Accéder directement au contenu

Sylvain Bourdel

Pr Sylvain BOURDEL, Grenoble-INP
9
Documents
Affiliations actuelles
  • 1043043
  • 1043329
  • 1042703
Identifiants chercheurs
Contact

Présentation

**Sylvain Bourdel** received the Ph. D in microelectronics from the National Institute of Applied Science (INSA) of Toulouse in 2000. He was with the LAAS laboratory of Toulouse where he was involved on radiofrequency systems modelling and he was particularly focused on spread spectrum techniques applied to 2.45GHz transceivers. In 2002 he joined the IM2NP in Marseille where he headed with Pr H. Barthélemy the Integrated Circuit Design Team of the IM2NP. He joined in 2013 the IMEP-LaHC laboratory and Grenoble-INP as a full Professor. He currently leads the RFIC-Lab laboratory of Grenoble, France. He works on RF and MMW IC design and integration. He particularly focuses on low cost and low power applications. His area of interest also includes system level specifications, UWB and RFID. He is the author and co-author of more than 100 referenced IEEE publications.

Publications

"salvador-mir"
Image document

Feature selection techniques for indirect test and statistical calibration of mm-wave integrated circuits

Manuel Barragan , Gildas Leger , Florent Cilici , Estelle Lauga-Larroze , Salvador Mir
27th European Test Symposium (ETS 2022), May 2022, Barcelona, Spain
Communication dans un congrès hal-03759492v1
Image document

Efficient generation of data sets for one-shot statistical calibration of RF/mm-wave circuits

F. Cilici , G. Leger , Manuel J. Barragan , Salvador Mir , Estelle Lauga-Larroze
International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD 2019), Jul 2019, Lausanne, Switzerland. pp.17-20, ⟨10.1109/SMACD.2019.8795238⟩
Communication dans un congrès hal-02166246v1

Yield Recovery of mm-Wave Power Amplifiers using Variable Decoupling Cells and One-Shot Statistical Calibration

F. Cilici , Manuel J. Barragan , Salvador Mir , Estelle Lauga-Larroze , Sylvain Bourdel
IEEE International Symposium on Circuits and Systems (ISCAS 2019), May 2019, Sapporo, Japan. pp.1-5
Communication dans un congrès hal-02128847v1

On the use of causal feature selection in the context of machine-learning indirect test

Manuel J. Barragan , G. Leger , F. Cilici , Estelle Lauga-Larroze , Sylvain Bourdel
Design, Automation & Test in Europe Conference & Exhibition (DATE 2019), Mar 2019, Florence, Italy. pp.276-279
Communication dans un congrès hal-02137068v1

On the use of causal feature selection in the context of machine-learning indirect test

Manuel J. Barragan , G. Leger , F. Cilici , Estelle Lauga-Larroze , Sylvain Bourdel
2019 Design, Automation & Test in Europe Conference & Exhibition (DATE), Mar 2019, Florence, France. pp.276-279
Communication dans un congrès hal-02231655v1
Image document

Assisted test generation strategy for non-intrusive machine learning indirect test of millimeter-wave circuits

F. Cilici , Manuel J. Barragan , Salvador Mir , Estelle Lauga-Larroze , Sylvain Bourdel
23rd IEEE European Test Symposium (ETS'2018), May 2018, Bremen, Germany. pp.1-6, ⟨10.1109/ETS.2018.8400689⟩
Communication dans un congrès hal-01922313v1

Conception en vue du test d’un amplificateur de puissance à 60 GHz

F. Cilici , Manuel J. Barragan , Estelle Lauga-Larroze , Sylvain Bourdel , Salvador Mir
Journées Nationales du Réseau Doctoral en Micro-nanoélectronique (JNRDM'17), Nov 2017, Strasbourg, France
Communication dans un congrès hal-01649564v1