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Vincent Beroulle

11
Documents

Présentation

Vincent Beroulle received an Engineer Degree from the National Polytechnical Institute of Grenoble (INPG) in 1996, and a Master's Degree and a Ph.D. in Microelectronics from the University of Montpellier II, respectively in 1999 and 2002. He is currently a Professor at the Grenoble Institute of Technology. He is head of the LCIS laboratory. His main interest concerns the security and safety of complex integrated circuits and systems. In particular, his work deals with fault modeling and fault injection with emulation platforms with a specific focus on IoT and RFID technologies.

Publications

938340
Image document

Noise Optimisatioin of a Piezoresistive CMOS MEMS for Magnetic Field Sensing

Vincent Beroulle , Yves Bertrand , Laurent Latorre , Pascal Nouet
SOC Design Methodologies, 90, Kluwer Academic Publishers, pp.461-472, 2002, IFIP — The International Federation for Information Processing, 978-1-4757-6530-4. ⟨10.1007/978-0-387-35597-9_40⟩
Chapitre d'ouvrage lirmm-00268487v1
Image document

Noise optimisation of a piezoresistive CMOS MEMS for magnetic field sensing

Vincent Beroulle , Yves Bertrand , Laurent Latorre , Pascal Nouet
SOC Design Methodologies, 90, Kluwer Academic Publishers, pp.461-472, 2002, IFIP — The International Federation for Information Processing, 978-1-4757-6530-4. ⟨10.1007/978-0-387-35597-9_39⟩
Chapitre d'ouvrage hal-01105261v1

MEMS monolithiques.

Laurent Latorre , Vincent Beroulle , Yves Bertrand , Pascal Nouet
Hermès science publication, 1 (1), 2000, Nano et Micro Technologies, micro-capteurs et microsystèmes intégrés, 9-782746-202422
Chapitre d'ouvrage hal-01105274v1

Monotithic Piezoresistive CMOS Magnetic Field Sensors

Vincent Beroulle , Yves Bertrand , Laurent Latorre , Pascal Nouet
Sensors and Actuators A: Physical , 2003, A: Physical, Vol. 103 (1-2), pp. 23-32. ⟨10.1016/S0924-4247(02)00317-5⟩
Article dans une revue lirmm-00269696v1

Test and Testability of a Monolithic MEMS for Magnetic Field Sensing

Vincent Beroulle , Yves Bertrand , Laurent Latorre , Pascal Nouet
Journal of Electronic Testing: : Theory and Applications, 2001, 17 (5), pp.439-450. ⟨10.1023/A:1012759320563⟩
Article dans une revue hal-00378525v1

Conception et Test d'une Micro-Boussole Electromécanique Intégrée

Vincent Beroulle , Yves Bertrand , Laurent Latorre , Pascal Nouet
Colloque du GDR CAO de Circuits et Systèmes Intégrés, Paris (France), France. pp. 97-100
Communication dans un congrès lirmm-00269324v1

Evaluation of the Oscillation-Based Test Methodology for Micro-Electro-Mechanical Systems

Vincent Beroulle , Yves Bertrand , Laurent Latorre , Pascal Nouet
VTS'02: 20th IEEE VLSI Test Symposium, Monterey, CA, USA, pp.439-444
Communication dans un congrès lirmm-00268484v1

Micromachined CMOS Magnetic Field Sensors with Low-Noise Signal Conditioning

Vincent Beroulle , Yves Bertrand , Laurent Latorre , Pascal Nouet
MEMS'02: IEEE International Conference on Micro Electro Mechanical Systems, Las Vegas, Nevada, USA, pp.256-259
Communication dans un congrès lirmm-00268486v1

On the Use of an Oscillation-Based Test Methodology for CMOS Micro-Electro-Mechanichal Systems

Vincent Beroulle , Yves Bertrand , Laurent Latorre , Pascal Nouet
DATE: Design, Automation and Test in Europe, Mar 2002, Paris, France. pp.1120-1120, ⟨10.1109/DATE.2002.998476⟩
Communication dans un congrès lirmm-00268488v1

On the Use of CMOS 0n-Chip Mechanical Devices for Spectral Analysis

Laurent Latorre , Vincent Beroulle , Yves Bertrand , Guy Cathébras , Pascal Nouet
EUROSENSORS, Sep 2002, Prague, Czech Republic. pp.191-192
Communication dans un congrès lirmm-00268509v1

Testing Reasonant Micro-Electro-Mechanical Sensors Using the Oscillation-Based Test Methodology

Vincent Beroulle , Yves Bertrand , Laurent Latorre , Pascal Nouet
LATW 2002 - 3rd IEEE Latin American Test Workshop, Feb 2002, Montevideo, Uruguay. pp.99-104
Communication dans un congrès lirmm-00269323v1