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Vincent Beroulle
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Documents
Présentation
Vincent Beroulle received an Engineer Degree from the National Polytechnical Institute of Grenoble (INPG) in 1996, and a Master's Degree and a Ph.D. in Microelectronics from the University of Montpellier II, respectively in 1999 and 2002. He is currently a Professor at the Grenoble Institute of Technology. He is head of the LCIS laboratory. His main interest concerns the security and safety of complex integrated circuits and systems. In particular, his work deals with fault modeling and fault injection with emulation platforms with a specific focus on IoT and RFID technologies.
Publications
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Noise Optimisatioin of a Piezoresistive CMOS MEMS for Magnetic Field SensingSOC Design Methodologies, 90, Kluwer Academic Publishers, pp.461-472, 2002, IFIP — The International Federation for Information Processing, 978-1-4757-6530-4. ⟨10.1007/978-0-387-35597-9_40⟩
Chapitre d'ouvrage
lirmm-00268487v1
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Noise optimisation of a piezoresistive CMOS MEMS for magnetic field sensingSOC Design Methodologies, 90, Kluwer Academic Publishers, pp.461-472, 2002, IFIP — The International Federation for Information Processing, 978-1-4757-6530-4. ⟨10.1007/978-0-387-35597-9_39⟩
Chapitre d'ouvrage
hal-01105261v1
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MEMS monolithiques.Hermès science publication, 1 (1), 2000, Nano et Micro Technologies, micro-capteurs et microsystèmes intégrés, 9-782746-202422
Chapitre d'ouvrage
hal-01105274v1
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Monotithic Piezoresistive CMOS Magnetic Field SensorsSensors and Actuators A: Physical , 2003, A: Physical, Vol. 103 (1-2), pp. 23-32. ⟨10.1016/S0924-4247(02)00317-5⟩
Article dans une revue
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Test and Testability of a Monolithic MEMS for Magnetic Field SensingJournal of Electronic Testing: : Theory and Applications, 2001, 17 (5), pp.439-450. ⟨10.1023/A:1012759320563⟩
Article dans une revue
hal-00378525v1
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Conception et Test d'une Micro-Boussole Electromécanique IntégréeColloque du GDR CAO de Circuits et Systèmes Intégrés, Paris (France), France. pp. 97-100
Communication dans un congrès
lirmm-00269324v1
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Evaluation of the Oscillation-Based Test Methodology for Micro-Electro-Mechanical SystemsVTS'02: 20th IEEE VLSI Test Symposium, Monterey, CA, USA, pp.439-444
Communication dans un congrès
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Micromachined CMOS Magnetic Field Sensors with Low-Noise Signal ConditioningMEMS'02: IEEE International Conference on Micro Electro Mechanical Systems, Las Vegas, Nevada, USA, pp.256-259
Communication dans un congrès
lirmm-00268486v1
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On the Use of an Oscillation-Based Test Methodology for CMOS Micro-Electro-Mechanichal SystemsDATE: Design, Automation and Test in Europe, Mar 2002, Paris, France. pp.1120-1120, ⟨10.1109/DATE.2002.998476⟩
Communication dans un congrès
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On the Use of CMOS 0n-Chip Mechanical Devices for Spectral AnalysisEUROSENSORS, Sep 2002, Prague, Czech Republic. pp.191-192
Communication dans un congrès
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Testing Reasonant Micro-Electro-Mechanical Sensors Using the Oscillation-Based Test MethodologyLATW 2002 - 3rd IEEE Latin American Test Workshop, Feb 2002, Montevideo, Uruguay. pp.99-104
Communication dans un congrès
lirmm-00269323v1
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