Rodrigo Possamai Bastos

Présentation

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Publications

Ouvrages (1)

On-Chip Current Sensors for Reliable, Secure, and Low-Power Integrated Circuits Rodrigo Possamai Bastos,Frank Sill Torres springer, pp.1-162, 2020, ⟨10.1007/978-3-030-29353-6⟩ Ouvrages hal-02307356v1

HDR (1)

Exploiting Body Terminals of Transistors for Performing Post-Fabrication Tests, Run-Time Tests, and Self-Adaptive Bias in Integrated Circuits Rodrigo Possamai Bastos Micro and nanotechnologies/Microelectronics. Univ. Grenoble Alpes, January 30, 2018 HDR tel-02989324v1

Thèse (1)

Transient-Fault Robust Systems Exploiting Quasi-Delay Insensitive Asynchronous Circuits Rodrigo Possamai Bastos Micro and nanotechnologies/Microelectronics. Institut National Polytechnique de Grenoble, July 9, 2010. English. ⟨NNT : 2010INPG0070⟩ Thèse tel-00541344v1

Article dans une revue (40)

Uncovering Fault Behavior in Arm Cortex-M Microprocessors with Core Flight System under Neutron Radiation Leonardo Gobatto,Fabio Benevenuti,Luiz Henrique Laurini,Benjamin Cheymol,Rodrigo Possamai Bastoset al. IEEE Transactions on Nuclear Science, 2026, ⟨10.1109/TNS.2026.3663046⟩ Article dans une revue hal-05494719v1
Radiation-Induced Soft Error Assessment of a Multithreaded MobileNet CNN Model Running in a Multicore Edge Processor Jonas Gava,Areeb Sherjil,Luiz Henrique Laurini,Emmanuel Atukpor,Rodrigo Possamai Bastoset al. IEEE Transactions on Nuclear Science, 2025, 72 (8), pp.2821-2829. ⟨10.1109/TNS.2025.3585859⟩ Article dans une revue hal-05494674v1
Assessing the Impacts of Radiation-induced Soft Errors on Arm Cortex-M Microprocessors Fabio Benevenuti,Leonardo Gobatto,Rodrigo Possamai Bastos,José Rodrigo Azambuja,Fernanda Lima Kastensmidt IEEE Transactions on Nuclear Science, 2024, pp.1-1. ⟨10.1109/TNS.2024.3400921⟩ Article dans une revue hal-04575529v1
Assessment of Radiation-Induced Soft Error on Unmanned Surface Vehicles Marcos Antônio Junior Fleck,Elisa Pereira,Jonas Gava,Fernando Gehm Moraes,Ney Calazanset al. IEEE Transactions on Nuclear Science, 2024, ⟨10.1109/TNS.2024.3378807⟩ Article dans une revue hal-04501997v1
Soft Error Assessment of Attitude Estimation Algorithms Running on Resource-constrained Devices under Neutron Radiation Jonas Gava,Tarso Kraemer Sarzi Sartori,Alex Hanneman,Rafael Garibotti,Fernando Gehm Moraeset al. IEEE Transactions on Nuclear Science, 2024, 71 (8), pp.1511-1519. ⟨10.1109/TNS.2024.3378689⟩ Article dans une revue hal-04501984v1
Impact of Scaling Up the Sensor Sampling Frequency on the Reliability of Edge Processing Systems in Tolerating Soft Errors Caused by Neutrons Matheus Minelli de Carvalho,Luiz Henrique Laurini,Emmanuel Atukpor,Lirida Naviner,Rodrigo Possamai Bastos IEEE Sensors Letters, 2024, 8 (9), pp.Article Sequence Number: 7004304. ⟨10.1109/LSENS.2024.3435677⟩ Article dans une revue hal-04681009v1
Early Radiation-Induced Soft-Error Assessment of Arm Cortex-M SoCs Through Fault Injection Leonardo Gobatto,Fabio Benevenuti,Rodrigo Possamai Bastos,Nemitala Added,Saulo Albertonet al. IEEE Transactions on Device and Materials Reliability, 2024, pp.1-1. ⟨10.1109/TDMR.2024.3501193⟩ Article dans une revue hal-04793658v1
Medium-Earth Orbit Spaceflight Radiation Effects in Triple Modular System on Programmable Device Rodrigo Possamai Bastos,Marti Gorchs Picas,Raoul Velazco IEEE Transactions on Nuclear Science, 2023, pp.1. ⟨10.1109/TNS.2023.3247174⟩ Article dans une revue hal-04013884v1
Effectiveness of Attitude Estimation Processing Approaches in Tolerating Radiation Soft Errors Tarso Kraemer Sarzi Sartori,Luiz Henrique Laurini,Hassen Fourati,Rodrigo Possamai Bastos IEEE Transactions on Nuclear Science, 2023, 70 (8), pp.1658-1665. ⟨10.1109/TNS.2023.3284991⟩ Article dans une revue hal-04139654v1
Investigation of Edge Computing Hardware Architectures Processing Tiny Machine Learning under Neutron-induced Radiation Effects Luiz Henrique Laurini,Joao Baptista dos Santos Martins,Rodrigo Possamai Bastos Microelectronics Reliability, 2023, ⟨10.1016/j.microrel.2023.115179⟩ Article dans une revue hal-04207364v1
Learning-based Mitigation of Soft Error Effects on Quaternion Kalman Filter Processing Tarso Kraemer Sarzi Sartori,Hassen Fourati,Rodrigo Possamai Bastos IEEE Sensors Journal, 2023, 24 (1), pp.1079 -1089. ⟨10.1109/JSEN.2023.3336054⟩ Article dans une revue hal-04320242v1
SMART: Selective MAC zero-optimization for neural network reliability under radiation Anuj Justus Rajappa,Philippe Reiter,Tarso Kraemer Sarzi Sartori,Luiz Henrique Laurini,Hassen Fouratiet al. Microelectronics Reliability, 2023, 150, pp.1-7. ⟨10.1016/j.microrel.2023.115092⟩ Article dans une revue hal-04207365v1
A Lightweight Mitigation Technique for Resource-constrained Devices Executing DNN Inference Models under Neutron Radiation Jonas Gava,Alex Hanneman,Geancarlo Abich,Rafael Garibotti,Sergio Cuenca-Asensiet al. IEEE Transactions on Nuclear Science, 2023, pp.1-1. ⟨10.1109/TNS.2023.3262448⟩ Article dans une revue hal-04043892v1
The Living With a Star Space Environment Testbed Payload Clive Dyer,Keith A. Ryden,Paul Morris,Alex D. P. Hands,Peter J. Mcnultyet al. IEEE Transactions on Nuclear Science, 2023, pp.1. ⟨10.1109/TNS.2023.3239734⟩ Article dans une revue hal-04018027v1
Bare-Metal Redundant Multi-Threading on Multicore SoCs under Neutron Irradiation Alejandro Serrano-Cases,Antonio Martinez-Alvarez,Rodrigo Possamai Bastos,Sergio Cuenca-Asensi IEEE Transactions on Nuclear Science, 2023, pp.1. ⟨10.1109/TNS.2023.3247129⟩ Article dans une revue hal-04013870v1
Assessment of Radiation-Induced Soft Errors on Lightweight Cryptography Algorithms Running on a Resource-constrained Device Jonas Gava,Nicolas Moura,Joaquim Lucena,Vinicius da Rocha,Rafael Garibottiet al. IEEE Transactions on Nuclear Science, 2023, ⟨10.1109/tns.2023.3253684⟩ Article dans une revue hal-04021757v1
Investigating the reliability impacts of neutron-induced soft errors in aerial image classification CNNs implemented in a softcore SRAM-based FPGA GPU Fabio Benevenuti,Marcio Gonçalves,Evaldo Carlos F. Pereira,Rafael Vaz,Odair Gonçalezet al. Microelectronics Reliability, 2022, 138, pp.114738. ⟨10.1016/j.microrel.2022.114738⟩ Article dans une revue hal-03798800v1
Assessment of Radiation Effects on Attitude Estimation Processing for Autonomous Things Tarso Kraemer Sarzi Sartori,Hassen Fourati,Manon Létiche,Rodrigo Possamai Bastos IEEE Transactions on Nuclear Science, 2022, 69 (7), pp.1610-1617. ⟨10.1109/TNS.2022.3176676⟩ Article dans une revue hal-03675920v1
Assessment of Tiny Machine-Learning Computing Systems under Neutron-Induced Radiation Effects Rodrigo Possamai Bastos,Matheus Garay Trindade,Rafael Garibotti,Jonas Gava,Ricardo Reiset al. IEEE Transactions on Nuclear Science, 2022, pp.1-1. ⟨10.1109/TNS.2022.3176485⟩ Article dans une revue hal-03676824v1
Effects of thermal neutron radiation on a hardware-implemented machine learning algorithm Matheus Garay Trindade,Fabio Benevenuti,M. Letiche,J. Beaucour,Fernanda Lima Kastensmidtet al. Microelectronics Reliability, 2021, 116 (114022), ⟨10.1016/j.microrel.2020.114022⟩ Article dans une revue hal-03094007v1
Impact of radiation-induced soft error on embedded cryptography algorithms Vitor Bandeira,Jack Sampford,Rafael Garibotti,Matheus Garay Trindade,Rodrigo Possamai Bastoset al. Microelectronics Reliability, 2021, ⟨10.1016/j.microrel.2021.114349⟩ Article dans une revue hal-03375914v1
Assessment of On-Chip Current Sensor for Detection of Thermal-Neutron Induced Transients Rodrigo Possamai Bastos,Jean-Max Dutertre,Matheus Garay Trindade,Raphael Andreoni Camponogara-Viera,Olivier Potinet al. IEEE Transactions on Nuclear Science, 2020, 67 (7), pp.1404-1411. ⟨10.1109/tns.2020.2975923⟩ Article dans une revue hal-02482517v1
Simulation and Experimental Demonstration of the Importance of IR-Drops During Laser Fault-Injection Raphael Andreoni Camponogara-Viera,Philippe Maurine,Jean-Max Dutertre,Rodrigo Possamai Bastos IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2020, 39 (6), pp.1231-1244. ⟨10.1109/TCAD.2019.2928972⟩ Article dans une revue hal-02299068v1
Trojan Detection Test for Clockless Circuits R. Aquino Guazzelli,Matheus Garay Trindade,Leonel Acunha Guimarães,Thiago Ferreira de Paiva Leite,Laurent Fesquetet al. Journal of Electronic Testing: : Theory and Applications, 2020, ⟨10.1007/s10836-020-05857-6⟩ Article dans une revue hal-02472910v1
Learning-Based Reliability Assessment Method for Detection of Permanent Faults in Clockless Circuits R. Aquino Guazzelli,Matheus Garay Trindade,Laurent Fesquet,Rodrigo Possamai Bastos Microelectronics Reliability, 2019, 100, ⟨10.1016/j.microrel.2019.06.057⟩ Article dans une revue hal-03080316v1
Assessment of a Hardware-Implemented Machine Learning Technique under Neutron Irradiation Matheus Garay Trindade,Alexandre Coelho,Carlos Fernando Coelho Valadares,Raphael A. Camponogara Viera,Solenne Reyet al. IEEE Transactions on Nuclear Science, 2019, 66 (7), pp.1441-1448. ⟨10.1109/TNS.2019.2920747⟩ Article dans une revue hal-02193158v1
A body built-in cell for detecting transient faults and dynamically biasing subcircuits of integrated systems Thiago Ferreira de Paiva Leite,Laurent Fesquet,Rodrigo Possamai Bastos Microelectronics Reliability, 2018, 88-90, pp.122-127. ⟨10.1016/j.microrel.2018.07.069⟩ Article dans une revue istex hal-01893707v1
Nanobob: a CubeSat mission concept for quantum communication experiments in an uplink configuration Erik Kerstel,Arnaud Gardelein,Mathieu Barthelemy,Yves Gilot,Etienne Lecoareret al. European physical journal quantum technology, 2018, 5 (6), pp.1-30. ⟨10.1140/epjqt/s40507-018-0070-7⟩ Article dans une revue hal-01929079v1
Assessing Body Built-In Current Sensors for Detection of Multiple Transient Faults Raphael Viera,Jean-Max Dutertre,Marie-Lise Flottes,Olivier Potin,Giorgio Di Nataleet al. Microelectronics Reliability, 2018, 88-90, pp.128-134. ⟨10.1016/j.microrel.2018.07.111⟩ Article dans une revue istex hal-01893676v1
Method for evaluation of transient-fault detection techniques Raphael Viera,Rodrigo Possamai Bastos,Jean-Max Dutertre,Philippe Maurine,Rodrigo Iga Jadue Microelectronics Reliability, 2017, 76-77, pp.68-74. ⟨10.1016/j.microrel.2017.07.007⟩ Article dans une revue istex lirmm-01690185v1
Architectures of Bulk Built-In Current Sensors for Detection of Transient Faults in Integrated Circuits Rodrigo Possamai Bastos,Leonel Acunha Guimarães,Frank Sill Torres,Laurent Fesquet Microelectronics Journal, 2017, 71, pp.70-79. ⟨10.1016/j.mejo.2017.11.006⟩ Article dans une revue istex hal-01721110v1
Towards high-sensitive built-in current sensors enabling detection of radiation-induced soft errors R. O. Rocha,Frank Sill Torres,Rodrigo Possamai Bastos Microelectronics Reliability, 2017, ⟨10.1016/j.microrel.2017.08.015⟩ Article dans une revue istex hal-01721108v1
Exploiting reliable features of asynchronous circuits for designing low-voltage components in FD-SOI technology O. Rolloff,Rodrigo Possamai Bastos,Laurent Fesquet Microelectronics Reliability, 2015, 55 (9-10), pp.1302-1306. ⟨10.1016/j.microrel.2015.07.028⟩ Article dans une revue istex hal-01334697v1
Improving the ability of Bulk Built-In Current Sensors to detect Single Event Effects by using triple-well CMOS Jean-Max Dutertre,Rodrigo Possamai Bastos,Olivier Potin,Marie-Lise Flottes,Bruno Rouzeyreet al. Microelectronics Reliability, 2014, 54 (9-10), pp.2289-2294. ⟨10.1016/j.microrel.2014.07.151⟩ Article dans une revue istex emse-01094805v1
A New Recovery Scheme Against Short-to-Long Duration Transient Faults in Combinational Logic Rodrigo Possamai Bastos,Giorgio Di Natale,Marie-Lise Flottes,Feng Lu,Bruno Rouzeyre Journal of Electronic Testing: : Theory and Applications, 2013, 29, pp.331-340. ⟨10.1007/s10836-013-5359-y⟩ Article dans une revue lirmm-00838389v1
Detection of Transient Faults in Nanometer Technologies by using Modular Built-In Current Sensors Frank Sill Torres,Rodrigo Possamai Bastos Journal of Integrated Circuits and Systems, 2013, 8 (2), pp.89-97 Article dans une revue hal-00920428v1
Sensitivity tuning of a bulk built-in current sensor for optimal transient-fault detection Jean-Max Dutertre,Rodrigo Possamai Bastos,Olivier Potin,Marie-Lise Flottes,Bruno Rouzeyreet al. Microelectronics Reliability, 2013, European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 53 (9), pp.1320-1324. ⟨10.1016/j.microrel.2013.07.069⟩ Article dans une revue istex emse-01100723v1
Novel Transient-Fault Detection Circuit Featuring Enhanced Bulk Built-in Current Sensor with Low-Power Sleep Mode Rodrigo Possamai Bastos,Frank Sill Torres,Giorgio Di Natale,Marie-Lise Flottes,Bruno Rouzeyre Microelectronics Reliability, 2012, 52 (9-10), pp.1781-1786. ⟨10.1016/j.microrel.2012.06.149⟩ Article dans une revue istex lirmm-00715117v1
Asynchronous circuits as alternative for mitigation of long-duration transient faults in deep-submicron technologies Rodrigo Possamai Bastos,G. Sicard,Fernanda Lima Kastensmidt,Marc Renaudin,Ricardo Reis Microelectronics Reliability, 2010, 50 (9-11), pp.1241-1246. ⟨10.1016/j.microrel.2010.07.014⟩ Article dans une revue istex hal-00569838v1
Design of a soft-error robust microprocessor Rodrigo Possamai Bastos,Fernanda Lima Kastensmidt,Ricardo Reis Microelectronics Journal, 2008, 40 (7), pp.1062-1068. ⟨10.1016/j.mejo.2008.10.001⟩ Article dans une revue hal-00873149v1

Chapitre d'ouvrage (1)

Designing Low-Power Embedded Software for Mass-Produced Microprocessor by Using a Loop Table in On-Chip Memory Rodrigo Possamai Bastos,Fernanda Lima Kastensmidt,Ricardo Reis (eds) Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation. PATMOS 2005. Lecture Notes in Computer Science, vol 3728. Springer, Berlin, Heidelberg, pp.59-68, 2005, ⟨10.1007/11556930_7⟩ Chapitre d'ouvrage istex hal-03039091v1

Communication dans un congrès (103)

Spectral vs. Spatial Pruning: Fault Resilience Analysis for Extremely Sparse DNNs Manar Gani,Leonardo Alexandrino de Melo,Alberto Bosio,Rodrigo Possamai Bastos,David Novo LATS 2026 - 27th IEEE Latin American Test Symposium, Mar 2026, Florianopolis, Brazil. In press Communication dans un congrès hal-05544416v1
Deploying Compact and Reliable Deep Neural Networks in Safety-critical Applications Leonardo Alexandrino de Melo,Rodrigo Possamai Bastos,Alberto Bosio TTTC McCluskey Doctoral Thesis Contest, IEEE Latin-American Test Symposium (LATS 2026), Mar 2026, Florianopolis, Brazil Communication dans un congrès hal-05544409v1
Case Study: RISC-V Cores for Resource-Constrained Computing Systems Facing Neutrons Pierre-Alexandre Peyronnet,Luiz Henrique Laurini,Emmanuel Atukpor,Jessy Guilbot,Christian Costaet al. IEEE Latin-American Test Symposium (LATS 2026), Mar 2026, Florianapolis, Brazil Communication dans un congrès hal-05544402v1
Impact of Register Reservation on the Reliability of Arm Cortex-M Processors under Neutrons Leonardo Gobatto,Fabio Benevenuti,Luiz Henrique Laurini,Benjamin Cheymol,Rodrigo Possamai Bastoset al. 2025 38th SBC/SBMicro/IEEE Symposium on Integrated Circuits and Systems Design (SBCCI), Aug 2025, Manaus, Brazil. pp.1-5, ⟨10.1109/SBCCI66862.2025.11218669⟩ Communication dans un congrès hal-05544089v1
Reliability of Computing Systems and Components Facing Cosmic Ray Radiation Effects Rodrigo Possamai Bastos Invited talk presented as a course within the ”Formation continue : ingénierie système appliquée au spatial : instrumentation spatiale et données” organized by the CSUG (Centre spatial universitaire de Grenoble) of the UGA. Grenoble, November 20, 2025, CSUG, Nov 2025, Grenoble, France Communication dans un congrès hal-05544070v1
Accelerated Radiation Testing Method for Processor-based Computing Systems Luiz Henrique Laurini,Luciano Ost,Sergio Cuenca-Asensi,Benjamin Cheymol,Emmanuel Atukporet al. 2025 32nd IEEE International Conference on Electronics, Circuits and Systems (ICECS), IEEE, Nov 2025, Marrakech, Morocco. pp.1-4, ⟨10.1109/ICECS66544.2025.11270682⟩ Communication dans un congrès hal-05544186v1
Near-sensor testing method for observing radiation-induced soft errors in modern sensors Matheus Minelli de Carvalho,Benjamin Cheymol,Lirida Naviner,Rodrigo Possamai Bastos Conference on Design of Circuits and Integrated Systems (DCIS 2025), Nov 2025, Santander, Spain Communication dans un congrès hal-05404459v1
Uncovering Fault Behavior in Arm Cortex-M Microprocessors with cFS Under Neutron Radiation Leonardo Gobatto,Fabio Benevenuti,Luiz Henrique Laurini,Benjamin Cheymol,Rodrigo Possamai Bastoset al. Conference on Radiation Effects on Components and Systems (RADECS 2025), Sep 2025, Antwerp, Belgium Communication dans un congrès hal-05544286v1
Assessment of RISC-V architectures for resource-constrained edge computing systems facing neutron radiation Pierre-Alexandre Peyronnet,Christian Costa,Jessy Guilbot,Rodrigo Possamai Bastos Invited talk presented in Journée thématique SAFRAN sur la fiabilité des composants, Groupement de Recherche System On Chip, Systèmes embarqués et Objets Connectés (GDR-SOC2 SAFRAN 2025), Oct 2025, Paris, France Communication dans un congrès hal-05544366v1
Analyzing Cache Utilization for Improved System Reliability Antonio Martínez-Álvarez,Darío González-Montesoro,Rodrigo Possamai Bastos,Sergio Cuenca-Asensi,Alejandro Serrano-Cases ESREF 2025 : 36th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2025, Université de Bordeaux, ADERA, Oct 2025, Bordeaux, France Communication dans un congrès hal-05323084v1
Neutron radiation tests and preliminary assessment of COTS edge computing systems Luiz Henrique Laurini,Rodrigo Possamai Bastos Invited talk presented in Journée thématique SAFRAN sur la fiabilité des composants, Groupement de Recherche System On Chip, Systèmes embarqués et Objets Connectés (GDR-SOC2 SAFRAN 2025), Oct 2025, Paris, France Communication dans un congrès hal-05544360v1
Rust vs. C: Evaluating Soft Error Sensitivity Antonio Martínez-Álvarez,Darío González-Montesoro,Rodrigo Possamai Bastos,Sergio Cuenca-Asensi,Alejandro Serrano-Cases Conference on Radiation Effects on Components and Systems (RADECS 2025), Sep 2025, Antwerp, Belgium Communication dans un congrès hal-05544270v1
Analyzing Embedded AI Vulnerabilities in Google’s LiteRT Through Fault Injection Leonardo Alexandrino de Melo,Rodrigo Possamai Bastos,Alberto Bosio Colloque national du groupement de recherche System On Chip, Systèmes embarqués et Objets Connectés (GDR-SOC2 2025), CNRS, Jun 2025, Lorient, France Communication dans un congrès hal-05543921v1
Open Source Port of NASA Core Flight System to FreeRTOS in Arm Cortex-M-based Microprocessor Luis Fernando França,Fabio Benevenuti,Leonardo Gobatto,Rodrigo Possamai Bastos,José Rodrigo Azambujaet al. IEEE CASS Latin American Symposium on Circuits and Systems, LASCAS, Feb 2025, Bento Gonçalves, Brazil Communication dans un congrès hal-04793698v1
MicroFI: Tensorflow Lite based Fault Injection Framework for Microcontrollers Leonardo Alexandrino de Melo,Rodrigo Possamai Bastos,Alberto Bosio IEEE VLSI Test Symposium (VTS, 2025), Apr 2025, Tempe, United States Communication dans un congrès hal-05012276v1
Impacto de la Mejora en el Aprovechamiento de la Memoria Caché sobre la Fiabilidad de un Sistema Antonio Martínez-Álvarez,Darío González-Montesoro,Rodrigo Possamai Bastos,Sergio Cuenca-Asensi,Alejandro Serrano-Cases Jornadas SARTECO 2025 (Sociedad de Arquitectura y Tecnología de Computadores), Jun 2025, Sevilla, España Communication dans un congrès hal-05543342v1
Early Neutron Reliability Assessment of an Arm Cortex-M4 through Emulated Fault Injection Leonardo Gobatto,Fabio Benevenuti,Rodrigo Possamai Bastos,Fernanda Lima Kastensmidt,José Rodrigo Azambuja Symposium on Integrated Circuits and Systems Design (SBCCI 2024), Sep 2024, Joao Pessaoa, Brazil Communication dans un congrès hal-04615351v1
Radiation-induced Soft Error Assessment of a Multithreaded MobileNet CNN Model Running in a Multicore Edge Processor Jonas Gava,Areeb Sherjil,Luiz Henrique Laurini,Rodrigo Possamai Bastos,Ricardo Reiset al. Conference on Radiation Effects on Components and Systems (RADECS 2024), Sep 2024, Maspalomas, Canary Islands, Spain Communication dans un congrès hal-04615502v1
Deploying Compact and Dependable DNNs in Safety-critical Applications Leonardo Alexandrino de Melo,Alberto Bosio,Rodrigo Possamai Bastos European Test Symposium (ETS 2024) - PhD Forum, May 2024, The Hague, Netherlands Communication dans un congrès hal-04615328v1
Impact of Using Off-Chip Memories on Reliability of Edge Computing Systems to Single-Event Upsets Luiz Henrique Laurini,Leonardo Alexandrino de Melo,Alberto Bosio,Rodrigo Possamai Bastos Conference on Radiation Effects on Components and Systems (RADECS 2024), Sep 2024, Maspalomas, Canary Islands, Spain Communication dans un congrès hal-04615508v1
Robustness of Redundancy-Hardened Convolutional Neural Networks Against Adversarial Attacks Leonardo Alexandrino de Melo,Mauricio Gomes de Queiroz,Alberto Bosio,Rodrigo Possamai Bastos IEEE Pacific Rim International Symposium on Dependable Computing (PRDC 2024), Nov 2024, Osaka, Japan Communication dans un congrès hal-04739758v1
The Impact of Allocating Weights and Biases in SRAM Parity Checking Areas on the Soft Error Reliability of CNN Inference Models Jonas Gava,Luiz Henrique Laurini,Rodrigo Possamai Bastos,Ricardo Reis,Luciano Ost Conference on Radiation Effects on Components and Systems (RADECS 2024), Sep 2024, Maspalomas, Canary Islands, Spain Communication dans un congrès hal-04615485v1
Deploying Compact and Dependable DNNs in Safety-critical Applications Leonardo Alexandrino de Melo,Alberto Bosio,Rodrigo Possamai Bastos Colloque national du groupement de recherche System On Chip, Systèmes embarqués et Objets Connectés (GDR-SOC2 2024), Jun 2024, Toulouse, France Communication dans un congrès hal-04615293v1
Impact of scaling up the sensor sampling frequency on the reliability of edge processing systems in tolerating soft errors caused by neutrons Matheus Minelli de Carvalho,Luiz Henrique Laurini,Emmanuel Atukpor,Lirida Naviner,Rodrigo Possamai Bastos IEEE Sensors Conference 2024, Oct 2024, Kobe, Japan Communication dans un congrès hal-04739776v1
Neutron radiation tests and assessment of edge computing systems Rodrigo Possamai Bastos,Luiz Henrique Laurini,Matheus Minelli de Carvalho,Lirida Naviner Invited talk presented in VII Workshop sobre os Efeitos das Radiações Ionizantes em Componentes e Circuitos Eletrônicos de Uso Aeroespacial (WERICE AEROESPACIAL 2024), Nov 2024, São José dos Campos, Brazil Communication dans un congrès hal-04739744v1
On Rust and C Variability of Fault Sensitivity across Different Runtimes and Cache-Aware Source Codes Antonio Martinez-Alvarez,Dario Gonzalez-Montesoro,Rodrigo Possamai Bastos,Sergio Cuenca-Asensi,Alejandro Serrano-Cases Conference on Radiation Effects on Components and Systems (RADECS 2024), Sep 2024, Maspalomas, Canary Islands, Spain Communication dans un congrès hal-04615400v1
Soft Error Assessment of Attitude Estimation Algorithms Running in a Resource-constrained Device under Neutron Radiation Jonas Gava,Tarso Kraemer Sarzi Sartori,Alex Hanneman,Rafael Garibotti,Ney Calazanset al. RADECS 2023 - International Conference on Radiation and its Effects on Components and Systems, Sep 2023, Toulouse, France. pp.1-4 Communication dans un congrès hal-04342734v1
SMART: Selective MAC zero-optimization for neural network reliability under radiation Anuj Justus Rajappa,Philippe Reiter,Tarso Kraemer Sarzi Sartori,Luiz Henrique Laurini,Hassen Fouratiet al. ESREF 2023 - 34th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Oct 2023, Toulouse, France. pp.1-4 Communication dans un congrès hal-04094354v1
Investigation of Edge Computing Hardware Architectures Processing Tiny Machine Learning under Neutron-induced Radiation Effects Luiz Henrique Laurini,Joao Baptista dos Santos Martins,Rodrigo Possamai Bastos European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2023), Oct 2023, Toulouse, France Communication dans un congrès hal-04157172v1
Impact of Radiation-Induced Soft Error on Object Detection Algorithm of Unmanned Surface Vehicles Marcos Antônio Junior Fleck,Elisa Pereira,Jonas Gava,Fernando Gehm Moraes,Ney Calazanset al. Conference on Radiation Effects on Components and Systems (RADECS 2023), Sep 2023, Toulouse, France Communication dans un congrès hal-04157135v1
Assessing the Arm Cortex-M under Radiation with and without a Real-time Operating System Fabio Benevenuti,Leonardo Gobatto,Rodrigo Possamai Bastos,José Rodrigo Azambuja,Fernanda Lima Kastensmidt Conference on Radiation Effects on Components and Systems (RADECS 2023), Sep 2023, Toulouse, France Communication dans un congrès hal-04157205v1
Assessment of Radiation-Induced Soft Error on Lightweight Cryptography Algorithms Jonas Gava,Nicolas Moura,Vinicius da Rocha,Rafael Garibotti,Sergio Cuenca-Asensiet al. Conference on Radiation Effects on Components and Systems (RADECS 2022), Oct 2022, Venice, Italy Communication dans un congrès hal-03688760v1
Redundancia multihilo para la mitigación de Sotf errors en Sistemas on Chip multinúcleo Alejandro Serrano-Cases,Antonio Martinez-Alvarez,Rodrigo Possamai Bastos,Sergio Cuenca-Asensi Jornadas SARTECO 2022 (Sociedad de Arquitectura y Tecnología de Computadores), Sep 2022, Alicante, España Communication dans un congrès hal-04298341v1
MEO Spaceflight Results of Radiation Effects in COTS FPGA-implemented Triple Modular System Rodrigo Possamai Bastos,Marti Gorchs Picas,Marcelo Correa Cueto,Raoul Velazco Conference on Radiation Effects on Components and Systems (RADECS 2022), Oct 2022, Venice, Italy Communication dans un congrès hal-03688775v1
Investigating the Reliability Impacts of Neutron-induced Soft Errors in Aerial Image Classification CNNs Implemented in a Softcore SRAM-based FPGA GPU Fabio Benevenuti,Marcio Goncalves,Evaldo Carlos Pereira Jr,Rafael Vaz,O.L. Gonçalezet al. European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2022), Sep 2022, Berlin, Germany Communication dans un congrès hal-03688778v1
Effectiveness of Attitude Estimation Processing Approaches in Tolerating Radiation Soft Errors Tarso Kraemer Sarzi Sartori,Hassen Fourati,Anuj Justus Rajappa,Philippe Reiter,Rodrigo Possamai Bastos RADECS 2022 - Conference on Radiation Effects on Components and Systems, Oct 2022, Venise, Italy Communication dans un congrès hal-03688756v1
Redundant Portable Multi-Threading for Soft Error Mitigation on Multicore Systems on Chip Alejandro Serrano-Cases,Antonio Martinez-Alvarez,Rodrigo Possamai Bastos,Sergio Cuenca-Asensi Conference on Radiation Effects on Components and Systems (RADECS 2022), Oct 2022, Venice, Italy Communication dans un congrès hal-03688771v1
A Lightweight Mitigation Technique for Resource-constrained Devices under Neutron Radiation Jonas Gava,Geancarlo Abich,Rafael Garibotti,Sergio Cuenca-Asensi,Rodrigo Possamai Bastoset al. Conference on Radiation Effects on Components and Systems (RADECS 2022), Oct 2022, Venice, Italy Communication dans un congrès hal-03688765v1
Impact of radiation-induced soft error on embedded cryptography algorithms Vitor Bandeira,Jack Sampford,Rafael Garibotti,Matheus Garay Trindade,Rodrigo Possamai Bastoset al. European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2021), Oct 2021, Bordeaux, France Communication dans un congrès hal-03375885v1
Assessment of Machine Learning Models in Computing System under Neutron Radiation Matheus Garay Trindade,Joao Paolo Sales Brum,Liége Maldaner,Rafael Garibotti,Luciano Ostet al. RADECS 2021 - Conference on Radiation Effects on Components and Systems, Sep 2021, Vienna, Austria Communication dans un congrès hal-03375695v1
Evaluation of Attitude Estimation Algorithm under Soft Error Effects Joao Paolo Sales Brum,Tarso Kraemer Sarzi Sartori,Jiaru Lin,Matheus Garay Trindade,Hassen Fouratiet al. LATS 2021 - IEEE Latin-American Test Symposium, Oct 2021, Punta del Este (Virtual event), Uruguay. ⟨10.1109/LATS53581.2021.9651794⟩ Communication dans un congrès hal-03375744v1
Nanosatellite On-Board Computer including a Many-Core Processor Fabrice Pancher,Vanessa Carolina Vargas Vallejo,Pablo Francisco Ramos Vargas,Rodrigo Possamai Bastos,David César Ardiles Saraviaet al. IEEE Latin-American Test Symposium (LATS 2021), Oct 2021, Virtual event, Uruguay Communication dans un congrès hal-03387930v1
Radiation effects in tiny machine learning systems and attitude estimation processing modules for autonomous things Rodrigo Possamai Bastos Invited talk presented in 17th International School on the Effects of Radiation on Embedded Systems for Space Applications (SERESSA 2021), Nov 2021, Virtual event, Brazil Communication dans un congrès hal-03621516v1
Assessment of Attitude Estimation Processing System under Neutron Radiation Effects Tarso Kraemer Sarzi Sartori,Hassen Fourati,Matheus Garay Trindade,Rodrigo Possamai Bastos RADECS 2021 - Conference on Radiation Effects on Components and Systems, Sep 2021, Vienna, Austria Communication dans un congrès hal-03375701v1
Assessment of Machine Learning Algorithms for Near-Sensor Computing Under Radiation Soft Errors Matheus Garay Trindade,Rafael Garibotti,Luciano Ost,M. Letiche,J. Beaucouret al. IEEE International conference on electronics, circuits & systems (ICECS 2020), Nov 2020, Glasgow, SCOTLAND, United Kingdom Communication dans un congrès hal-02988115v1
Body-Bias Micro-Generators for Activity-Driven Power Management Laurent Fesquet,Yoan Decoudu,Rodrigo Iga Jadue,Thiago Ferreira de Paiva Leite,O. Rolloffet al. FDSOI workshop at DATE Conference 2020, Mar 2020, Grenoble, France Communication dans un congrès hal-02956260v1
Assessment of Machine Learning Algorithms for Near-Sensor Computing Under Radiation Soft Errors Matheus Garay Trindade,Rafael Garibotti,Luciano Ost,M. Letiche,J. Beaucouret al. 16th International School on the Effects of Radiation on Embedded Systems for Space Applications (SERESSA 2020), Dec 2020, Porto Alegre (Virtual edition), Brazil Communication dans un congrès hal-03100531v1
Exploring a Non-conventional Testing Technique for Asynchronous Circuits R. Aquino Guazzelli,Matheus Garay Trindade,Laurent Fesquet,Rodrigo Possamai Bastos 21èmes Journées Nationales du Réseau Doctoral en Microélectronique (JNRDM 2019), Jun 2019, Montpellier, France Communication dans un congrès hal-03100560v1
A Distributed Body-Biasing Strategy for Asynchronous Circuits Laurent Fesquet,Yoan Decoudu,Rodrigo Iga Jadue,Thiago Ferreira de Paiva Leite,O. Rolloffet al. 27th IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC 2019), Oct 2019, Cuzco, Peru Communication dans un congrès hal-02170157v1
On the reliability of Support Vector Machines Matheus Garay Trindade,Rodrigo Possamai Bastos 21èmes Journées Nationales du Réseau Doctoral en Microélectronique (JNRDM 2019), Jun 2019, Montpellier, France Communication dans un congrès hal-03100549v1
Learning-Based Reliability Assessment Method for Detection of Permanent Faults in Clockless Circuits R. Aquino Guazzelli,Matheus Garay Trindade,Laurent Fesquet,Rodrigo Possamai Bastos 30th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2019), Aug 2019, Toulouse, France Communication dans un congrès hal-02165113v1
Assessment of Current Sensor on Chip for Detecting Neutron-Induced Transients via Body Terminals Rodrigo Possamai Bastos,Jean-Max Dutertre,Matheus Garay Trindade,Raphael Andreoni Camponogara-Viera,Olivier Potinet al. Conference on Radiation Effects on Components and Systems (RADECS 2019), Sep 2019, Montpellier, France Communication dans un congrès hal-02299066v1
Level Shifter Architecture for Dynamically Biasing Ultra-Low Voltage Subcircuits of Integrated Systems Rodrigo Iga Jadue,Rodrigo Possamai Bastos,Thiago Ferreira de Paiva Leite,O. Rolloff,Mamadou Dialloet al. IEEE International Symposium on Circuits & Systems (ISCAS 2018), May 2018, Florence, Italy Communication dans un congrès hal-01726964v1
A Non-Intrusive Testing Technique for Detection of Trojans in Asynchronous Circuits Leonel Acunha Guimarães,Rodrigo Possamai Bastos,Thiago Ferreira de Paiva Leite,Laurent Fesquet Design, Automation and Test in Europe (DATE 2018), Mar 2018, Dresden, Germany. pp.1516-1519 Communication dans un congrès hal-01726979v1
A body built-in cell for detecting transient faults and dynamically biasing subcircuits of integrated systems Thiago Ferreira de Paiva Leite,Laurent Fesquet,Rodrigo Possamai Bastos European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF'2018), Oct 2018, Aalborg, Denmark Communication dans un congrès hal-01986346v1
Assessment of Hardware-Implemented Support Vector Machine under Radiation Effects Matheus Garay Trindade,A. Coelho,C. Valadares,Raphael Andreoni Camponogara-Viera,Solenne Reyet al. Conference on Radiation Effects on Components and Systems (RADECS'2018), Sep 2018, Gothenburg, Sweden Communication dans un congrès hal-01996777v1
Standard CAD Tool-Based Method for Simulation of Laser-Induced Faults in Large-Scale Circuits Raphael Andreoni Camponogara-Viera,Jean-Max Dutertre,Philippe Maurine,Rodrigo Possamai Bastos ISPD 2018 - International Symposium on Physical Design, Mar 2018, Monterey, CA, United States. pp.160-167, ⟨10.1145/3177540.3178243⟩ Communication dans un congrès lirmm-01743368v1
Assessing Body Built-In Current Sensors for Detection of Multiple Transient Faults Raphael Viera,Jean-Max Dutertre,Marie-Lise Flottes,Olivier Potin,Giorgio Di Nataleet al. ESREF 2018 - European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Oct 2018, Aalborg, Denmark Communication dans un congrès hal-04457522v1
Fine Grain Body-Biasing: A strategy for asynchronous circuits Thiago Ferreira de Paiva Leite,Rodrigo Iga Jadue,Sylvain Engels,Rodrigo Possamai Bastos,Laurent Fesquet European Nanoelectronics Applications, Design and Technology Conference (ADTC), Jun 2018, Grenoble, France Communication dans un congrès hal-01828009v1
Detection of Layout-Level Trojans by Injecting Current Into Substrate and Digitally Monitoring Built-In Sensors Leonel Acunha Guimarães,Rodrigo Possamai Bastos,Laurent Fesquet Design Automation Conference, Jun 2017, Austin, TX, United States Communication dans un congrès hal-01627374v1
Body Bias Control Cells based on Negative- and Positive-Level Shifter Architectures in Technology FD-SOI 28 nm O. Rolloff,Rodrigo Iga Jadue,Thiago Ferreira de Paiva Leite,Rodrigo Possamai Bastos,Laurent Fesquet Journées Nationales du Réseau Doctoral en Micro-nanoélectronique (JNRDM 2017), Nov 2017, Strasbourg, France Communication dans un congrès hal-01721072v1
Method for evaluation of transient-fault detection techniques Raphael Andreoni Camponogara-Viera,Rodrigo Possamai Bastos,Jean-Max Dutertre,Philippe Maurine ESREF: European Symposium on Reliability of Electron devices, Failure physics and analysis, Sep 2017, Bordeaux, France Communication dans un congrès hal-01721081v1
Detection of Layout-Level Trojans by Monitoring Substrate with Preexisting Built-in Sensors Leonel Acunha Guimarães,Rodrigo Possamai Bastos,Laurent Fesquet IEEE Computer Society Annual Symposium on VLSI (ISVLSI 2017), Jul 2017, Bochum, Germany. pp.290-295, ⟨10.1109/ISVLSI.2017.58⟩ Communication dans un congrès hal-01627346v1
A practical framework for specification, verification and design of self-timed pipelines Jean Simatic,Abdelkarim Cherkaoui,Bertrand François,Rodrigo Possamai Bastos,Laurent Fesquet 23rd IEEE International Symposium on Asynchronous Circuits and Systems (Async 2017), May 2017, San Diego, CA, United States. pp.65-72, ⟨10.1109/ASYNC.2017.16⟩ Communication dans un congrès hal-01512247v1
Importance of IR Drops on the Modeling of Laser-Induced Transient Faults Raphael Viera,Philippe Maurine,Jean-Max Dutertre,Rodrigo Possamai Bastos SMACD 2017 - 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, Jun 2017, Giardini Naxos, Italy. ⟨10.1109/SMACD.2017.7981593⟩ Communication dans un congrès hal-01721087v1
Fine Body Biasing Island Strategy in FD-SOI Rodrigo Iga Jadue,Thiago Ferreira de Paiva Leite,O. Rolloff,Mamadou Diallo,Rodrigo Possamai Bastoset al. 20th IP-SoC Conference (IP-SOC), Dec 2017, Grenoble, France Communication dans un congrès hal-01721571v1
Role of Laser-Induced IR Drops in the Occurrence of Faults: Assessment and Simulation Raphael Andreoni Camponogara-Viera,Jean-Max Dutertre,Rodrigo Possamai Bastos,Philippe Maurine DSD 2017 - Euromicro Symposium on Digital System Design, Aug 2017, Vienna, Austria. pp.252-259, ⟨10.1109/DSD.2017.43⟩ Communication dans un congrès lirmm-01699776v1
QDI asynchronous circuits for low power applications: a comparative study in technology FD-SOI 28 nm Thiago Ferreira de Paiva Leite,Rodrigo Possamai Bastos,Laurent Fesquet Journées Nationales du Réseau Doctoral en Micro-Nanoélectronique (JNRDM'16), May 2016, Toulouse, France Communication dans un congrès hal-01524092v1
Simple Tri-State Logic Trojans Able to Upset Properties of Ring Oscillators Leonel Acunha Guimarães,Rodrigo Possamai Bastos,Thiago Ferreira de Paiva Leite,Laurent Fesquet 11th International Conference on Design &Technology of Integrated Systems in Nanoscale Era (DTIS'16), Apr 2016, Istanbul, Turkey. pp.1-6, ⟨10.1109/DTIS.2016.7483811⟩ Communication dans un congrès hal-01431177v1
AHLS_DESYNC: A Desynchronization Tool For High-Level Synthesis of Asynchronous Circuits Jean Simatic,Rodrigo Possamai Bastos,Laurent Fesquet Design, Automation and Test in Europe (DATE 2016), Mar 2016, Dresden, Germany Communication dans un congrès hal-01293842v1
High-level synthesis for event-based systems Jean Simatic,Rodrigo Possamai Bastos,Laurent Fesquet Second International Conference on Event-Based Control, Communications, and Signal Processing (EBCCSP 2016), Jun 2016, Krakow, Poland. pp.1-7, ⟨10.1109/EBCCSP.2016.7605252⟩ Communication dans un congrès hal-01345745v1
Analysis of granularity for automatic biasing control in FDSOI technology with low-voltage supply O. Rolloff,Thiago Ferreira de Paiva Leite,Rodrigo Possamai Bastos,Laurent Fesquet Journées Nationales du Réseau Doctoral en Micro-Nanoélectronique (JNRDM'16), May 2016, Toulouse, France Communication dans un congrès hal-01524090v1
New asynchronous protocols for enhancing area and throughput in bundle-data pipelines Jean Simatic,Abdelkarim Cherkaoui,Rodrigo Possamai Bastos,Laurent Fesquet 29th Symposium on Integrated Circuits and Systems Design (SBCCI 2016), Aug 2016, Belo Horizonte, Brazil. pp.1-6, ⟨10.1109/SBCCI.2016.7724066⟩ Communication dans un congrès hal-01345749v1
Comparison of Low-Voltage Scaling in Synchronous and Asynchronous FD-SOI Circuits Thiago Ferreira de Paiva Leite,Rodrigo Possamai Bastos,Rodrigo Iga Jadue,Laurent Fesquet 26th International Workshop on Power and Timing Modeling, Optimization and Simulation (PATMOS'16), Sep 2016, Bremen, Germany Communication dans un congrès hal-01524087v1
Flot de conception pour l'ultra-faible consommation : échantillonage non-uniforme et électronique asynchrone Jean Simatic,Rodrigo Possamai Bastos,Laurent Fesquet Journées Nationales du Réseau Doctoral en Micro-nanoélectronique (JNRDM'15), May 2015, Bordeaux, France Communication dans un congrès hal-01524095v1
Exploiting reliable features of asynchronous circuits for designing low-voltage components in FD-SOI technology O. Rolloff,Rodrigo Possamai Bastos,Laurent Fesquet 26th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF'15), Oct 2015, Toulouse, France Communication dans un congrès hal-01393437v1
A New Proposition on Hardware Trojan Activation Leonel Acunha Guimarães,Rodrigo Possamai Bastos,Laurent Fesquet Journées Nationales du Réseau Doctoral en Micro-nanoélectronique (JNRDM'15), May 2015, Bordeaux, France Communication dans un congrès hal-01524097v1
Exploration of Noise Robustness and Sensitivity of Bulk Current Sensors for Soft Error Detection J.G.M. Melo,Frank Sill Torres,Rodrigo Possamai Bastos International Workshop on CMOS Variability (VARI'15), Sep 2015, Salvador Bahia, Brazil. pp.13-18 Communication dans un congrès hal-01414765v1
Validation Of Single BBICS Architecture In Detecting Multiple Faults Raphael Andreoni Camponogara-Viera,Rodrigo Possamai Bastos,Jean-Max Dutertre,Olivier Potin,Marie-Lise Flotteset al. ATS: Asian Test Symposium, Nov 2015, Mumbai, India Communication dans un congrès lirmm-01234067v1
Design of Bulk Built-In Current Sensors to Detect Single Event Effects and Laser-Induced Fault Injection Attempts Jean-Max Dutertre,Rodrigo Possamai Bastos,Olivier Potin,Marie-Lise Flottes,Giorgio Di Nataleet al. Joint MEDIAN–TRUDEVICE Open Forum, Sep 2014, Amsterdam, Netherlands Communication dans un congrès emse-01099040v1
Improving the ability of Bulk Built-In Current Sensors to detect Single Event Effects by using triple-well CMOS Jean-Max Dutertre,Rodrigo Possamai Bastos,Olivier Potin,Marie-Lise Flottes,Bruno Rouzeyreet al. 25th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2014), Sep 2014, Berlin, Germany Communication dans un congrès hal-03094235v1
Comparison of bulk built-in current sensors in terms of transient-fault detection sensitivity Rodrigo Possamai Bastos,Jean-Max Dutertre,Frank Sill Torres CMOS variability (VARI), Sep 2014, Palma de Mallorca, Spain. ⟨10.1109/VARI.2014.6957089⟩ Communication dans un congrès emse-01099015v1
A Bulk Built-in Sensor for Detection of Fault Attacks Rodrigo Possamai Bastos,Frank Sill Torres,Jean Max Dutertre,Marie-Lise Flottes,Giorgio Di Nataleet al. HOST: Hardware-Oriented Security and Trust, Jun 2013, Austin, TX, United States. pp.51-54, ⟨10.1109/HST.2013.6581565⟩ Communication dans un congrès lirmm-01430800v1
Sensitivity tuning of a bulk built-in current sensor for optimal transient-fault detection Jean-Max Dutertre,Rodrigo Possamai Bastos,Olivier Potin,Marie-Lise Flottes,Bruno Rouzeyreet al. ESREF: European Symposium on Reliability of Electron devices, Failure physics and analysis, Sep 2013, Arcachon, France. pp.B3c-2 #68 Communication dans un congrès hal-00872705v1
A single built-in sensor to check pull-up and pull-down CMOS networks against transient faults Rodrigo Possamai Bastos,Frank Sill Torres,Jean-Max Dutertre,Marie-Lise Flottes,Giorgio Di Nataleet al. PATMOS: Power and Timing Modeling, Optimization and Simulation, Sep 2013, Karlsruhe, Germany. pp.157-163, ⟨10.1109/PATMOS.2013.6662169⟩ Communication dans un congrès lirmm-00968621v1
Robust Modular Bulk Built-In Current Sensors for Detection of Transient Faults Frank Sill Torres,Rodrigo Possamai Bastos SBCCI'2012: 25th Symposium onIntegrated Circuits and Systems Design, Aug 2012, Brasilia, Brazil. pp.1-6, ⟨10.1109/SBCCI.2012.6344422⟩ Communication dans un congrès lirmm-00715122v1
How to Sample Results of Concurrent Error Detection Schemes in Transient Fault Scenarios? Rodrigo Possamai Bastos,Giorgio Di Natale,Marie-Lise Flottes,Bruno Rouzeyre RADECS: Radiation and Its Effects on Components and Systems, Sep 2011, Sevilla, Spain. pp.635-642, ⟨10.1109/RADECS.2011.6131361⟩ Communication dans un congrès lirmm-00701776v1
Novel transient-fault detection circuit featuring enhanced bulk built-in current sensor with low-power sleep-mode Rodrigo Possamai Bastos,Frank Sill Torres,Giorgio Di Natale,Marie-Lise Flottes,Bruno Rouzeyre ESREF: European Symposium on Reliability of Electron devices, Failure physics and analysis, Oct 2012, Cagliari, Italy Communication dans un congrès hal-00867864v1
Calibrating Bulk Built-in Current Sensors for Detecting Transient Faults Rodrigo Possamai Bastos,Giorgio Di Natale,Marie-Lise Flottes,Bruno Rouzeyre Colloque GDR SoC-SiP, 2012, Lyon, France Communication dans un congrès lirmm-00715126v1
Timing Issues for an Efficient Use of Concurrent Error Detection Codes Rodrigo Possamai Bastos,Giorgio Di Natale,Marie-Lise Flottes,Bruno Rouzeyre LATW: Latin American Test Workshop, Mar 2011, Porto de Galinhas, Brazil. pp.1-6, ⟨10.1109/LATW.2011.5985933⟩ Communication dans un congrès lirmm-00627427v1
Timing Issues of Transient Faults in Concurrent Error Detection Schemes Rodrigo Possamai Bastos,Giorgio Di Natale,Marie-Lise Flottes,Bruno Rouzeyre GdR SoC-SiP'2011: Colloque national du Groupement de Recherche System-On-Chip et System-In-Package, Jun 2011, Lyon, France. http://www2.lirmm.fr/~w3mic/SOCSIP/ Communication dans un congrès lirmm-00701798v1
A New Bulk Built-in Current Sensor-Based Strategy for Dealing with Long-Duration Transient Faults in Deep-Submicron Technologies Rodrigo Possamai Bastos,Giorgio Di Natale,Marie-Lise Flottes,Bruno Rouzeyre DFT'2011: International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2011, Vancouver, Canada. pp.302-308, ⟨10.1109/DFT.2011.15⟩ Communication dans un congrès lirmm-00701789v1
Evaluating transient-fault effects on traditional C-element's implementations Rodrigo Possamai Bastos,G. Sicard,Fernanda Lima Kastensmidt,Marc Renaudin,Ricardo Reis 16th IEEE International On-Line Testing Symposium (IOLTS'10), Jul 2010, Corfu island, Greece. pp.35 - 40, ⟨10.1109/IOLTS.2010.5560237⟩ Communication dans un congrès hal-00569056v1
Asynchronous circuits as alternative for mitigation of long-duration transient faults in deep-submicron technologies Rodrigo Possamai Bastos,G. Sicard,Fernanda Lima Kastensmidt,Marc Renaudin,Ricardo Reis 21st European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Oct 2010, Monte Cassino Abbey and Gaeta, Italy. A.p.4 Communication dans un congrès hal-00867836v1
Asynchronous circuits as alternative for mitigation of long-duration transient faults in deep-submicron technologies Rodrigo Possamai Bastos,G. Sicard,Fernanda Lima Kastensmidt,Marc Renaudin,Ricardo Reis Digest of Papers, 15th IEEE European Test Symposium (ETS'10), May 2010, Prague, Czech Republic Communication dans un congrès hal-00568749v1
A Methodology to Evaluate Transient-Fault Effects on Asynchronous and Synchronous Circuits Rodrigo Possamai Bastos,Y. Monnet,G. Sicard,Fernanda Lima Kastensmidt,Marc Renaudinet al. Digest of Papers, 14th IEEE European Test Symposium (ETS'09), May 2009, Sevilla, Spain Communication dans un congrès hal-00417840v1
Comparing Transient-Fault Effects on Synchronous and on Asynchronous Circuits Rodrigo Possamai Bastos,Y. Monnet,G. Sicard,Fernanda Lima Kastensmidt,Marc Renaudinet al. 15th IEEE International On-Line Testing Symposium (IOLTS'09), Jun 2009, Sesimbra-Lisbon, Portugal. pp.29-34, ⟨10.1109/IOLTS.2009.5195979⟩ Communication dans un congrès hal-00419061v1
Design of a Robust 8-Bit Microprocessor to Soft Single Event Effects Rodrigo Possamai Bastos,Fernanda Lima Kastensmidt,Ricardo Reis Digest of Papers, IEEE Latin American Test Workshop, LATW, Mar 2006, Buenos Aires, Argentina Communication dans un congrès hal-03039148v1
Design of a Robust 8-Bit Microprocessor to Soft Single Event Effects Rodrigo Possamai Bastos,Fernanda Lima Kastensmidt,Ricardo Reis SOUTH SYMPOSIUM ON MICROELECTRONICS, SIM, 21., May 2006, Porto Alegre, Brazil Communication dans un congrès hal-03402758v1
Design at high level of a robust 8-bit microprocessor to soft errors by using only standard gates Rodrigo Possamai Bastos,Fernanda Lima Kastensmidt,Ricardo Reis ACM Symposium on Integrated Circuits and Systems Design (SBCCI'06), Aug 2006, Ouro Preto, France. pp.196-201, ⟨10.1145/1150343.1150394⟩ Communication dans un congrès hal-03039303v1
Design of a Robust 8-Bit Microprocessor to Soft Errors Rodrigo Possamai Bastos,Fernanda Lima Kastensmidt,Ricardo Reis 12th IEEE International On-Line Testing Symposium (IOLTS'06), Jul 2006, Como, Italy. pp.195-196, ⟨10.1109/IOLTS.2006.21⟩ Communication dans un congrès hal-03039298v1
Designing Low-Power Embedded Software for Mass-Produced Microprocessor by Using a Loop Table in On-Chip Memory Rodrigo Possamai Bastos,Fernanda Lima Kastensmidt,Ricardo Reis International Workshop on Power and Timing Modeling, Optimization and Simulation (PATMOS'05), Sep 2005, Leuven, Belgium Communication dans un congrès hal-03039110v1
Designing Low Power Embedded Software for Mass-Produced Microprocessor by Using a Loop Table in On-Chip Memory Rodrigo Possamai Bastos,Fernanda Lima Kastensmidt,Ricardo Reis SOUTH SYMPOSIUM ON MICROELECTRONICS, SIM, 20., May 2005, Santa Cruz do Sul, Brazil Communication dans un congrès hal-03402756v1

Autre publication scientifique (23)

Reliability of Computing Systems and Components Facing Cosmic Ray Radiation Effects Rodrigo Possamai Bastos Invited talk presented as a course within the IRT-Nanoelec training ”Synchrotron X-ray and neutron applied to nano-electronics” for PhD students of the doctoral school EEATS of the UGA. Training organized by the radiation facilities ILL (Institut Laue Langevin) and ESRF (European Synchrotron Radiation Facility). Grenoble, France, March 25, 2025 Autre publication scientifique hal-05010781v1
Reliability of Computing Systems and Components Facing Cosmic Ray Radiation Effects Rodrigo Possamai Bastos Invited talk presented as a course within the ”Formation continue : ingénierie système appliquée au spatial : instrumentation spatiale et données” organized by the CSUG (Centre spatial universitaire de Grenoble) of the UGA. Grenoble, November 28, 2024 Autre publication scientifique hal-04737097v1
MultiRad Platform for Testing Case-Study Algorithm Applications in Computing Systems under Neutron Radiation Rodrigo Possamai Bastos Invited talk presented at the Universidade Federal do Rio Grande do Sul (UFRGS), Porto Alegre, Brazil, April 27, 2023 Autre publication scientifique hal-04290719v1
Reliability of Computing Systems and Components Facing Cosmic Ray Radiation Effects Rodrigo Possamai Bastos Invited talk presented as a course within the ”Formation continue : ingénierie système appliquée au spatial : instrumentation spatiale et données” organized by the CSUG (Centre spatial universitaire de Grenoble) of the UGA. Grenoble, October 26, 2023 Autre publication scientifique hal-04290743v1
Reliability of Computing Systems and Components Facing Cosmic Ray Radiation Effects Rodrigo Possamai Bastos Invited talk presented as a course and practical activities with thermal neutron source at the ILL (Institut Laue Langevin) within the IRT-Nanoelec training ”Synchrotron X-ray and neutron applied to nano-electronics” for PhD students of the doctoral school EEATS of the UGA. Training organized by the radiation facilities ILL and ESRF (European Synchrotron Radiation Facility). Grenoble, March 30 and 31, 2023 Autre publication scientifique hal-04290741v1
Reliability of Computing Systems and Components Facing Cosmic Ray Radiation Effects Rodrigo Possamai Bastos Invited talk presented in the work group FIMA (Modèles Aléatoires pour la Fiabilité et la Maintenance des Systèmes) of the IMdR (Institut pour la Maîtrise des Risques), Grenoble, France, March 2, 2023 Autre publication scientifique hal-04290715v1
Reliability of Computing Systems and Components Facing Cosmic Ray Radiation Effects Rodrigo Possamai Bastos Invited talk presented as a course within the IRT-Nanoelec training ”Synchrotron X-ray and neutron applied to nano-electronics” for PhD students of the doctoral school EEATS of the UGA. Training organized by the radiation facilities ILL (Institut Laue Langevin) and ESRF (European Synchrotron Radiation Facility). Grenoble, France, May 19, 2022 Autre publication scientifique hal-04290740v1
Reliability of Computing Systems and Components Facing Cosmic Ray Radiation Effects Rodrigo Possamai Bastos Invited talk presented as a course within the ”Formation continue : ingénierie système appliquée au spatial : instrumentation spatiale et données” organized by the CSUG (Centre spatial universitaire de Grenoble) of the UGA. Grenoble, March 24, 2022 Autre publication scientifique hal-04290742v1
Medium-Earth Orbit Spaceflight Radiation Effects in Digital System on Programmable Device Rodrigo Possamai Bastos Invited talk presented at the Universidade Federal de Santa Maria (UFSM), Santa Maria, Brazil, December 21, 2021 Autre publication scientifique hal-04290711v1
Reliability of Computing Systems and Components Facing Cosmic Ray Radiation Effects Rodrigo Possamai Bastos Invited talk presented as a course within the IRT-Nanoelec training ”Synchrotron X-ray and neutron applied to nano-electronics” for PhD students of the doctoral school EEATS of the UGA. Training organized by the radiation facilities ILL (Institut Laue Langevin) and ESRF (European Synchrotron Radiation Facility). Grenoble, France, January 14, 2021 Autre publication scientifique hal-04290739v1
Integrated Bulk Sensors Enabling Online Test for Radiation Induced Soft-Errors and Noise Sensing Frank Sill Torres,Rodrigo Possamai Bastos Tutorial accepted to be presented in Test Technology Educational Program (TTEP), IEEE International Test Conference (ITC), Phoenix, USA, October 28, 2018 Autre publication scientifique hal-04290708v1
Dynamisant les Cours en Amphi avec les Smartphones des Étudiants et les Boîtiers de Vote de l’Université : Activités en Groupe et Classement par Étudiant Rodrigo Possamai Bastos Invited talk presented in ”Rencontre Boitiers de Vote à l’Université Grenoble Alpes (UGA)” and organized by the ”Service d’Accompagnement des Pédagogies, des Initiatives Enseignantes et du Numérique dans le Supérieur (SAPIENS) de l’UGA”, Grenoble, France, June 17, 2016 Autre publication scientifique hal-04290728v1
The World of the Hardware Trojans Rodrigo Possamai Bastos Invited talk presented at the Universidade Federal do Rio Grande do Sul (UFRGS), Porto Alegre, Brazil, April 26, 2013 Autre publication scientifique hal-04290703v1
Systèmes Intégrés Tolérants aux Fautes, Fiables et Sécurisés Rodrigo Possamai Bastos Invited talk presented at TIMA Laboratory, Grenoble, France, April 17, 2012 Autre publication scientifique hal-04290698v1
Asynchronous Circuits as an Alternative for Mitigation of Long-Duration Transient Faults in Deep-Submicron Technologies Rodrigo Possamai Bastos Invited talk presented at the Universidade Federal do Rio Grande do Sul (UFRGS), Porto Alegre, Brazil, April 1, 2011 Autre publication scientifique hal-04290490v1
Circuitos Assíncronos QDI: Uma Alternativa Naturalmente Robusta a Desafios das Tecnologias Submicrônicas Rodrigo Possamai Bastos PhD thesis initial proposal presented and defended, 98 pages, Universidade Federal do Rio Grande do Sul (UFRGS), Porto Alegre, Brazil, November 18, 2009 Autre publication scientifique hal-04290734v1
Simulação de circuitos assíncronos QDI no nível de transistores sob o efeito de injeção de falhas Patricia Corrêa Centeno,Rodrigo Possamai Bastos,Ricardo Reis Presentation in regional workshop: Abstract 116, page 47, Salão de Iniciação Científica of the Universidade Federal do Rio Grande do Sul (UFRGS), Porto Alegre, Brazil, October 21-26, 2007 Autre publication scientifique hal-04290751v1
Simulação de circuitos robustos através de injeção de falhas no nível de portas lógicas Rodrigo da Rocha Manito,Rodrigo Possamai Bastos,Ricardo Reis Presentation in regional workshop: Abstract 048, page 26, Salão de Iniciação Científica of the Universidade Federal do Rio Grande do Sul (UFRGS), Porto Alegre, Brazil, October 15-20, 2006 Autre publication scientifique hal-04290750v1
Design of a Soft-Error Robust Microprocessor Rodrigo Possamai Bastos Master thesis presented and defended, 120 pages, Universidade Federal do Rio Grande do Sul (UFRGS), Instituto de Informática, PPGC, Ouro Preto, Brazil, August 29, 2006 Autre publication scientifique hal-04290736v1
Sistemas Embarcados de Equipamentos de Telecomunicação Rodrigo Possamai Bastos Final report for Electrical Engineer's degree, 40 pages, internship in DataCom Telemática, Universidade Federal do Rio Grande do Sul (UFRGS), Departamento de Engenharia Elétrica, Porto Alegre, Brazil, September, 2002 Autre publication scientifique hal-04290738v1
Sistema microprocessado de medição de vibração para aquisição em tempo real Rodrigo Possamai Bastos,Daniel da Rocha Janner,Altamiro Amadeu Susin Presentation in regional workshop: Abstract 191, page 223, Salão de Iniciação Científica of the Universidade Federal do Rio Grande do Sul (UFRGS), Porto Alegre, Brazil, October 22-26, 2001 Autre publication scientifique hal-04290746v1
Acionamento microcontrolado de motor de passo através de sinais infravermelho padrão RC5 André Piazza,Rodrigo Possamai Bastos,Luciano Hoffmann Paludo,Luiz Tiarajú dos Reis Loureiro Presentation in regional workshop: Abstract 002, page 649, Salão de Iniciação Científica of the Universidade Federal do Rio Grande do Sul (UFRGS), Porto Alegre, Brazil, October 22-26, 2001 Autre publication scientifique hal-04290748v1
Sistema de medição de vibração com acelerômetro de estado sólido Rodrigo Possamai Bastos,Altamiro Amadeu Susin,Marcelo Negreiros,Wilson Pardi Júnior,Rui Francisco Martins Marçal Presentation in regional workshop: Abstract 011, page 539, Salão de Iniciação Científica of the Universidade Federal do Rio Grande do Sul (UFRGS), Porto Alegre, Brazil, September 11-15, 2000 Autre publication scientifique hal-04290745v1