario Bomers
,
Franziska Barho
,
Maria Jose Milla-Rodrigo
,
Laurent Cerutti
,
Richard Arinero
,
et al.
Article dans une revue
hal-01754720v1
Actions
Partager
Gmail
Facebook
X
LinkedIn
More
Mid-IR plasmonic compound with gallium oxide toplayer formed by GaSb oxidation in water
Mario Bomers
,
Davide Maria Di Paola
,
Laurent Cerutti
,
Thierry Michel
,
Richard Arinero
,
et al.
Article dans une revue
hal-02045509v1
Actions
Partager
Gmail
Facebook
X
LinkedIn
More
Imaging the Temperature-frequency Dependence of the Local Dielectric Response of Phase Separated Polymer Films by Means of EFM
Clément Riedel
,
R. Sweeney
,
N. E. Israeloff
,
Richard Arinero
,
Gustavo Ariel Schwartz
,
et al.
The 12th International Scanning Probe Microscopy (ISPM) Conference , May 2010, Sapporo, Japan
Communication dans un congrès
hal-01813953v1
Actions
Partager
Gmail
Facebook
X
LinkedIn
More
Determination of the Nanoscale dielectric permittivity by means of a double pass method using EFM
Clément Riedel
,
Richard Arinero
,
Philippe Tordjeman
,
Michel Ramonda
,
Gérard Leveque
,
et al.
inanoGUNE ETORTEK 1st Workshop , May 2009, San Sebastian, Spain
Communication dans un congrès
hal-01814138v1
Actions
Partager
Gmail
Facebook
X
LinkedIn
More
Post-Irradiation-Gate-Stress on Power MOSFETs: Quantification of Latent Defects-Induced Reliability Degradation
A. Privat
,
Antoine Touboul
,
R. Arinero
,
Frédéric Wrobel
,
F. Saigné
,
et al.
Nuclear and Space Radiation Effects (NSREC) , 2013, San Francisco, United States
Communication dans un congrès
hal-01824642v1
Actions
Partager
Gmail
Facebook
X
LinkedIn
More
Etude électrique et physique à l’échelle nanométrique des couches minces de SiO2 thermique sous différentes atmosphères
Wael Hourani
,
Brice Gautier
,
Liviu Militaru
,
David Albertini
,
Armel Descamps-Mandine
,
et al.
Forum des microscopies à sondes locales , Mar 2011, Ecully, France
Communication dans un congrès
hal-01814134v1
Actions
Partager
Gmail
Facebook
X
LinkedIn
More
Fundamentals of Atomic Force Microscopy
Richard Arinero
AFM School, “AFM characterization of wood mechanical properties” , Sep 2014, Zvolen, Slovakia
Communication dans un congrès
hal-01814141v1
Actions
Partager
Gmail
Facebook
X
LinkedIn
More
AFM characterization of the mechanical properties of wood at the cell wall level ; a prospective study
Karl Bytebier
,
Olivier Arnould
,
Richard Arinero
,
Joseph Gril
Workshop of COST action E50 , 2006, Warsaw, Poland
Communication dans un congrès
hal-00546591v1
Actions
Partager
Gmail
Facebook
X
LinkedIn
More
STRUCTURAL PROPERTIES OF PbTiO 3 FILMS GROWN BY MIXED REACTIVE THERMAL CO-EVAPORATION
B. Sorli
,
Jean Podlecki
,
P. Combette
,
R. Arinero
,
Grégory Simon
,
et al.
Article dans une revue
hal-01737898v1
Actions
Partager
Gmail
Facebook
X
LinkedIn
More
nanoDielectric Spectroscopy in polymers and soft matter by electrostatic force microscopy (EFM): current status and future developments
Gustavo Ariel Schwartz
,
Richard Arinero
,
Clément Riedel
,
Philippe Tordjeman
,
Angel Alegría
,
et al.
New trends in polymer rheology: complex architectures and complex environments , Apr 2010, San Sebastian, Spain
Communication dans un congrès
hal-01813974v1
Actions
Partager
Gmail
Facebook
X
LinkedIn
More
Quantitative Dielectric Mapping of Nano-structured Systems by Means of Electrostatic Force Microscopy
Gustavo Ariel Schwartz
,
Richard Arinero
,
Clément Riedel
,
Philippe Tordjeman
,
Angel Alegría
,
et al.
The 12th International Scanning Probe Microscopy (ISPM) Conference , May 2010, Sapporo, Japan
Communication dans un congrès
hal-01813969v1
Actions
Partager
Gmail
Facebook
X
LinkedIn
More
Imaging the mechanical properties of wood cell layers by atomic force modulation microscopy
Bruno Clair
,
Richard Arinero
,
Gérard Lévèque
,
Michel Ramonda
,
Bernard Thibaut
Article dans une revue
hal-00004541v2
Actions
Partager
Gmail
Facebook
X
LinkedIn
More
PbTiO3 thin films grown by mixed reactive thermal co-evaporation
B. Sorli
,
J. Podlecki
,
P. Combette
,
R. Arinero
,
F. Pascal-Delannoy
,
et al.
Article dans une revue
istex
hal-00327663v1
Actions
Partager
Gmail
Facebook
X
LinkedIn
More
Impact of Single Event Gate Rupture and Latent Defects on Power MOSFETs Switching Operation
A. Privat
,
Antoine Touboul
,
Mickael Petit
,
J.-J. Huselstein
,
Frédéric Wrobel
,
et al.
Article dans une revue
hal-01635047v1
Actions
Partager
Gmail
Facebook
X
LinkedIn
More
Toward a better understanding of the nanoscale degradation mechanisms of ultra-thin Si0 2 /Si films: Investigation of the best experimental conditions with a conductive-atomic force microscope
R. Arinero
,
W. Hourani
,
Antoine Touboul
,
B. Gautier
,
M. Ramonda
,
et al.
Article dans une revue
hal-01632428v1
Actions
Partager
Gmail
Facebook
X
LinkedIn
More
Measurement of radiations of high influence by a capacitive element of MOS type
Richard Arinero
,
Julien Mekki
,
Antoine Touboul
,
Frédéric Saigné
,
J.-R. Vaillé
United States, Patent n° : US Patent 8,981,308. 2015
Brevet
hal-01791141v1
Actions
Partager
Gmail
Facebook
X
LinkedIn
More
Mechanical characterization of wood viscoelasticity at the submicrometre scale
Karl Bytebier
,
Olivier Arnould
,
Richard Arinero
COST FP0802 Workshop on "Experimental and computational methods in wood micromechanics" , 2009, Vienne, Austria. pp.93-94
Communication dans un congrès
hal-00538975v1
Actions
Partager
Gmail
Facebook
X
LinkedIn
More
New chemical methods to form metallic nanoparticles on semiconductor surface
Berkovits V
,
Ulin V
,
Iluridze G
,
Minashvili T
,
Davitadze K
,
et al.
Nano 2016 - 4th International Conference “Nanotechnologies” , Oct 2016, Tbilisi, Georgia
Communication dans un congrès
hal-01827080v1
Actions
Partager
Gmail
Facebook
X
LinkedIn
More
Caractérisation nano-mécanique de la paroi cellulaire du bois par Microscopie à Force Atomique
Olivier Arnould
,
Karl Bytebier
,
Richard Arinero
DEPOS 23 , Sep 2010, Guidel, France
Communication dans un congrès
hal-00689756v1
Actions
Partager
Gmail
Facebook
X
LinkedIn
More
Mechanical characterization of wood viscoelasticity at the submicrometre scale
Karl Bytebier
,
Olivier Arnould
,
Richard Arinero
NanoSouth-West European Conference , Nov 2008, Bordeaux, France
Communication dans un congrès
hal-01814012v1
Actions
Partager
Gmail
Facebook
X
LinkedIn
More
Nanodielectric spectroscopy and nanoscale space charge detection in nanostructured dielectric films by means of Electrostatic force microscopy (Invited)
Richard Arinero
,
Jérôme Castellon
2015 IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP), Workshop on nanodielectrics , Oct 2015, Ann Arbor, United States
Communication dans un congrès
hal-01814129v1
Actions
Partager
Gmail
Facebook
X
LinkedIn
More
Resonant-Contact Atomic Force Microscopy
Richard Arinero
COST, Action FP0802, Experimental and Computational Micro-Characterization Techniques in Wood Mechanics Training School, “Acoustic, ultrasonic and AFM characterization of wood mechanical properties” , May 2012, Montpellier, France
Communication dans un congrès
hal-01814140v1
Actions
Partager
Gmail
Facebook
X
LinkedIn
More
AFM en mode contact vibrant
Richard Arinero
,
Bruno Clair
,
Gérard Leveque
13ème journée Nanotechnologie , Jan 2003, Paris, France
Communication dans un congrès
hal-01827097v1
Actions
Partager
Gmail
Facebook
X
LinkedIn
More
Half-disk laser: insight into the internal mode structure of laser resonators
Prokhor Alekseev
,
Mikhail Dunaevskiy
,
Andrey Monakhov
,
Vladislav Dudelev
,
Grigorii Sokolovskii
,
et al.
Article dans une revue
hal-01814218v1
Actions
Partager
Gmail
Facebook
X
LinkedIn
More