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Vincent Beroulle
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Documents
Présentation
Vincent Beroulle received an Engineer Degree from the National Polytechnical Institute of Grenoble (INPG) in 1996, and a Master's Degree and a Ph.D. in Microelectronics from the University of Montpellier II, respectively in 1999 and 2002. He is currently a Professor at the Grenoble Institute of Technology. He is head of the LCIS laboratory. His main interest concerns the security and safety of complex integrated circuits and systems. In particular, his work deals with fault modeling and fault injection with emulation platforms with a specific focus on IoT and RFID technologies.
Publications
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Mutation Sampling Technique for the Generation of Structural Test DataDATE 2005 - 8th Design, Automation and Test in Europe Conference and Exhibition, Mar 2005, Munich, Germany. pp.1022-1023, ⟨10.1109/DATE.2005.220⟩
Communication dans un congrès
hal-00181680v1
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Mutation Sampling Technique for the Generation of Structural Test DataDATE 2005 - 8th Design, Automation and Test in Europe Conference and Exhibition, Mar 2005, Munich, Germany. pp.1022-1023, ⟨10.1109/DATE.2005.220⟩
Communication dans un congrès
lirmm-00105978v1
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Mutation sampling technique for the generation of structural test data6th IEEE Latin American Test Workshop, Mar 2005, Salvador, Bahia, Brazil
Communication dans un congrès
hal-00378490v1
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Software-Based Testing of Sequential VHDL Descriptions8th IEEE European Test Workshop (ETW), May 2003, Maastricht, Netherlands. pp.199-200
Communication dans un congrès
lirmm-00269437v1
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