Rodrigo Possamai Bastos
Présentation
Publications
Publications
|
|
On-Chip Current Sensors for Reliable, Secure, and Low-Power Integrated Circuitsspringer, pp.1-162, 2020, ⟨10.1007/978-3-030-29353-6⟩ |
|
|
Exploiting Body Terminals of Transistors for Performing Post-Fabrication Tests, Run-Time Tests, and Self-Adaptive Bias in Integrated CircuitsMicro and nanotechnologies/Microelectronics. Univ. Grenoble Alpes, January 30, 2018 |
|
|
Transient-Fault Robust Systems Exploiting Quasi-Delay Insensitive Asynchronous CircuitsMicro and nanotechnologies/Microelectronics. Institut National Polytechnique de Grenoble, July 9, 2010. English. ⟨NNT : 2010INPG0070⟩ |
Designing Low-Power Embedded Software for Mass-Produced Microprocessor by Using a Loop Table in On-Chip Memory(eds) Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation. PATMOS 2005. Lecture Notes in Computer Science, vol 3728. Springer, Berlin, Heidelberg, pp.59-68, 2005, ⟨10.1007/11556930_7⟩ |
Spectral vs. Spatial Pruning: Fault Resilience Analysis for Extremely Sparse DNNsLATS 2026 - 27th IEEE Latin American Test Symposium, Mar 2026, Florianopolis, Brazil. In press |
|
Case Study: RISC-V Cores for Resource-Constrained Computing Systems Facing NeutronsIEEE Latin-American Test Symposium (LATS 2026), Mar 2026, Florianapolis, Brazil |
|
Deploying Compact and Reliable Deep Neural Networks in Safety-critical ApplicationsTTTC McCluskey Doctoral Thesis Contest, IEEE Latin-American Test Symposium (LATS 2026), Mar 2026, Florianopolis, Brazil |
|
Impact of Register Reservation on the Reliability of Arm Cortex-M Processors under Neutrons2025 38th SBC/SBMicro/IEEE Symposium on Integrated Circuits and Systems Design (SBCCI), Aug 2025, Manaus, Brazil. pp.1-5, ⟨10.1109/SBCCI66862.2025.11218669⟩ |
|
Reliability of Computing Systems and Components Facing Cosmic Ray Radiation EffectsInvited talk presented as a course within the ”Formation continue : ingénierie système appliquée au spatial : instrumentation spatiale et données” organized by the CSUG (Centre spatial universitaire de Grenoble) of the UGA. Grenoble, November 20, 2025, CSUG, Nov 2025, Grenoble, France |
|
Near-sensor testing method for observing radiation-induced soft errors in modern sensorsConference on Design of Circuits and Integrated Systems (DCIS 2025), Nov 2025, Santander, Spain |
|
Accelerated Radiation Testing Method for Processor-based Computing Systems2025 32nd IEEE International Conference on Electronics, Circuits and Systems (ICECS), IEEE, Nov 2025, Marrakech, Morocco. pp.1-4, ⟨10.1109/ICECS66544.2025.11270682⟩ |
|
Assessment of RISC-V architectures for resource-constrained edge computing systems facing neutron radiationInvited talk presented in Journée thématique SAFRAN sur la fiabilité des composants, Groupement de Recherche System On Chip, Systèmes embarqués et Objets Connectés (GDR-SOC2 SAFRAN 2025), Oct 2025, Paris, France |
|
|
|
Analyzing Cache Utilization for Improved System ReliabilityESREF 2025 : 36th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2025, Université de Bordeaux, ADERA, Oct 2025, Bordeaux, France |
Uncovering Fault Behavior in Arm Cortex-M Microprocessors with cFS Under Neutron RadiationConference on Radiation Effects on Components and Systems (RADECS 2025), Sep 2025, Antwerp, Belgium |
|
Analyzing Embedded AI Vulnerabilities in Google’s LiteRT Through Fault InjectionColloque national du groupement de recherche System On Chip, Systèmes embarqués et Objets Connectés (GDR-SOC2 2025), CNRS, Jun 2025, Lorient, France |
|
Neutron radiation tests and preliminary assessment of COTS edge computing systemsInvited talk presented in Journée thématique SAFRAN sur la fiabilité des composants, Groupement de Recherche System On Chip, Systèmes embarqués et Objets Connectés (GDR-SOC2 SAFRAN 2025), Oct 2025, Paris, France |
|
Rust vs. C: Evaluating Soft Error SensitivityConference on Radiation Effects on Components and Systems (RADECS 2025), Sep 2025, Antwerp, Belgium |
|
Open Source Port of NASA Core Flight System to FreeRTOS in Arm Cortex-M-based MicroprocessorIEEE CASS Latin American Symposium on Circuits and Systems, LASCAS, Feb 2025, Bento Gonçalves, Brazil |
|
MicroFI: Tensorflow Lite based Fault Injection Framework for MicrocontrollersIEEE VLSI Test Symposium (VTS, 2025), Apr 2025, Tempe, United States |
|
Impacto de la Mejora en el Aprovechamiento de la Memoria Caché sobre la Fiabilidad de un SistemaJornadas SARTECO 2025 (Sociedad de Arquitectura y Tecnología de Computadores), Jun 2025, Sevilla, España |
|
Radiation-induced Soft Error Assessment of a Multithreaded MobileNet CNN Model Running in a Multicore Edge ProcessorConference on Radiation Effects on Components and Systems (RADECS 2024), Sep 2024, Maspalomas, Canary Islands, Spain |
|
Early Neutron Reliability Assessment of an Arm Cortex-M4 through Emulated Fault InjectionSymposium on Integrated Circuits and Systems Design (SBCCI 2024), Sep 2024, Joao Pessaoa, Brazil |
|
Deploying Compact and Dependable DNNs in Safety-critical ApplicationsEuropean Test Symposium (ETS 2024) - PhD Forum, May 2024, The Hague, Netherlands |
|
Impact of Using Off-Chip Memories on Reliability of Edge Computing Systems to Single-Event UpsetsConference on Radiation Effects on Components and Systems (RADECS 2024), Sep 2024, Maspalomas, Canary Islands, Spain |
|
Robustness of Redundancy-Hardened Convolutional Neural Networks Against Adversarial AttacksIEEE Pacific Rim International Symposium on Dependable Computing (PRDC 2024), Nov 2024, Osaka, Japan |
|
The Impact of Allocating Weights and Biases in SRAM Parity Checking Areas on the Soft Error Reliability of CNN Inference ModelsConference on Radiation Effects on Components and Systems (RADECS 2024), Sep 2024, Maspalomas, Canary Islands, Spain |
|
Deploying Compact and Dependable DNNs in Safety-critical ApplicationsColloque national du groupement de recherche System On Chip, Systèmes embarqués et Objets Connectés (GDR-SOC2 2024), Jun 2024, Toulouse, France |
|
Impact of scaling up the sensor sampling frequency on the reliability of edge processing systems in tolerating soft errors caused by neutronsIEEE Sensors Conference 2024, Oct 2024, Kobe, Japan |
|
Neutron radiation tests and assessment of edge computing systemsInvited talk presented in VII Workshop sobre os Efeitos das Radiações Ionizantes em Componentes e Circuitos Eletrônicos de Uso Aeroespacial (WERICE AEROESPACIAL 2024), Nov 2024, São José dos Campos, Brazil |
|
On Rust and C Variability of Fault Sensitivity across Different Runtimes and Cache-Aware Source CodesConference on Radiation Effects on Components and Systems (RADECS 2024), Sep 2024, Maspalomas, Canary Islands, Spain |
|
|
|
Soft Error Assessment of Attitude Estimation Algorithms Running in a Resource-constrained Device under Neutron RadiationRADECS 2023 - International Conference on Radiation and its Effects on Components and Systems, Sep 2023, Toulouse, France. pp.1-4 |
|
|
SMART: Selective MAC zero-optimization for neural network reliability under radiationESREF 2023 - 34th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Oct 2023, Toulouse, France. pp.1-4 |
Investigation of Edge Computing Hardware Architectures Processing Tiny Machine Learning under Neutron-induced Radiation EffectsEuropean Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2023), Oct 2023, Toulouse, France |
|
Impact of Radiation-Induced Soft Error on Object Detection Algorithm of Unmanned Surface VehiclesConference on Radiation Effects on Components and Systems (RADECS 2023), Sep 2023, Toulouse, France |
|
Assessing the Arm Cortex-M under Radiation with and without a Real-time Operating SystemConference on Radiation Effects on Components and Systems (RADECS 2023), Sep 2023, Toulouse, France |
|
Assessment of Radiation-Induced Soft Error on Lightweight Cryptography AlgorithmsConference on Radiation Effects on Components and Systems (RADECS 2022), Oct 2022, Venice, Italy |
|
Redundancia multihilo para la mitigación de Sotf errors en Sistemas on Chip multinúcleoJornadas SARTECO 2022 (Sociedad de Arquitectura y Tecnología de Computadores), Sep 2022, Alicante, España |
|
MEO Spaceflight Results of Radiation Effects in COTS FPGA-implemented Triple Modular SystemConference on Radiation Effects on Components and Systems (RADECS 2022), Oct 2022, Venice, Italy |
|
Investigating the Reliability Impacts of Neutron-induced Soft Errors in Aerial Image Classification CNNs Implemented in a Softcore SRAM-based FPGA GPUEuropean Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2022), Sep 2022, Berlin, Germany |
|
Effectiveness of Attitude Estimation Processing Approaches in Tolerating Radiation Soft ErrorsRADECS 2022 - Conference on Radiation Effects on Components and Systems, Oct 2022, Venise, Italy |
|
Redundant Portable Multi-Threading for Soft Error Mitigation on Multicore Systems on ChipConference on Radiation Effects on Components and Systems (RADECS 2022), Oct 2022, Venice, Italy |
|
A Lightweight Mitigation Technique for Resource-constrained Devices under Neutron RadiationConference on Radiation Effects on Components and Systems (RADECS 2022), Oct 2022, Venice, Italy |
|
Impact of radiation-induced soft error on embedded cryptography algorithmsEuropean Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2021), Oct 2021, Bordeaux, France |
|
Evaluation of Attitude Estimation Algorithm under Soft Error EffectsLATS 2021 - IEEE Latin-American Test Symposium, Oct 2021, Punta del Este (Virtual event), Uruguay. ⟨10.1109/LATS53581.2021.9651794⟩ |
|
Assessment of Machine Learning Models in Computing System under Neutron RadiationRADECS 2021 - Conference on Radiation Effects on Components and Systems, Sep 2021, Vienna, Austria |
|
Radiation effects in tiny machine learning systems and attitude estimation processing modules for autonomous thingsInvited talk presented in 17th International School on the Effects of Radiation on Embedded Systems for Space Applications (SERESSA 2021), Nov 2021, Virtual event, Brazil |
|
Nanosatellite On-Board Computer including a Many-Core ProcessorIEEE Latin-American Test Symposium (LATS 2021), Oct 2021, Virtual event, Uruguay |
|
Assessment of Attitude Estimation Processing System under Neutron Radiation EffectsRADECS 2021 - Conference on Radiation Effects on Components and Systems, Sep 2021, Vienna, Austria |
|
Assessment of Machine Learning Algorithms for Near-Sensor Computing Under Radiation Soft ErrorsIEEE International conference on electronics, circuits & systems (ICECS 2020), Nov 2020, Glasgow, SCOTLAND, United Kingdom |
|
Body-Bias Micro-Generators for Activity-Driven Power ManagementFDSOI workshop at DATE Conference 2020, Mar 2020, Grenoble, France |
|
|
|
Assessment of Machine Learning Algorithms for Near-Sensor Computing Under Radiation Soft Errors16th International School on the Effects of Radiation on Embedded Systems for Space Applications (SERESSA 2020), Dec 2020, Porto Alegre (Virtual edition), Brazil |
Exploring a Non-conventional Testing Technique for Asynchronous Circuits21èmes Journées Nationales du Réseau Doctoral en Microélectronique (JNRDM 2019), Jun 2019, Montpellier, France |
|
On the reliability of Support Vector Machines21èmes Journées Nationales du Réseau Doctoral en Microélectronique (JNRDM 2019), Jun 2019, Montpellier, France |
|
Learning-Based Reliability Assessment Method for Detection of Permanent Faults in Clockless Circuits30th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2019), Aug 2019, Toulouse, France |
|
A Distributed Body-Biasing Strategy for Asynchronous Circuits27th IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC 2019), Oct 2019, Cuzco, Peru |
|
Assessment of Current Sensor on Chip for Detecting Neutron-Induced Transients via Body TerminalsConference on Radiation Effects on Components and Systems (RADECS 2019), Sep 2019, Montpellier, France |
|
Level Shifter Architecture for Dynamically Biasing Ultra-Low Voltage Subcircuits of Integrated SystemsIEEE International Symposium on Circuits & Systems (ISCAS 2018), May 2018, Florence, Italy |
|
A Non-Intrusive Testing Technique for Detection of Trojans in Asynchronous CircuitsDesign, Automation and Test in Europe (DATE 2018), Mar 2018, Dresden, Germany. pp.1516-1519 |
|
Assessment of Hardware-Implemented Support Vector Machine under Radiation EffectsConference on Radiation Effects on Components and Systems (RADECS'2018), Sep 2018, Gothenburg, Sweden |
|
A body built-in cell for detecting transient faults and dynamically biasing subcircuits of integrated systemsEuropean Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF'2018), Oct 2018, Aalborg, Denmark |
|
|
|
Standard CAD Tool-Based Method for Simulation of Laser-Induced Faults in Large-Scale CircuitsISPD 2018 - International Symposium on Physical Design, Mar 2018, Monterey, CA, United States. pp.160-167, ⟨10.1145/3177540.3178243⟩ |
Assessing Body Built-In Current Sensors for Detection of Multiple Transient FaultsESREF 2018 - European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Oct 2018, Aalborg, Denmark |
|
Fine Grain Body-Biasing: A strategy for asynchronous circuitsEuropean Nanoelectronics Applications, Design and Technology Conference (ADTC), Jun 2018, Grenoble, France |
|
Body Bias Control Cells based on Negative- and Positive-Level Shifter Architectures in Technology FD-SOI 28 nmJournées Nationales du Réseau Doctoral en Micro-nanoélectronique (JNRDM 2017), Nov 2017, Strasbourg, France |
|
Detection of Layout-Level Trojans by Injecting Current Into Substrate and Digitally Monitoring Built-In SensorsDesign Automation Conference, Jun 2017, Austin, TX, United States |
|
Method for evaluation of transient-fault detection techniquesESREF: European Symposium on Reliability of Electron devices, Failure physics and analysis, Sep 2017, Bordeaux, France |
|
Detection of Layout-Level Trojans by Monitoring Substrate with Preexisting Built-in SensorsIEEE Computer Society Annual Symposium on VLSI (ISVLSI 2017), Jul 2017, Bochum, Germany. pp.290-295, ⟨10.1109/ISVLSI.2017.58⟩ |
|
|
|
Importance of IR Drops on the Modeling of Laser-Induced Transient FaultsSMACD 2017 - 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, Jun 2017, Giardini Naxos, Italy. ⟨10.1109/SMACD.2017.7981593⟩ |
A practical framework for specification, verification and design of self-timed pipelines23rd IEEE International Symposium on Asynchronous Circuits and Systems (Async 2017), May 2017, San Diego, CA, United States. pp.65-72, ⟨10.1109/ASYNC.2017.16⟩ |
|
Fine Body Biasing Island Strategy in FD-SOI20th IP-SoC Conference (IP-SOC), Dec 2017, Grenoble, France |
|
|
|
Role of Laser-Induced IR Drops in the Occurrence of Faults: Assessment and SimulationDSD 2017 - Euromicro Symposium on Digital System Design, Aug 2017, Vienna, Austria. pp.252-259, ⟨10.1109/DSD.2017.43⟩ |
QDI asynchronous circuits for low power applications: a comparative study in technology FD-SOI 28 nmJournées Nationales du Réseau Doctoral en Micro-Nanoélectronique (JNRDM'16), May 2016, Toulouse, France |
|
Simple Tri-State Logic Trojans Able to Upset Properties of Ring Oscillators11th International Conference on Design &Technology of Integrated Systems in Nanoscale Era (DTIS'16), Apr 2016, Istanbul, Turkey. pp.1-6, ⟨10.1109/DTIS.2016.7483811⟩ |
|
AHLS_DESYNC: A Desynchronization Tool For High-Level Synthesis of Asynchronous CircuitsDesign, Automation and Test in Europe (DATE 2016), Mar 2016, Dresden, Germany |
|
High-level synthesis for event-based systemsSecond International Conference on Event-Based Control, Communications, and Signal Processing (EBCCSP 2016), Jun 2016, Krakow, Poland. pp.1-7, ⟨10.1109/EBCCSP.2016.7605252⟩ |
|
New asynchronous protocols for enhancing area and throughput in bundle-data pipelines29th Symposium on Integrated Circuits and Systems Design (SBCCI 2016), Aug 2016, Belo Horizonte, Brazil. pp.1-6, ⟨10.1109/SBCCI.2016.7724066⟩ |
|
Analysis of granularity for automatic biasing control in FDSOI technology with low-voltage supplyJournées Nationales du Réseau Doctoral en Micro-Nanoélectronique (JNRDM'16), May 2016, Toulouse, France |
|
Comparison of Low-Voltage Scaling in Synchronous and Asynchronous FD-SOI Circuits26th International Workshop on Power and Timing Modeling, Optimization and Simulation (PATMOS'16), Sep 2016, Bremen, Germany |
|
Flot de conception pour l'ultra-faible consommation : échantillonage non-uniforme et électronique asynchroneJournées Nationales du Réseau Doctoral en Micro-nanoélectronique (JNRDM'15), May 2015, Bordeaux, France |
|
Exploiting reliable features of asynchronous circuits for designing low-voltage components in FD-SOI technology26th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF'15), Oct 2015, Toulouse, France |
|
A New Proposition on Hardware Trojan ActivationJournées Nationales du Réseau Doctoral en Micro-nanoélectronique (JNRDM'15), May 2015, Bordeaux, France |
|
Exploration of Noise Robustness and Sensitivity of Bulk Current Sensors for Soft Error DetectionInternational Workshop on CMOS Variability (VARI'15), Sep 2015, Salvador Bahia, Brazil. pp.13-18 |
|
Validation Of Single BBICS Architecture In Detecting Multiple FaultsATS: Asian Test Symposium, Nov 2015, Mumbai, India |
|
|
|
Design of Bulk Built-In Current Sensors to Detect Single Event Effects and Laser-Induced Fault Injection AttemptsJoint MEDIAN–TRUDEVICE Open Forum, Sep 2014, Amsterdam, Netherlands |
Improving the ability of Bulk Built-In Current Sensors to detect Single Event Effects by using triple-well CMOS25th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2014), Sep 2014, Berlin, Germany |
|
Comparison of bulk built-in current sensors in terms of transient-fault detection sensitivityCMOS variability (VARI), Sep 2014, Palma de Mallorca, Spain. ⟨10.1109/VARI.2014.6957089⟩ |
|
|
|
A Bulk Built-in Sensor for Detection of Fault AttacksHOST: Hardware-Oriented Security and Trust, Jun 2013, Austin, TX, United States. pp.51-54, ⟨10.1109/HST.2013.6581565⟩ |
Sensitivity tuning of a bulk built-in current sensor for optimal transient-fault detectionESREF: European Symposium on Reliability of Electron devices, Failure physics and analysis, Sep 2013, Arcachon, France. pp.B3c-2 #68 |
|
|
|
A single built-in sensor to check pull-up and pull-down CMOS networks against transient faultsPATMOS: Power and Timing Modeling, Optimization and Simulation, Sep 2013, Karlsruhe, Germany. pp.157-163, ⟨10.1109/PATMOS.2013.6662169⟩ |
|
|
Robust Modular Bulk Built-In Current Sensors for Detection of Transient FaultsSBCCI'2012: 25th Symposium onIntegrated Circuits and Systems Design, Aug 2012, Brasilia, Brazil. pp.1-6, ⟨10.1109/SBCCI.2012.6344422⟩ |
|
|
How to Sample Results of Concurrent Error Detection Schemes in Transient Fault Scenarios?RADECS: Radiation and Its Effects on Components and Systems, Sep 2011, Sevilla, Spain. pp.635-642, ⟨10.1109/RADECS.2011.6131361⟩ |
Novel transient-fault detection circuit featuring enhanced bulk built-in current sensor with low-power sleep-modeESREF: European Symposium on Reliability of Electron devices, Failure physics and analysis, Oct 2012, Cagliari, Italy |
|
|
|
Calibrating Bulk Built-in Current Sensors for Detecting Transient FaultsColloque GDR SoC-SiP, 2012, Lyon, France |
|
|
Timing Issues for an Efficient Use of Concurrent Error Detection CodesLATW: Latin American Test Workshop, Mar 2011, Porto de Galinhas, Brazil. pp.1-6, ⟨10.1109/LATW.2011.5985933⟩ |
|
|
Timing Issues of Transient Faults in Concurrent Error Detection SchemesGdR SoC-SiP'2011: Colloque national du Groupement de Recherche System-On-Chip et System-In-Package, Jun 2011, Lyon, France. http://www2.lirmm.fr/~w3mic/SOCSIP/ |
|
|
A New Bulk Built-in Current Sensor-Based Strategy for Dealing with Long-Duration Transient Faults in Deep-Submicron TechnologiesDFT'2011: International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2011, Vancouver, Canada. pp.302-308, ⟨10.1109/DFT.2011.15⟩ |
Evaluating transient-fault effects on traditional C-element's implementations16th IEEE International On-Line Testing Symposium (IOLTS'10), Jul 2010, Corfu island, Greece. pp.35 - 40, ⟨10.1109/IOLTS.2010.5560237⟩ |
|
Asynchronous circuits as alternative for mitigation of long-duration transient faults in deep-submicron technologies21st European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Oct 2010, Monte Cassino Abbey and Gaeta, Italy. A.p.4 |
|
Asynchronous circuits as alternative for mitigation of long-duration transient faults in deep-submicron technologiesDigest of Papers, 15th IEEE European Test Symposium (ETS'10), May 2010, Prague, Czech Republic |
|
A Methodology to Evaluate Transient-Fault Effects on Asynchronous and Synchronous CircuitsDigest of Papers, 14th IEEE European Test Symposium (ETS'09), May 2009, Sevilla, Spain |
|
Comparing Transient-Fault Effects on Synchronous and on Asynchronous Circuits15th IEEE International On-Line Testing Symposium (IOLTS'09), Jun 2009, Sesimbra-Lisbon, Portugal. pp.29-34, ⟨10.1109/IOLTS.2009.5195979⟩ |
|
Design of a Robust 8-Bit Microprocessor to Soft Single Event EffectsDigest of Papers, IEEE Latin American Test Workshop, LATW, Mar 2006, Buenos Aires, Argentina |
|
Design of a Robust 8-Bit Microprocessor to Soft Single Event EffectsSOUTH SYMPOSIUM ON MICROELECTRONICS, SIM, 21., May 2006, Porto Alegre, Brazil |
|
Design at high level of a robust 8-bit microprocessor to soft errors by using only standard gatesACM Symposium on Integrated Circuits and Systems Design (SBCCI'06), Aug 2006, Ouro Preto, France. pp.196-201, ⟨10.1145/1150343.1150394⟩ |
|
Design of a Robust 8-Bit Microprocessor to Soft Errors12th IEEE International On-Line Testing Symposium (IOLTS'06), Jul 2006, Como, Italy. pp.195-196, ⟨10.1109/IOLTS.2006.21⟩ |
|
Designing Low-Power Embedded Software for Mass-Produced Microprocessor by Using a Loop Table in On-Chip MemoryInternational Workshop on Power and Timing Modeling, Optimization and Simulation (PATMOS'05), Sep 2005, Leuven, Belgium |
|
Designing Low Power Embedded Software for Mass-Produced Microprocessor by Using a Loop Table in On-Chip MemorySOUTH SYMPOSIUM ON MICROELECTRONICS, SIM, 20., May 2005, Santa Cruz do Sul, Brazil |
Reliability of Computing Systems and Components Facing Cosmic Ray Radiation EffectsInvited talk presented as a course within the IRT-Nanoelec training ”Synchrotron X-ray and neutron applied to nano-electronics” for PhD students of the doctoral school EEATS of the UGA. Training organized by the radiation facilities ILL (Institut Laue Langevin) and ESRF (European Synchrotron Radiation Facility). Grenoble, France, March 25, 2025 |
|
Reliability of Computing Systems and Components Facing Cosmic Ray Radiation EffectsInvited talk presented as a course within the ”Formation continue : ingénierie système appliquée au spatial : instrumentation spatiale et données” organized by the CSUG (Centre spatial universitaire de Grenoble) of the UGA. Grenoble, November 28, 2024 |
|
MultiRad Platform for Testing Case-Study Algorithm Applications in Computing Systems under Neutron RadiationInvited talk presented at the Universidade Federal do Rio Grande do Sul (UFRGS), Porto Alegre, Brazil, April 27, 2023 |
|
Reliability of Computing Systems and Components Facing Cosmic Ray Radiation EffectsInvited talk presented as a course within the ”Formation continue : ingénierie système appliquée au spatial : instrumentation spatiale et données” organized by the CSUG (Centre spatial universitaire de Grenoble) of the UGA. Grenoble, October 26, 2023 |
|
Reliability of Computing Systems and Components Facing Cosmic Ray Radiation EffectsInvited talk presented in the work group FIMA (Modèles Aléatoires pour la Fiabilité et la Maintenance des Systèmes) of the IMdR (Institut pour la Maîtrise des Risques), Grenoble, France, March 2, 2023 |
|
Reliability of Computing Systems and Components Facing Cosmic Ray Radiation EffectsInvited talk presented as a course and practical activities with thermal neutron source at the ILL (Institut Laue Langevin) within the IRT-Nanoelec training ”Synchrotron X-ray and neutron applied to nano-electronics” for PhD students of the doctoral school EEATS of the UGA. Training organized by the radiation facilities ILL and ESRF (European Synchrotron Radiation Facility). Grenoble, March 30 and 31, 2023 |
|
Reliability of Computing Systems and Components Facing Cosmic Ray Radiation EffectsInvited talk presented as a course within the IRT-Nanoelec training ”Synchrotron X-ray and neutron applied to nano-electronics” for PhD students of the doctoral school EEATS of the UGA. Training organized by the radiation facilities ILL (Institut Laue Langevin) and ESRF (European Synchrotron Radiation Facility). Grenoble, France, May 19, 2022 |
|
Reliability of Computing Systems and Components Facing Cosmic Ray Radiation EffectsInvited talk presented as a course within the ”Formation continue : ingénierie système appliquée au spatial : instrumentation spatiale et données” organized by the CSUG (Centre spatial universitaire de Grenoble) of the UGA. Grenoble, March 24, 2022 |
|
Medium-Earth Orbit Spaceflight Radiation Effects in Digital System on Programmable DeviceInvited talk presented at the Universidade Federal de Santa Maria (UFSM), Santa Maria, Brazil, December 21, 2021 |
|
Reliability of Computing Systems and Components Facing Cosmic Ray Radiation EffectsInvited talk presented as a course within the IRT-Nanoelec training ”Synchrotron X-ray and neutron applied to nano-electronics” for PhD students of the doctoral school EEATS of the UGA. Training organized by the radiation facilities ILL (Institut Laue Langevin) and ESRF (European Synchrotron Radiation Facility). Grenoble, France, January 14, 2021 |
|
Integrated Bulk Sensors Enabling Online Test for Radiation Induced Soft-Errors and Noise SensingTutorial accepted to be presented in Test Technology Educational Program (TTEP), IEEE International Test Conference (ITC), Phoenix, USA, October 28, 2018 |
|
Dynamisant les Cours en Amphi avec les Smartphones des Étudiants et les Boîtiers de Vote de l’Université : Activités en Groupe et Classement par ÉtudiantInvited talk presented in ”Rencontre Boitiers de Vote à l’Université Grenoble Alpes (UGA)” and organized by the ”Service d’Accompagnement des Pédagogies, des Initiatives Enseignantes et du Numérique dans le Supérieur (SAPIENS) de l’UGA”, Grenoble, France, June 17, 2016 |
|
The World of the Hardware TrojansInvited talk presented at the Universidade Federal do Rio Grande do Sul (UFRGS), Porto Alegre, Brazil, April 26, 2013 |
|
Systèmes Intégrés Tolérants aux Fautes, Fiables et SécurisésInvited talk presented at TIMA Laboratory, Grenoble, France, April 17, 2012 |
|
Asynchronous Circuits as an Alternative for Mitigation of Long-Duration Transient Faults in Deep-Submicron TechnologiesInvited talk presented at the Universidade Federal do Rio Grande do Sul (UFRGS), Porto Alegre, Brazil, April 1, 2011 |
|
Circuitos Assíncronos QDI: Uma Alternativa Naturalmente Robusta a Desafios das Tecnologias SubmicrônicasPhD thesis initial proposal presented and defended, 98 pages, Universidade Federal do Rio Grande do Sul (UFRGS), Porto Alegre, Brazil, November 18, 2009 |
|
Simulação de circuitos assíncronos QDI no nível de transistores sob o efeito de injeção de falhasPresentation in regional workshop: Abstract 116, page 47, Salão de Iniciação Científica of the Universidade Federal do Rio Grande do Sul (UFRGS), Porto Alegre, Brazil, October 21-26, 2007 |
|
Simulação de circuitos robustos através de injeção de falhas no nível de portas lógicasPresentation in regional workshop: Abstract 048, page 26, Salão de Iniciação Científica of the Universidade Federal do Rio Grande do Sul (UFRGS), Porto Alegre, Brazil, October 15-20, 2006 |
|
Design of a Soft-Error Robust MicroprocessorMaster thesis presented and defended, 120 pages, Universidade Federal do Rio Grande do Sul (UFRGS), Instituto de Informática, PPGC, Ouro Preto, Brazil, August 29, 2006 |
|
Sistemas Embarcados de Equipamentos de TelecomunicaçãoFinal report for Electrical Engineer's degree, 40 pages, internship in DataCom Telemática, Universidade Federal do Rio Grande do Sul (UFRGS), Departamento de Engenharia Elétrica, Porto Alegre, Brazil, September, 2002 |
|
Sistema microprocessado de medição de vibração para aquisição em tempo realPresentation in regional workshop: Abstract 191, page 223, Salão de Iniciação Científica of the Universidade Federal do Rio Grande do Sul (UFRGS), Porto Alegre, Brazil, October 22-26, 2001 |
|
Acionamento microcontrolado de motor de passo através de sinais infravermelho padrão RC5Presentation in regional workshop: Abstract 002, page 649, Salão de Iniciação Científica of the Universidade Federal do Rio Grande do Sul (UFRGS), Porto Alegre, Brazil, October 22-26, 2001 |
|
Sistema de medição de vibração com acelerômetro de estado sólidoPresentation in regional workshop: Abstract 011, page 539, Salão de Iniciação Científica of the Universidade Federal do Rio Grande do Sul (UFRGS), Porto Alegre, Brazil, September 11-15, 2000 |