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Vincent Beroulle

17
Documents

Présentation

Vincent Beroulle received an Engineer Degree from the National Polytechnical Institute of Grenoble (INPG) in 1996, and a Master's Degree and a Ph.D. in Microelectronics from the University of Montpellier II, respectively in 1999 and 2002. He is currently a Professor at the Grenoble Institute of Technology. He is head of the LCIS laboratory. His main interest concerns the security and safety of complex integrated circuits and systems. In particular, his work deals with fault modeling and fault injection with emulation platforms with a specific focus on IoT and RFID technologies.

Publications

pascal-nouet
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Noise Optimisatioin of a Piezoresistive CMOS MEMS for Magnetic Field Sensing

Vincent Beroulle , Yves Bertrand , Laurent Latorre , Pascal Nouet
SOC Design Methodologies, 90, Kluwer Academic Publishers, pp.461-472, 2002, IFIP — The International Federation for Information Processing, 978-1-4757-6530-4. ⟨10.1007/978-0-387-35597-9_40⟩
Chapitre d'ouvrage lirmm-00268487v1
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Noise optimisation of a piezoresistive CMOS MEMS for magnetic field sensing

Vincent Beroulle , Yves Bertrand , Laurent Latorre , Pascal Nouet
SOC Design Methodologies, 90, Kluwer Academic Publishers, pp.461-472, 2002, IFIP — The International Federation for Information Processing, 978-1-4757-6530-4. ⟨10.1007/978-0-387-35597-9_39⟩
Chapitre d'ouvrage hal-01105261v1
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Impact of Technology Spreading on MEMS Design Robustness

Vincent Beroulle , Laurent Latorre , Muriel Dardalhon , Coumar Oudéa , Guy Perez
SOC Design Methodologies, 90, Kluwer Academic Publishers, pp.241-251, 2002, IFIP — The International Federation for Information Processing, 978-1-4757-6530-4. ⟨10.1007/978-0-387-35597-9_21⟩
Chapitre d'ouvrage lirmm-00268485v1

MEMS monolithiques.

Laurent Latorre , Vincent Beroulle , Yves Bertrand , Pascal Nouet
Hermès science publication, 1 (1), 2000, Nano et Micro Technologies, micro-capteurs et microsystèmes intégrés, 9-782746-202422
Chapitre d'ouvrage hal-01105274v1

Micromachined CMOS Magnetic Field Sensors with Low-Noise Signal Conditioning

Vincent Beroulle , Yves Bertrand , Laurent Latorre , Pascal Nouet
MEMS'02: IEEE International Conference on Micro Electro Mechanical Systems, Las Vegas, Nevada, USA, pp.256-259
Communication dans un congrès lirmm-00268486v1

Evaluation of the Oscillation-Based Test Methodology for Micro-Electro-Mechanical Systems

Vincent Beroulle , Yves Bertrand , Laurent Latorre , Pascal Nouet
VTS'02: 20th IEEE VLSI Test Symposium, Monterey, CA, USA, pp.439-444
Communication dans un congrès lirmm-00268484v1

Conception et Test d'une Micro-Boussole Electromécanique Intégrée

Vincent Beroulle , Yves Bertrand , Laurent Latorre , Pascal Nouet
Colloque du GDR CAO de Circuits et Systèmes Intégrés, Paris (France), France. pp. 97-100
Communication dans un congrès lirmm-00269324v1
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An A/D Interface for Resonant Piezoresistive MEMS Sensor

Luigi Dilillo , Vincent Beroulle , Norbert Dumas , Laurent Latorre , Pascal Nouet
ISIE 2004 - IEEE International Symposium on Industrial Electronics, May 2004, Ajaccio, France. pp.83-88, ⟨10.1109/ISIE.2004.1571786⟩
Communication dans un congrès lirmm-00108896v1

Design and Simulation of a CMOS MEMS Using Standard Microelectronic CAD Environment

Laurent Latorre , Vincent Beroulle , Pascal Nouet
NANOTECH 2003 - Nanotechnology Conference and Trade Show, Feb 2003, San Francisco, CA, United States. pp.472-475
Communication dans un congrès lirmm-00269546v1

Testing Reasonant Micro-Electro-Mechanical Sensors Using the Oscillation-Based Test Methodology

Vincent Beroulle , Yves Bertrand , Laurent Latorre , Pascal Nouet
LATW 2002 - 3rd IEEE Latin American Test Workshop, Feb 2002, Montevideo, Uruguay. pp.99-104
Communication dans un congrès lirmm-00269323v1

On the Use of an Oscillation-Based Test Methodology for CMOS Micro-Electro-Mechanichal Systems

Vincent Beroulle , Yves Bertrand , Laurent Latorre , Pascal Nouet
DATE: Design, Automation and Test in Europe, Mar 2002, Paris, France. pp.1120-1120, ⟨10.1109/DATE.2002.998476⟩
Communication dans un congrès lirmm-00268488v1

Impact of Environmental Parameters on CMOS MEMS Structures

Muriel Dardalhon , Marc-Olivier Dzeukou , Vincent Beroulle , Laurent Latorre , Pascal Nouet
CANEUS, Aug 2002, Montreal, Canada
Communication dans un congrès lirmm-00269356v1

On the Use of CMOS 0n-Chip Mechanical Devices for Spectral Analysis

Laurent Latorre , Vincent Beroulle , Yves Bertrand , Guy Cathébras , Pascal Nouet
EUROSENSORS, Sep 2002, Prague, Czech Republic. pp.191-192
Communication dans un congrès lirmm-00268509v1