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Resonant-Contact Atomic Force Microscopy

Richard Arinero
AFM School, “AFM characterization of wood mechanical properties”, Sep 2014, Zvolen, Slovakia
Communication dans un congrès hal-01814142v1

Heavy ion-induced latent defects dependence on oxide thickness: The reason why Post Gate Stress are especially dedicated to Power MOSFETs

A.M.J.F. Carvalho , Antoine Touboul , M. Marinoni , R. Arinero , Frédéric Saigné , et al.
7th Symposium SIO2 Advanced Dielectrics an Related Devices, 2008, Saint-Etienne, France
Communication dans un congrès hal-01822739v1

New Insights into Dielectric Nanocomposites by EFM Imaging and Spectroscopy

R. Arinero , D. El Khoury , J. Castellon
IEEE Nanotechnology Materials and Devices Conference NMDC 2018, on-line proceedings, 2018, Portland, United States
Communication dans un congrès hal-02007254v1

Contrast inversion in electrostatic force microscopy imaging of trapped charges: tip–sample distance and dielectric constant dependence

C. Riedel , A. Alegria , R. Arinero , J. Colmenero , J J Sáenz
Nanotechnology, 2011, 22 (34), ⟨10.1088/0957-4484/22/34/345702⟩
Article dans une revue istex hal-01632610v1

Vibration of the cantilever in Force Modulation Microscopy analysis by a finite element model

R. Arinero , Gaëtan Lévêque
Review of Scientific Instruments, 2003, 74 (1), pp.104-111. ⟨10.1063/1.1525874⟩
Article dans une revue hal-00327957v1

Mise en évidence des propriétés élastiques de la paroi cellulaire du bois par microscopie à force atomique

Richard Arinero , Gérard Leveque , Bruno Clair , Michel Ramonda
Forum des microscopies à sondes locales, Mar 2001, La Baume-les-Aix, France
Communication dans un congrès hal-01815449v1
Image document

Pedestal formation of all-semiconductor gratings through GaSb oxidation for mid-IR plasmonics

Mario Bomers , Franziska Barho , Maria Jose Milla-Rodrigo , Laurent Cerutti , Richard Arinero , et al.
Journal of Physics D: Applied Physics, 2018, 51 (1), pp.015104. ⟨10.1088/1361-6463/aa98af⟩
Article dans une revue hal-01754720v1
Image document

Mid-IR plasmonic compound with gallium oxide toplayer formed by GaSb oxidation in water

Mario Bomers , Davide Maria Di Paola , Laurent Cerutti , Thierry Michel , Richard Arinero , et al.
Semiconductor Science and Technology, 2018, 33 (9), pp.095009. ⟨10.1088/1361-6641/aad4bf⟩
Article dans une revue hal-02045509v1

Imaging the Temperature-frequency Dependence of the Local Dielectric Response of Phase Separated Polymer Films by Means of EFM

Clément Riedel , R. Sweeney , N. E. Israeloff , Richard Arinero , Gustavo Ariel Schwartz , et al.
The 12th International Scanning Probe Microscopy (ISPM) Conference, May 2010, Sapporo, Japan
Communication dans un congrès hal-01813953v1

Determination of the Nanoscale dielectric permittivity by means of a double pass method using EFM

Clément Riedel , Richard Arinero , Philippe Tordjeman , Michel Ramonda , Gérard Leveque , et al.
inanoGUNE ETORTEK 1st Workshop, May 2009, San Sebastian, Spain
Communication dans un congrès hal-01814138v1

Post-Irradiation-Gate-Stress on Power MOSFETs: Quantification of Latent Defects-Induced Reliability Degradation

A. Privat , Antoine Touboul , R. Arinero , Frédéric Wrobel , F. Saigné , et al.
Nuclear and Space Radiation Effects (NSREC), 2013, San Francisco, United States
Communication dans un congrès hal-01824642v1

Etude électrique et physique à l’échelle nanométrique des couches minces de SiO2 thermique sous différentes atmosphères

Wael Hourani , Brice Gautier , Liviu Militaru , David Albertini , Armel Descamps-Mandine , et al.
Forum des microscopies à sondes locales, Mar 2011, Ecully, France
Communication dans un congrès hal-01814134v1

Fundamentals of Atomic Force Microscopy

Richard Arinero
AFM School, “AFM characterization of wood mechanical properties”, Sep 2014, Zvolen, Slovakia
Communication dans un congrès hal-01814141v1

AFM characterization of the mechanical properties of wood at the cell wall level ; a prospective study

Karl Bytebier , Olivier Arnould , Richard Arinero , Joseph Gril
Workshop of COST action E50, 2006, Warsaw, Poland
Communication dans un congrès hal-00546591v1

STRUCTURAL PROPERTIES OF PbTiO 3 FILMS GROWN BY MIXED REACTIVE THERMAL CO-EVAPORATION

B. Sorli , Jean Podlecki , P. Combette , R. Arinero , Grégory Simon , et al.
Integrated Ferroelectrics, 2008, 98 (1), pp.161 - 170. ⟨10.1080/10584580802093496⟩
Article dans une revue hal-01737898v1

nanoDielectric Spectroscopy in polymers and soft matter by electrostatic force microscopy (EFM): current status and future developments

Gustavo Ariel Schwartz , Richard Arinero , Clément Riedel , Philippe Tordjeman , Angel Alegría , et al.
New trends in polymer rheology: complex architectures and complex environments, Apr 2010, San Sebastian, Spain
Communication dans un congrès hal-01813974v1

Quantitative Dielectric Mapping of Nano-structured Systems by Means of Electrostatic Force Microscopy

Gustavo Ariel Schwartz , Richard Arinero , Clément Riedel , Philippe Tordjeman , Angel Alegría , et al.
The 12th International Scanning Probe Microscopy (ISPM) Conference, May 2010, Sapporo, Japan
Communication dans un congrès hal-01813969v1
Image document

Imaging the mechanical properties of wood cell layers by atomic force modulation microscopy

Bruno Clair , Richard Arinero , Gérard Lévèque , Michel Ramonda , Bernard Thibaut
IAWA Journal, 2003, 24, pp.223-230. ⟨10.1163/22941932-90001591⟩
Article dans une revue hal-00004541v2

PbTiO3 thin films grown by mixed reactive thermal co-evaporation

B. Sorli , J. Podlecki , P. Combette , R. Arinero , F. Pascal-Delannoy , et al.
Journal of Crystal Growth, 2007, 304 (2), pp.383-387. ⟨10.1016/j.jcrysgro.2007.03.017⟩
Article dans une revue istex hal-00327663v1

Impact of Single Event Gate Rupture and Latent Defects on Power MOSFETs Switching Operation

A. Privat , Antoine Touboul , Mickael Petit , J.-J. Huselstein , Frédéric Wrobel , et al.
IEEE Transactions on Nuclear Science, 2014, 61 (4), pp.1856 - 1864. ⟨10.1109/TNS.2014.2333542⟩
Article dans une revue hal-01635047v1

Toward a better understanding of the nanoscale degradation mechanisms of ultra-thin Si0 2 /Si films: Investigation of the best experimental conditions with a conductive-atomic force microscope

R. Arinero , W. Hourani , Antoine Touboul , B. Gautier , M. Ramonda , et al.
Journal of Applied Physics, 2011, 110 (1), ⟨10.1063/1.3603037⟩
Article dans une revue hal-01632428v1

Measurement of radiations of high influence by a capacitive element of MOS type

Richard Arinero , Julien Mekki , Antoine Touboul , Frédéric Saigné , J.-R. Vaillé
United States, Patent n° : US Patent 8,981,308. 2015
Brevet hal-01791141v1

Mechanical characterization of wood viscoelasticity at the submicrometre scale

Karl Bytebier , Olivier Arnould , Richard Arinero
COST FP0802 Workshop on "Experimental and computational methods in wood micromechanics", 2009, Vienne, Austria. pp.93-94
Communication dans un congrès hal-00538975v1

New chemical methods to form metallic nanoparticles on semiconductor surface

Berkovits V , Ulin V , Iluridze G , Minashvili T , Davitadze K , et al.
Nano 2016 - 4th International Conference “Nanotechnologies”, Oct 2016, Tbilisi, Georgia
Communication dans un congrès hal-01827080v1
Image document

Caractérisation nano-mécanique de la paroi cellulaire du bois par Microscopie à Force Atomique

Olivier Arnould , Karl Bytebier , Richard Arinero
DEPOS 23, Sep 2010, Guidel, France
Communication dans un congrès hal-00689756v1

Mechanical characterization of wood viscoelasticity at the submicrometre scale

Karl Bytebier , Olivier Arnould , Richard Arinero
NanoSouth-West European Conference, Nov 2008, Bordeaux, France
Communication dans un congrès hal-01814012v1

Nanodielectric spectroscopy and nanoscale space charge detection in nanostructured dielectric films by means of Electrostatic force microscopy (Invited)

Richard Arinero , Jérôme Castellon
2015 IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP), Workshop on nanodielectrics, Oct 2015, Ann Arbor, United States
Communication dans un congrès hal-01814129v1

Resonant-Contact Atomic Force Microscopy

Richard Arinero
COST, Action FP0802, Experimental and Computational Micro-Characterization Techniques in Wood Mechanics Training School, “Acoustic, ultrasonic and AFM characterization of wood mechanical properties”, May 2012, Montpellier, France
Communication dans un congrès hal-01814140v1

AFM en mode contact vibrant

Richard Arinero , Bruno Clair , Gérard Leveque
13ème journée Nanotechnologie, Jan 2003, Paris, France
Communication dans un congrès hal-01827097v1

Half-disk laser: insight into the internal mode structure of laser resonators

Prokhor Alekseev , Mikhail Dunaevskiy , Andrey Monakhov , Vladislav Dudelev , Grigorii Sokolovskii , et al.
Optics Express, 2018, 26 (11), ⟨10.1364/OE.26.014433⟩
Article dans une revue hal-01814218v1