Vincent Girones

Publications

Thèse (1)

Effect of the cumulative radiation on electronic components and systems: comparison between X-rays and Cobalt-60. Vincent Girones Electronics. Université de Montpellier, 2024. English. ⟨NNT : ⟩ Thèse tel-04979708v1

Poster de conférence (4)

An alternative to Cobalt-60 for TID testing of electronic systems Vincent Girones,Jérôme Boch,Frédéric Saigné,Tadec Maraine,Alain Carapelleet al. DEM 2024, May 2024, Avignon, France. Poster de conférence hal-04582179v1
Comparison of High Energy X-rays and Cobalt 60 irradiations on MOS capacitors Vincent Girones,Jérôme Boch,Frédéric Saigné,Alain Carapelle,Arnaud Chaponet al. RADECS 2023, Sep 2023, Toulouse, France Poster de conférence hal-04580390v1
The Use of High Energy X-Ray Generators for TID Testing of Electronic Devices Vincent Girones,Jérôme Boch,Frédéric Saigné,Tadec Maraine,Timothee Labauet al. SERESSA 2022, Dec 2022, Geneve (Cern), Switzerland Poster de conférence hal-04580388v1
The Use of High Energy X-Ray Generators for TID Testing of Electronic Devices Vincent Girones,Jérôme Boch,Frédéric Saigné,Rubén García RADECS, Oct 2022, Venise, Italy Poster de conférence hal-04580360v1

Article dans une revue (2)

Comparison of High Energy X-ray and Cobalt 60 irradiations on MOS capacitors Vincent Girones,Jérôme Boch,Frédéric Saigné,Alain Carapelle,Arnaud Chaponet al. IEEE Transactions on Nuclear Science, 2024, pp.1-1. ⟨10.1109/TNS.2024.3366432⟩ Article dans une revue hal-04580104v1
The Use of High Energy X-Ray Generators for TID Testing of Electronic Devices Vincent Girones,Jérôme Boch,Alain Carapelle,Arnaud Chapon,Tadec Maraineet al. IEEE Transactions on Nuclear Science, 2023, pp.1-1. ⟨10.1109/TNS.2023.3279626⟩ Article dans une revue hal-04124251v1

Communication dans un congrès (1)

The Use of Filtered High-Energy X-rays and 60Co for TID Testing of a 32-Bit 28nm FDSOI DSP Alejandro Urena Acuna,Julien Favrichon,Aurélien Ballier,Pierre-Alexis Robin,Vincent Gironeset al. ESREF 2024 - 35th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Sep 2024, Parme, Italy Communication dans un congrès hal-04892361v1