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Vincent Beroulle

16
Documents

Présentation

Vincent Beroulle received an Engineer Degree from the National Polytechnical Institute of Grenoble (INPG) in 1996, and a Master's Degree and a Ph.D. in Microelectronics from the University of Montpellier II, respectively in 1999 and 2002. He is currently a Professor at the Grenoble Institute of Technology. He is head of the LCIS laboratory. His main interest concerns the security and safety of complex integrated circuits and systems. In particular, his work deals with fault modeling and fault injection with emulation platforms with a specific focus on IoT and RFID technologies.

Publications

giorgio-di-natale
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Non-Invasive Attack on Ring Oscillator-based PUFs through Localized X-Ray Irradiation

Nasr-Eddine Ouldei Tebina , Aghiles Douadi , Luc Salvo , Vincent Beroulle , Nacer-Eddine Zergainoh
IEEE International Symposium on Hardware Oriented Security and Trust (HOST 2024), May 2024, Washington, DC, United States
Communication dans un congrès hal-04521587v1
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Modeling Thermal Effects For Biasing PUFs

Aghiles Douadi , Ioana Vatajelu , Paolo Maistri , David Hély , Vincent Beroulle
29th IEEE European Test Symposium (ETS 2024), May 2024, The Hague, Netherlands
Communication dans un congrès hal-04532564v1
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Experimental Evaluation of Delayed-Based Detectors Against Power-off Attack

Maryam Esmaeilian , Aghiles Douadi , Zahra Kazemi , Vincent Beroulle , Mirbaha Amir-Pasha
IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS 2023), Jul 2023, Crete, Greece. ⟨10.1109/IOLTS59296.2023.10224876⟩
Communication dans un congrès hal-04193277v1
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A Study of High Temperature Effects on Ring Oscillator based Physical Unclonable Functions

Aghiles Douadi , Giorgio Di Natale , Paolo Maistri , Ioana Vatajelu , Vincent Beroulle
29th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2023), Jul 2023, Chania, Greece
Communication dans un congrès hal-04169632v1
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Sub-Space Modeling: An Enrollment Solution for XOR Arbiter PUF using Machine Learning

Amir Ali Pour , David Hely , Vincent Beroulle , Giorgio Di Natale
International Symposium on Quality Electronic Design (ISQED 2022), Apr 2022, Virtual event, United States. ⟨10.1109/ISQED54688.2022.9806267⟩
Communication dans un congrès hal-03599356v1
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An Efficient Approach to Model Strong PUF with Multi-Layer Perceptron using Transfer Learning

Amir Ali Pour , David Hely , Vincent Beroulle , Giorgio Di Natale
International Symposium on Quality Electronic Design (ISQED 2022), Apr 2022, Virtual event, United States. ⟨10.1109/ISQED54688.2022.9806257⟩
Communication dans un congrès hal-03599336v1
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Secure PUF-based Authentication and Key Exchange Protocol using Machine Learning

Amir Ali Pour , Fatemeh Afghah , David Hely , Vincent Beroulle , Giorgio Di Natale
IEEE Computer Society Annual Symposium on VLSI (ISVLSI 2022), Jul 2022, Pafos, Cyprus
Communication dans un congrès hal-03689856v1
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Power of Prediction: Advantages of Deep Learning Modeling as Replacement for Traditional PUF CRP Enrollment

Amir Ali Pour , David Hely , Vincent Beroulle , Giorgio Di Natale
TrueDevice2020, Mar 2020, Grenoble, France
Communication dans un congrès hal-02954099v1
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Machine Learning and Hardware security: Challenges and Opportunities

F. Regazzoni , S. Bhasin , Amir Ali Pour , Ihab Alshaer , F. Aydin
International Conference on Computer-Aided Design (ICCAD 2020), Nov 2020, San Diego, United States
Communication dans un congrès hal-02999327v1
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PUF Enrollment and Life Cycle Management: Solutions and Perspectives for the Test Community

Amir Ali Pour , Vincent Beroulle , Bertrand Cambou , Jean-Luc Danger , Giorgio Di Natale
IEEE European Test Symposium (ETS 2020), May 2020, Tallinn, Estonia. pp.1-10
Communication dans un congrès hal-02999226v1
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The case of using CMOS FD-SOI rather than CMOS bulk to harden ICs against laser attacks

Jean-Max Dutertre , Vincent Beroulle , Philippe Candelier , Louis-Barthelemy Faber , Marie-Lise Flottes
IOLTS: International On-Line Testing Symposium, Jul 2018, Platja d’Aro, Spain. pp.214-219, ⟨10.1109/IOLTS.2018.8474230⟩
Communication dans un congrès emse-01856000v1
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Laser fault injection at the CMOS 28 nm technology node: an analysis of the fault model

Jean-Max Dutertre , Vincent Beroulle , Philippe Candelier , Stephan de Castro , Louis-Barthelemy Faber
FDTC: Fault Diagnosis and Tolerance in Cryptography, Sep 2018, Amsterdam, Netherlands. pp.1-6, ⟨10.1109/FDTC.2018.00009⟩
Communication dans un congrès emse-01856008v1
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Laser-Induced Fault Effects in Security-Dedicated Circuits

Vincent Beroulle , Philippe Candelier , Stephan de Castro , Giorgio Di Natale , Jean-Max Dutertre
VLSI-SoC: Very Large Scale Integration and System-on-Chip, Oct 2014, Playa del Carmen, Mexico. pp.220-240, ⟨10.1007/978-3-319-25279-7_12⟩
Communication dans un congrès hal-01383737v1